JPH02252315A - Input buffer circuit for semiconductor integrated circuit - Google Patents
Input buffer circuit for semiconductor integrated circuitInfo
- Publication number
- JPH02252315A JPH02252315A JP1074634A JP7463489A JPH02252315A JP H02252315 A JPH02252315 A JP H02252315A JP 1074634 A JP1074634 A JP 1074634A JP 7463489 A JP7463489 A JP 7463489A JP H02252315 A JPH02252315 A JP H02252315A
- Authority
- JP
- Japan
- Prior art keywords
- level
- input
- signal
- input buffer
- buffer circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 8
- 230000005540 biological transmission Effects 0.000 claims abstract description 3
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体集積回路に関し、特に入力バッファ回路
に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor integrated circuit, and particularly to an input buffer circuit.
従来、この種の入力バッファ回路は第2図に示すように
、入力バッファ6の入力が単に半導体集積回路の外部入
力端子5に接続されているだけであった。Conventionally, in this type of input buffer circuit, the input of the input buffer 6 was simply connected to the external input terminal 5 of the semiconductor integrated circuit, as shown in FIG.
上述した従来の入力バッファ回路は入力する信号の電位
レベルが異なる場合、入力電位レベルの変換が必要とな
り、種類の違う入力バッファ回路を用いなければいけな
いという欠点がある。The above-described conventional input buffer circuit has the drawback that when the potential levels of the input signals differ, the input potential level must be converted, and a different type of input buffer circuit must be used.
本発明の目的は前記課題を解決した半導体集積回路用バ
ッファ回路を捷供することにある。An object of the present invention is to provide a buffer circuit for a semiconductor integrated circuit that solves the above problems.
前記目的を達成するため、本発明の半導体集積回路用入
力バッフ1回路は、半導体集積回路用入力バッファ回路
の前段にNチャネルMO3!−ランジスタのトランスミ
ッションゲ−1・を有するものである。In order to achieve the above object, an input buffer circuit for a semiconductor integrated circuit according to the present invention includes an N-channel MO3! - It has a transistor transmission gate 1.
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の一実施例の回路図である。FIG. 1 is a circuit diagram of an embodiment of the present invention.
図において、NチャネルMO3)ランジスタ2のソース
電極は外部入力端子1に接続され、ゲート電極は電源電
極4に接続されている。さらに、ドレイン電極は入力バ
ッファ3の入力端子に接続されている。In the figure, the source electrode of an N-channel MO transistor 2 is connected to an external input terminal 1, and the gate electrode is connected to a power supply electrode 4. Furthermore, the drain electrode is connected to the input terminal of the input buffer 3.
NチャネルMOSトランジスタ2のソース電極の電位を
Vin、ゲーI−電極の電位をVg、ドレインtsの電
位をvO5しきい値電圧をvthとした場合、Nチャネ
ルMO8)ランジスタ2のリニア領域での動作は、Vo
=Vinであり、飽和領域での動作は、Vo =Vg
−Vthとなる。従ッテ、入力端子1よりCMOSレベ
ルの信号を入力した場合、NチャネルMOSトランジス
タ2は飽和領域で動作するため、ドレイン電極からは、
TTLレベルの信号とほぼ等しい振幅の信号が出力され
る。If the source electrode potential of N-channel MOS transistor 2 is Vin, the gate I-electrode potential is Vg, the drain ts potential is vO5, and the threshold voltage is vth, then N-channel MOS transistor 2 operates in the linear region. Ha, Vo
=Vin, and the operation in the saturation region is Vo =Vg
-Vth. When a CMOS level signal is input from input terminal 1, N-channel MOS transistor 2 operates in the saturation region, so from the drain electrode,
A signal with approximately the same amplitude as the TTL level signal is output.
また、入力端子1よりTTLレベルの信号を入力した場
合、NチャネルMOSトランジスタ2はリニア領域で動
作するため、ドレイン電極からは入力とほぼ等しい振幅
の信号が出力される。従って、異なる入力レベルの信号
が外部入力端子から入力されてもドレイン電極からは、
はぼ等しい電位レベルの信号が出力される。Furthermore, when a TTL level signal is input from the input terminal 1, the N-channel MOS transistor 2 operates in a linear region, so that a signal with approximately the same amplitude as the input is output from the drain electrode. Therefore, even if signals with different input levels are input from the external input terminal, the signals from the drain electrode are
Signals with approximately equal potential levels are output.
以上説明したように本発明は、従来入力レベルに合わせ
て2種類あった入力バッファ回路を、1種類の入力バッ
ファ回路で実現することが可能となる効果がある。As described above, the present invention has the advantage that it is possible to realize one type of input buffer circuit instead of the conventional two types of input buffer circuits depending on the input level.
また入力に過電圧が掛かった場合でも、入力バッファの
ゲート電極には電源電圧以下の電圧しか掛からないため
、入力バッファ回路を保護する効果がある。Furthermore, even if an overvoltage is applied to the input, only a voltage lower than the power supply voltage is applied to the gate electrode of the input buffer, which has the effect of protecting the input buffer circuit.
第1図は本発明の一実施例を示す回路図、第2図は従来
の入力バッファ回路を示す回路図である。
1.5・・・外部入力端子
2・・・NチャネルMO8)ランジスタ3.6・・・入
力バッファ
4・・・電源電圧
特許出願人 日本電気株式会社FIG. 1 is a circuit diagram showing an embodiment of the present invention, and FIG. 2 is a circuit diagram showing a conventional input buffer circuit. 1.5...External input terminal 2...N channel MO8) transistor 3.6...Input buffer 4...Power supply voltage Patent applicant NEC Corporation
Claims (1)
ャネルMOSトランジスタのトランスミッションゲート
を有することを特徴とする半導体集積回路用入力バッフ
ァ回路。(1) An input buffer circuit for a semiconductor integrated circuit, comprising a transmission gate of an N-channel MOS transistor at the front stage of the input buffer circuit for a semiconductor integrated circuit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1074634A JPH02252315A (en) | 1989-03-27 | 1989-03-27 | Input buffer circuit for semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1074634A JPH02252315A (en) | 1989-03-27 | 1989-03-27 | Input buffer circuit for semiconductor integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02252315A true JPH02252315A (en) | 1990-10-11 |
Family
ID=13552835
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1074634A Pending JPH02252315A (en) | 1989-03-27 | 1989-03-27 | Input buffer circuit for semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02252315A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04243321A (en) * | 1991-01-17 | 1992-08-31 | Toshiba Corp | Input output buffer circuit |
JPH06169250A (en) * | 1992-11-30 | 1994-06-14 | Mitsubishi Electric Corp | Input circuit for semiconductor integrated circuit device |
EP0702858A1 (en) * | 1994-04-08 | 1996-03-27 | Vivid Semiconductor, Inc. | High voltage cmos logic using low voltage cmos process |
KR100549935B1 (en) * | 1998-12-08 | 2006-05-03 | 삼성전자주식회사 | Input buffer of semiconductor memory device |
JP2011097550A (en) * | 2009-10-31 | 2011-05-12 | Lsi Corp | Interfacing between differing voltage level requirements in integrated circuit system |
JP2017055214A (en) * | 2015-09-08 | 2017-03-16 | 株式会社東海理化電機製作所 | Level shift circuit |
-
1989
- 1989-03-27 JP JP1074634A patent/JPH02252315A/en active Pending
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04243321A (en) * | 1991-01-17 | 1992-08-31 | Toshiba Corp | Input output buffer circuit |
JP2566064B2 (en) * | 1991-01-17 | 1996-12-25 | 株式会社東芝 | I / O buffer circuit |
JPH06169250A (en) * | 1992-11-30 | 1994-06-14 | Mitsubishi Electric Corp | Input circuit for semiconductor integrated circuit device |
EP0702858A1 (en) * | 1994-04-08 | 1996-03-27 | Vivid Semiconductor, Inc. | High voltage cmos logic using low voltage cmos process |
EP0702858A4 (en) * | 1994-04-08 | 1997-04-16 | Vivid Semiconductor Inc | High voltage cmos logic using low voltage cmos process |
KR100549935B1 (en) * | 1998-12-08 | 2006-05-03 | 삼성전자주식회사 | Input buffer of semiconductor memory device |
JP2011097550A (en) * | 2009-10-31 | 2011-05-12 | Lsi Corp | Interfacing between differing voltage level requirements in integrated circuit system |
KR101535689B1 (en) * | 2009-10-31 | 2015-07-09 | 엘에스아이 코포레이션 | Interfacing Between Differing Voltage Level Requirements In An Integrated Circuit System |
JP2017055214A (en) * | 2015-09-08 | 2017-03-16 | 株式会社東海理化電機製作所 | Level shift circuit |
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