JPH02310805A - Quality deciding method for head chip - Google Patents

Quality deciding method for head chip

Info

Publication number
JPH02310805A
JPH02310805A JP13132089A JP13132089A JPH02310805A JP H02310805 A JPH02310805 A JP H02310805A JP 13132089 A JP13132089 A JP 13132089A JP 13132089 A JP13132089 A JP 13132089A JP H02310805 A JPH02310805 A JP H02310805A
Authority
JP
Japan
Prior art keywords
chip
block
head
gap depth
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13132089A
Other languages
Japanese (ja)
Inventor
Shinji Takano
Kiyotaka Wasai
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13132089A priority Critical patent/JPH02310805A/en
Publication of JPH02310805A publication Critical patent/JPH02310805A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To execute selection only by a smapling inspection before another head chip is assembled by sampling the several head chips belonging to the same block, sticking them to a grinding jig, lapping them by the half of core thickness, measuring the initial gap dapth and initial distance of the head chip and inspecting the finished shape of a tip part.
CONSTITUTION: Dozens of chips 1, which are segmented from the same bonding block 10, are defined as one block and one chip 1 is sampled respectively from both ends and a central part and sticked to the chip grinding jig for each block. Then, lapping inspected is executed to the chop and the chip is directly inspected by a microscope and measured. A back number is applied for each block according to the order of the chip segementation and the gap depth of the other head chip in each block is estimated by using the result of the sampling and measurement. Afterwards, the gap depth is used as the dimension of initial gap depth Gd0 when each chip is assembled and ground, Further, when the gap depth is measured, the finishing state of the tip part directing the tape sliding surface of a coiling window is inspected and used as materials for deciding the quality of the chip for each blok. Thus, the quality can be decided for the head chip which can guarantee the output of life of the mass-produced head.
COPYRIGHT: (C)1990,JPO&Japio
JP13132089A 1989-05-26 1989-05-26 Quality deciding method for head chip Pending JPH02310805A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13132089A JPH02310805A (en) 1989-05-26 1989-05-26 Quality deciding method for head chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13132089A JPH02310805A (en) 1989-05-26 1989-05-26 Quality deciding method for head chip

Publications (1)

Publication Number Publication Date
JPH02310805A true JPH02310805A (en) 1990-12-26

Family

ID=15055197

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13132089A Pending JPH02310805A (en) 1989-05-26 1989-05-26 Quality deciding method for head chip

Country Status (1)

Country Link
JP (1) JPH02310805A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011123935A (en) * 2009-12-09 2011-06-23 Hitachi Global Storage Technologies Netherlands Bv Method for manufacturing magnetic head, and method for manufacturing magnetic recording device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011123935A (en) * 2009-12-09 2011-06-23 Hitachi Global Storage Technologies Netherlands Bv Method for manufacturing magnetic head, and method for manufacturing magnetic recording device

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