JPH0125005B2 - - Google Patents

Info

Publication number
JPH0125005B2
JPH0125005B2 JP57144456A JP14445682A JPH0125005B2 JP H0125005 B2 JPH0125005 B2 JP H0125005B2 JP 57144456 A JP57144456 A JP 57144456A JP 14445682 A JP14445682 A JP 14445682A JP H0125005 B2 JPH0125005 B2 JP H0125005B2
Authority
JP
Japan
Prior art keywords
thickness
notch
signal
radiation
detection section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57144456A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5934106A (ja
Inventor
Yukio Matsuda
Yorio Mukaikubo
Junichi Murakami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Nippon Steel Corp
Original Assignee
Toshiba Corp
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Sumitomo Metal Industries Ltd filed Critical Toshiba Corp
Priority to JP14445682A priority Critical patent/JPS5934106A/ja
Publication of JPS5934106A publication Critical patent/JPS5934106A/ja
Publication of JPH0125005B2 publication Critical patent/JPH0125005B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP14445682A 1982-08-20 1982-08-20 放射線厚み測定装置 Granted JPS5934106A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14445682A JPS5934106A (ja) 1982-08-20 1982-08-20 放射線厚み測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14445682A JPS5934106A (ja) 1982-08-20 1982-08-20 放射線厚み測定装置

Publications (2)

Publication Number Publication Date
JPS5934106A JPS5934106A (ja) 1984-02-24
JPH0125005B2 true JPH0125005B2 (enrdf_load_stackoverflow) 1989-05-16

Family

ID=15362668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14445682A Granted JPS5934106A (ja) 1982-08-20 1982-08-20 放射線厚み測定装置

Country Status (1)

Country Link
JP (1) JPS5934106A (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4934350A (enrdf_load_stackoverflow) * 1972-07-28 1974-03-29

Also Published As

Publication number Publication date
JPS5934106A (ja) 1984-02-24

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