JPH02278572A - Alternative block processing system - Google Patents

Abstract

PURPOSE:To reduce a time for reloading a defect list by updating only the third defect list when a defective block is generated, transiting data to the second defect list in the case of overflow and preparing the new secondary defect list. CONSTITUTION:In addition to a primary defect list 11 and a secondary defect list 12, a third defect list 13 is provided on an optical disk medium as a control area to be used in an optical disk controller 1. The address of the defective block, which is detected before loading to a user, is written to the list 11 and the address of the defective block, which is generated after the loading, and the address of an alternative block are written to the list 12 as a pair. The list 13 has data structure same as that of the list 12 and the number of the data for the list 13 is enough smaller than that of the list 12. When the defective block is newly generated, only the list 13 is updated and when the list 13 is turned to the overflow, the data of the list 13 are moved to the list 12 and sorted. Then, the new secondary defect list 12 is prepared and the third defect list 13 is cleared.

Description

[Detailed Description of the Invention] [Summary] The purpose of this invention is to reduce the number of times a defect list is rewritten due to the occurrence of a new defective block, regarding replacement processing when write data is not normally recorded in an optical disk device. Then, the address of the defective block detected before shipment to the user (the address of the primary defective block in which the address was written), the address of the defective block that occurred after shipment to the user, and the address of the replacement block in which data was written in place of the defective block are paired. In an optical disc replacement process in which a written secondary defect list is prepared and managed on the optical disc medium, in addition to the primary defect list and secondary defect list, data that has the same data structure as the secondary defect list and is sufficiently smaller is added to the primary defect list and the secondary defect list. In addition, the optical disk control device is provided with an area for reading and storing the third defect list in addition to an area for reading and storing the primary defect list and the secondary defect list. When a block occurs, if there is space in the third defect list, only the third defect list is updated, and if the third defect list overflows, the third defect list is added to the secondary defect list. Transfer the data of the defect list, sort the original data of the secondary defect list and the transferred data by combining them, create new secondary defect lists 1~, and clear the third defect list. Configure it to do so.

[Industrial Field of Application] The present invention relates to replacement processing when write data is not normally recorded in an optical disc device.

In an optical disk device, after writing data to a medium using a write command, a check is performed to see if the data was written correctly. If the data becomes uncorrectable even with the error detection and correction code (ECC) during the check (this is called an uncorrectable data check), an unused block in the replacement area prepared in advance is searched for and the data is stored there. Write. At the time of reading, if a data check occurs when a read operation is performed, there is a possibility that data has been written in the alternate area, so the corresponding block is searched from the alternate area and the data is read out. This is the replacement process, and the replacement process requires efficient search processing for the replacement area.

[Prior Art] In an optical disk device, after writing data to a medium using a write command, a check is performed to see if the data was written correctly. If the data becomes uncorrectable even by ECC during the check, it is considered unused. Find a replacement block and write data there. In that case, as is done in the case of magnetic disk drives, the ID (identification information such as rack address, sector address, etc.) section is used to indicate the address of the defective block, the address of the replacement block, and the defect/replacement. No flags are written to link bad blocks to replacement blocks. This is because, unlike magnetic disks, the ID section cannot be rewritten these days.

When reading, if a data check occurs when a read operation is performed, there is a possibility that data has been written in the alternate area, so data is read in order from the beginning of the alternate area to find the corresponding block. . If the replacement block is not found even after reaching the end of the replacement area, it is determined that the writing was normal, but some abnormality occurred before the data was read, resulting in a data check. In this case, the occurrence of a data check is reported to the software of the host device.

Recently, the International Standards Organization (I5O) has standardized the map method in addition to the conventional replacement processing method for replacement processing of rewritable optical disks such as magneto-optical disks. In the map method, as shown in Figure 5, the primary defect list (
I'rimary De4ccL List) and Secondary Defect List (Secondary Defect I,
The block is divided into 1st) and user area. The user area is also divided into a primary area and a replacement area.

Primary Defect
Li5t) contains the address of the defective block at the time of shipment of the medium. This does not allocate a replacement block, but instead decides not to use that block and shifts the entire address one place later.

Secondary Defect L
i5t) is used to deal with newly generated defective blocks after being shipped to users, and is a list in which both the address of the defective block and the address of the replacement block are written bare. When a medium is loaded into an optical disk device and becomes ready, the optical disk control device
The values of both defect lists are read and used for subsequent writing and reading processing.

In the example shown in FIG. 5, blocks 1, 2, and 3.4 are defective blocks, and blocks 101, 102, 103, and 104 are replacement blocks. Among these, only block 3 is a defective block detected before shipment, and block 3
The address of is written to the primary defect list and written to the replacement block 103, which is the next block after block 3.

The replacement blocks of block I, 2.4 are written to the replacement area and blocks 1, 101.2 and 1 are written to the secondary defect list.
Addresses 02.4 and 104 are written bare.

FIG. 6 is a diagram showing the structure of the primary defect list.

In this list, one data consists of 4 bytes,
Addresses of bad blocks are listed in descending order. The first 4 bytes (hyde numbers 0 to 3) are the code indicating the beginning of squirrel 1 (00, is OO in hexadecimal), the identifier 01H indicating that it is a primary defect list, the upper byte of the list length, and List information consisting of lower hides is written. The address of each bad byte is written in the upper byte of the track number of the bad block in the first hide, the middle byte in the second high byte, the lower byte 1-1 in the third byte, and the sector number in the fourth byte. .

FIG. 7 is a diagram showing the structure of the secondary defect list.

In this list, one data consists of 8 bytes,
The 4-byte address of the defective block and the 4-byte address of the replacement block are included as a pair (bare). List information similar to that in FIG. 6 is written in the first 8 hides (byte numbers 0 to 7). Pies 1 to 8 to 11 contain the addresses of the first defective blocks that occur in the user, and hide numbers 12 to 15 contain the addresses of replacement blocks. The contents of the address are the same as in the case of FIG.

[Problem to be Solved by the Invention] In replacement processing using the above-described primary defect list and secondary defect list, it is not necessary to rewrite the primary defect list, but the secondary defect list is updated with new defective blocks. needs to be rewritten every time it occurs.

There is no problem in the primary defect list because the addresses of defective blocks that have occurred before shipment are written in ascending order, but in the secondary defect list, each time a new defective block occurs, it is sorted using the address of the defective block as a key ( classification) is necessary.

If the defect list is not sorted, the list must be searched from beginning to end each time a read/write command is received. If it is sorted, you can start the search using the well-known binary search (binary search) and start IJ when the address of the processing block becomes smaller than the address of the defect list, which will increase the time required for the search process. This is because it will be different.

However, sorting takes a lot of time, and sorting every time a bad block occurs is a big burden.

The problem to be solved by the present invention is to provide an alternate block processing method that eliminates such conventional problems.

[Means to solve the problem]

FIG. 1 is a diagram showing the configuration and principle of the present invention.

In the figure, numeral 11 is a primary defect list in which addresses of defective blocks detected before shipment to the user are written.

Reference numeral 12 denotes a secondary defect list, in which the address of a defective block that has occurred after shipment to the user and the address of a replacement block into which data has been written in place of the defective block are written as a pair.

A third defect list 13 is provided in the control area, and has the same data structure as the secondary defect list 12, but has a sufficiently smaller number of data (for example, 10 blocks).

The primary defect list 11, the secondary defect list 12 and the second defect list [3 are written on the optical disc medium.

6], 62 and 63 are memory areas in the optical disk control device, 61 reads and stores the secondary defect list 11, 62 reads and stores the secondary defect list 12, and 63 stores the third defect list. 1 to 13 are read and stored.

[For production]

In the present invention, in addition to the primary defect area list 11 and the secondary defect list 12, a third defect list 13 is provided.

That is, a control area that can be used by the optical disk control device is provided on the optical disk medium, and a defect list 13 is provided in a part of the control area. The third defect list 13 has the same data structure as the next defect number 2 and has a sufficiently smaller number of data (for example, 10 defective/replacement block addresses).

In the initial state after shipment to the user, the secondary defect list 11 and the third defect list 13 are blank except for the list information, and the address of the defective/replacement block paste 1-J2 to be written is O. When a new defective fron occurs and is written to a replacement block, the optical disk control device first writes it to the third defect list 13. When the address of the list of defective/replacement blocks listed in the third defect list 13 reaches a value (for example, 10) (when the number of blocks corresponds), the third defect is added to the secondary defect list 12. Move the data of list 13 and OL the original data of secondary defect list 12 and this transferred data to see 1-
(fill, merge) to create a new secondary defect list 13 and clear the third defect list 13. The processing performed by these optical disk control devices is carried out on storage areas 6162 and 63 within the own device, which are copies of the defect list IL 12.13 on the medium, and are immediately copied to the defect list 1112 and 13 of the medium. . After that, when a bad block occurs, if there is a free area in the third defect list 13, only the third defect list 13 is updated, and when the third defect list 3 overflows, it is updated as a secondary defect. The data of the third defect list 13 is transferred to the list 12 and merged with the original data of the secondary defect list 12 to create a new secondary defect list 13, and the third defect list 13 is cleared.

By adopting such a configuration, there is no need to sort every time a defective bronch occurs, and the third defect list 13
If the number of data is 10 blocks, the number of sorting operations can be performed without reducing to 1/IO.

At the time of reading, when searching for the address of a defective block, the secondary defect list 12 can be searched quickly by the above-mentioned pinar search, and the third defect list 13 is searched from beginning to end, but the number of defects is extremely small. There is less time to search. The third defect list 13 may also be sorted every time a defective block occurs and arranged in descending order of address (since the number is small, the sorting time can be shortened).

[Embodiment] FIG. 2 is a diagram showing the configuration of an optical disc control device in an embodiment of the present invention.

3 and 4 are diagrams showing the state of the defect list in one embodiment of the present invention.

In the figure, 1 is an optical disc control device.

2 is a microprocessor (M P (1)) which controls the operation of the entire optical disk control device. M P U 2 also controls sorting, merging, etc. of the defect list.

Reference numeral 3 denotes a control memory (C3), which stores a microprogram executed by the MPU 2.

4 is a defect list storage memory that stores the defect list read from the medium; 41 stores a secondary defect list;
42 stores a secondary defect list, and 43 stores a third defect list.

5 is a host interface circuit, which interfaces with the host computer.

Reference numeral 6 denotes a lower interface circuit, which interfaces with the optical disk device.

A data transfer buffer 7 temporarily holds data transferred from the boss I/computer to the optical disk device or vice versa.

8 is a higher-level interface control circuit, which controls the higher-level interface circuit.

9 is a lower-order interface control circuit, which controls the lower-order interface circuit.

10 is an error correction processing circuit which detects data errors using an error detection and correction coat and corrects correctable errors.

When an optical disk medium is transferred to an optical disk device (not shown) and becomes ready, the optical disk control device 1 sends a read command to the optical disk device and checks the primary defect lists 1 to 2 of the optical disk device. The next defect list and the third defect list in the control area are read out from the corresponding defect list storage memory 61. , 62.63
Store in.

The third defect list in this embodiment can store addresses of 10 defective/replacement blocks as shown in FIG.

It is now assumed that the state of the third defect list is as shown in No. 31m(a). That is, up to eight defective block addresses D1-D8 and replacement block addresses A1-80 are stored. For unused areas, a
Contains data of ll"'00"'.

Now, assume that a write command is issued, and as a result of writing and reading the data written to address D9, an error that cannot be corrected by the error correction processing circuit 10 occurs, and a replacement block Δ9 is allocated. At that time, the third defect list is in a state as shown in FIG. 3(b). When the third defect list is rewritten in the defect list storage memory 63, the third defect list j. on the optical disk medium is also rewritten.

After that, while executing the write command, the next bad block D1. When AIO is detected and a replacement block AIO is allocated, the third defect list becomes as shown in FIG. 3 (FC).

When the above state is reached, the optical disc control device 1:
The data of the secondary defect list and the data of the third defect list are merged. The result is a state as shown in FIG. That is, the third defect list is completely cleared as shown in FIG. 4(a), and the primary defect list is cleared as shown in FIG. 4(b).
As shown in , the defective block addresses D1 to DIO1 of the third defective list 1 to
is integrated with the data in the secondary defect list and arranged in ascending order of address. According to the third defect list and secondary defect list shown in FIG. 4 created in the defect list storage areas 62 and 63 of the optical disk control device, each list on the optical disk medium is also rewritten. .

[Effect 1 of the Invention As is clear from the explanations given below, according to the present invention, the number of saw Is can be significantly reduced without having to sort and rewrite the secondary defect list every time a defective block occurs. This has a significant industrial effect of reducing command processing time.

[BRIEF DESCRIPTION OF THE DRAWINGS] Fig. 1 is a diagram showing the configuration and principle of the present invention, Fig. 2 is a diagram showing the configuration of an optical disc control device in an embodiment of the present invention, and Figs. FIG. 5 is a diagram showing the data storage area configuration of four media in the map method; FIG. 6 is a diagram showing the configuration of the next defect list; FIG. The figure shows the structure of the secondary defect list. In the figure, 1 is an optical disk control device, 2 is M P [J, 3 is a control memory, 4, 41 . , 42.43 is the defect list storage area, 5 is the upper interface circuit, 6 is the lower interface circuit, 7 is the data transfer circuit, 8 is the upper interface control circuit, 9 is the lower interface, Ace control circuit, and 10 is the error correction circuit. processing circuit, 11 is a primary defect list, 1
No. 2 shows the secondary defect list, and No. 13 shows the third defect list. Hemorrhoids Kugan

Claims (1)

[Claims] A primary defect list (11) in which addresses of defective blocks detected before shipment to the user are written, addresses of defective blocks that have occurred after shipment to the user, and replacement blocks in which data is written in place of the defective blocks. In an optical disk replacement process in which a secondary defect list (12) in which addresses are written as pairs is provided on the optical disk medium and managed, the primary defect list (11) and the secondary defect list (12) are managed.
In addition to 2), a third defect list (13) having the same data structure as the secondary defect list (12) and a sufficiently smaller number of data is provided, and the optical disk control device (1) Areas (41) and (4) for reading and storing the defect list (11) and secondary defect list (12).
In addition to 2), an area (43) for reading and storing a third defect list (13) is provided, and when a new defective block occurs, if there is space in the third defect list (13), the area (43) is provided to read and store a third defect list (13). If only the third defect list (13) is updated and the third defect list (13) overflows, the third defect list (13) is added to the secondary defect list (12).
The original data of the secondary defect list (12) and the transferred data are sorted together to create a new secondary defect list (13), and a third defect list (13) is created.
).