JPH02133557A - Manufacture of copper base material for vacuum vapor deposition - Google Patents

Manufacture of copper base material for vacuum vapor deposition

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Publication number
JPH02133557A
JPH02133557A JP28455888A JP28455888A JPH02133557A JP H02133557 A JPH02133557 A JP H02133557A JP 28455888 A JP28455888 A JP 28455888A JP 28455888 A JP28455888 A JP 28455888A JP H02133557 A JPH02133557 A JP H02133557A
Authority
JP
Japan
Prior art keywords
copper
vacuum
base material
purity
atmosphere
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28455888A
Other languages
Japanese (ja)
Inventor
Akito Kurosaka
昭人 黒坂
Haruo Tominaga
晴夫 冨永
Kazuhiko Tomomatsu
友松 和彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujikura Ltd
Original Assignee
Fujikura Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujikura Ltd filed Critical Fujikura Ltd
Priority to JP28455888A priority Critical patent/JPH02133557A/en
Publication of JPH02133557A publication Critical patent/JPH02133557A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To manufacture an oxygen-free Cu base material for vacuum vapor deposition by casting high-purity Cu in a nonoxidizing atmosphere, working the above into the desired shape, etching the surface of the above with acid, and successively subjecting the above to immersion into an alcohol solution of hydroxylamine, to drying, and then to vacuum packing treatment. CONSTITUTION:Electrolytic copper of >=99.99% purity is cast in a reducing atmosphere of CO gas, H2 gas, etc., or in vacuum, worked into chip shape, and then immersed into strong acid, such as nitric acid, by which the surface is etched to >=50mum thickness and a Cu2O film on the surface is removed. Subsequently, the above Cu is immersed into an alcohol solution of hydroxyl of >=2wt.% concentration, dried in an oven of <=80 deg.C, and subjected, without delay, to vacuum packing treatment. By using O2-free Cu as the raw material at the time of forming a thin Cu film by a vacuum vapor deposition method, a vapor- deposited film of high-purity Cu free from surface defects can be obtained.

Description

【発明の詳細な説明】 「産業上の利用分野」 本発明方法は、真空蒸着用として用られる銅薄膜彩成用
銅基材の製造方法に関するしのである。
DETAILED DESCRIPTION OF THE INVENTION "Industrial Application Field" The method of the present invention relates to a method for producing a copper substrate for forming a copper thin film, which is used for vacuum deposition.

「従来の技術」 最近、?′lX子デバイスの7ri極用として銅薄、嘆
を使用する傾向が強上っているが、この種の銅薄膜を真
空蒸6法によって製造することが−・役向になされてい
る。この頁空蒸n、去による銅薄膜の形l成工程では、
ス青面1−に種々の表面欠陥、特に突起状の表面欠陥を
生じることがあり、この表面欠陥の発生が原因となって
形成工程における補修率の増加あるいは歩留りの低下が
苦しくなるという問題点かぁ−)だ。
"Conventional technology" Recently? There is a strong tendency to use thin copper films for 7ri electrodes in X-ray devices, and it is becoming more and more useful to produce this type of copper thin film by the vacuum evaporation process. In this step of forming a thin copper film by vaporizing,
Various surface defects, especially protruding surface defects, may occur on the blue surface 1-, and the problem is that the occurrence of these surface defects makes it difficult to increase the repair rate or reduce the yield in the forming process. Kaa-).

この表面欠陥の発生を阻止するためには、不純物元素の
含有量が少ない高純度銅から銅括材を形成することが効
果的であり、特に、酸素含f丁虫を低トシ」ることが効
果的である。
In order to prevent the occurrence of surface defects, it is effective to form the copper bracket from high-purity copper with a low content of impurity elements. Effective.

そこで従来、真空蒸着用銅屑材の製造方法においては、
酸素含有量を低くするために、1元性ガス雰囲気中ある
いは真空雰囲気中で銅を溶解して鋳造する方法が実施さ
れている。
Therefore, conventionally, in the manufacturing method of copper scrap material for vacuum deposition,
In order to reduce the oxygen content, methods have been implemented in which copper is melted and cast in a monotonous gas atmosphere or a vacuum atmosphere.

「発明が解決しようとケる課題 」 しかしながら、溶解して鋳造した段階で酸素含有量が少
なくてし、鋳造後に加工を行うと、最終形状までの加工
工程中において、しばしば銅基材の表面が酸化して酸化
銅(Cute)が生じ、この酸化銅の発生が原因となっ
て真空蒸着による銅薄膜形成工程において突起状の表面
欠陥を生じるという問題点があった。更に、nj記問題
点を解決するために、酸化した銅基材の表面部分を切削
して除去すると高純度銅を使用している銅基材の歩留り
が氷化して製造コストが著しく向上する問題点がある。
``Problem to be solved by the invention'' However, when the oxygen content is low at the stage of melting and casting, and when processing is performed after casting, the surface of the copper base material often changes during the processing process to the final shape. There is a problem in that copper oxide (Cute) is produced by oxidation, and the production of copper oxide causes protruding surface defects in the step of forming a copper thin film by vacuum evaporation. Furthermore, in order to solve the problem described in item nj, if the surface part of the oxidized copper base material is cut and removed, the yield of the copper base material using high-purity copper will deteriorate and the manufacturing cost will increase significantly. There is a point.

また、酸化した表面部分を切削除去した銅基材において
ら、切削後に大気中に放置しておくと、再度、表面に酸
化銅を生じる問題がある。
Furthermore, if a copper base material from which the oxidized surface portion has been removed is left in the atmosphere after cutting, there is a problem in that copper oxide is generated on the surface again.

また、従来、最終形状まで機械加工した後、銅基材表面
に付着した汚れを除去するために、水あるいはアルコー
ル等で洗浄してからドライヤー等を用いて熱風乾燥する
ことがあったが、この乾燥工程中に大気中の粉塵を銅基
材に吹き付けてしまい、かえって銅基材を、′り染させ
てその純度を低下させてしまう問題があり、この銅基材
を真空蒸着用として使用した場合に銅薄膜に突起状の表
面欠陥を生じてしまう問題があった。
In addition, in the past, after machining to the final shape, in order to remove dirt adhering to the surface of the copper substrate, it was washed with water or alcohol, and then dried with hot air using a dryer, etc. During the drying process, there was a problem in which atmospheric dust was blown onto the copper base material, causing the copper base material to become dyed and reducing its purity. In some cases, there is a problem in that protrusion-like surface defects occur on the copper thin film.

以上説明したような問題が生じているので本発明者らは
無酸素銅チップを長期間大気中で放置し、酸化銅の生成
によって変色した銅基材について、その表面を切削する
ことなしに酸によって適当な厚さエツチング処理を施し
たところ、酸化銅が除去されて変色が消失し、適度な濃
度のヒドロキシルアミンのアルコール溶液中に浸漬して
適当な温度雰囲気中にて乾燥すると、再度酸化銅が生成
し難く、しかも、この基材を用いて形成された蒸着膜に
表面欠陥が生じないことを知見した。
Because of the problems described above, the inventors of the present invention left oxygen-free copper chips in the atmosphere for a long period of time, and removed the copper base material, which had discolored due to the formation of copper oxide, without cutting the surface. When etched to an appropriate thickness, the copper oxide was removed and the discoloration disappeared. When immersed in an alcoholic solution of hydroxylamine with an appropriate concentration and dried in an atmosphere at an appropriate temperature, the copper oxide was removed again. It has been found that this substrate is difficult to form, and that no surface defects occur in the deposited film formed using this substrate.

本発明は、前記知見に基いてなされたもので、真空蒸着
に用いた場合に表面欠陥を生じない銅蒸着表面を安定し
て得ることができる真空蒸着用銅基材を提供することを
目的とする。
The present invention has been made based on the above findings, and an object of the present invention is to provide a copper base material for vacuum evaporation that can stably obtain a copper evaporation surface that does not cause surface defects when used for vacuum evaporation. do.

「課題を解決するための手段」 本発明は、純度99.99%以上の銅を原料として、C
Oガス、H、ガスなどの還元性ガス雰囲気中あるいは真
空雰囲気中における鋳造によって銅の鋳造品を形成し、
この鋳造品を加工した後に、この加工品の表面を硝酸な
どの酸に浸して厚さ507zm以上エッヂングして除去
し、更に、2重M%(以丁、%という)以上の虚度のヒ
ドロキシルアミンのアルコール溶液に浸しf二後、80
℃以下の温度雰囲気中で乾燥し、この乾燥品に真空パッ
ク処理を施すものである。
"Means for Solving the Problems" The present invention uses copper with a purity of 99.99% or more as a raw material.
Forming a copper casting by casting in a reducing gas atmosphere such as O gas, H gas, or in a vacuum atmosphere,
After processing this cast product, the surface of this processed product is immersed in an acid such as nitric acid to create an edging with a thickness of 507 mm or more and then removed. After soaking in an alcohol solution of 80
The product is dried in an atmosphere at a temperature below °C, and the dried product is vacuum packed.

この発明において出発原料の銅の純度を9999%以北
としたのは、純度が9999%未満であると、不純物が
多ずぎて本発明の方法を実施して銅基材を形成してら、
その銅基材により形成される7A n膜に表面欠陥を生
じるためである。また、エツチング深さを50μm未満
にすると、酸化銅(CuyO)の除去が不1−分でその
蒸着膜に表面欠陥が生じ易い。しかしながら、過剰のエ
ツチングは銅基材の歩留りを悪くし、多量のエツチング
液を消費して、製造コストを上界させる原因となるので
、エツチングする厚さは可能な限り小さい方が好ましい
In this invention, the purity of copper as a starting material is set to 9999% or higher.If the purity is less than 9999%, there will be too many impurities, so if the copper base material is formed by carrying out the method of the present invention,
This is because surface defects occur in the 7A n film formed from the copper base material. Furthermore, if the etching depth is less than 50 μm, copper oxide (CuyO) cannot be removed for 1 minute, and surface defects are likely to occur in the deposited film. However, excessive etching deteriorates the yield of the copper base material, consumes a large amount of etching solution, and causes an increase in manufacturing costs, so it is preferable that the etching thickness be as small as possible.

一方、ヒドロキシルアミンの濃度を2%以上としたのは
、遊離の酸が銅基材表面に付着していると、酸化銅が生
成しやすくなるのでこの酸を十分に中和するためである
。更に、エツチング後にヒドロキシルアミンのアルコー
ル溶液に浸すとこの遊離の酸が除去されて銅基材表面に
酸化銅を生じ難くする効果がある。ただし、ヒドロキシ
ルアミンの轟度が2%以下であると酸化銅を生じ難くす
る効果が不足する。更に、80℃以下の温度雰囲気中で
銅基材を乾燥すると、銅基材表面に酸化銅が生じること
がない。なお、前記エツチングに用いる酸は、硝酸など
を用いても良い。
On the other hand, the reason why the concentration of hydroxylamine is set to 2% or more is to sufficiently neutralize the free acid since copper oxide is likely to be generated when the free acid adheres to the surface of the copper base material. Furthermore, immersion in an alcoholic solution of hydroxylamine after etching has the effect of removing this free acid and making it difficult for copper oxide to form on the surface of the copper substrate. However, if the degree of oxidation of hydroxylamine is 2% or less, the effect of making it difficult to form copper oxide is insufficient. Furthermore, when the copper base material is dried in an atmosphere at a temperature of 80° C. or lower, no copper oxide is generated on the surface of the copper base material. Note that the acid used for the etching may be nitric acid or the like.

更に真空パック処理とは、処理品にプラスチックフィル
ムを被せ、内部を真空ポンプにより真空引きして処理品
にプラスデックフィルムを密着させ、プラスチックフィ
ルムの端部を溶着一体化して処理品をプラスチックフィ
ルムで完全包装する処理である。この真空パック処理を
行うことによって重連のように製造された高品質の銅基
材を長期間にわたり酸化させることなく保存することが
できる。
Furthermore, vacuum packing processing involves covering the processed product with a plastic film, evacuating the inside with a vacuum pump, making the Plus Deck film adhere to the processed product, and welding the edges of the plastic film to integrate the processed product with the plastic film. This is a complete packaging process. By carrying out this vacuum packing process, high quality copper base materials manufactured such as Jyuren can be stored for a long period of time without being oxidized.

「作用」 純度99.99%以上の銅を原料にすることにより不純
物が少なくなって高品質の銅基材が得られる。また、エ
ツチング深さを50μmより深く4−ることで表面の酸
化銅部分が十分に除去されろ。
"Function" By using copper with a purity of 99.99% or more as a raw material, impurities are reduced and a high quality copper base material can be obtained. In addition, the copper oxide portion on the surface should be sufficiently removed by making the etching depth deeper than 50 μm.

また、酸−ζ工Jチングした後に2%以」二の濃度のヒ
ドロキシルアミンのアルコール溶液に浸すことで残留し
j二酸が中和される。更に、真空ノく・ツク処理に五−
で高品質の銅基材が長期間、酸化することなく保存され
る。
In addition, by dipping in an alcoholic solution of hydroxylamine with a concentration of 2% or more after acid oxidation, the remaining diacid is neutralized. In addition, there are five methods for vacuum drilling and drilling.
The high quality copper base material can be stored for a long time without oxidation.

[実施例 1 純度9999%のjiX解銅を出発原料とし、到1全α
空!!t l x l O−’Torrの真空雰囲気中
におL)で、黒鉛るつぼを用いて溶解するとともに鋳造
して酸累含rI′’R8ppmの無酸素銅ロッド(直径
20nu+×長さ300111111)を得た。
[Example 1 Using 9999% pure jiX copper decomposition as a starting material, up to 1 total α
Sky! ! In a vacuum atmosphere of t l Obtained.

次にこの無酸素銅ロッドにスウエージングなどの機械加
工を行って直径101!1111、長さ101のチップ
を得た。更にこのチップを硝酸に浸して表面から7さ5
0μmの部分を溶解除去するエツチング処理を行った。
Next, this oxygen-free copper rod was subjected to machining such as swaging to obtain a chip having a diameter of 101!1111 and a length of 101. Furthermore, soak this chip in nitric acid and remove it from the surface.
Etching treatment was performed to dissolve and remove the 0 μm portion.

続いて、2%濃度のヒト〔1キシルアミンのエタノール
溶液中に浸[また後、80℃のオーブン中で乾燥した。
Subsequently, it was immersed in an ethanol solution of 2% human [1-xylamine] and then dried in an oven at 80°C.

そし゛どこの乾燥品を品を直ちにプラスチックシートで
真空Iくツクする処理を施して!10日間、室温の大気
中に放置し、放置後に取り出して試料と(また。
Then, immediately apply vacuum treatment to the dried items with a plastic sheet! Leave it in the air at room temperature for 10 days, then take it out and remove it from the sample (again.

以上の如く得られた試料を銅基材として1(1い、A1
1l)s基板上に到達真空度I X I O”Torr
の条件下で工(空蒸着による銅薄模を形成し、この蒸着
面について顕微鏡観察を行い、突起状(05μm以りの
凸部)の表面欠陥の台無を調ベノこ。なお、以ドの比較
例1〜6で製造した試料ら併U゛て同等の試験を行い、
後述の第1表にその結果を記載しt二。
The sample obtained as above was used as a copper base material.
1l) Vacuum level reached on s substrate I X I O”Torr
A thin copper pattern was formed by dry vapor deposition under the following conditions, and the vapor-deposited surface was observed under a microscope to check for surface defects such as protrusions (projections of 05 μm or larger). An equivalent test was carried out using the samples produced in Comparative Examples 1 to 6.
The results are listed in Table 1 below.

「比較例1」 前記実施例の6処理において真空ツク・ツク処理のみを
省略し、池のも理は同専の条i++で行−)でj−)た
乾燥品をそのま圭の状態で室温の人気中に90 [1間
放置したしのを試料とした。
"Comparative Example 1" In the 6th treatment of the above-mentioned Example, only the vacuum tsukku treatment was omitted, and the dried product obtained by Ike no Mori in the same article i++) and j-) was left in its original state. The sample was prepared by leaving it for 90 minutes at room temperature.

[比較例2−1 2%濃度のヒドロキシルアミンのエタノール溶液中に浸
した後、100℃のオーブンで乾燥を行い、こt1以外
の条件はjfJ記実施例と同等の条件で試料を作li 
した。
[Comparative Example 2-1 A sample was prepared under the same conditions as in the Example described in JFJ, except for t1, which was immersed in a 2% concentration hydroxylamine ethanol solution and dried in an oven at 100°C.
did.

1−比較例′3」 1%濃度のヒドロキシルアミンのエタノール溶液をII
い、これ以外の条件は前記実意例と同等0)条t’tで
試料を作成した。。
1-Comparative Example '3'' A 1% concentration hydroxylamine ethanol solution was
The other conditions were the same as in the above-mentioned practical example, and a sample was prepared under 0) t't. .

[比較例4j 硝酸によるエツチング深さを30μmに設定12、これ
以外の条件は+1ii記実議例と同等の条件で試料を作
1戊し)こ1、 l−比較例51 純11999%の電解銅を出発原料として用L)、これ
以外の条件は前記実施例と同等の条件で試v1を作成し
た。
[Comparative Example 4j The etching depth with nitric acid was set to 30 μm12, and the other conditions were the same as those in +1ii. Test v1 was prepared using copper as the starting material (L), and other conditions were the same as those in the previous example.

「比較例6」 @累含何量350 ppmのタフビフチ銅ロッド(直径
20mmX長さ300 o+m)の銅チップを作成し、
この他の処理は前記実意例と同等に行って試料を作成し
た。
"Comparative Example 6" @ A copper chip of a tough bift copper rod (diameter 20 mm x length 300 o + m) with a cumulative content of 350 ppm was made,
Other treatments were carried out in the same manner as in the above-mentioned practical example to prepare a sample.

第1表 第1表から明らかなように、本発明をJ= 憔1′らこ
とにより、表ir+i欠陥を生じさせろことなく洞薄模
を真空■着4゛ろことかできる優れた銅基(」を製造で
きろことが判明した。
Table 1 As is clear from Table 1, the present invention has an excellent copper base ( It turned out that it was possible to manufacture ``.

1発明の効果−1 以上説明したように本発明によれは、純IJ%: 99
99%以十の不純物の少ない銅を原料とし、還元性ガス
あるいは真空雰囲気で鋳造して鋳造丁程においての酸化
を防11−シ、更に、加工品の表面を酸により50μm
以上エッヂングして除去し、加工品の表面を2市呈%以
上の濃度のヒドロキシルアミンのアルフール溶液で十分
に還元するので、真空蒸着用として使用した場合に、表
面欠陥の無い胴入n表面を形成できる高品質の銅基(4
をiQろことができる効果がある。なお、純度99.9
9”4以−Lo′)#14を原料とすることにより不純
物の巴影呵が取り除かれ、50μm以上エツチングする
ことにより加工品の表面に形成されている酸化銅が十分
に除去され、これを2重量%以上の濃度のヒドロキシル
アミンのアルコール溶液で処理することで表面の酸が中
和され、更に80℃以下の温度雰囲気中で乾燥すること
により乾燥時に表面が酸化することかないので最終的に
高品質の銅基材が得られる。また、以上のように得られ
た高品質の銅基材を真空バック処理することによりその
品質を長期間にイつたり維持することができる。
1 Effect of the invention-1 As explained above, according to the present invention, pure IJ%: 99
The raw material is copper with less impurities of 99% or more, and is cast in a reducing gas or vacuum atmosphere to prevent oxidation during the casting process, and the surface of the processed product is coated with acid to a thickness of 50 μm.
The surface of the processed product is sufficiently reduced with an Alfur solution of hydroxylamine with a concentration of 2% or more, so when used for vacuum deposition, the surface of the processed product can be removed without surface defects. High quality copper base that can be formed (4
It has the effect of allowing you to use iQ. In addition, the purity is 99.9
By using #9"4-Lo') #14 as a raw material, the influence of impurities is removed, and by etching it to a depth of 50 μm or more, the copper oxide formed on the surface of the processed product is sufficiently removed. By treating with an alcohol solution of hydroxylamine with a concentration of 2% by weight or more, the acid on the surface is neutralized, and by drying in an atmosphere at a temperature of 80°C or less, the surface will not be oxidized during drying, so the final result is A high-quality copper base material can be obtained. Furthermore, by vacuum-backing the high-quality copper base material obtained as described above, its quality can be maintained for a long period of time.

Claims (1)

【特許請求の範囲】[Claims] 純度99.99%以上の銅を原料として、COガス、H
_2ガスなどの還元性ガス雰囲気中あるいは真空雰囲気
中における鋳造によって銅の鋳造品を形成し、この鋳造
品を加工した後に、この加工品の表面を酸に浸して厚さ
50μm以上エッチングして除去し、更に、2重量%以
上の濃度のヒドロキシルアミンのアルコール溶液に浸し
た後、80℃以下の温度雰囲気中で乾燥し、この乾燥品
に真空パック処理を施すことを特徴とする真空蒸着用銅
基材の製造方法。
CO gas, H
A copper casting is formed by casting in a reducing gas atmosphere such as _2 gas or in a vacuum atmosphere, and after processing this casting, the surface of the processed product is dipped in acid and etched to a thickness of 50 μm or more and removed. Copper for vacuum evaporation, which is further immersed in an alcoholic solution of hydroxylamine with a concentration of 2% by weight or more, dried in an atmosphere at a temperature of 80°C or less, and subjected to vacuum packing treatment to the dried product. Method of manufacturing base material.
JP28455888A 1988-11-10 1988-11-10 Manufacture of copper base material for vacuum vapor deposition Pending JPH02133557A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28455888A JPH02133557A (en) 1988-11-10 1988-11-10 Manufacture of copper base material for vacuum vapor deposition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28455888A JPH02133557A (en) 1988-11-10 1988-11-10 Manufacture of copper base material for vacuum vapor deposition

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JPH02133557A true JPH02133557A (en) 1990-05-22

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JP28455888A Pending JPH02133557A (en) 1988-11-10 1988-11-10 Manufacture of copper base material for vacuum vapor deposition

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