JPH0125311Y2 - - Google Patents
Info
- Publication number
- JPH0125311Y2 JPH0125311Y2 JP1981156372U JP15637281U JPH0125311Y2 JP H0125311 Y2 JPH0125311 Y2 JP H0125311Y2 JP 1981156372 U JP1981156372 U JP 1981156372U JP 15637281 U JP15637281 U JP 15637281U JP H0125311 Y2 JPH0125311 Y2 JP H0125311Y2
- Authority
- JP
- Japan
- Prior art keywords
- detection section
- output
- width
- comparator
- mask width
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 13
- 230000007547 defect Effects 0.000 description 8
- 238000007689 inspection Methods 0.000 description 8
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000873 masking effect Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
【考案の詳細な説明】
〔産業上の利用分野〕
本考案の表面検査装置、特に被検体のエツジ部
をマスクするようにした被検体の表面検査装置に
関するものである。[Detailed Description of the Invention] [Industrial Field of Application] The present invention relates to a surface inspection device, and particularly to a surface inspection device for a subject that masks the edges of the subject.
一般に此の種の表面検査装置において被検体全
面を走査して検査するのが普通であるが合成樹脂
フイルム、板状体等のシートものを連続的に製造
してその欠陥を検査する場合効率的には、最終工
程で除去される部分は検査することなく、製品と
して使用する部分のみ検査することがよい。特に
感光性フイルムのように微小欠陥を探索する必要
のあるものにおいては不要部分のノイズをなるべ
く少なくして、精度を高める必要がある。そのた
めフイルム表面に感光性乳剤を塗布したものゝ検
査に際してはその両側端のエツジ部分は塗布ムラ
が多く、製品化に際して除去するのが一般的であ
る。
Generally, this kind of surface inspection equipment scans and inspects the entire surface of the object to be inspected, but it is more efficient when continuously manufacturing sheet materials such as synthetic resin films and plates and inspecting their defects. In this case, it is best to inspect only the parts that will be used as products, without inspecting the parts that will be removed in the final process. Particularly in products such as photosensitive films where it is necessary to search for minute defects, it is necessary to reduce noise in unnecessary parts as much as possible to improve accuracy. Therefore, when inspecting a film whose surface is coated with a photosensitive emulsion, there are many uneven coatings at the edge portions on both sides, and this is generally removed when the film is manufactured into a product.
而して高速で搬送される被検体、例えばウエブ
は検査位置で蛇行(幅方向に偏位)するおそれが
あり、このとき両エツジの位置が変化する。従つ
てこのエツジ部の変位を検知して前記マスクの幅
もそれに応じて変える必要がある。
Therefore, there is a possibility that an object to be inspected, such as a web, being conveyed at high speed may meander (deviate in the width direction) at the inspection position, and at this time, the positions of both edges change. Therefore, it is necessary to detect the displacement of this edge portion and change the width of the mask accordingly.
然しながら従来のビデオ信号のレベル変化を検
出してマスクを行つていた装置ではその閾値によ
つてはマスク不良が生じたり、又はウエブ上の大
きな欠陥を検出した場合にビデオ信号が誤つてマ
スクされてしまう等の欠点があつた。 However, with conventional devices that perform masking by detecting level changes in the video signal, depending on the threshold value, masking defects may occur, or the video signal may be erroneously masked when a large defect is detected on the web. There were some drawbacks, such as:
本考案の表面検査装置はこのような欠点を除く
ようにしたものである。 The surface inspection device of the present invention is designed to eliminate these drawbacks.
本考案の表面検査装置は長手方向に移動する被
検体の幅方向の位置を測定する手段と、この測定
手段の出力をデイジタル信号に変換し単位時間毎
に加算する手段と、多数のセンサーを被検体の幅
方向に並設して成り被検体の表面状態を検出する
ライン状検出部と、この検出部からの出力を位置
毎に取り出すアドレスカウンターと、コンパレー
タによつて前記加算手段の出力をマスク幅設定値
と比較する手段と、このコンパレータの比較結果
によつて前記ライン状検出部からのビデオ信号の
マスク幅を制御するためのマスク幅設定回路とよ
り成ることを特徴とする。
The surface inspection device of the present invention includes a means for measuring the position in the width direction of an object moving in the longitudinal direction, a means for converting the output of this measuring means into a digital signal and adding it every unit time, and a large number of sensors. The output of the adding means is masked by a line-shaped detection section that is arranged in parallel in the width direction of the specimen and detects the surface condition of the specimen, an address counter that takes out the output from this detection section for each position, and a comparator. The present invention is characterized by comprising means for comparing with a width setting value, and a mask width setting circuit for controlling the mask width of the video signal from the linear detection section based on the comparison result of the comparator.
上記長手方向に移動する被検体の幅方向の位置
を測定する手段は例えば被検体の蛇行に追従して
移動する追跡装置と、この追跡装置に連結した移
動鉄心を有する差動トランスとより成る。 The means for measuring the position in the width direction of the subject moving in the longitudinal direction includes, for example, a tracking device that moves following the meandering of the subject, and a differential transformer having a movable iron core connected to the tracking device.
以下図面によつて本考案の実施例を説明する。 Embodiments of the present invention will be described below with reference to the drawings.
第1図は表面検査装置における光学系を示し、
Aは被検体を照明するタングステンランプでハロ
ゲンランプ等の光源である。Bは赤外線透過フイ
ルター、Cは光量を有効に用いる第1コンデンサ
レンズ、Dはシリンドリカルレンズ、Eは第2コ
ンデンサレンズ、Fは被検体を搬送するロール、
GはこのロールFの表面を通る被検体でロールF
上を高速で搬送され、表面に塗布物を有するも
の、例えばウエブ、Hは1個の光源で照明される
被検査域、Iは被検体表面の傷等の欠陥箇所を表
し、Jは被検体Gの表面からの反射光を集光する
検出レンズ、Kは例えば多数のフオトエレメント
から構成されるCCD、フオトダイオードアレイ
等のライン状センサーより成る検出部を示し、こ
の検出部Kからは被検査域Hの欠陥箇所を見出し
たときに欠陥を示すビデオ信号が取り出される。 Figure 1 shows the optical system in the surface inspection device.
A is a tungsten lamp that illuminates the subject, and is a light source such as a halogen lamp. B is an infrared transmission filter, C is a first condenser lens that effectively uses the amount of light, D is a cylindrical lens, E is a second condenser lens, F is a roll that conveys the subject,
G is the object passing through the surface of this roll F.
An object that is conveyed at high speed and has a coating on its surface, such as a web, H represents the area to be inspected illuminated by one light source, I represents a defect such as a scratch on the surface of the object, and J represents the object to be inspected. A detection lens that collects the reflected light from the surface of G, and a detection section K that consists of a line-shaped sensor such as a CCD or photodiode array made up of many photo elements, and from this detection section K, the object to be inspected is detected. When a defect location in area H is found, a video signal indicating the defect is extracted.
本考案においては第2図に示すようにウエブG
の蛇行に追従して移動する追跡装置1を設け、こ
の追跡装置1を支持する追跡装置支持台2に差動
トランス3の移動鉄心3aを連結し、この差動ト
ランス3の固定コイル3bよりウエブGの幅方向
位置をアナログ信号として取り出しこれを電圧―
周波数変換器4によりデイジタル信号に変換し、
これをカウンター5により単位時間(一定周期)
毎に加算して単位時間毎に平均蛇行量を求める。 In this invention, as shown in Fig. 2, the web G
A tracking device 1 that moves by following the meandering of the Take out the width direction position of G as an analog signal and convert it into a voltage -
converted into a digital signal by a frequency converter 4,
This is measured by counter 5 for a unit time (constant period)
The average meandering amount is calculated for each unit time.
又、多数のセンサーをウエブGの幅方向に並設
して成る検出部Kのライン状センサーの出力をア
ドレスカウンター6によつて位置毎に取り出すと
共に、前記ウエブGの平均蛇行量を単位時間毎に
コンパレータ7によりマスク幅設定値8よりの設
定値と比較し、この比較結果に応じて、マスク幅
設定回路9を制御せしめ、前記比較結果に応じた
幅で検出部Kよりビデオ信号10のエツジ部分1
1をマスクするようにする。 Further, an address counter 6 extracts the output of a line-shaped sensor of a detection unit K, which has a large number of sensors arranged in parallel in the width direction of the web G, for each position, and calculates the average meandering amount of the web G for each unit time. The comparator 7 then compares the set value with the mask width set value 8, controls the mask width setting circuit 9 according to the comparison result, and detects the edge of the video signal 10 from the detection section K with a width according to the comparison result. part 1
1 will be masked.
本考案装置によればビデオ信号の変化によらず
ウエブのエツジ位置信号のみを用いてエツジ部に
存在する雑情報、不要情報をマスクするので従来
の欠点を一掃でき、又設定値を変えることによつ
てマスク幅の変更を容易に行うことができ、更に
ウエブのエツジ位置信号をデイジタル信号に変換
して処理しているのでラインノイズに対する誤差
が少なく、これにより高速で移動する帯状物の検
査部を特定化し、不要部の検査を行わず精度を高
めることができる。更にマスク幅設定回路への入
力としてライン状センサーを駆動するために必要
となるアドレスカウンター6の出力をそのまゝ利
用でき装置が簡単となる等大きな利益がある。
According to the device of the present invention, miscellaneous information and unnecessary information existing at the edge portion are masked using only the edge position signal of the web regardless of changes in the video signal, so the drawbacks of the conventional method can be eliminated, and the setting values can be changed. Therefore, the mask width can be easily changed, and since the edge position signal of the web is converted into a digital signal and processed, there is little error due to line noise, and this makes it possible to easily change the width of the strip. It is possible to increase accuracy without inspecting unnecessary parts. Furthermore, the output of the address counter 6, which is necessary for driving the line sensor, can be used as is as an input to the mask width setting circuit, and there are great advantages such as the device being simplified.
第1図は表面検査装置の光学系説明図、第2図
はその回路図である。
1……追跡装置、2……追跡装置支持台、3…
…差動トランス、3a……移動鉄心、3b……固
定コイル、4……電圧―周波数変換器、5……カ
ウンター、6……アドレスカウンター、7……コ
ンパレータ、8……マスク幅設定器、9……マス
ク幅設定回路、10……ビデオ信号、11……エ
ツジ部分、A……光源、B……赤外線透過フイル
ター、C……第1コンデンサレンズ、D……シリ
ンドリカルレンズ、E……第2コンデンサレン
ズ、F……ロール、G……ウエブ、H……被検査
域、I……欠陥箇所、J……検出レンズ、K……
検出部。
FIG. 1 is an explanatory diagram of the optical system of the surface inspection device, and FIG. 2 is its circuit diagram. 1... Tracking device, 2... Tracking device support stand, 3...
... Differential transformer, 3a ... Moving iron core, 3b ... Fixed coil, 4 ... Voltage-frequency converter, 5 ... Counter, 6 ... Address counter, 7 ... Comparator, 8 ... Mask width setter, 9... Mask width setting circuit, 10... Video signal, 11... Edge portion, A... Light source, B... Infrared transmission filter, C... First condenser lens, D... Cylindrical lens, E... Third 2 Condenser lens, F...Roll, G...Web, H...Test area, I...Defect location, J...Detection lens, K...
Detection unit.
Claims (1)
定する手段と、この測定手段の出力をデジタル信
号に変換し単位時間毎に加算する手段と、多数の
センサーを被検体の幅方向に並設して成り被検体
の表面状態を検出するライン状検出部と、この検
出部からの出力を位置毎に取り出すアドレスカウ
ンターと、コンパレータによつて前記加算手段の
出力をマスク幅設定値と比較する手段と、このコ
ンパレータの比較結果によつて前記ライン状検出
部からのビデオ信号のマスク幅を制御するための
マスク幅設定回路とより成ることを特徴とする表
面検査装置。 A means for measuring the position in the width direction of an object moving in the longitudinal direction, a means for converting the output of this measuring means into a digital signal and adding it every unit time, and a large number of sensors arranged in parallel in the width direction of the object. a linear detection section for detecting the surface condition of the object; an address counter for taking out the output from the detection section for each position; and means for comparing the output of the addition means with a mask width setting value using a comparator. and a mask width setting circuit for controlling the mask width of the video signal from the linear detection section based on the comparison result of the comparator.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15637281U JPS5862252U (en) | 1981-10-22 | 1981-10-22 | surface inspection equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15637281U JPS5862252U (en) | 1981-10-22 | 1981-10-22 | surface inspection equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5862252U JPS5862252U (en) | 1983-04-26 |
JPH0125311Y2 true JPH0125311Y2 (en) | 1989-07-28 |
Family
ID=29948915
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15637281U Granted JPS5862252U (en) | 1981-10-22 | 1981-10-22 | surface inspection equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5862252U (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5434290A (en) * | 1977-08-22 | 1979-03-13 | Omron Tateisi Electronics Co | Defect inspecting apparatus |
JPS5535276A (en) * | 1978-09-04 | 1980-03-12 | Nippon Steel Corp | Edge pin-hole detector |
JPS5557137A (en) * | 1978-10-19 | 1980-04-26 | Agfa Gevaert Nv | Method and device for checking about linear defects of moving sheet material |
-
1981
- 1981-10-22 JP JP15637281U patent/JPS5862252U/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5434290A (en) * | 1977-08-22 | 1979-03-13 | Omron Tateisi Electronics Co | Defect inspecting apparatus |
JPS5535276A (en) * | 1978-09-04 | 1980-03-12 | Nippon Steel Corp | Edge pin-hole detector |
JPS5557137A (en) * | 1978-10-19 | 1980-04-26 | Agfa Gevaert Nv | Method and device for checking about linear defects of moving sheet material |
Also Published As
Publication number | Publication date |
---|---|
JPS5862252U (en) | 1983-04-26 |
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