JPH02216406A - Device and instrument for measuring solid shape - Google Patents

Abstract

PURPOSE:To easily measure a solid shape and to quickly obtain a contour line drawing and a border line drawing by irradiating an optical plane over the whole periphery of an object to be measured and bringing an optical intersection part to image pickup by an image pickup device whose optical axis is perpendicular to the optical plane, and also, executing the image pickup, while varying the position of the optical intersection part against the object. CONSTITUTION:When an optical plane P is irradiated over the whole periphery of the object 10, and its optical intersection part S is brought to image pickup by an image pickup device 7 whose optical axis L is perpendicular to the optical plane P, the image of a border line in the optical plane P of the object 10 is obtained. Subsequently, while holding an interval between the optical plane P and the image pickup device 7 in a prescribed distance, the irradiated position of the optical plane P is moved by a necessary distance in the direction perpendicular to the optical plane P, and when the image pickup is executed again in this state, a border line drawing in a different cutting plane of the object 10 is obtained. In such a manner, by moving stepwise the irradiated position of the optical plane by a necessary distance each and executing successively its image pickup, a contour line drawing when the object 10 is brought to plane vision from the direction perpendicular to the optical plane P can be easily generated.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an apparatus and method for measuring the shape of a three-dimensional object, and the present invention relates to a device and method for measuring the shape of a three-dimensional object, and the present invention relates to a device and method for measuring the shape of a three-dimensional object. This provides a means for quickly obtaining a contour map or a contour map.

[Conventional technology and problems to be solved]

Due to various demands, it may be necessary to measure the shape of a specific three-dimensional object and express the results as a contour map, contour map, or the like.

Conventionally, in order to draw a contour map of a three-dimensional object, images of the three-dimensional object are taken from several locations separated by a predetermined interval, and the obtained images are processed by a three-dimensional plotter to create a contour map. It is being done.

However, conventional three-dimensional plotters have the disadvantages that they are not only complex and expensive devices, but also difficult to handle, requiring skill to operate, and requiring long working hours.

Therefore, it has been desired to provide a means by which anyone can easily measure three-dimensional shapes using a simple mechanism.

[Means to solve the problem]

The present invention was created in view of the above problems, and includes:
It is an object of the present invention to provide a means for quickly and easily measuring the shape of a three-dimensional object using a simple and inexpensive device.

Embodiments of the present invention are roughly divided into four categories.

The gist of the first embodiment is to use a measuring device comprising a device to hold the object to be measured, a device for irradiating the optical plane, an imaging device, and a means for changing the irradiation position of the optical plane to the object to be measured. A light plane forming a single plane is irradiated around the entire circumference of the object to be measured held at a predetermined position, and the object is illuminated with an imaging device whose optical axis is perpendicular to the light plane and installed at a predetermined distance from the light plane. After the object to be measured is imaged, the object to be measured is moved stepwise by a required distance in a direction perpendicular to the optical plane, and images of the object are sequentially taken by the imaging device. Alternatively, the position of the object to be measured is fixed, and the optical plane and the imaging device are moved step by step by a required distance in a direction perpendicular to the optical plane while maintaining a predetermined distance between the two. , the object to be measured is sequentially imaged by the imaging device.

Second implementation! The gist of method 3 is to hold the object to be measured in a predetermined position using a device to hold the object to be measured, a multilayer light plane irradiation device that irradiates a plurality of light planes, and an imaging device.
A multilayer optical plane consisting of a plurality of optical planes formed parallel to each other at required intervals is irradiated all around the object to be measured, and the optical axis is perpendicular to the multilayer optical plane and a predetermined distance from the multilayer optical plane. This is to take an image of the object to be measured using an imaging device that is installed at the same place.

Also, the third fruit Ff! Mr. S's point is to use a measuring device consisting of a rotation holding device that can hold the object to be measured and rotate it by the required angle, an optical plane irradiation device, and an imaging device. After irradiating the entire circumference of the object to be measured held in position with a light plane and imaging the object with an imaging device whose optical axis is perpendicular to the light plane and installed at a predetermined distance from the light plane, The object to be measured is sequentially imaged by the imaging device while the object to be measured is rotated stepwise by a required angle around an axis parallel to the optical plane.

The gist of the fourth embodiment is that, while keeping the optical axis perpendicular to the optical plane or multilayer optical plane, the imaging device is placed at a virtual distance from and parallel to the optical plane or multilayer optical plane. This is to image an object to be measured by moving it on a plane.

[Effect]

The operation of the present invention will be explained with reference to drawings showing embodiments.

As shown in FIGS. 1 to 3, when the entire circumference of the object to be measured l#ff1o is irradiated with the optical plane P, light scattering occurs at the points where the optical plane P intersects on the surface of the object to be measured 100. When this intersection S is imaged by an imaging device 7 whose optical axis is perpendicular to the optical plane P, an image of the outline of the cut surface of the object to be measured IO at the irradiation position of the optical plane P is obtained. The irradiation position of the optical plane P is moved by a required distance in the direction perpendicular to the optical plane P while maintaining the distance between the optical plane P and the imaging device 7 at a predetermined distance (see FIG. 3). If you perform imaging again in this state,
Contour diagrams of the object to be measured 10 at different cross-sections are obtained. Subsequently, the light plane irradiation position is moved stepwise by the required distance and images are taken sequentially. By combining the multiple images obtained in this way, it is possible to obtain an image of the object to be measured 1O when viewed in plan from a direction perpendicular to the light plane P. Contour maps can be easily created. Note that the multiple images obtained can be combined into one tie.
It is also possible to make one contour map by multiple exposure on the surface.

In addition, instead of a single optical plane, as shown in FIGS. 11 and 12, the object to be measured 10 is irradiated with multilayer optical planes Q formed parallel to each other at required intervals, and this is imaged to create a contour map. You can also get In this case, if the distance between the object to be measured 10 and the imaging device 7 is sufficiently large and the depth of focus of the image manipulation device @7 is deep, the object to be measured 10 is illuminated with the multilayer light plane Q.
The captured image becomes a contour map. In addition, when the depth of focus of the imaging device 7 is shallow, it is difficult to focus on all of the optical plane layers Ql-Q6 of the multilayer optical plane Q, so each optical plane layer old to Q6 is sequentially focused on the object to be measured. 10 and sequentially take images, and the obtained plural images are combined to create a contour map. At this time, if the distance between the object to be measured lO and the imaging device 7 is short, distance correction is applied to each image according to the difference in distance between each of the optical plane layers A6 to A6 and the imaging device 7. If the device 7 is movable in the direction perpendicular to the multilayer optical plane Q, each optical plane layer Q1~
06 and the imaging device 7 at a predetermined distance, the distance correction described above can be made unnecessary.

Further, as shown in FIG. 13, the object to be measured 10 held at a predetermined position is irradiated with the optical plane R, and the object to be measured IO is rotated step by step by a required angle around an axis parallel to the optical plane R. When IIA@ is performed sequentially, images corresponding to the contour lines of the object to be measured 1O when viewed from various angles are obtained. That is, information about the three-dimensional shape in spherical coordinate system or polar coordinate system is obtained. In this case as well, multiple images can be captured on one imaging surface by multiple exposure.

As illustrated in FIG. 14, since there is a constriction 20 etc. on the surface of the object to be measured 10, it is difficult to see the relationship between the optical plane P and the object to be measured 10 from a position where the optical axis passes through the object to be measured 10. It may not be possible to image the intersection S. In such a case, imaging can be performed by moving the imaging device 7 on a parallel virtual plane M located at a predetermined distance from the optical plane P while keeping the optical axis perpendicular to the optical plane P. It is. To briefly explain the principle, when the object to be measured 10 has a constriction 20, by moving the imaging device 7 an appropriate distance on the plane M, a position where the intersection S can be imaged can be found. At this time, the optical axis is perpendicular to the optical plane P, and the imaging device 7 and the optical plane P are always kept at a predetermined distance. Therefore, no matter which position the imager W7 is translated in parallel, the resulting image G1g has a shape that is different from the shape of the intersection S, and the similarity ratio between the two is constant. In other words, no matter where the imaging device 7 is located on the plane M, the original image G and the moved image g are congruent. However, when the imaging device 7 is moved in parallel, only a fl image of a part of the intersection S can be obtained.Therefore, the imaging device 7 is moved around an appropriate axis perpendicular to the optical plane P. #i image may be taken by rotating the object 10 by a required angle. By combining a plurality of images obtained in this manner, an accurate contour map can be created even for the object to be measured IO having a constriction 20.

〔Example〕

The details of the present invention will be explained below based on the drawings showing examples.

(First Embodiment) As shown in FIGS. 1 to 3, the three-dimensional shape measuring device (hereinafter simply referred to as the measuring device) according to the present invention includes a base surface irradiation device, and an object to be measured IO. Holding device 5 and imaging device 7
It consists of

The light heavy surface irradiation device 1 includes a light source 2. A diffuser 3 that diffuses the light beam projected from the light source 2 into a plane. It consists of a reflecting mirror 6 arranged to reflect the light plane P and irradiate it all around the object to be measured IO, and if necessary, direct the diffused light beam between the diffuser 3 and the object to be measured 10. A slit 4 is provided to take out one optical plane P.

Although it is desirable to use a laser with good directivity as the light 'fE2, this is not limiting.

For example, when the light source 1 is a laser, the light beam diffuser 3 may be a columnar lens, a columnar plano-convex lens, or a polygon mirror as shown in the figure. By doing so, the optical plane P can be easily generated. In this case, since the optical plane P also has high directivity, the slit 4
is not necessarily necessary. Further, when a normal light source such as a light bulb is used as the light source 1, a light plane can be obtained by condensing the light using a concave mirror, a lens, etc., and then passing the light through the illustrated slit 4. In this way, the type of diffuser 3 is determined as appropriate depending on the type of light source 1 used. translated. Further, in the drawing, the light plane P is irradiated to the entire circumference of the object to be measured 10 using one light source 2 and a plurality of reflecting mirrors 6, but it is of course possible to use a plurality of light sources 2. be.

In addition to a plane mirror, the reflecting mirror 6 includes a convex mirror 6 (
60) or the concave surface 5J16 (61) in FIG. 5 can be used. Furthermore, Fig. 6 (al and (b)
As shown in FIG.
A reflective i 6 (62) such as the one attached thereto can also be used.

This reflection &#I82 is the 6th when reflecting the diffused light J.
As shown in Figure fbl, the plano-convex lens 64 has the effect of making the light spread over a wider angle fJ2;M.

The reflective mirrors 6 may be arranged so as to surround the entire circumference of the object to be measured 10 without gaps, as illustrated in FIGS. In addition, when a large number of reflecting mirrors 6 are arranged at appropriate intervals around the entire circumference, an angle adjustment mechanism 70 is attached to each reflecting mirror 6 as shown in FIG. It is preferable to allow the configuration to be changed depending on the shape of the item 10, etc.

In this way, the number of light sources 2, the number and arrangement of reflecting mirrors 6, etc.
It is by no means limited. Of course, the wavelength, intensity, etc. of the light used are also appropriately set according to the measurement conditions. In any case, it is important to ensure that the optical plane P is irradiated all around the object to be measured 1O.

The holding device 5 can hold the object to be measured 10 and move the object to be measured 10 step by step by a required distance in a direction perpendicular to the base plane P formed by the optical plane irradiation device 1. It is made possible. The moving distance may be constant or changeable.

The imaging device 7 is installed at such a distance that its optical axis is perpendicular to the base surface P and that the image on the base surface P is in focus. As an example of the imaging device 7, in addition to a normal camera equipped with an optical lens and film, a combination of a CCD camera using a CCD element and a recording medium such as a floppy disk or magnetic tape can be adopted. .

Next, a procedure for creating a contour map of the object to be measured 10 using the above-mentioned measuring device will be explained.

First, the object to be measured 10 is held by the holding device 5 and set so that the base surface P passes through the measurement reference position of the object to be measured 10 . Next, the light plane irradiation device 1 irradiates the base surface P toward the object to be measured 10 . The light source 2 side of the object to be measured 10 is irradiated with direct light, but the opposite side and sides are irradiated with secondary light reflected by the reflector 6, and as a result, the entire circumference of the object to be measured 10 is It is irradiated by the hand surface P. In this state, the imaging device 7 images the intersection S between the base surface P and the object to be measured 1O. At the intersection S, light is scattered along the surface of the object to be measured IO, and this is imaged as a contour line of the cross section of the object to be measured 10 at the position of the base surface P, as shown in FIG. . Subsequently, the holding device 5 is operated to move the object to be measured 10 by a required distance in a direction perpendicular to the base surface P, as shown in FIG. The displacement ωJ distance is appropriately set depending on the interval of the contour map to be created. Once the movement of the object to be measured IO is completed, imaging is performed in the same manner as described above.

In this way, by moving the object to be measured 10 by the required distance and sequentially taking images, images of the outline of the figure obtained by cross-sectioning the object to be measured IO at each required interval are captured. Then, by superimposing the plurality of obtained images, a contour map of the target object to be measured 10 can be created. It is also possible to create a contour map by multiple exposure of multiple images onto a single film.

Note that instead of moving the object to be measured 10, the optical plane irradiation device l and the imaging device 7 are moved by a required distance in a direction perpendicular to the base plane P without changing their mutual positional relationship. There is no problem even if the irradiation position of the base hand surface P is changed by moving it in stages.

(Second Embodiment) In the first embodiment, the object to be measured 10 is irradiated with a single base surface P, but instead of this, it is also possible to use a plurality of base surfaces. It is.

FIGS. 11 and 12 show an embodiment in which a contour map is created using a multilayer optical plane Q consisting of a plurality of mutually parallel original planes at required intervals.

In this embodiment, the multilayer light plane irradiation device 11 forming the multilayer light plane Q includes a light source 12 and a light beam splitter 18 that splits the light beam projected from the light R12 into a plurality of parallel light beams at required intervals. , a diffuser 13 that diffuses each of the plurality of light rays in a planar shape, and a reflecting mirror 16. In this case, the distance between the optical plane layers Ql-06 may be adjusted as desired. Further, in this embodiment, a columnar plano-convex lens is used as the diffuser 13.

Furthermore, it is convenient if the optical plane layer can be selectively irradiated onto the object 10 to be measured.

Next, a procedure for creating a contour map using the multilayer optical plane irradiation device 11 will be explained.

The depth of focus of the imaging device surface 7 is sufficiently deep, and the multilayer original surface Q
If there is a sufficient distance from
Each intersection T1 between each optical plane layer Q1 to 06 and the object to be measured 10
~T6 may be imaged by the ink image device 7 whose optical axis is held perpendicular to the multilayer optical plane Q. In this case, the desired contour map can be obtained by imaging at -degrees.

In other cases, for example, when the depth of focus of the imaging device 7 is shallow, it is difficult to focus on all the optical plane layers O1-06 at the same time. Therefore, the optical plane layer 01 to the opening 6 are sequentially irradiated onto the object to be measured 10, and each intersection TI-T6 that is formed is focused and imaged each time.

Then, a contour map can be obtained by composing the plurality of obtained images or by performing multiple exposure on two sheets of film.

Furthermore, when the distance between the multilayer optical plane Q and the imaging device 7 is short, the magnification of the obtained image differs greatly between the optical vertical 13i Q 1 near the imaging device 7 and the normal optical plane layer Ω6. Therefore, when creating a contour map, it is usually necessary to perform distance correction on each obtained image. However, when the imaging device 7 can be moved in the direction perpendicular to the multilayer optical plane Q, each optical plane layer (11-0
The image capturing device 7 may be moved so that the distance from the image capturing device 6 is constant, and images may be captured sequentially. If this is done, the magnification of the obtained image will always be constant, so the distance correction described above will not be necessary.

(Third Embodiment) The measuring device according to the present invention can be used not only for creating contour maps, but also for polar coordinate system or spherical coordinate system. It is also applicable when obtaining a 1-line diagram. This will be explained using FIG. 13.

The measuring device shown in the same figure differs greatly from the previous embodiment in that it is configured to rotate the object to be measured 10 by a required angle around an axis parallel to the light perpendicular R. The basic configuration of the measuring device is the same as that of the previous embodiment. However, a rotation holding device 25 is used that holds the object to be measured 10 and rotates it by a required angle, and the optical plane irradiation device 1 is placed vertically above the object to be measured 10, so that the light perpendicular R formed thereby is The imaging device 7 is installed so that its optical axis is vertical. The rotation axis of the rotation 1y holding device 25 is parallel to the light perpendicular R.

Using the measuring device configured in this manner, the object to be measured 10 is irradiated with the vertical light R, and while the object to be measured 10 is rotated step by step by a required angle, the intersection U with the vertical light R is detected by the imaging device 7.
images in sequence. As a result, an image of the contour line corresponding to the rotation angle is obtained. That is, information regarding the three-dimensional shape of the object to be measured 10 expressed in polar coordinates can be obtained.

(Fourth Example) As illustrated in FIG. 14, since there is a constriction 20 on the surface of the object to be measured 10, the optical axis of the imaging device 7 is
It may not be possible to image the intersection S of the light vertical P and the object to be measured 10 from a position where the light passes approximately through the center of the object 10 . In such a case, create a contour map etc. as follows.

First, while keeping the optical axis perpendicular to the light perpendicular P, the imaging device 7 is moved by an appropriate distance on a parallel virtual plane M located at a certain distance from the light perpendicular P, and the intersection S is imaged. Find a possible position. The image g obtained at this time is congruent with the image G at the original position. The reason for this will be explained below.In the drawing, the intersection S is represented by a line segment AB, the image @G is represented by a line segment 8F, the image g is represented by a line e[, and AF and BE are represented by a plane M
Let the point where Af and Be intersect on the plane M be d. However, the images 1jJG and g are both on a virtual plane N parallel to the light perpendicular P. As can be easily seen from the drawing, △DAB and HeDFE are similar, and △
dAB and Δdfe are also similar. By the way, the respective similarity ratios are equal to each other because they are the ratio of the height of each triangle, that is, the ratio of the distance 1h between the plane M and the plane N to the distance I (between the light perpendicular P and the plane M). , line segment A
The lengths of the corresponding line segment FB and the line segment "e" are equal to each other. Therefore, as long as the imaging device 7 moves in parallel on the plane M, the captured images are all congruent.

(IIL, the imaging position of image g when the imaging device 7 is translated in parallel is different from the position of the original image @!G.

Therefore, a bellows mechanism 8 is provided in the imaging device W7, and the optical lens 7
a, film, CCO element, etc. l! It is configured to be able to move relative to the image plane 7b. With this shift, the imaging position on the imaging surface 7b can be kept constant.

Further, the image that can actually be captured is a part of the intersection S. Therefore, by rotating the imaging device 7 at appropriate angles around an axis perpendicular to the light vertical P on the plane M, and by composing the plurality of images obtained, the desired contour map can be obtained. Can be done.

Note that instead of rotating the 116 image device 7, the image device 7
A contour map may be created by translating the object lO by an appropriate distance on the plane M, and then imaging the object lO while rotating it by an appropriate angle around an axis perpendicular to the optical plane P.

The embodiments of the present invention are not limited to the above, and the embodiments of the present invention are not limited to the above embodiments. It is possible to change it as appropriate depending on the situation.

(Effects of the Invention) Since the three-dimensional shape measuring device according to the present invention has a simple configuration, it can be provided at low cost. Since the operation is very easy, by using the three-dimensional shape measuring method according to the present invention, contour maps, polar coordinate contour maps, etc. can be quickly created without requiring any skill.

In short, the present invention provides highly practical means for easily and reliably measuring the shape of a three-dimensional object.

[Brief explanation of the drawing]

The drawings are all related to the present invention, and FIGS. 1 to 3 are a perspective view and a plan view showing the first embodiment.
4 and 5 are perspective views showing an embodiment of the reflecting mirror, FIGS. 6 and 6(b) are perspective views and plan views showing other embodiments of the reflecting mirror, and The 1θ diagram is a plan view showing an example of arrangement of reflecting mirrors. 11 and 12 are a perspective view and a side view showing the second embodiment, FIG. 13 is a perspective view showing the third embodiment, and FIG. 14 is a side view showing the fourth embodiment. P-Optical plane Q-Multilayer optical plane Ql-02-・-Optical plane layer R-・Optical plane S-Intersection T (Tl~T6)・-
Intersection U - Intersection L - Optical axis l - Front surface irradiation device 2 - Light source 3 - Diffuser 4 - Slit 5 - Holding device 6 - Reflector 7 - Imaging device l〇 - Object to be measured 11 - One Layered light plane irradiation device 12-・Light m 13-
- Diffuser 14 - Slit 16 - Reflection i1 1B - Light beam splitter 25 - One rotation holding device Patent applicant Kanebuchi Chemical Industry Co., Ltd. Application agent Patent attorney Toshihiko Uchida - 1st ward 11th figure (b ) Figure 10

Claims (1)

[Scope of Claims] 1. A holding device that holds an object to be measured, a light plane irradiation device that irradiates a light plane to the entire circumference of the object to be measured, and an optical axis that is aligned with the light plane formed by the light plane irradiation device. an imaging device installed perpendicularly and at a predetermined distance from the optical plane; and an irradiation position changing means for changing the irradiation position of the optical plane onto the object to be measured by a required distance in a direction perpendicular to the optical plane. A three-dimensional shape measuring device comprising: 2. A holding device that holds the object to be measured, a multilayer optical plane irradiation device that irradiates a plurality of optical planes formed parallel to each other at required intervals around the entire circumference of the object to be measured, and a multilayer optical plane whose optical axis is the multilayer optical plane. A three-dimensional shape measuring device comprising: an imaging device installed perpendicular to a multilayer light plane formed by an irradiation device and at a predetermined distance from the multilayer light plane. 3. A rotation holding device that can hold the object to be measured and rotate it by a required angle, and a light plane irradiation device that irradiates the entire circumference of the object with a light plane parallel to the rotation axis of the object to be measured; A three-dimensional shape measuring device comprising: an imaging device whose optical axis is perpendicular to the optical plane formed by the optical plane irradiation device and installed at a predetermined distance from the optical plane. 4. The three-dimensional device according to claim 1 or 3, wherein the light plane irradiation device comprises one light source, a diffuser that diffuses the light beam projected from the light source in a planar shape, and a reflecting mirror. Shape measuring device. 5. The multilayer light plane irradiation device includes a light source, a light beam splitter that divides the light beam projected from the light source into a plurality of parallel light beams, a diffuser that diffuses each of the plurality of light beams into a planar shape, and a reflector. 3. The three-dimensional shape measuring device according to claim 2, comprising a mirror. 6. The imaging device is configured to maintain the optical axis perpendicular to the optical plane formed by the optical plane irradiation device or the multilayer optical plane formed by the multilayer optical plane irradiation device, and to The three-dimensional shape measuring device according to any one of claims 1 to 5, wherein the three-dimensional shape measuring device is movable on a parallel virtual plane at a predetermined distance. 7. Hold the object to be measured in a predetermined position, irradiate the entire circumference of the object with a single plane of light, and set the optical axis perpendicular to the optical plane and at a predetermined distance from the optical plane. After the object to be measured is imaged by the image pickup device, the object to be measured is moved stepwise by a required distance in a direction perpendicular to the optical plane, and images of the object are sequentially taken by the image pickup device. Characteristic three-dimensional shape measurement method. 8. Fixing the position of the object to be measured, and moving the optical plane and the imaging device step by step by a required distance in a direction perpendicular to the optical plane while maintaining a predetermined distance between the two; 8. The three-dimensional shape measuring method according to claim 7, wherein the image capturing device sequentially captures images of the object to be measured. 9. Hold the object to be measured in a predetermined position, and irradiate the entire circumference of the object with multilayer optical planes formed parallel to each other at required intervals, so that the optical axis is perpendicular to the multilayer optical plane and the multilayer A three-dimensional shape measuring method characterized by capturing an image of an object to be measured with an imaging device installed at a predetermined distance from an optical plane. 10. An imaging device that holds the object to be measured in a predetermined position, irradiates the entire circumference of the object with an optical plane, and has an optical axis perpendicular to the optical plane and installed at a predetermined distance from the optical plane. After taking an image of the object to be measured, the object to be measured is sequentially imaged by the imaging device while rotating the object stepwise by a required angle around an axis parallel to the optical plane. Shape measurement method. 11. The three-dimensional shape measuring method according to any one of claims 7, 8, and 10, wherein a plurality of obtained images are multiple-exposed on one imaging surface. 12. Moving the imaging device on a virtual plane parallel to and at a predetermined distance from the optical plane or multilayer optical plane while keeping the optical axis perpendicular to the optical plane or multilayer optical plane,
The three-dimensional shape measuring method according to any one of claims 7 to 11, wherein an image of the object to be measured is taken.