JP7835277B2 - 検査システム、検査方法、及びプログラム - Google Patents

検査システム、検査方法、及びプログラム

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Publication number
JP7835277B2
JP7835277B2 JP2024517801A JP2024517801A JP7835277B2 JP 7835277 B2 JP7835277 B2 JP 7835277B2 JP 2024517801 A JP2024517801 A JP 2024517801A JP 2024517801 A JP2024517801 A JP 2024517801A JP 7835277 B2 JP7835277 B2 JP 7835277B2
Authority
JP
Japan
Prior art keywords
container
angle
liquid
illumination
control unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2024517801A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023209995A1 (https=
JPWO2023209995A5 (https=
Inventor
満晶 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of JPWO2023209995A1 publication Critical patent/JPWO2023209995A1/ja
Publication of JPWO2023209995A5 publication Critical patent/JPWO2023209995A5/ja
Application granted granted Critical
Publication of JP7835277B2 publication Critical patent/JP7835277B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018—Dirt detection in containers
    • G01N21/9027—Dirt detection in containers in containers after filling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9009—Non-optical constructional details affecting optical inspection, e.g. cleaning mechanisms for optical parts, vibration reduction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8841—Illumination and detection on two sides of object

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2024517801A 2022-04-28 2022-04-28 検査システム、検査方法、及びプログラム Active JP7835277B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/019414 WO2023209995A1 (ja) 2022-04-28 2022-04-28 検査装置、検査システム、制御装置、検査方法、及びプログラム

Publications (3)

Publication Number Publication Date
JPWO2023209995A1 JPWO2023209995A1 (https=) 2023-11-02
JPWO2023209995A5 JPWO2023209995A5 (https=) 2024-12-20
JP7835277B2 true JP7835277B2 (ja) 2026-03-25

Family

ID=88518190

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024517801A Active JP7835277B2 (ja) 2022-04-28 2022-04-28 検査システム、検査方法、及びプログラム

Country Status (4)

Country Link
US (1) US20250231119A1 (https=)
EP (1) EP4517309A4 (https=)
JP (1) JP7835277B2 (https=)
WO (1) WO2023209995A1 (https=)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1693884A (zh) 2004-05-09 2005-11-09 刘巨昌 瓶装液体中异物的自动检测方法
JP2010181231A (ja) 2009-02-04 2010-08-19 Hitachi Information & Control Solutions Ltd 不透明溶液中の異物検査装置および異物検査方法
JP2014022482A (ja) 2012-07-17 2014-02-03 Hitachi High-Technologies Corp プラズマ処理装置
US20140240699A1 (en) 2011-09-20 2014-08-28 Krones Ag Method and device for inspecting containers and preforms
JP2016085221A (ja) 2014-10-27 2016-05-19 キリンテクノシステム株式会社 容器検査方法及び装置
WO2021214995A1 (ja) 2020-04-24 2021-10-28 日本電気株式会社 判定装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2828965B2 (ja) * 1995-12-28 1998-11-25 武田薬品工業株式会社 異物検査装置
JP2014224802A (ja) * 2013-04-19 2014-12-04 キリンテクノシステム株式会社 容器底部の検査方法及びそれを用いた検査装置
DE102016209722A1 (de) * 2016-06-02 2017-12-07 Robert Bosch Gmbh Vorrichtung und Verfahren zur Inspektion von Behältnissen
CN108896574B (zh) * 2018-05-11 2020-03-17 四川大学 一种基于机器视觉的瓶装白酒杂质检测方法及系统
JP6767524B2 (ja) 2019-01-18 2020-10-14 アサヒビール株式会社 異物検出システム及び異物検出方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1693884A (zh) 2004-05-09 2005-11-09 刘巨昌 瓶装液体中异物的自动检测方法
JP2010181231A (ja) 2009-02-04 2010-08-19 Hitachi Information & Control Solutions Ltd 不透明溶液中の異物検査装置および異物検査方法
US20140240699A1 (en) 2011-09-20 2014-08-28 Krones Ag Method and device for inspecting containers and preforms
JP2014022482A (ja) 2012-07-17 2014-02-03 Hitachi High-Technologies Corp プラズマ処理装置
JP2016085221A (ja) 2014-10-27 2016-05-19 キリンテクノシステム株式会社 容器検査方法及び装置
WO2021214995A1 (ja) 2020-04-24 2021-10-28 日本電気株式会社 判定装置

Also Published As

Publication number Publication date
JPWO2023209995A1 (https=) 2023-11-02
EP4517309A4 (en) 2025-07-09
US20250231119A1 (en) 2025-07-17
EP4517309A1 (en) 2025-03-05
WO2023209995A1 (ja) 2023-11-02

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