JP7530441B2 - 免疫染色方法、試料交換室、及び荷電粒子線装置 - Google Patents

免疫染色方法、試料交換室、及び荷電粒子線装置 Download PDF

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JP7530441B2
JP7530441B2 JP2022564993A JP2022564993A JP7530441B2 JP 7530441 B2 JP7530441 B2 JP 7530441B2 JP 2022564993 A JP2022564993 A JP 2022564993A JP 2022564993 A JP2022564993 A JP 2022564993A JP 7530441 B2 JP7530441 B2 JP 7530441B2
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sample
exchange chamber
charged particle
particle beam
staining
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JPWO2022113336A5 (https=
JPWO2022113336A1 (https=
Inventor
孝士 高木
佳弘 長瀬
徳東 康
一穂 本田
万里 坂上
恵 中村
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Showa University
Hitachi High Tech Corp
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Showa University
Hitachi High Tech Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/30—Staining; Impregnating ; Fixation; Dehydration; Multistep processes for preparing samples of tissue, cell or nucleic acid material and the like for analysis
    • G01N1/31—Apparatus therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/30—Staining; Impregnating ; Fixation; Dehydration; Multistep processes for preparing samples of tissue, cell or nucleic acid material and the like for analysis
    • G01N1/31—Apparatus therefor
    • G01N1/312—Apparatus therefor for samples mounted on planar substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/34—Purifying; Cleaning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/53—Immunoassay; Biospecific binding assay; Materials therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
    • H01J37/185—Means for transferring objects between different enclosures of different pressure or atmosphere
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/30—Staining; Impregnating ; Fixation; Dehydration; Multistep processes for preparing samples of tissue, cell or nucleic acid material and the like for analysis
    • G01N2001/305—Fixative compositions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/30—Staining; Impregnating ; Fixation; Dehydration; Multistep processes for preparing samples of tissue, cell or nucleic acid material and the like for analysis
    • G01N1/31—Apparatus therefor
    • G01N2001/315—Basket-type carriers for tissues
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H01J2237/2003—Environmental cells
    • H01J2237/2004—Biological samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/204—Means for introducing and/or outputting objects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Hematology (AREA)
  • Urology & Nephrology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Biotechnology (AREA)
  • Cell Biology (AREA)
  • Microbiology (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2022564993A 2020-11-30 2020-11-30 免疫染色方法、試料交換室、及び荷電粒子線装置 Active JP7530441B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/044477 WO2022113336A1 (ja) 2020-11-30 2020-11-30 免疫染色方法、試料交換室、及び荷電粒子線装置

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JPWO2022113336A1 JPWO2022113336A1 (https=) 2022-06-02
JPWO2022113336A5 JPWO2022113336A5 (https=) 2023-08-14
JP7530441B2 true JP7530441B2 (ja) 2024-08-07

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US (1) US12546687B2 (https=)
JP (1) JP7530441B2 (https=)
CN (1) CN116615652B (https=)
WO (1) WO2022113336A1 (https=)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005529341A (ja) 2002-06-05 2005-09-29 クアントミックス・リミテッド サンプルを含む流体のｓｅｍ検査のための方法
JP2007149571A (ja) 2005-11-30 2007-06-14 Hitachi High-Technologies Corp 試料測定方法、及び荷電粒子線装置
WO2008044351A1 (fr) 2006-10-12 2008-04-17 National University Corporation Okayama University Nouvelle protéine transporteuse chez les mammifères et son utilisation
JP2017107877A (ja) 2017-03-21 2017-06-15 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材
JP2017201289A (ja) 2016-04-28 2017-11-09 国立大学法人浜松医科大学 電子顕微鏡によるナノ粒子の直接的な同定・定量のための検出キットおよび方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08335449A (ja) 1995-06-06 1996-12-17 Kawasaki Steel Corp 走査電子顕微鏡用試料の前処理方法及び装置
JP4178741B2 (ja) * 2000-11-02 2008-11-12 株式会社日立製作所 荷電粒子線装置および試料作製装置
EP1953225A1 (en) 2005-10-14 2008-08-06 Genomembrane, Inc. Novel transporter protein in mammal and utilization of the same
US8507879B2 (en) * 2006-06-08 2013-08-13 Xei Scientific, Inc. Oxidative cleaning method and apparatus for electron microscopes using UV excitation in an oxygen radical source
EP1890136A1 (en) * 2006-08-16 2008-02-20 FEI Company Method for obtaining images from slices of a specimen
JP2009080108A (ja) 2007-09-05 2009-04-16 Shiseido Co Ltd 生物組織薄切切片からｓｅｍ標本を作製する方法及びｓｅｍ標本、並びに皮膚の状態を評価する方法
JP2011034895A (ja) * 2009-08-05 2011-02-17 Hitachi High-Technologies Corp 荷電粒子線装置及び試料汚染除去機構
TW201222617A (en) 2010-10-07 2012-06-01 Hitachi High Tech Corp Sample device for charged particle beam
JP6669795B2 (ja) 2018-03-15 2020-03-18 株式会社ホロン 走査型電子顕微鏡および検査装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005529341A (ja) 2002-06-05 2005-09-29 クアントミックス・リミテッド サンプルを含む流体のｓｅｍ検査のための方法
JP2007149571A (ja) 2005-11-30 2007-06-14 Hitachi High-Technologies Corp 試料測定方法、及び荷電粒子線装置
WO2008044351A1 (fr) 2006-10-12 2008-04-17 National University Corporation Okayama University Nouvelle protéine transporteuse chez les mammifères et son utilisation
JP2017201289A (ja) 2016-04-28 2017-11-09 国立大学法人浜松医科大学 電子顕微鏡によるナノ粒子の直接的な同定・定量のための検出キットおよび方法
JP2017107877A (ja) 2017-03-21 2017-06-15 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材

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CN116615652B (zh) 2025-03-28
JPWO2022113336A1 (https=) 2022-06-02
WO2022113336A1 (ja) 2022-06-02
US20240019346A1 (en) 2024-01-18
US12546687B2 (en) 2026-02-10
CN116615652A (zh) 2023-08-18

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