JPH02238375A - Measuring apparatus of radiation electromagnetic field characteristic - Google Patents

Measuring apparatus of radiation electromagnetic field characteristic

Info

Publication number
JPH02238375A
JPH02238375A JP6038389A JP6038389A JPH02238375A JP H02238375 A JPH02238375 A JP H02238375A JP 6038389 A JP6038389 A JP 6038389A JP 6038389 A JP6038389 A JP 6038389A JP H02238375 A JPH02238375 A JP H02238375A
Authority
JP
Japan
Prior art keywords
antenna
measuring
data
control
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6038389A
Other languages
Japanese (ja)
Inventor
Tadahiko Maeda
Seiji Oura
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP6038389A priority Critical patent/JPH02238375A/en
Publication of JPH02238375A publication Critical patent/JPH02238375A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To improve the precision in measurement of a radiation electromagnetic field over all solid angles by providing a calibration means, a drive control means, a data interpolation processing means, a display means and an arithmetic means.
CONSTITUTION: An antenna 1 to be measured is mounted on a turn table 2 of a basic block 50, while a reception antenna 7 is fixed at a distance (r), and the table is rotated three- dimensionally. Under the control of a personal computer 6, first, operation data (a measuring frequency, the number of rotations of θ and ϕ, (r)) are inputted to check up synthetically error adjustment of a measuring system and the presence or absence of abnormality thereof, and the antenna 1 is rotated under the control at a required angular speed through the intermediary of a driving power supply element 5 and a rotation driving element 4 and returned to a prescribed initial position after the completion of measurement. A blank part of measured data obtained through a receiver 9 is subjected to an interpolation processing by using an interpolation formula of the first degree or the like. Horizontal and vertical polarization reception powers Wh and Wv are determined as to all points P (rθϕ) on the spherical surface and a reflection distribution pattern map is prepared therefrom. The reflection efficiency of the antenna 1 is determined in a required mode, color display of the strength of powers or computation by the personal computer 6, for instance.
COPYRIGHT: (C)1990,JPO&Japio
JP6038389A 1989-03-13 1989-03-13 Measuring apparatus of radiation electromagnetic field characteristic Pending JPH02238375A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6038389A JPH02238375A (en) 1989-03-13 1989-03-13 Measuring apparatus of radiation electromagnetic field characteristic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6038389A JPH02238375A (en) 1989-03-13 1989-03-13 Measuring apparatus of radiation electromagnetic field characteristic

Publications (1)

Publication Number Publication Date
JPH02238375A true JPH02238375A (en) 1990-09-20

Family

ID=13140573

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6038389A Pending JPH02238375A (en) 1989-03-13 1989-03-13 Measuring apparatus of radiation electromagnetic field characteristic

Country Status (1)

Country Link
JP (1) JPH02238375A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004301514A (en) * 2003-03-28 2004-10-28 Fujitsu Ltd Antenna measuring device
WO2008139832A1 (en) * 2007-05-07 2008-11-20 Murata Manufacturing Co., Ltd. Radiation efficiency measuring device and radiation efficiency measuring method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004301514A (en) * 2003-03-28 2004-10-28 Fujitsu Ltd Antenna measuring device
WO2008139832A1 (en) * 2007-05-07 2008-11-20 Murata Manufacturing Co., Ltd. Radiation efficiency measuring device and radiation efficiency measuring method
US8400366B2 (en) 2007-05-07 2013-03-19 Murata Manufacturing Co., Ltd. Radiation efficiency measuring apparatus and radiation efficiency measuring method

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