JP7595229B1 - ファイングレインdramにおける通常アクセス性能を回復するための方法及び装置 - Google Patents
ファイングレインdramにおける通常アクセス性能を回復するための方法及び装置 Download PDFInfo
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4093—Input/output [I/O] data interface arrangements, e.g. data buffers
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/16—Handling requests for interconnection or transfer for access to memory bus
- G06F13/1605—Handling requests for interconnection or transfer for access to memory bus based on arbitration
- G06F13/161—Handling requests for interconnection or transfer for access to memory bus based on arbitration with latency improvement
- G06F13/1626—Handling requests for interconnection or transfer for access to memory bus based on arbitration with latency improvement by reordering requests
- G06F13/1631—Handling requests for interconnection or transfer for access to memory bus based on arbitration with latency improvement by reordering requests through address comparison
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/16—Handling requests for interconnection or transfer for access to memory bus
- G06F13/1605—Handling requests for interconnection or transfer for access to memory bus based on arbitration
- G06F13/1647—Handling requests for interconnection or transfer for access to memory bus based on arbitration with interleaved bank access
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4076—Timing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
- G11C11/4087—Address decoders, e.g. bit - or word line decoders; Multiple line decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1042—Read-write modes for single port memories, i.e. having either a random port or a serial port using interleaving techniques, i.e. read-write of one part of the memory while preparing another part
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1045—Read-write mode select circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/18—Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/1733—Controllable logic circuits
- H03K19/1737—Controllable logic circuits using multiplexers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/177—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form
- H03K19/17724—Structural details of logic blocks
- H03K19/17728—Reconfigurable logic blocks, e.g. lookup tables
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/025—Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device
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- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Computing Systems (AREA)
- General Physics & Mathematics (AREA)
- Databases & Information Systems (AREA)
- Dram (AREA)
- Memory System (AREA)
Abstract
Description
Claims (15)
- ファイングレインダイナミックランダムアクセスメモリ(DRAM)であって、
複数のグレインに分割されたメモリアレイを含む第1のメモリバンクであって、各グレインは行バッファ及び入力/出力(I/O)回路を含む、第1のメモリバンクと、
第2のメモリバンクと、
前記第1のメモリバンク内の各グレインの前記I/O回路に結合されたデュアルモードI/O回路であって、第1のデータ幅を有するコマンドが各グレインにルーティングされ、各グレインにおいて個別に実行される第1のモードと、前記第1のデータ幅とは異なる第2のデータ幅を有するコマンドが前記グレインのうち少なくとも2つによって並列に実行される第2のモードと、で動作するデュアルモードI/O回路と、を備える、
ファイングレインDRAM。 - 前記デュアルモードI/O回路は、マルチキャスト列アドレスストローブ(CAS)コマンドに応じて、前記第2のモードでコマンドを実行する、
請求項1のファイングレインDRAM。 - 前記デュアルモードI/O回路は、前記グレインのうち少なくとも2つにおいて選択された列に対して列アドレスストローブを並列にアサートさせることによって、前記マルチキャストCASコマンドに応答する、
請求項2のファイングレインDRAM。 - 前記デュアルモードI/O回路は、前記第1のメモリバンク内の各グレインの前記I/O回路内の列デコーダに結合されたマルチプレクサを含む、
請求項3のファイングレインDRAM。 - 前記デュアルモードI/O回路は、前記第2のモードにおいて、前記マルチキャストCASコマンド内の初期グレイン識別子ビットを、異なるグレインに関連付けられた新しい値に置き換えることによって、前記マルチキャストCASコマンドのローカライズされたリレーを前記グレインのうち少なくとも2つのグレインの少なくとも1つに転送するように実行する、
請求項3のファイングレインDRAM。 - 前記デュアルモードI/O回路は、ルックアップテーブル及び加算器のうち何れかを使用して前記新しい値を識別する、
請求項5のファイングレインDRAM。 - 揮発性メモリを動作させる方法であって、
メモリコントローラから前記揮発性メモリ上の第1のバンクの第1のグレインに列アドレスストローブ(CAS)コマンドを送信することと、
前記揮発性メモリ上のデュアルモードI/O回路にマルチキャストCASコマンドを送信することと、
前記揮発性メモリにおいて、前記マルチキャストCASコマンドに応じて、前記第1のグレインを含む複数のグレインにCAS信号を送信することと、を含む、
方法。 - 前記CASコマンドに応じて、第1のデータ幅を有するデータを読み取ることと、前記CAS信号に応じて、前記第1のデータ幅とは異なる第2のデータ幅を有する第2のデータを前記複数のグレインから並列に読み取ることと、を含む、
請求項7の方法。 - 前記デュアルモードI/O回路において、前記マルチキャストCASコマンドを前記複数のグレインに分配することを含む、
請求項7の方法。 - 前記デュアルモードI/O回路において、前記マルチキャストCASコマンド内の初期グレイン識別子ビットを、異なるグレインに関連付けられた新しい値で置き換えることによって、マルチキャストCASのローカライズされたリレーを前記複数のグレインのうち少なくとも1つに転送することを含む、
請求項7の方法。 - 前記デュアルモードI/O回路は、ルックアップテーブル及び加算器のうち何れかを使用して前記新しい値を識別する、
請求項10の方法。 - ジャストインタイムコンパイラを使用して、元のメモリアクセス要求に基づいて前記マルチキャストCASコマンドを生成することを含む、
請求項7の方法。 - コンパイラを使用して、元のメモリアクセス要求に基づいて前記マルチキャストCASコマンドを生成することを含む、
請求項7の方法。 - メモリコントローラにおいて、所定のデータ幅に関連付けられた命令セットアーキテクチャ(ISA)コマンドを認識することに基づいて前記マルチキャストCASコマンドを生成することを含む、
請求項7の方法。 - メモリコントローラにおいて、前記メモリコントローラによって処理されるメモリコマンドに関連付けられたメモリ領域に基づいて前記マルチキャストCASコマンドを生成することを含む、
請求項7の方法。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17/549,359 | 2021-12-13 | ||
| US17/549,359 US11756606B2 (en) | 2021-12-13 | 2021-12-13 | Method and apparatus for recovering regular access performance in fine-grained DRAM |
| PCT/US2022/052164 WO2023114071A1 (en) | 2021-12-13 | 2022-12-07 | A method and apparatus for recovering regular access performance in fine-grained dram |
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| JP7595229B1 true JP7595229B1 (ja) | 2024-12-05 |
| JP2024545876A JP2024545876A (ja) | 2024-12-13 |
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| Country | Link |
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| US (2) | US11756606B2 (ja) |
| EP (1) | EP4449415A4 (ja) |
| JP (1) | JP7595229B1 (ja) |
| KR (1) | KR102812912B1 (ja) |
| CN (1) | CN118525335B (ja) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US11756606B2 (en) * | 2021-12-13 | 2023-09-12 | Advanced Micro Devices, Inc. | Method and apparatus for recovering regular access performance in fine-grained DRAM |
| US12183420B2 (en) * | 2022-08-31 | 2024-12-31 | Micron Technology, Inc. | Memory array with compensated word line access delay |
| US20260029922A1 (en) * | 2024-07-24 | 2026-01-29 | Advanced Micro Devices, Inc. | Memory controller for use with row-buffer memory |
| US20260050544A1 (en) * | 2024-08-16 | 2026-02-19 | Arm Limited | Access to a memory device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2009535748A (ja) | 2006-05-02 | 2009-10-01 | ラムバス・インコーポレーテッド | 低減されたアクセス粒度を備えたメモリモジュール |
| JP2020187747A (ja) | 2019-05-10 | 2020-11-19 | 三星電子株式会社Samsung Electronics Co.,Ltd. | 高帯域幅メモリシステム及びメモリアドレス方法 |
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| KR100605600B1 (ko) * | 2004-07-27 | 2006-07-28 | 주식회사 하이닉스반도체 | 반도체 메모리 소자 |
| US7280428B2 (en) | 2004-09-30 | 2007-10-09 | Rambus Inc. | Multi-column addressing mode memory system including an integrated circuit memory device |
| US7254075B2 (en) | 2004-09-30 | 2007-08-07 | Rambus Inc. | Integrated circuit memory system having dynamic memory bank count and page size |
| US20080028135A1 (en) | 2006-07-31 | 2008-01-31 | Metaram, Inc. | Multiple-component memory interface system and method |
| US7975109B2 (en) * | 2007-05-30 | 2011-07-05 | Schooner Information Technology, Inc. | System including a fine-grained memory and a less-fine-grained memory |
| WO2013028859A1 (en) | 2011-08-24 | 2013-02-28 | Rambus Inc. | Methods and systems for mapping a peripheral function onto a legacy memory interface |
| WO2014120215A1 (en) * | 2013-01-31 | 2014-08-07 | Hewlett-Packard Development Company, L.P. | Adaptive granularity row-buffer cache |
| US10037150B2 (en) | 2016-07-15 | 2018-07-31 | Advanced Micro Devices, Inc. | Memory controller with virtual controller mode |
| US11527510B2 (en) * | 2017-06-16 | 2022-12-13 | Micron Technology, Inc. | Finer grain dynamic random access memory |
| CN111240581B (zh) * | 2018-11-29 | 2023-08-08 | 北京地平线机器人技术研发有限公司 | 存储器访问控制方法、装置和电子设备 |
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| US11756606B2 (en) * | 2021-12-13 | 2023-09-12 | Advanced Micro Devices, Inc. | Method and apparatus for recovering regular access performance in fine-grained DRAM |
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- 2021-12-13 US US17/549,359 patent/US11756606B2/en active Active
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- 2022-12-07 KR KR1020247021834A patent/KR102812912B1/ko active Active
- 2022-12-07 CN CN202280082084.0A patent/CN118525335B/zh active Active
- 2022-12-07 EP EP22908247.4A patent/EP4449415A4/en active Pending
- 2022-12-07 JP JP2024534636A patent/JP7595229B1/ja active Active
- 2022-12-07 WO PCT/US2022/052164 patent/WO2023114071A1/en not_active Ceased
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009535748A (ja) | 2006-05-02 | 2009-10-01 | ラムバス・インコーポレーテッド | 低減されたアクセス粒度を備えたメモリモジュール |
| JP2020187747A (ja) | 2019-05-10 | 2020-11-19 | 三星電子株式会社Samsung Electronics Co.,Ltd. | 高帯域幅メモリシステム及びメモリアドレス方法 |
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| Publication number | Publication date |
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| JP2024545876A (ja) | 2024-12-13 |
| US11756606B2 (en) | 2023-09-12 |
| US20230420036A1 (en) | 2023-12-28 |
| EP4449415A1 (en) | 2024-10-23 |
| US12518819B2 (en) | 2026-01-06 |
| CN118525335B (zh) | 2025-11-11 |
| EP4449415A4 (en) | 2025-01-22 |
| KR102812912B1 (ko) | 2025-05-27 |
| CN118525335A (zh) | 2024-08-20 |
| US20230186976A1 (en) | 2023-06-15 |
| KR20240121783A (ko) | 2024-08-09 |
| WO2023114071A1 (en) | 2023-06-22 |
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