JP6062355B2 - Gas analysis method and gas analyzer - Google Patents

Description

  The present disclosure relates to a gas analysis method and a gas analyzer.

The infrared absorption spectroscopic method and the infrared absorption spectroscopic device are used for analyzing the concentration of a component contained in a gas to be analyzed by examining light absorption in the infrared region.
In general, in infrared absorption spectroscopy, two light receiving elements for measurement signals and reference signals are prepared. The light emitted from the light source is divided into two, one of the light passes through the gas to be analyzed and then enters the light receiving element for measurement signal, and the other light does not pass through the gas and the reference signal Incident on the light receiving element. The difference between the measurement signal and the reference signal is used for gas analysis.

  In contrast to this conventional method, Patent Document 1 discloses a method for correcting the baseline of an infrared absorption spectrum, and if a corrected baseline obtained by the method is used, measurement of a reference signal is not necessary. Conceivable. More specifically, in the method described in Patent Document 1, a peak is detected in the electrical spectrum, data in a region corresponding to the peak is erased, and two points on both sides of the erased region are used as a reference. Data is interpolated.

  On the other hand, some infrared absorption spectrometers use a wavelength tunable diode laser as a light source. As this type of infrared absorption spectroscopic apparatus, for example, in a laser measuring apparatus described in Patent Document 2, the wavelength and intensity of laser light emitted from a light source are swept. In this laser measurement device, both the measurement signal and the reference signal are measured, and even if the intensity of the laser beam is swept in a triangular waveform, the influence of the sweep is eliminated by taking the difference between the measurement signal and the reference signal. can do.

JP 2001-343324 A JP 2012-137429 A

As a disturbance for gas analysis, dust contained in the gas to be analyzed can be given. When the gas to be analyzed contains dust, the laser light is scattered or shielded by the dust, and the transmittance of the laser light is reduced. As a result, the measurement signal includes an error and the analysis accuracy is lowered.
Such a problem occurs even when two light receiving elements for measurement signals and reference signals are used as in Patent Document 2 or when one light receiving element is used as in Patent Document 1.

  Accordingly, an object of at least one embodiment of the present invention is to provide a gas analysis method and a gas analysis apparatus in which errors due to disturbance are reduced.

A gas analysis method according to some embodiments of the present invention includes:
A step of disposing a wavelength tunable diode laser having an oscillation wavelength variable in a wavelength range including a center wavelength and having the center wavelength variably configured at a start end of an optical path;
Placing a light receiving element at the end of the optical path;
Repetitively acquiring a first measurement signal by the light receiving element while repeatedly sweeping the oscillation wavelength of the wavelength tunable diode laser in a first measurement wavelength range including an absorption line of the gas to be analyzed;
Disturbance included in at least one of the plurality of first measurement signals based on the maximum value of each of the plurality of first measurement signals acquired in the step of repeatedly acquiring the first measurement signal. Obtaining a disturbance component caused by
Determining a baseline corresponding to the at least one first measurement signal;
Analyzing the gas to be analyzed based on the at least one first measurement signal, the disturbance component included in the at least one first measurement signal, and the baseline.

  According to this configuration, the disturbance component due to the disturbance is obtained based on the maximum value of each of the plurality of first measurement signals. Since the gas to be analyzed is analyzed in consideration of the disturbance component, the influence of the disturbance is reduced and the analysis is performed with high accuracy.

In some embodiments,
A step of obtaining a stray light component caused by stray light included in the at least one first measurement signal based on a minimum value of each of the plurality of first measurement signals;
In the step of analyzing the analysis target gas, the analysis target is based on the at least one first measurement signal, the disturbance component and the stray light component included in the at least one first measurement signal, and the baseline. Analyze the gas.

  When stray light such as radiation is incident on the light receiving element, the first measurement signal is increased. In this respect, according to this configuration, only the stray light is incident on the light receiving element when the first measurement signal has the minimum value, and the stray light component is based on the minimum value of each of the plurality of first measurement signals. Desired. Since the analysis target gas is analyzed in consideration of the stray light component, the influence of the stray light is reduced and the analysis is performed with high accuracy.

In some embodiments,
In the step of repeatedly acquiring the first measurement signal, the oscillation wavelength sweep in the first measurement wavelength range is repeated at intervals.

  According to this configuration, the stray light component can be obtained more accurately by causing the minimum value of the first measurement signal to appear for a certain time corresponding to the interval. As a result, gas analysis is performed with higher accuracy.

In some embodiments,
The step of obtaining the baseline includes
Sweeping the oscillation wavelength of the tunable diode laser in a second measurement wavelength range not including the absorption line of the gas to be analyzed, and obtaining a second measurement signal by the light receiving element;
Determining the baseline based on the second measurement signal.

According to this configuration, the first measurement signal and the second measurement signal are acquired using the same light receiving element. For this reason, the optical system for acquiring the first measurement signal and the second measurement signal is exactly the same, and errors due to the difference in the optical system are eliminated.
On the other hand, according to this configuration, the absorption line of the analysis target gas is not included in the second measurement wavelength range, and the shape of the second measurement signal can be used as the baseline almost as it is. For this reason, even if one light receiving element is used, there is almost no error that occurs when obtaining the baseline.
As a result, according to this configuration, it is possible to analyze the analysis target gas with high accuracy based on the first measurement signal and the baseline.

In some embodiments,
In the step of obtaining the second measurement signal, while repeating the oscillation wavelength sweep in the second measurement wavelength range, obtaining a plurality of the second measurement signals,
The step of obtaining the baseline obtains a disturbance component caused by a disturbance included in at least one second measurement signal among the plurality of second measurement signals based on the maximum value of each of the plurality of second measurement signals. Further comprising a step,
In the step of obtaining the baseline, the baseline is obtained based on the at least one second measurement signal and the disturbance component included in the at least one second measurement signal.

  According to this configuration, the disturbance component due to the disturbance included in the second measurement signal is obtained based on the maximum value of each of the plurality of second measurement signals. Since the analysis target gas is analyzed in consideration of the disturbance component included in the second measurement signal, the influence of the disturbance is reduced, and the analysis is performed with high accuracy.

In some embodiments,
In the step of obtaining the second measurement signal, while repeating the oscillation wavelength sweep in the second measurement wavelength range, obtaining a plurality of the second measurement signals,
The step of obtaining the baseline includes a stray light component caused by stray light included in at least one second measurement signal of the plurality of second measurement signals based on a minimum value of each of the plurality of second measurement signals. Further including a step of obtaining
In the step of obtaining the baseline, the baseline is obtained based on the at least one second measurement signal and the stray light component included in the at least one second measurement signal.

  When stray light such as radiation is incident on the light receiving element, the second measurement signal is increased. In this respect, according to this configuration, only the stray light is incident on the light receiving element when the second measurement signal is the minimum value, and the stray light component included in the second measurement signal is a plurality of second measurement signals. It is determined based on each minimum value. Since the analysis target gas is analyzed in consideration of the stray light component, the influence of the stray light is reduced and the analysis is performed with high accuracy.

In some embodiments,
In the step of obtaining the second measurement signal, the oscillation wavelength sweep in the second measurement wavelength range is repeated at intervals.

  According to this configuration, the stray light component can be obtained more accurately by causing the minimum value of the second measurement signal to appear for a certain time corresponding to the interval. As a result, gas analysis is performed with higher accuracy.

A gas analyzer according to some embodiments of the present invention includes:
A wavelength tunable diode laser disposed at the beginning of the optical path, the oscillation wavelength being variable in a wavelength range including the center wavelength, and the center wavelength being variably configured;
A light receiving element disposed at the end of the optical path;
A measuring instrument configured to analyze an analysis target gas based on an output signal of the light receiving element;
The measuring instrument is
Repeatedly acquiring the first measurement signal by the light receiving element while the oscillation wavelength of the wavelength tunable diode laser is repeatedly swept in the first measurement wavelength range including the absorption line of the gas to be analyzed;
Based on the maximum value of each of the plurality of first measurement signals repeatedly obtained, obtain a disturbance component caused by the disturbance included in at least one first measurement signal among the plurality of first measurement signals,
The analysis target gas is configured to be analyzed based on the at least one first measurement signal, a disturbance component included in the at least one first measurement signal, and the baseline.

  According to this configuration, the disturbance component due to the disturbance is obtained based on the maximum value of each of the plurality of first measurement signals. Since the gas to be analyzed is analyzed in consideration of the disturbance component, the influence of the disturbance is reduced and the analysis is performed with high accuracy.

In some embodiments,
The measuring instrument is
Based on the minimum value of each of the plurality of first measurement signals, a stray light component due to stray light included in the at least one first measurement signal is obtained,
The analysis target gas is configured to be analyzed based on the at least one first measurement signal, the disturbance component and the stray light component included in the at least one first measurement signal, and the baseline. .

  When stray light such as radiation is incident on the light receiving element, the first measurement signal is increased. In this respect, according to this configuration, only the stray light is incident on the light receiving element when the first measurement signal has the minimum value, and the stray light component is based on the minimum value of each of the plurality of first measurement signals. Desired. Since the analysis target gas is analyzed in consideration of the stray light component, the influence of the stray light is reduced and the analysis is performed with high accuracy.

In some embodiments,
The measuring instrument is configured to acquire a plurality of the first measurement signals while the oscillation wavelength sweep in the first measurement wavelength range is repeated at intervals.

  According to this configuration, the stray light component can be obtained more accurately by causing the minimum value of the first measurement signal to appear for a certain time corresponding to the interval. As a result, gas analysis is performed with higher accuracy.

In some embodiments,
The measuring instrument is
A second measurement signal is acquired by the light receiving element while the oscillation wavelength of the wavelength tunable diode laser is swept in a second measurement wavelength range not including the absorption line of the analysis target gas;
The base line is obtained based on the second measurement signal.

According to this configuration, the first measurement signal and the second measurement signal are acquired using the same light receiving element. For this reason, the optical system for acquiring the first measurement signal and the second measurement signal is exactly the same, and errors due to the difference in the optical system are eliminated.
On the other hand, according to this configuration, the absorption line of the analysis target gas is not included in the second measurement wavelength range, and the shape of the second measurement signal can be used as the baseline almost as it is. For this reason, even if one light receiving element is used, there is almost no error that occurs when obtaining the baseline.
As a result, according to this configuration, it is possible to analyze the analysis target gas with high accuracy based on the first measurement signal and the baseline.

In some embodiments,
The measuring instrument is
Obtaining a plurality of the second measurement signals while the sweep of the oscillation wavelength in the second measurement wavelength range is repeated;
Based on the maximum value of each of the plurality of second measurement signals, a disturbance component caused by a disturbance included in at least one second measurement signal among the plurality of second measurement signals is obtained.
The base line is determined based on the at least one second measurement signal and the disturbance component included in the at least one second measurement signal.

  According to this configuration, the disturbance component due to the disturbance included in the second measurement signal is obtained based on the maximum value of each of the plurality of second measurement signals. Since the analysis target gas is analyzed in consideration of the disturbance component included in the second measurement signal, the influence of the disturbance is reduced, and the analysis is performed with high accuracy.

In some embodiments,
The measuring instrument is
Obtaining a plurality of the second measurement signals while the sweep of the oscillation wavelength in the second measurement wavelength range is repeated;
Based on the minimum value of each of the plurality of second measurement signals, a stray light component caused by stray light included in at least one second measurement signal among the plurality of second measurement signals is obtained.
The baseline is determined based on the at least one second measurement signal and the stray light component included in the at least one second measurement signal.

  When stray light such as radiation is incident on the light receiving element, the second measurement signal is increased. In this respect, according to this configuration, only the stray light is incident on the light receiving element when the second measurement signal is the minimum value, and the stray light component included in the second measurement signal is a plurality of second measurement signals. It is determined based on each minimum value. Since the analysis target gas is analyzed in consideration of the stray light component, the influence of the stray light is reduced and the analysis is performed with high accuracy.

In some embodiments,
The measuring instrument is configured to acquire a plurality of the second measurement signals while the oscillation wavelength sweep in the second measurement wavelength range is repeated at intervals.

  According to this configuration, the stray light component can be obtained more accurately by causing the minimum value of the second measurement signal to appear for a certain time corresponding to the interval. As a result, gas analysis is performed with higher accuracy.

In some embodiments,
A gas introduction device configured to removably introduce the gas to be analyzed onto the optical path;
In the state where the gas to be analyzed is removed from the optical path, the measuring device is configured to receive a second measurement signal by the light receiving element while the oscillation wavelength of the wavelength tunable diode laser is swept in the first measurement wavelength range. Get
The base line is obtained based on the second measurement signal.

  According to this configuration, the first measurement signal and the second measurement signal are acquired using the same light receiving element. For this reason, the optical system for acquiring the first measurement signal and the second measurement signal is exactly the same, and errors due to the difference in the optical system are eliminated.

  According to at least one embodiment of the present invention, a gas analysis method and a gas analysis apparatus are provided in which errors due to disturbance are reduced.

It is a figure which shows schematic structure of a boiler. It is a figure which shows schematic structure of the gas analyzer which concerns on one Embodiment of this invention. It is a figure which shows roughly the relationship between the intensity | strength of the laser beam radiate | emitted from TDL, a wavelength, and time. It is a flowchart which shows roughly the procedure of the gas analysis method which concerns on some embodiment. It is a graph which shows roughly the relationship between the wavelength of a laser beam, and the absorption factor of the laser beam by gas with the absorption line of gas. It is a figure for demonstrating a disturbance component acquisition process. It is a figure which shows schematically the relationship between the time of the wavelength of TDL, the emitted light intensity, the corrected first measurement signal, the second measurement signal, and the baseline. It is a graph which shows roughly the difference of the base line calculated | required based on the 2nd measurement signal, and the correct | amended 1st measurement signal. It is a flowchart which shows roughly the procedure of the gas analysis method which concerns on some embodiment. It is a figure for demonstrating a stray light component acquisition process. It is a graph which shows roughly the relation between the emitted light intensity of TDL and time in the gas analysis method concerning some embodiments. FIG. 12 is a diagram schematically showing a relationship between a first measurement signal and time corresponding to the graph of FIG. 11. It is a figure which shows schematic structure of the gas analyzer which concerns on some embodiment. It is a flowchart which shows roughly the procedure of the gas analysis method which concerns on some embodiment. It is a figure which shows schematic structure of the gas analyzer which concerns on some embodiment. It is a flowchart which shows roughly the procedure of the gas analysis method which concerns on some embodiment.

  Embodiments of the present invention will be described below with reference to the accompanying drawings. However, the dimensions, materials, shapes, and relative arrangements of the components described in this embodiment or shown in the drawings are not intended to limit the scope of the present invention, but are merely illustrative examples. Only.

FIG. 1 is a diagram illustrating a schematic configuration of a boiler 10.
The boiler 10 includes a combustion furnace 12 and a flue 14 connected to the combustion furnace 12.
The fire channel wall 16 of the combustion furnace 12 includes an evaporation pipe for heating water, and a superheater 18 for superheating steam is disposed at the upper part of the combustion furnace 12. A economizer 20 for preheating water is disposed below the flue 14. In addition, a reheater 22 for reheating the steam is disposed on the upper portion of the flue 14.

  A burner 24 is attached to the combustion furnace 12, and air can be supplied from the blower 26 to the burner 24 and pulverized coal can be supplied from the coal pulverizer 28. An air supply pipe 30 is attached to the combustion furnace 12, and air can be supplied to the air supply pipe 30 from the blower 26.

High-temperature exhaust gas generated by burning pulverized coal ejected from the burner 24 rises in the combustion furnace 12 and flows into the flue 14. The heat generated by the combustion is transmitted to the evaporation pipe of the fire channel wall 16, thereby heating the water. The heat of the exhaust gas is used to superheat the steam in the superheater 18, reheat the steam in the reheater 22, and preheat water in the economizer 20. The exhaust gas that has become low temperature flows into a denitration device provided downstream of the boiler 10, for example, and is purified.
The steam (main steam) superheated by the superheater 18 is supplied to, for example, the steam turbine 32 and used for power generation or the like.

  For example, the control device 34 of the boiler 10 is configured to control the governor valve 36 based on the power generation amount, and to control the combustion state in the boiler 10 based on the pressure of the main steam. That is, the control device 34 of the boiler 10 is configured to control the amount of fuel and air supplied to the combustion furnace 12 and the amount of water supplied to the evaporation pipe through the economizer 20.

  FIG. 2 shows a schematic configuration of a gas analyzer according to an embodiment of the present invention. The gas analyzer can analyze the exhaust gas flowing through the flue 14. In the present embodiment, the gas analyzer can analyze the exhaust gas at the position indicated by the alternate long and short dash line L1 in FIG. That is, the gas analyzer can analyze the exhaust gas between the superheater 18 and the economizer 20. However, the gas analyzer may analyze the exhaust gas at the positions indicated by alternate long and short dash lines L2 and L3 in FIG. That is, the gas analyzer may analyze the exhaust gas in the combustion furnace 12.

  The gas analyzer includes a wavelength tunable diode laser 40, a light receiving element 42, and a measuring instrument 44. Hereinafter, the tunable diode laser 40 is also referred to as a TDL (Tunable Diode LASER).

  The TDL 40 is disposed at the start end of the optical path 46 and is configured to emit laser light. FIG. 3 shows the relationship between the intensity and wavelength of laser light emitted from the TDL 40 and time. As shown in FIG. 3, the oscillation wavelength of the TDL 40 is variable in the wavelength range Δλ including the center wavelength λc1 by changing the current supplied to the TDL 40. In the present embodiment, the emitted light intensity is changed to a triangular wave shape (saw blade shape). However, the modulation pattern of the emitted light intensity is not limited to this.

  As shown in FIG. 3, the TDL 40 can change the center wavelength λc1 to, for example, the center wavelength λc2 beyond the wavelength range Δλ by changing the temperature of the TDL 40. Even if the center wavelength is changed due to a temperature change, the modulation pattern of the wavelength range Δλ and the modulation pattern of the emitted light intensity can be kept the same if the modulation pattern of the supply current remains the same.

  The light receiving element 42 is disposed at the end of the optical path 46 and receives the laser light emitted from the TDL 40. The light receiving element 42 is made of, for example, a photodiode. The light receiving element 42 is configured to output a signal corresponding to the intensity of the incident laser light.

  At least a part of the optical path 46 extends in the flue 14, that is, in the exhaust gas flow path. The configuration of the optical system that defines the optical path 46 is not particularly limited. In this embodiment, the TDL 40 is connected to one end of an optical fiber 50 by a coupler 48, and a light transmission collimator 52 is attached to the other end of the optical fiber 50. The laser light emitted from the light transmission collimator 52 passes through the flue 14 and then enters the light receiving collimator 54. The light receiving element 42 is attached to the light receiving collimator 54, and the laser beam converged by the light receiving collimator 54 enters the light receiving element 42.

  The measuring instrument 44 is configured by a computer, for example, and is configured to analyze the gas to be analyzed based on the output of the light receiving element 42. The gas analysis includes, for example, concentration analysis of components contained in the gas and temperature analysis.

FIG. 4 is a flowchart schematically showing a procedure of a gas analysis method according to some embodiments. The gas analysis method can be used for gas analysis using the above-described gas analyzer.
As shown in FIG. 4, the gas analysis method includes a second measurement signal acquisition step S10, a center wavelength change step S12, a first measurement signal acquisition step S14, a disturbance component acquisition step S16, and a measurement signal correction step S18. And a baseline calculation step S20 and a gas analysis step S22. The measuring instrument 44 is configured to be able to execute these steps S10 to S22.

FIG. 5 is a graph showing the relationship between the wavelength of the laser beam and the absorption rate of the laser beam by the gas, along with the gas absorption line. As shown in FIG. 5, the gas has a plurality of absorption lines 56 according to the components, and the laser light is absorbed at the absorption lines 56 and wavelengths in the vicinity thereof.
In the second measurement signal acquisition step S10, the oscillation wavelength of the TDL 40 is swept in the second measurement wavelength range Δλ2 that does not include the absorption line 56. Then, while the oscillation wavelength is swept, the output (second measurement signal) of the light receiving element 42 is acquired. The oscillation wavelength is swept by modulating the supply current to the TDL 40.

  In the center wavelength changing step S12, the center wavelength of the TDL 40 is changed so that the absorption line 56 used for the analysis is included in the wavelength range in which the oscillation wavelength is swept. The change of the center wavelength is performed by adjusting the temperature of the TDL 40. The modulation pattern of the current supplied to the TDL 40 is not changed, and the size of the wavelength range (first measurement wavelength range Δλ1) after changing the center wavelength is the same as the size of the second measurement wavelength range Δλ2. The modulation pattern of the light intensity is not changed.

  Note that the second measurement wavelength range Δλ2 may be a substantially transparent range that does not include the absorption line 56 to be analyzed and hardly absorbs, and partially overlaps the first measurement wavelength range Δλ1. May be. In general, in a wavelength tunable diode laser, the variable range of the oscillation wavelength varies depending on its composition and the like. Among them, the gas type to be analyzed, the absorption line 56 to be analyzed, the first measurement wavelength range In consideration of Δλ1 and the second measurement wavelength range Δλ2, one having an appropriate variable range is selected as the TDL 40.

  In the first measurement signal acquisition step S14, the oscillation wavelength of the TDL 40 is swept in the first measurement wavelength range Δλ1 including the absorption line 56. Then, while the oscillation wavelength is swept, the output (first measurement signal) of the light receiving element 42 is acquired.

In the disturbance component acquisition step S16, a disturbance component included in the first measurement signal is acquired.
In the measurement signal correction step S18, the first measurement signal is corrected based on the disturbance component obtained in the disturbance component acquisition step S16.
In the baseline calculation step S20, a baseline is obtained based on the first measurement signal and the second measurement signal corrected in the measurement signal correction step S18.

In the gas analysis step S22, the analysis target gas is analyzed based on the corrected first measurement signal and the baseline.
The concentration (molar fraction) C and temperature of the gas species contained in the analysis target gas are obtained by the following equations (1) and (2) according to the Lambert-Beer rule.
I / Io = exp (−K (λ) · L) (1)
K (λ) = P · C · S (T) · φ (λ) (2)

  In equations (1) and (2), I is the transmitted light intensity, Io is the incident light intensity (baseline light intensity), I / Io is the transmittance, K (λ) is the absorption coefficient, and λ is the absorption line. The wavelength is 56, L is the optical path length, P is the static pressure of the field, S (T) is the absorption intensity temperature dependence coefficient, T is the temperature of the gas species, and φ (λ) is the absorption line shape function.

Hereinafter, the disturbance component acquisition step S16 and the measurement signal correction step S18 will be described. FIG. 6 is a diagram for explaining the disturbance component acquisition step S16 and the measurement signal correction step S18.
6, when the first measurement signal is repeatedly measured, the maximum values I1max1, I1max2, I1max3,... Of the plurality of first measurement signals are acquired. In the disturbance component acquisition step S16, a function f (t) that smoothly connects the maximum values I1max1, I1max2, I1max3,... Of the plurality of first measurement signals is obtained.
And in measurement signal correction process S18, it correct | amends by dividing a 1st measurement signal by the function f (t).

Hereinafter, the baseline calculation step S20 will be described in detail.
FIG. 7 schematically shows the relationship between the wavelength of the TDL 40, the emitted light intensity, the first measurement signal corrected in the measurement signal correction step S18, the second measurement signal, and the baseline, and time. In the lower graph of FIG. 7, a two-dot chain line indicates a reference signal measured by preparing a light receiving element for measuring a reference signal. As will be described later, the light receiving element for measuring the reference signal is arranged at the end of the optical path branched from the optical path 46 before the flue 14.

As shown in the lower graph of FIG. 7, there is a difference between the maximum value I1max of the first measurement signal corrected in the measurement signal correction step S18 and the maximum value I2max of the second measurement signal. The baseline is obtained by multiplying the second measurement signal by a coefficient so that the maximum value I1max and the maximum value I2max coincide.
The baseline can be approximated using an approximate polynomial with time as a variable. Therefore, a value obtained by calculating a coefficient for the second measurement signal may be approximated with an approximate polynomial, and the obtained approximate polynomial may be used as a baseline.

FIG. 8 is a graph showing a difference (difference signal) between the baseline obtained based on the second measurement signal and the corrected first measurement signal. Note that a two-dot chain line in FIG. 8 indicates a difference between the base line based on the reference signal and the first measurement signal. The baseline based on the reference signal is obtained by multiplying the reference signal by a coefficient so that the maximum value Irmax of the reference signal matches the maximum value I1max of the first measurement signal corrected in the measurement signal correction step S18.
As shown in FIG. 8, the shape of the difference signal is almost the same when the baseline obtained based on the second measurement signal is used and when the baseline obtained based on the reference signal is used. There are some differences.

  When dust or the like is present on the optical path 46, light is scattered by the dust or the like, and the first measurement signal is attenuated. That is, dust etc. become disturbance and the first measurement signal is attenuated. In this respect, according to this configuration, the disturbance component due to the disturbance is obtained based on the maximum value of each of the plurality of first measurement signals, and the analysis target gas is analyzed in consideration of the disturbance component. Impact is reduced and analysis is performed with high accuracy.

  As schematically shown in an enlarged manner in FIG. 6, the function f (t) also represents a disturbance component between the maximum value and the maximum value of the first measurement signal, and each time t1, t2, t3 · The first measurement signal can be accurately corrected every time by dividing the first measurement signal by the corresponding values f (t1), f (t2), f (t3). . In FIG. 6, however, the time step is rough for the sake of explanation, but in practice it can be corrected continuously.

Further, according to the configuration described above, the first measurement signal and the second measurement signal are acquired using the same light receiving element 42. For this reason, the optical system for acquiring the first measurement signal and the second measurement signal is exactly the same, and errors due to the difference in the optical system are eliminated.
On the other hand, according to this configuration, the second measurement wavelength range Δλ2 does not include the absorption line 56 of the gas to be analyzed, and even if the shape of the second measurement signal is multiplied by the coefficient, the second measurement wavelength range Δλ2 is used as the baseline. Can be used. For this reason, even if one light receiving element 42 is used, there is almost no error that occurs when obtaining the baseline.
As a result, according to this configuration, it is possible to analyze the analysis target gas with high accuracy based on the first measurement signal and the baseline.

FIG. 9 is a flowchart schematically showing a procedure of a gas analysis method according to some embodiments. The gas analysis method can be used for gas analysis using the above-described gas analyzer.
In the gas analysis method shown in FIG. 9, the emitted light intensity of the TDL 40 is modulated with zero as the minimum value. In addition, the gas analysis method shown in FIG. 9 further includes a stray light component acquisition step S24 for acquiring a stray light component included in the first measurement signal. In the measurement signal correction step S26, the first measurement signal is corrected based on the disturbance component and the stray light component.

FIG. 10 is a diagram for explaining the stray light component acquisition step S24.
As shown in FIG. 10, when the first measurement signal is repeatedly measured, the minimum values I1min1, I1min2, I1min3,... Of the plurality of first measurement signals are acquired. In the stray light component acquisition step S24, a function g (t) that smoothly connects the minimum values I1min1, I1min2, I1min3,... Of the plurality of first measurement signals is obtained.
In the measurement signal correction step S26, a corrected first measurement signal is obtained by dividing the value obtained by subtracting the function g (t) from the first measurement signal by the function f (t).

  When stray light such as ambient light or radiation light enters the light receiving element 42, the first measurement signal increases. In this regard, according to this configuration, the emitted light intensity of the TDL 40 is modulated with zero as the minimum value, and only the stray light is incident on the light receiving element 42 when the emitted light intensity is zero. It is obtained based on the minimum value of each of the plurality of first measurement signals. Since the analysis target gas is analyzed in consideration of the stray light component, the influence of the stray light is reduced and the analysis is performed with high accuracy.

  As schematically shown in an enlarged manner in FIG. 10, g (t) also represents a stray light component between the minimum value and the minimum value of the first measurement signal, and each time t1, t2, t3,. By subtracting the corresponding g (t1), g (t2), g (t3)... From the first measurement signal of .., the first measurement signal can be accurately corrected for each time. . However, in FIG. 10, the time step is rough for the sake of explanation, but in practice it can be corrected continuously.

11 and 12 are diagrams for explaining a gas analysis method according to some embodiments.
As shown in FIG. 11, in some embodiments, the output light intensity of the TDL 40 is modulated at intervals where the output light intensity of the TDL 40 becomes zero for a certain time. According to such modulation, as shown in FIG. 12, a minimum value for a certain time appears in the first measurement signal corresponding to the interval.
As described above, the function g (t) representing the stray light component can be obtained more accurately by causing the minimum value of the first measurement signal to appear for a certain period of time. As a result, gas analysis is performed with higher accuracy.

FIG. 13 is a diagram for explaining an optical system of a gas analyzer according to some embodiments.
As shown in FIG. 13, the gas analyzer may have a chamber 60 disposed on an optical path 46 extending between the light-transmitting collimator 52 and the light-receiving collimator 54.
The chamber 60 constitutes a gas introducing device configured to removably introduce the analysis target gas onto the optical path 46. The chamber 60 can be filled with a gas to be analyzed, and can be filled with a purge gas instead of the gas to be analyzed. An exhaust pump 62 may be connected to the chamber 60 for gas replacement. The purge gas is a gas that does not contain the analysis target gas.

FIG. 14 is a flowchart schematically showing a procedure of a gas analysis method according to some embodiments. The gas analysis method of FIG. 14 is used for gas analysis using the gas analyzer of FIG.
The gas analysis method shown in FIG. 14 is obtained by adding a purge gas filling step S28 and an analysis object gas filling step S30 to the gas analysis method of FIG. 4 and omitting the center wavelength changing step S12.

Specifically, in the purge gas filling step S28, the chamber 60 is filled with the purge gas. In the second measurement signal acquisition step S10, the intensity of the laser beam that has passed through the purge gas in the chamber 60 is measured.
On the other hand, in the analysis target gas filling step S30, the analysis target gas is filled in the chamber 60. In the first measurement signal acquisition step S14, the intensity of the laser beam that has passed through the analysis target gas in the chamber 60 is measured.

According to this configuration, the first measurement signal and the second measurement signal are acquired using the same light receiving element 42. For this reason, the optical system for acquiring the first measurement signal and the second measurement signal is exactly the same, and errors due to the difference in the optical system are eliminated.
In this configuration, in the second measurement signal acquisition step S10, since the analysis target gas is not filled in the chamber 60, the second measurement signal is acquired while sweeping the oscillation wavelength in the first measurement wavelength range Δλ1. be able to.

FIG. 15 is a diagram for explaining an optical system of a gas analyzer according to some embodiments.
As shown in FIG. 15, the gas analyzer further includes a light receiving element 64 for measuring a reference signal. The light receiving element 64 is disposed at the end of the optical path 68 branched from the optical path 46 by the optical distributor 66, for example. The optical path 68 is defined by the optical fiber 70.

FIG. 16 is a flowchart schematically showing a procedure of a gas analysis method according to some embodiments. The gas analysis method of FIG. 16 is used for gas analysis using the gas analyzer of FIG.
The gas analysis method shown in FIG. 16 is obtained by replacing the second measurement signal acquisition step S10 of the gas analysis method of FIG. 4 with a reference signal acquisition step S32 and omitting the center wavelength changing step S12.

  In the reference signal acquisition step S <b> 32, the reference signal is acquired by the light receiving element 64. In the baseline calculation step S34, the reference signal is multiplied by a coefficient so that the maximum value Irmax of the reference signal coincides with the corrected maximum value I1max of the first measurement signal, thereby obtaining the baseline.

  Also in this configuration, the disturbance component due to the disturbance included in the first measurement signal is obtained based on the maximum value of each of the plurality of first measurement signals, and the analysis target gas is analyzed in consideration of the disturbance component. The influence of disturbance is reduced and analysis is performed with high accuracy.

In some embodiments, the modulation frequency of the emitted light intensity of the TDL 40 is set higher than the fluctuation frequency of the disturbance component and the stray light component, but is set to about 10 times the fluctuation frequency of the disturbance component and the stray light component. For example, the modulation frequency of the emitted light intensity of the TDL 40 is set to 100 Hz to 20 kHz, preferably 100 Hz to 1 kHz.
According to this configuration, by suppressing the modulation frequency of the emitted light intensity of the TDL 40 to be low, fluctuations in disturbance components and stray light components can be accurately determined based on the maximum and minimum values of the first measurement signal and the second measurement signal. Can be sought. In addition, by suppressing the modulation frequency to a low value, inexpensive TDL 40, light receiving element 42 and measuring instrument 44 can be used.

The present invention is not limited to the above-described several embodiments, and includes forms obtained by changing some of the above-described embodiments and forms obtained by appropriately combining these forms.
For example, in some of the embodiments described above, the disturbance component function f (t) is obtained and corrected only for the first measurement signal. However, the disturbance component function f ( Correction may be performed by obtaining t).
In some embodiments described above, the function g (t) of the stray light component is obtained and corrected only for the first measurement signal, but the function g (t) of the stray light component is also obtained for the second measurement signal by the same method. May be corrected.

In some embodiments described above, the stray light component is corrected by calculation. However, a stray light removal filter may be provided in the optical system to optically remove the stray light component.
In some embodiments described above, the first measurement signal is measured after obtaining the second measurement signal. However, the second measurement signal may be obtained after obtaining the first measurement signal.

In some embodiments described above, the analysis result by the gas analyzer is input to the control device 34, and the control device 34 adds to the boiler 10 based on the analysis result by the gas analyzer in addition to the power generation amount and the main steam pressure. It may be configured to control the supply of fuel, air and water.
In some embodiments described above, the gas analyzer and the gas analysis method are applied to the analysis of the exhaust gas flowing through the flue 14, but the analysis target gas is not limited to the exhaust gas.

40 Tunable diode laser (TDL)
42 Photodetector 44 Measuring instrument 46 Optical path 48 Coupler 50 Optical fiber 52 Light transmitting collimator 54 Light receiving collimator 56 Absorption line

Claims (7)

A step of disposing a wavelength tunable diode laser having an oscillation wavelength variable in a wavelength range including a center wavelength and having the center wavelength variably configured at a start end of an optical path;
Placing a light receiving element at the end of the optical path;
By changing the supply current to the tunable diode laser, the light receiving element performs the first measurement while repeatedly sweeping the oscillation wavelength of the tunable diode laser in the first measurement wavelength range including the absorption line of the gas to be analyzed. A process of repeatedly acquiring signals;
Disturbance included in at least one of the plurality of first measurement signals based on the maximum value of each of the plurality of first measurement signals acquired in the step of repeatedly acquiring the first measurement signal. Obtaining a disturbance component caused by
Determining a baseline corresponding to the at least one first measurement signal;
Analyzing the gas to be analyzed based on the at least one first measurement signal, the disturbance component included in the at least one first measurement signal, and the baseline, and
In the step of obtaining a disturbance component included in the at least one first measurement signal, a function that smoothly connects the maximum values of the plurality of first measurement signals is obtained,
In the step of analyzing the gas to be analyzed, the at least one first measurement signal corrected by dividing the at least one first measurement signal by a function that smoothly connects the maximum values of the plurality of first measurement signals. signal, and, gas analysis method characterized that you analyzing the analyte gas based on the baseline. A step of obtaining a stray light component caused by stray light included in the at least one first measurement signal based on a minimum value of each of the plurality of first measurement signals;
In the step of analyzing the analysis target gas, the analysis target is based on the at least one first measurement signal, the disturbance component and the stray light component included in the at least one first measurement signal, and the baseline. Analyze the gas ,
In the step of obtaining the stray light component included in the at least one first measurement signal, a function that smoothly connects the minimum values of the plurality of first measurement signals is obtained,
Based on the base line and the at least one first measurement signal corrected by subtracting a function that smoothly connects the minimum values of the plurality of first measurement signals in the step of analyzing the analysis target gas. The gas analysis method according to claim 1, wherein the analysis target gas is analyzed .   3. The gas analysis method according to claim 2, wherein in the step of repeatedly acquiring the first measurement signal, the oscillation wavelength sweep in the first measurement wavelength range is repeated at intervals. A wavelength tunable diode laser disposed at the beginning of the optical path, the oscillation wavelength being variable in a wavelength range including the center wavelength, and the center wavelength being variably configured;
A light receiving element disposed at the end of the optical path;
A measuring instrument configured to analyze an analysis target gas based on an output signal of the light receiving element;
The measuring instrument is
By changing the supply current to the wavelength tunable diode laser, the light receiving element causes the oscillation wavelength of the wavelength tunable diode laser to be swept repeatedly in the first measurement wavelength range including the absorption line of the analysis target gas. Repeatedly acquiring the first measurement signal,
Based on the maximum value of each of the plurality of first measurement signals repeatedly obtained, obtain a disturbance component caused by the disturbance included in at least one first measurement signal among the plurality of first measurement signals,
Analyzing the gas to be analyzed based on the at least one first measurement signal, a disturbance component included in the at least one first measurement signal, and a baseline ;
In order to obtain a disturbance component included in the at least one first measurement signal, a function that smoothly connects the maximum values of the plurality of first measurement signals is obtained,
Based on the at least one first measurement signal corrected by dividing the at least one first measurement signal by a function that smoothly connects the maximum values of the plurality of first measurement signals, and the baseline A gas analyzer configured to analyze the gas to be analyzed . The measuring instrument is
Based on the minimum value of each of the plurality of first measurement signals, a stray light component due to stray light included in the at least one first measurement signal is obtained,
Analyzing the analysis target gas based on the at least one first measurement signal, the disturbance component and the stray light component included in the at least one first measurement signal, and the baseline ;
In order to obtain a stray light component included in the at least one first measurement signal, a function that smoothly connects the minimum values of the plurality of first measurement signals is obtained,
The analysis target gas is analyzed on the basis of the at least one first measurement signal corrected by subtracting a function that smoothly connects the minimum values of the plurality of first measurement signals and the baseline. The gas analyzer according to claim 4 , wherein the gas analyzer is configured. The measuring instrument is configured to acquire a plurality of the first measurement signals while the oscillation wavelength sweep in the first measurement wavelength range is repeated at intervals. The gas analyzer according to claim 5 . A gas introduction device configured to removably introduce the gas to be analyzed onto the optical path;
In the state where the gas to be analyzed is removed from the optical path, the measuring device is configured to receive a second measurement signal by the light receiving element while the oscillation wavelength of the wavelength tunable diode laser is swept in the first measurement wavelength range. Get
The gas analyzer according to any one of claims 4 to 6 , wherein the gas analyzer is configured to obtain the baseline based on the second measurement signal.

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