JPH01139431U - - Google Patents

Info

Publication number
JPH01139431U
JPH01139431U JP3646488U JP3646488U JPH01139431U JP H01139431 U JPH01139431 U JP H01139431U JP 3646488 U JP3646488 U JP 3646488U JP 3646488 U JP3646488 U JP 3646488U JP H01139431 U JPH01139431 U JP H01139431U
Authority
JP
Japan
Prior art keywords
wafer
measurement
wafer inspection
tester
displays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3646488U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3646488U priority Critical patent/JPH01139431U/ja
Publication of JPH01139431U publication Critical patent/JPH01139431U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3646488U 1988-03-18 1988-03-18 Pending JPH01139431U (US07943777-20110517-C00090.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3646488U JPH01139431U (US07943777-20110517-C00090.png) 1988-03-18 1988-03-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3646488U JPH01139431U (US07943777-20110517-C00090.png) 1988-03-18 1988-03-18

Publications (1)

Publication Number Publication Date
JPH01139431U true JPH01139431U (US07943777-20110517-C00090.png) 1989-09-22

Family

ID=31263066

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3646488U Pending JPH01139431U (US07943777-20110517-C00090.png) 1988-03-18 1988-03-18

Country Status (1)

Country Link
JP (1) JPH01139431U (US07943777-20110517-C00090.png)

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