JP7125648B2 - 可変基準電圧源 - Google Patents

可変基準電圧源 Download PDF

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Publication number
JP7125648B2
JP7125648B2 JP2021521620A JP2021521620A JP7125648B2 JP 7125648 B2 JP7125648 B2 JP 7125648B2 JP 2021521620 A JP2021521620 A JP 2021521620A JP 2021521620 A JP2021521620 A JP 2021521620A JP 7125648 B2 JP7125648 B2 JP 7125648B2
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JP
Japan
Prior art keywords
voltage
unit
capacitor
reference voltage
accumulated
Prior art date
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JP2021521620A
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English (en)
Japanese (ja)
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JPWO2020240693A1 (https=
Inventor
直志 美濃谷
賢一 松永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
NTT Inc USA
Original Assignee
Nippon Telegraph and Telephone Corp
NTT Inc USA
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Publication of JPWO2020240693A1 publication Critical patent/JPWO2020240693A1/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G05F1/46—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2021521620A 2019-05-28 2019-05-28 可変基準電圧源 Active JP7125648B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/021082 WO2020240693A1 (ja) 2019-05-28 2019-05-28 可変基準電圧源

Publications (2)

Publication Number Publication Date
JPWO2020240693A1 JPWO2020240693A1 (https=) 2020-12-03
JP7125648B2 true JP7125648B2 (ja) 2022-08-25

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ID=73552091

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JP2021521620A Active JP7125648B2 (ja) 2019-05-28 2019-05-28 可変基準電圧源

Country Status (3)

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US (1) US11714437B2 (https=)
JP (1) JP7125648B2 (https=)
WO (1) WO2020240693A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12470227B2 (en) * 2021-06-16 2025-11-11 Ntt, Inc. Self-calibration-function-equipped A/D converter

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008001603A1 (en) 2006-06-26 2008-01-03 National University Corporation Gunma University Dc/dc converter

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6410708A (en) * 1987-07-01 1989-01-13 Nec Corp Offset canceling circuit
JPH06301800A (ja) * 1993-04-14 1994-10-28 Matsushita Electric Ind Co Ltd スイッチトキャパシタ積分器
JPH0918290A (ja) * 1995-06-29 1997-01-17 Matsushita Electric Ind Co Ltd スイッチトキャパシタ回路
JP5730520B2 (ja) * 2010-09-03 2015-06-10 スパンション エルエルシー スイッチングレギュレータ
US9859887B2 (en) * 2015-12-04 2018-01-02 National Chiao Tung University Impedance-to-digital converter, impedance-to-digital converting device, and method for adjustment of impedance-to-digital converting device
EP3435046B1 (en) * 2017-07-26 2019-12-25 ams International AG Optical sensor arrangement and method for light sensing
JP7079914B2 (ja) * 2018-11-12 2022-06-03 日本電信電話株式会社 自己校正機能付きａｄコンバータ
JP7089182B2 (ja) * 2018-11-19 2022-06-22 日本電信電話株式会社 可変基準電圧源
JP7315868B2 (ja) * 2019-05-21 2023-07-27 日本電信電話株式会社 自己校正機能付きａｄコンバータ
US11936396B2 (en) * 2019-10-30 2024-03-19 Nippon Telegraph And Telephone Corporation AD converter with self-calibration function
EP3829058A1 (en) * 2019-11-26 2021-06-02 ams International AG Switched-capacitor amplifier and pipelined analog-to-digital converter comprising the same
JP7328579B2 (ja) * 2019-12-10 2023-08-17 日本電信電話株式会社 Ａｄコンバータ

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008001603A1 (en) 2006-06-26 2008-01-03 National University Corporation Gunma University Dc/dc converter

Also Published As

Publication number Publication date
WO2020240693A1 (ja) 2020-12-03
JPWO2020240693A1 (https=) 2020-12-03
US11714437B2 (en) 2023-08-01
US20220236753A1 (en) 2022-07-28

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