JPH02289815A - Optical scanning device - Google Patents

Optical scanning device

Info

Publication number
JPH02289815A
JPH02289815A JP11902189A JP11902189A JPH02289815A JP H02289815 A JPH02289815 A JP H02289815A JP 11902189 A JP11902189 A JP 11902189A JP 11902189 A JP11902189 A JP 11902189A JP H02289815 A JPH02289815 A JP H02289815A
Authority
JP
Japan
Prior art keywords
subscanning direction
field
curvature
voltage
applied
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11902189A
Inventor
Akihisa Itabashi
Kenichi Takanashi
Hiroshi Tomita
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP21205788 priority Critical
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Publication of JPH02289815A publication Critical patent/JPH02289815A/en
Application status is Pending legal-status Critical

Links

Abstract

PURPOSE:To easily and securely remove the curvature of field in a subscanning direction and to make a high-density optical scan by providing a focal length varying means which varies the focal length of a cylindrical lens in synchronism with the optical scanning of deflected luminous flux. CONSTITUTION:Substrates 13A and 13B of the cylindrical lens 2A are provided with transparent electrodes, through which a voltage V can be applied from an applying means 15, so that an electric field is activated on liquid crystal 12 by the voltage application. The refractive index of the liquid crystal 12 is expressed as the function n(V) of the voltage applied from the applying means 15 and the distance bfcv from the substrate 13A to the focus can be varied by controlling the applied voltage V. Here, the curvature of field in the subscanning direction can be removed by controlling the applied voltage V so that the curvature of field in the subscanning direction is corrected according to the optical scanning. Consequently, the curvature of field in the subscanning direction can easily and securely be removed, the diameter of a light spot in the subscanning direction can be uniformed, and the high-density scan can be made.
JP11902189A 1988-08-26 1989-05-12 Optical scanning device Pending JPH02289815A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21205788 1988-08-26

Publications (1)

Publication Number Publication Date
JPH02289815A true JPH02289815A (en) 1990-11-29

Family

ID=16616151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11902189A Pending JPH02289815A (en) 1988-08-26 1989-05-12 Optical scanning device

Country Status (1)

Country Link
JP (1) JPH02289815A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5831711A (en) * 1995-03-20 1998-11-03 Fujitsu Limited Optical deflector device
JP2007102108A (en) * 2005-10-07 2007-04-19 Ricoh Co Ltd Optical scanner/image forming apparatus/liquid crystal device
EP1837696A1 (en) 2006-03-20 2007-09-26 WaveLight AG Optical imaging system and method for controlling and using such an imaging system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5831711A (en) * 1995-03-20 1998-11-03 Fujitsu Limited Optical deflector device
JP2007102108A (en) * 2005-10-07 2007-04-19 Ricoh Co Ltd Optical scanner/image forming apparatus/liquid crystal device
US8031362B2 (en) 2005-10-07 2011-10-04 Ricoh Company, Ltd. Optical scanning device, image forming apparatus, and liquid crystal element
EP1837696A1 (en) 2006-03-20 2007-09-26 WaveLight AG Optical imaging system and method for controlling and using such an imaging system

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