JP7567905B2 - 判定システム - Google Patents

判定システム Download PDF

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Publication number
JP7567905B2
JP7567905B2 JP2022516808A JP2022516808A JP7567905B2 JP 7567905 B2 JP7567905 B2 JP 7567905B2 JP 2022516808 A JP2022516808 A JP 2022516808A JP 2022516808 A JP2022516808 A JP 2022516808A JP 7567905 B2 JP7567905 B2 JP 7567905B2
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JPWO2021214995A1 (https=
JPWO2021214995A5 (https=
Inventor
尚司 谷内田
恵子 井上
あずさ 澤田
利憲 細井
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NEC Corp
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NEC Corp
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018Dirt detection in containers
    • G01N21/9027Dirt detection in containers in containers after filling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/0008Industrial image inspection checking presence/absence
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/20Analysis of motion
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10016Video; Image sequence
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10141Special mode during image acquisition
    • G06T2207/10152Varying illumination
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20021Dividing image into blocks, subimages or windows

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2022516808A 2020-04-24 2020-04-24 判定システム Active JP7567905B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/017750 WO2021214995A1 (ja) 2020-04-24 2020-04-24 判定装置

Publications (3)

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JPWO2021214995A1 JPWO2021214995A1 (https=) 2021-10-28
JPWO2021214995A5 JPWO2021214995A5 (https=) 2022-12-28
JP7567905B2 true JP7567905B2 (ja) 2024-10-16

Family

ID=78270624

Family Applications (1)

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JP2022516808A Active JP7567905B2 (ja) 2020-04-24 2020-04-24 判定システム

Country Status (4)

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US (1) US12437416B2 (https=)
EP (1) EP4141422B1 (https=)
JP (1) JP7567905B2 (https=)
WO (1) WO2021214995A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7835277B2 (ja) * 2022-04-28 2026-03-25 日本電気株式会社 検査システム、検査方法、及びプログラム

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010048712A (ja) 2008-08-22 2010-03-04 Olympus Corp 欠陥検査装置
JP2010181231A (ja) 2009-02-04 2010-08-19 Hitachi Information & Control Solutions Ltd 不透明溶液中の異物検査装置および異物検査方法
JP2011085575A (ja) 2009-09-16 2011-04-28 Hitachi Computer Peripherals Co Ltd 流動物内の異物検出方法、異物検出装置及び異物検出プログラム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5011094A (https=) * 1973-05-29 1975-02-04
JP2806415B2 (ja) * 1993-09-22 1998-09-30 澁谷工業株式会社 異物検査装置
JPH0792108A (ja) * 1993-09-24 1995-04-07 Kirin Techno Syst:Kk 検査用照明装置
DE60223956T3 (de) * 2001-03-14 2011-05-19 Hitachi Information & Control Solutions, Ltd., Hitachi Untersuchungsgerät und System zur Untersuchung von Fremdkörpern in mit Flüssigkeit gefüllten Behältern
JP3668449B2 (ja) 2001-09-28 2005-07-06 日立エンジニアリング株式会社 透明容器等の充填液中の異物検出装置
JP4743552B2 (ja) * 2002-12-27 2011-08-10 キリンテクノシステム株式会社 異物検査方法、及び異物検査装置並びに異物検査用の照明装置
JP5374078B2 (ja) * 2008-06-16 2013-12-25 オリンパス株式会社 画像処理装置、画像処理方法および画像処理プログラム
JP5591849B2 (ja) * 2012-03-09 2014-09-17 株式会社 日立産業制御ソリューションズ 異物検査装置、異物検査プログラム、異物検査方法
JP6462544B2 (ja) * 2015-09-17 2019-01-30 株式会社東芝 推定装置、方法及びプログラム
US11012633B2 (en) * 2018-03-22 2021-05-18 Ricoh Company, Ltd. Image capturing apparatus, image capturing method, and image processing apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010048712A (ja) 2008-08-22 2010-03-04 Olympus Corp 欠陥検査装置
JP2010181231A (ja) 2009-02-04 2010-08-19 Hitachi Information & Control Solutions Ltd 不透明溶液中の異物検査装置および異物検査方法
JP2011085575A (ja) 2009-09-16 2011-04-28 Hitachi Computer Peripherals Co Ltd 流動物内の異物検出方法、異物検出装置及び異物検出プログラム

Also Published As

Publication number Publication date
JPWO2021214995A1 (https=) 2021-10-28
EP4141422A1 (en) 2023-03-01
WO2021214995A1 (ja) 2021-10-28
EP4141422B1 (en) 2026-02-11
US12437416B2 (en) 2025-10-07
US20230154012A1 (en) 2023-05-18
EP4141422A4 (en) 2023-06-21

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