JP7238964B2 - 検品装置、検品方法、及びプログラム - Google Patents

検品装置、検品方法、及びプログラム Download PDF

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Publication number
JP7238964B2
JP7238964B2 JP2021506875A JP2021506875A JP7238964B2 JP 7238964 B2 JP7238964 B2 JP 7238964B2 JP 2021506875 A JP2021506875 A JP 2021506875A JP 2021506875 A JP2021506875 A JP 2021506875A JP 7238964 B2 JP7238964 B2 JP 7238964B2
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Japan
Prior art keywords
inspected
powder
vibration frequency
inspection
vibrating
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Japanese (ja)
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JPWO2020188728A1 (https=
Inventor
尚司 谷内田
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NEC Corp
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NEC Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018—Dirt detection in containers
    • G01N21/9027—Dirt detection in containers in containers after filling
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B06—GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
    • B06B—METHODS OR APPARATUS FOR GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS OF INFRASONIC, SONIC, OR ULTRASONIC FREQUENCY, e.g. FOR PERFORMING MECHANICAL WORK IN GENERAL
    • B06B1/00—Methods or apparatus for generating mechanical vibrations of infrasonic, sonic, or ultrasonic frequency
    • B06B1/02—Methods or apparatus for generating mechanical vibrations of infrasonic, sonic, or ultrasonic frequency making use of electrical energy
    • B06B1/0207—Driving circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/75—Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries
    • G06V10/751—Comparing pixel values or logical combinations thereof, or feature values having positional relevance, e.g. template matching
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/74—Circuitry for compensating brightness variation in the scene by influencing the scene brightness using illuminating means

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Quality & Reliability (AREA)
  • Evolutionary Computation (AREA)
  • Mechanical Engineering (AREA)
  • Artificial Intelligence (AREA)
  • Computing Systems (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • Medical Informatics (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2021506875A 2019-03-19 2019-03-19 検品装置、検品方法、及びプログラム Active JP7238964B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/011346 WO2020188728A1 (ja) 2019-03-19 2019-03-19 検品装置、検品方法、及び非一時的なコンピュータ可読媒体

Publications (2)

Publication Number Publication Date
JPWO2020188728A1 JPWO2020188728A1 (https=) 2020-09-24
JP7238964B2 true JP7238964B2 (ja) 2023-03-14

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JP2021506875A Active JP7238964B2 (ja) 2019-03-19 2019-03-19 検品装置、検品方法、及びプログラム

Country Status (4)

Country Link
US (1) US11972555B2 (https=)
EP (1) EP3943921B1 (https=)
JP (1) JP7238964B2 (https=)
WO (1) WO2020188728A1 (https=)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000298103A (ja) 1999-04-15 2000-10-24 Nittetsu Mining Co Ltd 透明容器内粉末の異物検査装置
JP2001004549A (ja) 1999-06-24 2001-01-12 Dai Ichi Seiyaku Co Ltd 粉体中の異物検出装置
JP2004257937A (ja) 2003-02-27 2004-09-16 Japan System Kk 異物検査装置および検査方法
JP2005030810A (ja) 2003-07-08 2005-02-03 Asahi Shuzo Kk 異物検査装置
JP2010008339A (ja) 2008-06-30 2010-01-14 Decsys:Kk 透明容器内粉末中の異物検査方法及び異物検査装置
JP2011080936A (ja) 2009-10-09 2011-04-21 Eisai Machinery Co Ltd 異物検査装置及び方法
JP2014006186A (ja) 2012-06-26 2014-01-16 Fuji Electric Co Ltd 異物検査装置
JP2014145652A (ja) 2013-01-29 2014-08-14 Fuji Electric Co Ltd 異物検査装置
WO2018002049A1 (en) 2016-06-28 2018-01-04 F. Hoffmann-La Roche Ag Inspection device

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52124064A (en) 1976-04-12 1977-10-18 Armstrong Cork Co Method and device for producing sheet material
JPH01272948A (ja) 1988-04-26 1989-10-31 Mitsubishi Heavy Ind Ltd 実ビン内異物検査方法
JP2719410B2 (ja) * 1989-07-19 1998-02-25 日鉄鉱業株式会社 粉末密封透明容器の自動検査装置
JP2012220453A (ja) * 2011-04-13 2012-11-12 Eisai Machinery Co Ltd 異物検出装置
JP5994416B2 (ja) * 2012-06-18 2016-09-21 ニプロ株式会社 テラヘルツパルス波を用いた粉末中の異物検出装置および異物検出方法
JPWO2014064897A1 (ja) * 2012-10-25 2016-09-08 日本電気株式会社 情報処理装置、情報処理方法および情報処理プログラム
CN106312062B (zh) * 2016-08-02 2018-09-25 西安铂力特增材技术股份有限公司 一种检验铺粉质量的方法及增材制造设备
US11344949B2 (en) * 2018-06-08 2022-05-31 General Electric Company Powder removal floating structures

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000298103A (ja) 1999-04-15 2000-10-24 Nittetsu Mining Co Ltd 透明容器内粉末の異物検査装置
JP2001004549A (ja) 1999-06-24 2001-01-12 Dai Ichi Seiyaku Co Ltd 粉体中の異物検出装置
JP2004257937A (ja) 2003-02-27 2004-09-16 Japan System Kk 異物検査装置および検査方法
JP2005030810A (ja) 2003-07-08 2005-02-03 Asahi Shuzo Kk 異物検査装置
JP2010008339A (ja) 2008-06-30 2010-01-14 Decsys:Kk 透明容器内粉末中の異物検査方法及び異物検査装置
JP2011080936A (ja) 2009-10-09 2011-04-21 Eisai Machinery Co Ltd 異物検査装置及び方法
JP2014006186A (ja) 2012-06-26 2014-01-16 Fuji Electric Co Ltd 異物検査装置
JP2014145652A (ja) 2013-01-29 2014-08-14 Fuji Electric Co Ltd 異物検査装置
WO2018002049A1 (en) 2016-06-28 2018-01-04 F. Hoffmann-La Roche Ag Inspection device

Also Published As

Publication number Publication date
WO2020188728A1 (ja) 2020-09-24
EP3943921A1 (en) 2022-01-26
EP3943921A4 (en) 2022-03-16
JPWO2020188728A1 (https=) 2020-09-24
US20220148144A1 (en) 2022-05-12
EP3943921B1 (en) 2024-10-16
US11972555B2 (en) 2024-04-30

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