JP7558424B2 - 半導体集積回路装置 - Google Patents

半導体集積回路装置 Download PDF

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Publication number
JP7558424B2
JP7558424B2 JP2023555927A JP2023555927A JP7558424B2 JP 7558424 B2 JP7558424 B2 JP 7558424B2 JP 2023555927 A JP2023555927 A JP 2023555927A JP 2023555927 A JP2023555927 A JP 2023555927A JP 7558424 B2 JP7558424 B2 JP 7558424B2
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Japan
Prior art keywords
voltage
current
circuit
output
semiconductor integrated
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JP2023555927A
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Japanese (ja)
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JPWO2023073802A1 (https=
Inventor
理 錦戸
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Publication of JPWO2023073802A1 publication Critical patent/JPWO2023073802A1/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2023555927A 2021-10-26 2021-10-26 半導体集積回路装置 Active JP7558424B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/039441 WO2023073802A1 (ja) 2021-10-26 2021-10-26 半導体集積回路装置

Publications (2)

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JPWO2023073802A1 JPWO2023073802A1 (https=) 2023-05-04
JP7558424B2 true JP7558424B2 (ja) 2024-09-30

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ID=86159237

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JP2023555927A Active JP7558424B2 (ja) 2021-10-26 2021-10-26 半導体集積回路装置

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JP (1) JP7558424B2 (https=)
WO (1) WO2023073802A1 (https=)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6008673A (en) 1997-09-30 1999-12-28 Intel Corporation High speed, low power, current mode comparator
US20110012605A1 (en) 2009-07-20 2011-01-20 Texas Instruments Incorporated Current based overvoltage and undervoltage detector
JP2012117983A (ja) 2010-12-02 2012-06-21 Advantest Corp 電子デバイスおよび測定装置
JP2016211917A (ja) 2015-05-01 2016-12-15 国立研究開発法人産業技術総合研究所 半導体チップ、半導体装置及び半導体検査システム

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6232714A (ja) * 1985-08-06 1987-02-12 Clarion Co Ltd オフセツト電圧補正回路
JPH0829493A (ja) * 1994-07-14 1996-02-02 Fujitsu Ltd 半導体集積回路装置
JPH09139635A (ja) * 1995-09-12 1997-05-27 Toshiba Corp カレントミラー回路
JP2017005609A (ja) * 2015-06-15 2017-01-05 株式会社デンソー 過電圧検出回路
JP7363657B2 (ja) * 2020-04-21 2023-10-18 株式会社デンソー 過電圧判定回路

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6008673A (en) 1997-09-30 1999-12-28 Intel Corporation High speed, low power, current mode comparator
US20110012605A1 (en) 2009-07-20 2011-01-20 Texas Instruments Incorporated Current based overvoltage and undervoltage detector
JP2012117983A (ja) 2010-12-02 2012-06-21 Advantest Corp 電子デバイスおよび測定装置
JP2016211917A (ja) 2015-05-01 2016-12-15 国立研究開発法人産業技術総合研究所 半導体チップ、半導体装置及び半導体検査システム

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WO2023073802A1 (ja) 2023-05-04
JPWO2023073802A1 (https=) 2023-05-04

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