JP7638454B2 - 異常要因推定装置、学習装置、精密診断システム、および、異常要因推定方法 - Google Patents

異常要因推定装置、学習装置、精密診断システム、および、異常要因推定方法 Download PDF

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JP7638454B2
JP7638454B2 JP2024544376A JP2024544376A JP7638454B2 JP 7638454 B2 JP7638454 B2 JP 7638454B2 JP 2024544376 A JP2024544376 A JP 2024544376A JP 2024544376 A JP2024544376 A JP 2024544376A JP 7638454 B2 JP7638454 B2 JP 7638454B2
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abnormality
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anomaly
learning
sensor
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健 森山
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
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    • G06Q50/04—Manufacturing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
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    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0709—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a distributed system consisting of a plurality of standalone computer nodes, e.g. clusters, client-server systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
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    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
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    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q50/00—Information and communication technology [ICT] specially adapted for implementation of business processes of specific business sectors, e.g. utilities or tourism
    • G06Q50/06—Energy or water supply

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JP2024544376A 2022-09-08 2022-09-08 異常要因推定装置、学習装置、精密診断システム、および、異常要因推定方法 Active JP7638454B2 (ja)

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PCT/JP2022/033628 WO2024053030A1 (ja) 2022-09-08 2022-09-08 異常要因推定装置、学習装置、精密診断システム、および、異常要因推定方法

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JPWO2024053030A1 JPWO2024053030A1 (https=) 2024-03-14
JPWO2024053030A5 JPWO2024053030A5 (https=) 2024-10-10
JP7638454B2 true JP7638454B2 (ja) 2025-03-03

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US (1) US20250190297A1 (https=)
JP (1) JP7638454B2 (https=)
CN (1) CN119998750A (https=)
DE (1) DE112022007490B4 (https=)
WO (1) WO2024053030A1 (https=)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010067177A (ja) 2008-09-12 2010-03-25 Fujitsu Ltd 支援プログラム、支援装置および支援方法
WO2018146768A1 (ja) 2017-02-09 2018-08-16 三菱電機株式会社 不良要因推定装置および不良要因推定方法
WO2018198267A1 (ja) 2017-04-27 2018-11-01 日本電気株式会社 因果関係学習方法、プログラム、装置および異常分析システム
JP6935046B1 (ja) 2020-12-18 2021-09-15 三菱電機株式会社 情報処理装置及び情報処理方法
WO2021241578A1 (ja) 2020-05-29 2021-12-02 株式会社ダイセル 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6609689B2 (ja) * 2016-03-15 2019-11-20 株式会社日立製作所 異常診断システム

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010067177A (ja) 2008-09-12 2010-03-25 Fujitsu Ltd 支援プログラム、支援装置および支援方法
WO2018146768A1 (ja) 2017-02-09 2018-08-16 三菱電機株式会社 不良要因推定装置および不良要因推定方法
WO2018198267A1 (ja) 2017-04-27 2018-11-01 日本電気株式会社 因果関係学習方法、プログラム、装置および異常分析システム
WO2021241578A1 (ja) 2020-05-29 2021-12-02 株式会社ダイセル 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム
JP6935046B1 (ja) 2020-12-18 2021-09-15 三菱電機株式会社 情報処理装置及び情報処理方法

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US20250190297A1 (en) 2025-06-12
DE112022007490B4 (de) 2025-11-20
DE112022007490T5 (de) 2025-05-08
CN119998750A (zh) 2025-05-13
WO2024053030A1 (ja) 2024-03-14
JPWO2024053030A1 (https=) 2024-03-14

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