JP6498503B2 - 電流検出回路 - Google Patents
電流検出回路 Download PDFInfo
- Publication number
- JP6498503B2 JP6498503B2 JP2015086139A JP2015086139A JP6498503B2 JP 6498503 B2 JP6498503 B2 JP 6498503B2 JP 2015086139 A JP2015086139 A JP 2015086139A JP 2015086139 A JP2015086139 A JP 2015086139A JP 6498503 B2 JP6498503 B2 JP 6498503B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- gate
- source
- differential amplifier
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000001514 detection method Methods 0.000 title claims description 48
- 230000003071 parasitic effect Effects 0.000 claims description 10
- 238000012544 monitoring process Methods 0.000 claims description 3
- 230000006866 deterioration Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 230000005856 abnormality Effects 0.000 description 4
- DYCJFJRCWPVDHY-LSCFUAHRSA-N NBMPR Chemical compound O[C@@H]1[C@H](O)[C@@H](CO)O[C@H]1N1C2=NC=NC(SCC=3C=CC(=CC=3)[N+]([O-])=O)=C2N=C1 DYCJFJRCWPVDHY-LSCFUAHRSA-N 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
- G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
- H03F3/45273—Mirror types
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/081—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
- H03K17/0814—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the output circuit
- H03K17/08142—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the output circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/01—Shaping pulses
- H03K5/08—Shaping pulses by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0023—Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/91—Indexing scheme relating to amplifiers the amplifier has a current mode topology
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Amplifiers (AREA)
- Control Of Voltage And Current In General (AREA)
- Measurement Of Current Or Voltage (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015086139A JP6498503B2 (ja) | 2015-04-20 | 2015-04-20 | 電流検出回路 |
TW105107992A TWI684767B (zh) | 2015-04-20 | 2016-03-16 | 電流檢測電路 |
US15/090,810 US9733284B2 (en) | 2015-04-20 | 2016-04-05 | Current detection circuit |
KR1020160044728A KR20160124672A (ko) | 2015-04-20 | 2016-04-12 | 전류 검출 회로 |
CN201610245937.4A CN106066419B (zh) | 2015-04-20 | 2016-04-20 | 电流检测电路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015086139A JP6498503B2 (ja) | 2015-04-20 | 2015-04-20 | 電流検出回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2016206852A JP2016206852A (ja) | 2016-12-08 |
JP6498503B2 true JP6498503B2 (ja) | 2019-04-10 |
Family
ID=57128331
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015086139A Active JP6498503B2 (ja) | 2015-04-20 | 2015-04-20 | 電流検出回路 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9733284B2 (zh) |
JP (1) | JP6498503B2 (zh) |
KR (1) | KR20160124672A (zh) |
CN (1) | CN106066419B (zh) |
TW (1) | TWI684767B (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6586853B2 (ja) * | 2015-10-19 | 2019-10-09 | アイシン精機株式会社 | 電流源回路及び検出回路 |
US10734882B2 (en) * | 2018-02-09 | 2020-08-04 | Delta Electronics, Inc. | Conversion circuit |
CN108880488A (zh) * | 2018-06-29 | 2018-11-23 | 思瑞浦微电子科技(苏州)股份有限公司 | 差分对管的保护电路 |
JP7241565B2 (ja) * | 2019-02-25 | 2023-03-17 | エイブリック株式会社 | 電流生成回路 |
CN113341192B (zh) * | 2020-03-02 | 2023-10-13 | 圣邦微电子(北京)股份有限公司 | 电流检测电路 |
US11499995B2 (en) | 2020-10-26 | 2022-11-15 | Analog Devices, Inc. | Leakage compensation technique for current sensor |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3972003A (en) * | 1974-08-09 | 1976-07-27 | Bell Telephone Laboratories, Incorporated | High speed current detection amplifier circuit |
JPH07119776B2 (ja) * | 1989-05-26 | 1995-12-20 | 富士通株式会社 | 電流検出回路 |
JPH1146120A (ja) * | 1997-07-25 | 1999-02-16 | Mitsubishi Electric Corp | 差動増幅回路 |
JP2000009764A (ja) * | 1998-06-18 | 2000-01-14 | Harness Syst Tech Res Ltd | 電流検出回路 |
US6946882B2 (en) * | 2002-12-20 | 2005-09-20 | Infineon Technologies Ag | Current sense amplifier |
US7433253B2 (en) * | 2002-12-20 | 2008-10-07 | Qimonda Ag | Integrated circuit, method of operating an integrated circuit, method of manufacturing an integrated circuit, memory module, stackable memory module |
JP4034279B2 (ja) * | 2004-03-03 | 2008-01-16 | ローム株式会社 | 電流検出回路、負荷駆動回路、及び記憶装置 |
EP1659690B1 (en) * | 2004-11-22 | 2013-11-06 | Semiconductor Components Industries, LLC | Comparator for input voltages higher than supply voltage |
JP2007166444A (ja) | 2005-12-16 | 2007-06-28 | Nec Electronics Corp | 過電流検出回路及びスイッチング回路 |
JP4878181B2 (ja) | 2006-03-06 | 2012-02-15 | 株式会社リコー | 電流検出回路および該電流検出回路を利用した電流モードdc−dcコンバータ |
CN101666824B (zh) * | 2009-10-14 | 2011-07-06 | 美芯晟科技(北京)有限公司 | 高端电流检测电路 |
JP2011220767A (ja) * | 2010-04-07 | 2011-11-04 | Panasonic Corp | 電流検出回路 |
US20120154969A1 (en) * | 2010-12-21 | 2012-06-21 | Samsung Electro-Mechanics Co., Ltd. | Overcurrent detection circuit of light emitting module |
CN202794314U (zh) * | 2012-07-19 | 2013-03-13 | 快捷半导体(苏州)有限公司 | 一种功率开关管的过流检测电路 |
-
2015
- 2015-04-20 JP JP2015086139A patent/JP6498503B2/ja active Active
-
2016
- 2016-03-16 TW TW105107992A patent/TWI684767B/zh not_active IP Right Cessation
- 2016-04-05 US US15/090,810 patent/US9733284B2/en active Active
- 2016-04-12 KR KR1020160044728A patent/KR20160124672A/ko not_active Application Discontinuation
- 2016-04-20 CN CN201610245937.4A patent/CN106066419B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TW201640126A (zh) | 2016-11-16 |
US9733284B2 (en) | 2017-08-15 |
US20160305985A1 (en) | 2016-10-20 |
KR20160124672A (ko) | 2016-10-28 |
CN106066419B (zh) | 2019-12-24 |
JP2016206852A (ja) | 2016-12-08 |
CN106066419A (zh) | 2016-11-02 |
TWI684767B (zh) | 2020-02-11 |
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