JPH02206774A - Test circuit for semiconductor integrated circuit - Google Patents

Test circuit for semiconductor integrated circuit

Info

Publication number
JPH02206774A
JPH02206774A JP1027277A JP2727789A JPH02206774A JP H02206774 A JPH02206774 A JP H02206774A JP 1027277 A JP1027277 A JP 1027277A JP 2727789 A JP2727789 A JP 2727789A JP H02206774 A JPH02206774 A JP H02206774A
Authority
JP
Japan
Prior art keywords
semiconductor integrated
integrated circuit
output
test
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1027277A
Other languages
Japanese (ja)
Inventor
Kazuo Aoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP1027277A priority Critical patent/JPH02206774A/en
Publication of JPH02206774A publication Critical patent/JPH02206774A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To perform the performance test of a semiconductor integrated circuit having many output terminals with the aid of a small number of output terminals by selecting and outputting one of the plural output signals of the semiconductor integrated circuit by a selecting switch to the outside.
CONSTITUTION: The ordinary outputs O1-On of the semiconductor integrated circuit are respectively outputted from corresponding output terminal 1. Meanwhile, at the time of testing the semiconductor integrated circuit, the selecting switch 2 is controlled with the parallel selection control output through a shift register 6 where clock and serial selection data are supplied so as to output the selected test output from a test terminal 3.
COPYRIGHT: (C)1990,JPO&Japio
JP1027277A 1989-02-06 1989-02-06 Test circuit for semiconductor integrated circuit Pending JPH02206774A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1027277A JPH02206774A (en) 1989-02-06 1989-02-06 Test circuit for semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1027277A JPH02206774A (en) 1989-02-06 1989-02-06 Test circuit for semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH02206774A true JPH02206774A (en) 1990-08-16

Family

ID=12216579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1027277A Pending JPH02206774A (en) 1989-02-06 1989-02-06 Test circuit for semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH02206774A (en)

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