JP6062523B1 - 三次元計測装置 - Google Patents

三次元計測装置 Download PDF

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Publication number
JP6062523B1
JP6062523B1 JP2015231661A JP2015231661A JP6062523B1 JP 6062523 B1 JP6062523 B1 JP 6062523B1 JP 2015231661 A JP2015231661 A JP 2015231661A JP 2015231661 A JP2015231661 A JP 2015231661A JP 6062523 B1 JP6062523 B1 JP 6062523B1
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JP
Japan
Prior art keywords
imaging
image data
light
light intensity
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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JP2015231661A
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English (en)
Japanese (ja)
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JP2017096866A (ja
Inventor
信行 梅村
信行 梅村
大山　剛
剛 大山
憲彦 坂井田
憲彦 坂井田
学 奥田
学 奥田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CKD Corp
Original Assignee
CKD Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by CKD Corp filed Critical CKD Corp
Priority to JP2015231661A priority Critical patent/JP6062523B1/ja
Priority to TW105116968A priority patent/TWI610061B/zh
Priority to MX2018001490A priority patent/MX366402B/es
Priority to DE112016005425.4T priority patent/DE112016005425T5/de
Priority to CN201680046181.9A priority patent/CN107923736B/zh
Priority to PCT/JP2016/070238 priority patent/WO2017090268A1/ja
Application granted granted Critical
Publication of JP6062523B1 publication Critical patent/JP6062523B1/ja
Publication of JP2017096866A publication Critical patent/JP2017096866A/ja
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Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2015231661A 2015-11-27 2015-11-27 三次元計測装置 Active JP6062523B1 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2015231661A JP6062523B1 (ja) 2015-11-27 2015-11-27 三次元計測装置
TW105116968A TWI610061B (zh) 2015-11-27 2016-05-31 三維測量裝置
MX2018001490A MX366402B (es) 2015-11-27 2016-07-08 Dispositivo de medicion tridimensional.
DE112016005425.4T DE112016005425T5 (de) 2015-11-27 2016-07-08 Vorrichtung zur dreidimensionalen Messung
CN201680046181.9A CN107923736B (zh) 2015-11-27 2016-07-08 三维测量装置
PCT/JP2016/070238 WO2017090268A1 (ja) 2015-11-27 2016-07-08 三次元計測装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015231661A JP6062523B1 (ja) 2015-11-27 2015-11-27 三次元計測装置

Publications (2)

Publication Number Publication Date
JP6062523B1 true JP6062523B1 (ja) 2017-01-18
JP2017096866A JP2017096866A (ja) 2017-06-01

Family

ID=57800032

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015231661A Active JP6062523B1 (ja) 2015-11-27 2015-11-27 三次元計測装置

Country Status (6)

Country Link
JP (1) JP6062523B1 (es)
CN (1) CN107923736B (es)
DE (1) DE112016005425T5 (es)
MX (1) MX366402B (es)
TW (1) TWI610061B (es)
WO (1) WO2017090268A1 (es)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7371443B2 (ja) * 2019-10-28 2023-10-31 株式会社デンソーウェーブ 三次元計測装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007113958A (ja) * 2005-10-18 2007-05-10 Yamatake Corp ３次元計測装置、３次元計測方法、及び３次元計測プログラム
JP2013167464A (ja) * 2012-02-14 2013-08-29 Ckd Corp 三次元計測装置
JP2015087244A (ja) * 2013-10-30 2015-05-07 キヤノン株式会社 画像処理装置、画像処理方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4701948B2 (ja) * 2005-09-21 2011-06-15 オムロン株式会社 パタン光照射装置、３次元形状計測装置、及びパタン光照射方法
CN100561258C (zh) * 2008-02-01 2009-11-18 黑龙江科技学院 一种三维测量系统中相移光栅
DE202010018585U1 (de) * 2009-05-27 2017-11-28 Koh Young Technology Inc. Vorrichtung zur Messung einer dreidimensionalen Form
JP2013124938A (ja) * 2011-12-15 2013-06-24 Ckd Corp 三次元計測装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007113958A (ja) * 2005-10-18 2007-05-10 Yamatake Corp ３次元計測装置、３次元計測方法、及び３次元計測プログラム
JP2013167464A (ja) * 2012-02-14 2013-08-29 Ckd Corp 三次元計測装置
JP2015087244A (ja) * 2013-10-30 2015-05-07 キヤノン株式会社 画像処理装置、画像処理方法

Also Published As

Publication number Publication date
JP2017096866A (ja) 2017-06-01
WO2017090268A1 (ja) 2017-06-01
MX2018001490A (es) 2018-08-01
MX366402B (es) 2019-07-08
CN107923736A (zh) 2018-04-17
DE112016005425T5 (de) 2018-08-16
CN107923736B (zh) 2020-01-24
TW201719112A (zh) 2017-06-01
TWI610061B (zh) 2018-01-01

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