JP7484610B2 - 情報処理装置、学習装置、情報処理システム、情報処理方法、プログラム、および、記録媒体 - Google Patents

情報処理装置、学習装置、情報処理システム、情報処理方法、プログラム、および、記録媒体 Download PDF

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JP7484610B2
JP7484610B2 JP2020158289A JP2020158289A JP7484610B2 JP 7484610 B2 JP7484610 B2 JP 7484610B2 JP 2020158289 A JP2020158289 A JP 2020158289A JP 2020158289 A JP2020158289 A JP 2020158289A JP 7484610 B2 JP7484610 B2 JP 7484610B2
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JP2022052102A (ja
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生馬 太田
愛彦 江口
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Konica Minolta Inc
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Konica Minolta Inc
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Priority to EP21195051.4A priority patent/EP3974807B1/en
Priority to US17/482,932 priority patent/US20220091049A1/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/20—Design optimisation, verification or simulation
    • G06F30/27—Design optimisation, verification or simulation using machine learning, e.g. artificial intelligence, neural networks, support vector machines [SVM] or training a model
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Artificial Intelligence (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Software Systems (AREA)
  • Medical Informatics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Moulding By Coating Moulds (AREA)
  • Injection Moulding Of Plastics Or The Like (AREA)
  • Image Analysis (AREA)
JP2020158289A 2020-09-23 2020-09-23 情報処理装置、学習装置、情報処理システム、情報処理方法、プログラム、および、記録媒体 Active JP7484610B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2020158289A JP7484610B2 (ja) 2020-09-23 2020-09-23 情報処理装置、学習装置、情報処理システム、情報処理方法、プログラム、および、記録媒体
EP21195051.4A EP3974807B1 (en) 2020-09-23 2021-09-06 Information processing apparatus, learning device, information processing system, information processing method, program, and non-transitory storage medium
US17/482,932 US20220091049A1 (en) 2020-09-23 2021-09-23 Information processing apparatus, learning device, information processing system, information processing method, and non-transitory storage medium

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JP2020158289A JP7484610B2 (ja) 2020-09-23 2020-09-23 情報処理装置、学習装置、情報処理システム、情報処理方法、プログラム、および、記録媒体

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JP2022052102A JP2022052102A (ja) 2022-04-04
JP2022052102A5 JP2022052102A5 (https=) 2023-05-12
JP7484610B2 true JP7484610B2 (ja) 2024-05-16

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Families Citing this family (8)

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JPWO2024004583A1 (https=) * 2022-06-30 2024-01-04
JPWO2024024796A1 (https=) * 2022-07-29 2024-02-01
EP4563987A4 (en) * 2022-07-29 2025-11-12 Konica Minolta Inc IMAGE MANAGEMENT SYSTEM, IMAGE MANAGEMENT DEVICE, IMAGE MANAGEMENT METHOD, AND IMAGE MANAGEMENT PROGRAM
JP2024039216A (ja) * 2022-09-09 2024-03-22 ポリプラスチックス株式会社 樹脂成形品中における充填材の配向状態の解析方法
JP7754058B2 (ja) 2022-11-11 2025-10-15 トヨタ自動車株式会社 情報処理装置、情報処理方法、及び情報処理プログラム
WO2024142021A1 (en) * 2022-12-31 2024-07-04 9T Labs Ag Machine learning method for adjusting a preform
WO2024203394A1 (ja) * 2023-03-28 2024-10-03 コニカミノルタ株式会社 画像撮影方法、ｘ線タルボ撮影装置、画像撮影システム及びプログラム
WO2026070007A1 (ja) * 2024-09-27 2026-04-02 コニカミノルタ株式会社 切り出し領域出力装置、切り出し領域出力システム、切り出し領域出力方法及びプログラム

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016146169A (ja) 2014-12-18 2016-08-12 ダッソー システムズ シムリア コーポレイション データに基づくインタラクティブ３ｄエクスペリエンス
JP2017006468A (ja) 2015-06-24 2017-01-12 キヤノン株式会社 放射線撮像装置および微分方向推定方法
JP2018202231A (ja) 2018-10-04 2018-12-27 コニカミノルタ株式会社 放射線撮影システム及び画像処理装置
JP2019184450A (ja) 2018-04-12 2019-10-24 コニカミノルタ株式会社 Ｘ線撮影システム

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US5518671A (en) * 1993-10-20 1996-05-21 Nissei Plastic Industrial Co., Ltd. Method of setting molding conditions for an injection molding machine
JP4574880B2 (ja) * 2001-03-22 2010-11-04 東レエンジニアリング株式会社 射出成形品の構造強度シミュレーション方法及び装置
US7164145B2 (en) * 2005-05-12 2007-01-16 Honeywell International Inc. Measuring fiber orientation by detecting dispersion of polarized light
JP5264380B2 (ja) * 2008-09-17 2013-08-14 三菱電機株式会社 構造解析方法
FR3060179B1 (fr) * 2016-12-08 2020-04-03 Safran Procede et dispositif de determination des orientations d'elements de fibres dans une piece en materiau composite
JP6776890B2 (ja) * 2016-12-27 2020-10-28 コニカミノルタ株式会社 Ｘ線撮影システム
US11162908B2 (en) * 2017-04-07 2021-11-02 Konica Minolta, Inc. Quality inspection method
JP7411786B2 (ja) * 2019-09-11 2024-01-11 エル エス エムトロン リミテッド 人工知能基盤の射出成形システムおよび射出成形システムでの成形条件生成方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016146169A (ja) 2014-12-18 2016-08-12 ダッソー システムズ シムリア コーポレイション データに基づくインタラクティブ３ｄエクスペリエンス
JP2017006468A (ja) 2015-06-24 2017-01-12 キヤノン株式会社 放射線撮像装置および微分方向推定方法
JP2019184450A (ja) 2018-04-12 2019-10-24 コニカミノルタ株式会社 Ｘ線撮影システム
JP2018202231A (ja) 2018-10-04 2018-12-27 コニカミノルタ株式会社 放射線撮影システム及び画像処理装置

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EP3974807B1 (en) 2025-07-23
US20220091049A1 (en) 2022-03-24
JP2022052102A (ja) 2022-04-04
EP3974807A1 (en) 2022-03-30

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