JP7534148B2 - クランプジョーアセンブリを有する非接触電気的パラメータ測定装置、及び電気的パラメータ測定方法 - Google Patents

クランプジョーアセンブリを有する非接触電気的パラメータ測定装置、及び電気的パラメータ測定方法 Download PDF

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Publication number
JP7534148B2
JP7534148B2 JP2020134023A JP2020134023A JP7534148B2 JP 7534148 B2 JP7534148 B2 JP 7534148B2 JP 2020134023 A JP2020134023 A JP 2020134023A JP 2020134023 A JP2020134023 A JP 2020134023A JP 7534148 B2 JP7534148 B2 JP 7534148B2
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clamp jaw
electrical parameter
clamp
jaw
visual indicator
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JP2021026011A (ja
JP2021026011A5 (https=
Inventor
イー ウーロンズ ジェフリー
エム ウー ジンジャー
コリガン クリス
リアン インツィー
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Fluke Corp
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Fluke Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/22—Tong testers acting as secondary windings of current transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G01R15/186—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using current transformers with a core consisting of two or more parts, e.g. clamp-on type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G01R15/181—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using coils without a magnetic core, e.g. Rogowski coils
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/205—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using magneto-resistance devices, e.g. field plates

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
JP2020134023A 2019-08-08 2020-08-06 クランプジョーアセンブリを有する非接触電気的パラメータ測定装置、及び電気的パラメータ測定方法 Active JP7534148B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024123536A JP2024156789A (ja) 2019-08-08 2024-07-30 クランプジョーアセンブリを有する非接触電気的パラメータ測定装置、及び電気的パラメータ測定方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/536,118 2019-08-08
US16/536,118 US11112433B2 (en) 2019-08-08 2019-08-08 Non-contact electrical parameter measurement device with clamp jaw assembly

Related Child Applications (1)

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JP2024123536A Division JP2024156789A (ja) 2019-08-08 2024-07-30 クランプジョーアセンブリを有する非接触電気的パラメータ測定装置、及び電気的パラメータ測定方法

Publications (3)

Publication Number Publication Date
JP2021026011A JP2021026011A (ja) 2021-02-22
JP2021026011A5 JP2021026011A5 (https=) 2023-07-11
JP7534148B2 true JP7534148B2 (ja) 2024-08-14

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JP2020134023A Active JP7534148B2 (ja) 2019-08-08 2020-08-06 クランプジョーアセンブリを有する非接触電気的パラメータ測定装置、及び電気的パラメータ測定方法
JP2024123536A Pending JP2024156789A (ja) 2019-08-08 2024-07-30 クランプジョーアセンブリを有する非接触電気的パラメータ測定装置、及び電気的パラメータ測定方法

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US (1) US11112433B2 (https=)
EP (1) EP3779473A1 (https=)
JP (2) JP7534148B2 (https=)
CN (1) CN112345803A (https=)

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USD957973S1 (en) * 2021-01-29 2022-07-19 Huizhou Fuyi Electronic Technology Co., Ltd. Digital clamp meter
USD973522S1 (en) * 2021-02-23 2022-12-27 Fluke Corporation Clamp meter
CN113125836A (zh) * 2021-04-15 2021-07-16 青岛汉泰智能科技有限公司 一种电流探头
USD1049890S1 (en) * 2022-03-18 2024-11-05 Fluke Corporation Clamp meter
USD1022737S1 (en) * 2022-03-18 2024-04-16 Fluke Corporation Clamp meter
USD1016641S1 (en) * 2022-04-06 2024-03-05 Fluke Corporation Clamp meter
WO2023195997A1 (en) * 2022-04-09 2023-10-12 Tim Suleymanov Sensor device and method for non-iinvasive monitoring of energy consumptiion usage
CN114999797B (zh) * 2022-06-21 2025-05-30 上海四达电子仪表有限公司 一种屏蔽头结构及用于该结构的钳形表
US12487259B2 (en) 2023-07-28 2025-12-02 Senva Inc. Contactless power meter
USD1091347S1 (en) * 2023-12-29 2025-09-02 Fluke Corporation Clamp for electrical measurement

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JP2017158294A (ja) 2016-03-01 2017-09-07 中国電力株式会社 先端工具、及び着脱装置
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JP2014153107A (ja) 2013-02-06 2014-08-25 Kyoritsu Electrical Instruments Works Ltd クランプテスタ
JP2018013500A (ja) 2013-05-09 2018-01-25 日置電機株式会社 検出センサおよび測定装置
JP2016070711A (ja) 2014-09-29 2016-05-09 日置電機株式会社 検電器
JP2016085216A (ja) 2014-10-27 2016-05-19 フルークコーポレイションＦｌｕｋｅ Ｃｏｒｐｏｒａｔｉｏｎ 電流測定装置及び方法
JP2016148564A (ja) 2015-02-12 2016-08-18 中国電力株式会社 電流検出器
JP2017158294A (ja) 2016-03-01 2017-09-07 中国電力株式会社 先端工具、及び着脱装置
JP2018105850A (ja) 2016-11-11 2018-07-05 フルークコーポレイションＦｌｕｋｅ Ｃｏｒｐｏｒａｔｉｏｎ 非接触電気的パラメータ測定システム

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Publication number Publication date
JP2021026011A (ja) 2021-02-22
CN112345803A (zh) 2021-02-09
JP2024156789A (ja) 2024-11-06
EP3779473A1 (en) 2021-02-17
US11112433B2 (en) 2021-09-07
US20210041483A1 (en) 2021-02-11

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