JP5967897B2 - Imaging apparatus, control method therefor, and program - Google Patents

Description

  The present invention relates to an imaging apparatus, a control method thereof, and a program.

  2. Description of the Related Art Conventionally, an imaging device such as an electronic camera that records and reproduces a still image or a moving image captured by a solid-state imaging device such as a CCD or CMOS is commercially available using a memory card having a solid-state memory device as a recording medium.

  When imaging using a solid-state imaging device such as a CCD or CMOS, image quality degradation may occur due to dark current noise generated in the imaging device or minute scratches inherent to the imaging device. A high-quality image can be obtained by performing various correction processes against such image quality degradation.

  For example, by performing arithmetic processing on a dark image that is read by performing charge accumulation in the same manner as the main imaging without exposing the image sensor and a main image that is read by performing charge accumulation while the image sensor is exposed, Dark noise correction processing can be performed.

  Accordingly, it is possible to obtain a high-quality image by correcting the captured image with respect to image quality degradation such as pixel current loss due to dark current noise generated in the image sensor or a minute scratch peculiar to the image sensor.

  In addition, image quality degradation can be further reduced by correcting defective pixels by interpolation processing using pixels adjacent to the defective pixels.

  Correction of defective pixels is usually performed as follows. First, a defective pixel of an image sensor is detected in advance, and data relating to the defective pixel is stored in a ROM or the like. This operation is performed, for example, when the image sensor is shipped from the factory. The output of the image sensor at the standard charge accumulation time under a predetermined condition is evaluated, and a defective pixel is determined based on the evaluation result.

  Then, the type of defective pixel (black flaw pixel, white flaw pixel, etc.), the address of the defective pixel and the data of the defect level are acquired and written in the ROM or the like.

  As described above, in the imaging apparatus in which the position of the defective pixel or the like is stored in the ROM in advance, the pixel at the position corresponding to the position data of the defective pixel stored in the ROM in the image supplied from the imaging element The defective pixel data can be corrected using the pixel data.

  As a result, among the video signals obtained by the image sensor, pixels that output a signal of a specific level (that is, defective pixels) are corrected, and a good reproduced image can be obtained.

  Among defective pixels, it is known that the degree of white dot-like defective pixels (hereinafter referred to as “white scratched pixels”) whose output is high varies greatly depending on the charge accumulation time in the image sensor at the time of imaging.

  Therefore, even if a pixel does not pose a problem when imaging with a normal short accumulation time (short seconds), the level as a defective pixel increases when imaging with a longer time (long seconds) than normal, which affects the image quality. Will be given.

  It is assumed that the defective pixel is corrected in consideration of such image quality degradation due to the defective pixel at a long time. That is, a pixel with a low defect level is also corrected. In this case, correction is performed with a huge number of pixels as defective pixels, but correction processing is also performed on pixels that originally do not require correction processing in a short time, and conversely, image quality deterioration due to overcorrection is caused. .

  Therefore, there is a method of performing defective pixel correction by setting a predetermined threshold value. For example, a method has been proposed in which the level of defective pixels to be corrected is changed in accordance with imaging conditions such as charge accumulation time and ISO sensitivity (see, for example, Patent Document 1). As a result, it is possible to avoid insufficient correction or overcorrection of defective pixels.

  In addition to the defective pixel correction, an imaging apparatus such as an electronic camera performs various correction processes on the obtained output value of each pixel.

  For example, there is a peripheral light amount drop correction in which gain correction is performed on the peripheral part of an image depending on the type of the lens in consideration of the peripheral light amount drop of the lens. There is also a correction that applies gain only to a predetermined area in the screen such as the face of the subject in accordance with the captured image. Furthermore, there is also a correction for applying a gain to the output according to the aperture value of the lens at the time of imaging.

JP 2003-333435 A

  However, as described above, the method of acquiring and correcting an image separately from main imaging requires two times of charge accumulation in order to acquire one image, and the time load increases as imaging for a long time. Become. That is, there is a problem that the release time lag and the imaging frame interval are greatly affected.

  On the other hand, the method of changing the level of the defective pixel to be corrected according to the imaging conditions such as the charge accumulation time and ISO sensitivity is not subject to correction if gain is applied to a predetermined area in the screen such as peripheral light amount correction. The result was that the defective pixels became noticeable.

  An object of the present invention is to provide an imaging apparatus, a control method thereof, and a program that do not make defective pixels uncorrected without correcting defective pixels more than necessary.

In order to achieve the above object, an image pickup apparatus according to claim 1 is an image pickup apparatus that obtains a picked-up image by picking up an image of a subject with an image pickup element via an optical member , and a defective pixel caused by the image pickup element a first storage means for defect information positions and the lack Ochiire bell is associated in the captured image is stored in, the defect levels of the defective pixels to be corrected in accordance with the pupil distance or the aperture value of the optical member Second storage means for storing setting information for setting a threshold value for each area of the captured image, the defect information stored in the first storage means, and the setting information stored in the second storage means And determining means for determining whether or not to correct each defective pixel, and correcting means for correcting the defective pixel determined to be corrected by the determining means. .

  According to the present invention, it is possible to provide an imaging apparatus, a control method therefor, and a program that do not make defective pixels unremarkable without correcting defective pixels more than necessary.

1 is a diagram illustrating a schematic configuration of an imaging apparatus according to an embodiment of the present invention. It is a figure which shows an example of the flaw data memorize | stored in the non-volatile memory in FIG. FIG. 2 is a scratch level setting table stored in the memory in FIG. 1 and shows a scratch level setting table to be corrected according to the position of an image. It is a figure which shows the area | region shown by FIG. FIG. 4 is a diagram illustrating a scratch level in FIG. 3 stored in a memory in FIG. 1 and a scratch correction level corresponding to the level. 2 is a flowchart showing a procedure of overall imaging processing (part 1) executed by the system control circuit in FIG. 3 is a flowchart showing a procedure of overall imaging processing (part 2) executed by the system control circuit in FIG. It is a flowchart which shows the procedure of the imaging process in step S136 of FIG. It is a flowchart which shows the procedure of the defect correction process in step S139 of FIG. 10 is a flowchart illustrating a procedure of correction target pixel designation processing in step S501 of FIG. 9. 10 is a flowchart illustrating a procedure of correction target pixel designation processing in step S501 of FIG. 9. It is a figure which shows the table | surface which showed the coefficient (beta) of the flaw level by aperture value (Av). FIG. 13 is a diagram illustrating a scratch level to which FIG. 12 is applied and a scratch correction level corresponding to the level.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

[First Embodiment]
FIG. 1 is a diagram illustrating a schematic configuration of an imaging apparatus 1 according to an embodiment of the present invention.

  The imaging device 1 in FIG. 1 is a digital single-lens reflex camera, for example. The imaging apparatus 1 includes an image processing apparatus (main body) 100, recording media 200 and 210 that are detachably attached to the image processing apparatus body, and a lens unit 300 that is detachably attached to the image processing apparatus body. (Optical member).

  In the image processing apparatus 100, the shutter 12 controls the exposure amount to the image sensor 14. The image sensor 14 converts an optical image of a subject into an electrical signal.

  The light beam incident on the imaging lens 310 in the lens unit 300 can be guided through the aperture 312, the lens mounts 306 and 106, the mirror 130 and the shutter 12, and can be formed on the imaging device 14 as an optical image. As described above, the imaging apparatus 1 is an imaging apparatus that obtains a captured image by imaging a subject with an imaging element via an optical member.

  The A / D converter 16 converts the analog signal output from the image sensor 14 into a digital signal. The timing generation circuit 18 supplies a clock signal and a control signal to the image sensor 14, the A / D converter 16, and the D / A converter 26. The timing generation circuit 18 is controlled by the memory control circuit 22 and the system control circuit 50.

  The image processing circuit 20 performs predetermined pixel interpolation processing and color conversion processing on the data from the A / D converter 16 or the data from the memory control circuit 22. The image processing circuit 20 performs a predetermined calculation process using the captured image as necessary.

  The image processing circuit 20 performs TTL AF processing, AE processing, and EF processing for the system control circuit 50 to control the shutter control unit 40 and the distance measurement control unit 42 based on the obtained calculation result. Note that TTL indicates through-the-lens, AF indicates autofocus, AE indicates automatic exposure, and EF indicates flash light control.

  The image processing circuit 20 performs predetermined arithmetic processing using the captured image, and performs TTL AWB (auto white balance) processing based on the obtained arithmetic result. In the present embodiment, since the distance measurement control unit 42 and the photometry control unit 46 are provided exclusively, the system control circuit 50 uses the distance measurement control unit 42 and the photometry control unit 46 to perform AF processing and AE processing. , EF processing is performed. Then, the image processing circuit 20 may be used so that the AF process and the EF process are not performed.

  The memory control circuit 22 controls the A / D converter 16, the timing generation circuit 18, the image processing circuit 20, the image display memory 24, the D / A converter 26, the memory 30, and the compression / decompression circuit 32.

  Data from the A / D converter 16 is written into the image display memory 24 or the memory 30 via the image processing circuit 20 and the memory control circuit 22. Alternatively, data from the A / D converter 16 is directly written into the image display memory 24 or the memory 30 via the memory control circuit 22.

  The image display unit 28 includes a TFT type LCD. The display image written in the image display memory 24 is displayed on the image display unit 28 via the D / A converter 26. When the captured images are sequentially displayed on the image display unit 28, an electronic viewfinder function can be realized.

  The image display unit 28 can arbitrarily turn on / off the display according to the display of the system control circuit 50. When the display is turned off, the power consumption of the image processing apparatus 100 can be greatly reduced. it can.

The memory 30 stores captured still images and moving images. The memory 30 has a storage capacity sufficient to store a predetermined number of still images and a moving image for a predetermined time. Therefore, even if the continuous shooting imaging and the panoramic imaging which are continuously captured a plurality of still images, it is possible to perform high-speed and large amounts of image writing to the memory 30. The memory 30 can also be used as a work area for the system control circuit 50.

  The compression / decompression circuit 32 compresses and decompresses an image by adaptive discrete cosine transform (ADCT) or the like. The compression / decompression circuit 32 reads an image stored in the memory 30, performs compression processing or decompression processing, and writes the processed data to the memory 30.

  The shutter control unit 40 controls the shutter 12 in cooperation with the aperture control unit 340 that controls the aperture 312 based on the photometry information from the photometry control unit 46. The distance measurement control unit 42 performs AF processing. A light beam incident on the imaging lens 310 in the lens unit 300 is further incident in a single-lens reflex system via a stop 312, lens mounts 306 and 106, a mirror 130, and a distance measuring sub-mirror (not shown). The distance measurement control unit 42 measures the in-focus state of the image formed as an optical image by the incident light beam.

  The thermometer 44 detects the ambient temperature in the imaging environment. When the thermometer 44 is in the image sensor (sensor) 14, it is possible to predict the dark current of the sensor more accurately.

  The photometry control unit 46 performs AE processing. Similar to the distance measurement control unit 42, the photometry control unit 46 measures the exposure state of an image formed as an optical image by the incident light beam. The photometric control unit 46 also has an EF (flash dimming) processing function in cooperation with the flash unit 48. The flash unit 48 has an AF auxiliary light projecting function and a flash light control function.

  The system control circuit 50 can perform exposure control and AF control using the video TTL system for the shutter control unit 40, the aperture control unit 340, and the distance measurement control unit 342. The control by the system control circuit 50 is performed based on the calculation result calculated by the image processing circuit 20 using the captured image by the image sensor 14.

  The AF control may be performed using the measurement result obtained by the distance measurement control unit 42 and the calculation result obtained by calculating the captured image by the image processing circuit 20 using the image sensor 14.

  Further, the exposure control may be performed using the measurement result obtained by the photometry control unit 46 and the calculation result obtained by calculating the captured image by the image processing circuit 20 using the image sensor 14.

  The system control circuit 50 controls the entire image processing apparatus 100 and incorporates a CPU and the like. The memory 52 stores constants, variables, programs, and the like for operating the system control circuit 50.

  The display unit 54 includes a liquid crystal display device that displays an operation state, a message, and the like with characters, images, sounds, and the like according to execution of a program in the system control circuit 50, a speaker, and the like. Specifically, the display unit 54 is configured by a combination of an LCD, an LED, a sound generating element, and the like. The display unit 54 is installed at a single or a plurality of locations in the vicinity of the operation unit of the image processing apparatus 100 that are easily visible. Some functions of the display unit 54 are provided in the optical viewfinder 104.

  Among the display contents of the display unit 54, what is displayed on the LCD or the like includes single shot / continuous shooting imaging display, self-timer display, compression rate display, recording pixel number display, recording number display, remaining image pickup possible number display, and There is a shutter speed display. Further, the display content of the display unit 54 includes aperture value display, exposure correction display, flash display, red-eye reduction display, macro imaging display, buzzer setting display, clock battery level display, battery level display, and error display. is there. Further, the display content of the display unit 54 is information display by a multi-digit number, display of attachment / detachment state of the recording media 200 and 210, display of attachment / detachment state of the lens unit 300, communication I / F operation display, date / time display, external computer Display to show the connection status.

  Among the display contents of the display unit 54, what is displayed in the optical viewfinder 104 includes an in-focus display, an imaging preparation completion display, and a camera shake warning display. Further, the display content of the display unit 54 includes flash charge display, flash charge completion display, shutter speed display, aperture value display, exposure correction display, recording medium writing operation display, and the like.

  Moreover, what is displayed on the LED or the like among the display contents of the display unit 54 includes, for example, a focus display, an imaging preparation completion display, a camera shake warning display, and a flash charge display. Further, display contents of the display unit 54 include a flash charge completion display, a recording medium writing operation display, a macro imaging setting notification display, a secondary battery charge display, and the like.

  Among the display contents of the display unit 54, what is displayed on a lamp or the like includes, for example, a self-timer notification lamp. This self-timer notification lamp may be shared with AF auxiliary light.

  The nonvolatile memory 56 is electrically erasable / recordable in which programs and the like to be described later are stored, and an EEPROM or the like is used as the nonvolatile memory 56. The nonvolatile memory 56 stores various parameters, setting values such as ISO sensitivity, setting mode, and defective pixel position and level data. The position and level data of the defective pixel is created and written at the time of adjustment or inspection in the production process. As a method of creating the data of the position and level of the defective pixel, for example, a method of generating data by extracting a pixel having an output of a predetermined level or higher of an image obtained by performing dark imaging can be considered.

  The mode dial switch 60 is for switching and setting each function imaging mode. As each of the functional imaging modes, there are an automatic imaging mode, a program imaging mode, a shutter speed priority imaging mode, an aperture priority imaging mode, and a manual imaging mode. Further, as each function imaging mode, there are a depth-of-focus priority (depth) imaging mode, a portrait imaging mode, a landscape imaging mode, a close-up imaging mode, a sports imaging mode, a night scene imaging mode, a panoramic imaging mode, and the like.

  The shutter switch (SW1) 62 is turned on during the operation of a shutter button (not shown), and instructs to start operations such as AF processing, AE processing, AWB processing, and EF processing.

  The shutter switch (SW2) 64 is turned on when the operation of a shutter button (not shown) is completed. The shutter switch (SW2) 64 is a switch for instructing the start of a series of processing operations. Specifically, the shutter switch (SW2) 64 performs an exposure process for writing an image read out from the image sensor 14 to the memory 30 via the A / D converter 16 and the memory control circuit 22. Then, development processing using computations in the image processing circuit 20 and the memory control circuit 22, recording processing for reading out the image from the memory 30, compression in the compression / decompression circuit 32, and writing the image on the recording media 200 and 210. Done.

  The playback switch 66 instructs the start of a playback operation in which the captured image is read from the memory 30 or the recording media 200 and 210 and displayed on the image display unit 28 in the imaging mode state.

  When the shutter switch (SW2) 64 is pressed, the single-shot / continuous-shot switch 68 performs a single shooting mode in which a single frame is imaged and is in a standby state, and while the shutter switch (SW2) 64 is pressed. It is possible to set a continuous shooting mode in which imaging is continuously performed.

  The ISO sensitivity setting switch 69 can set the ISO sensitivity by changing the gain setting in the image sensor 14 or the image processing circuit 20.

  The operation unit 70 including various buttons and a touch panel includes a menu button, a set button, a macro button, a multi-screen playback page break button, a flash setting button, and a single shooting / continuous shooting / self-timer switching button.

  Further, the operation unit 70 includes a menu movement + (plus) button, a menu movement − (minus) button, a reproduction image movement + (plus) button, a reproduction image − (minus) button, an imaging image quality selection button, and an exposure correction button. is there.

  Further, the operation unit 70 includes a date / time setting button, a selection / switching button for setting selection and switching of various functions when performing imaging and playback such as a panorama mode. The operation unit 70 includes a determination / execution button for setting determination and execution of various functions when performing imaging and playback in a panorama mode or the like. The operation unit 70 includes an image display ON / OFF switch for setting ON / OFF of the image display unit 28 and a quick review ON / OFF switch for setting a quick review function for automatically reproducing a captured image immediately after imaging.

  Further, the operation unit 70 includes a compression mode switch that is a switch for selecting a compression rate for JPEG compression or for selecting a CCD RAW mode in which a signal from an image sensor is directly digitized and recorded on a recording medium. The operation unit 70 has a playback switch that can set each function mode such as a playback mode, a multi-screen playback / erase mode, and a PC connection mode. The operation unit 70 includes an AF mode setting switch that can set a one-shot AF mode and a servo AF mode. The one-shot AF mode is a mode in which an autofocus operation is started when the user presses the shutter switch (SW1) 62, and once in focus, the focused state is maintained. The servo AF mode is a mode in which the autofocus operation is continuously performed while the user presses the shutter switch (SW1) 62.

  In addition, the functions of the plus button and the minus button can be selected more easily by providing a rotary dial switch.

  The power switch 72 can switch between power-on and power-off modes of the image processing apparatus 100. In addition, the power on and power off settings of various accessory devices such as the lens unit 300, the external strobe, and the recording media 200 and 210 connected to the image processing apparatus 100 can be switched.

  The power supply control unit 80 includes a battery detection circuit, a DC-DC converter, a switch circuit that switches blocks to be energized, and the like. The power supply control unit 80 detects the presence / absence of a battery, the type of battery, and the remaining battery level. Then, the power control unit 80 controls the DC-DC converter based on the detection result and an instruction from the system control circuit 50, and supplies a necessary voltage to each unit including the recording medium for a necessary period.

  The connectors 82 and 84 connect the power supply control unit 80 and the power supply unit 86. The power supply unit 86 includes a primary battery such as an alkaline battery or a lithium battery, a secondary battery such as a NiCd battery, a NiMH battery, or a Li battery, an AC adapter, or the like.

  The interfaces 90 and 94 are interfaces with recording media 200 and 210 such as a memory card and a hard disk. The connectors 92 and 96 connect to a recording medium such as a memory card or a hard disk.

  The recording medium attachment / detachment detection unit 98 detects whether or not the recording mediums 200 and 210 are attached to the connectors 92 and 96.

  In the present embodiment, two interfaces and connectors for attaching the recording medium are provided. However, a single or an arbitrary number of interfaces and connectors for attaching the recording medium may be provided.

  Further, as interfaces and connectors of different standards, those compliant with standards such as PCMCIA cards and CF (compact flash (registered trademark)) cards may be used.

  Furthermore, when the interfaces 90 and 94 and the connectors 92 and 96 are configured using a PCMCIA card or CF card conforming standard, images are transferred to and from other peripheral devices such as other computers and printers. It is possible. Furthermore, management information attached to images can be transferred to each other.

  In this case, various communication cards such as a LAN card, a modem card, a USB card, an IEEE 1394 card, a P1284 card, a SCSI card, and a communication card such as a PHS are connected.

  The optical viewfinder 104 can guide the light beam incident on the imaging lens 310 through the aperture 312, the lens mounts 306 and 106, and the mirrors 130 and 132 by the single-lens reflex method, and can display the image as an optical image. is there.

  Thereby, it is possible to perform imaging using only the optical finder 104 without using the electronic finder function of the image display unit 28.

  Further, in the optical viewfinder 104, some functions of the display unit 54, for example, a focus display, a camera shake warning display, a flash charge display, a shutter speed display, an aperture value display, an exposure correction display, and the like are provided.

  The communication unit 110 has various communication functions such as RS232C, USB, IEEE1394, P1284, SCSI, modem, LAN, and wireless communication.

  The connector 112 connects the image processing apparatus 100 to other devices via the communication unit 110. The connector 112 may be an antenna for wireless communication.

  The interface 120 is an interface for connecting the image processing apparatus 100 to the lens unit 300 in the lens mount 106.

  The connector 122 electrically connects the image processing apparatus 100 to the lens unit 300. Although not shown, a lens attachment / detachment detection unit that detects whether or not the lens unit 300 is attached to the lens mount 106 and / or the connector 122 is provided.

  The connector 122 transmits control signals, status signals, data signals, and the like between the image processing apparatus 100 and the lens unit 300, and also has a function of supplying currents of various voltages. Further, the connector 122 may be configured to transmit not only electrical communication but also optical communication, voice communication, and the like.

  The mirrors 130 and 132 guide the light beam incident on the imaging lens 310 to the optical viewfinder 104 by a single-lens reflex system. The mirror 132 may be either a quick return mirror or a half mirror.

  The recording medium 200 is a memory card or a hard disk. The recording medium 200 includes a recording unit 202 composed of a semiconductor memory, a magnetic disk, or the like, an interface 204 with the image processing apparatus 100, and a connector 206 for connecting with the image processing apparatus 100.

  The recording medium 210 is a memory card, a hard disk, or the like, similar to the recording medium 200. The recording medium 210 includes a recording unit 212 composed of a semiconductor memory, a magnetic disk, or the like, an interface 214 with the image processing apparatus 100, and a connector 216 for connecting with the image processing apparatus 100.

  The lens unit 300 is an interchangeable lens type lens unit. The lens mount 306 mechanically couples the lens unit 300 with the image processing apparatus 100. The lens mount 306 includes various functions for electrically connecting the lens unit 300 to the image processing apparatus 100.

  The lens unit 300 includes an imaging lens 310 and a diaphragm 312. An interface 320 is an interface for connecting the lens unit 300 to the image processing apparatus 100 in the lens mount 306.

  The connector 322 electrically connects the lens unit 300 to the image processing apparatus 100. The connector 322 has a function of transmitting a control signal, a status signal, a data signal, and the like between the image processing apparatus 100 and the lens unit 300 and supplying various currents or supplying currents. The connector 322 may be configured to transmit not only an electrical signal but also an optical signal, an audio signal, and the like.

  The aperture control unit 340 controls the aperture 312 in cooperation with the shutter control unit 40 that controls the shutter 12 based on the photometry information from the photometry control unit 46. The distance measurement control unit 342 controls focusing of the imaging lens 310. The zoom control unit 344 controls zooming of the imaging lens 310.

  The lens system control circuit 350 controls the entire lens unit 300. The lens system control circuit 350 also has a nonvolatile memory function. With this function, identification information such as a memory or a number unique to the lens unit 300 for storing operation constants, variables, programs, etc., management information, function information such as an open aperture value, minimum aperture value, focal length, current and past Each setting value is stored.

  FIG. 2 is a diagram showing an example of scratch data stored in the nonvolatile memory 56 in FIG.

  In FIG. 2, “No.” is a serial number of scratch data. “Address [X]” indicates the X coordinate when the image size is (X × Y), and “Address [Y]” indicates the Y coordinate. The “scratch correction level” expresses the output level of defective pixels that are scratches in mV, and is a level indicating the degree of defects. “Type of scratch” indicates the type of scratch. For example, white indicates a white scratch and black indicates a black scratch. This flaw data corresponds to defect information in which a position in the captured image of a defective pixel caused by the image sensor is associated with a level indicating the degree of the defect. The nonvolatile memory 56 corresponds to the first storage unit.

  When the image sensor 14 is shipped, various scratches are extracted from images obtained at a predetermined environmental temperature and a predetermined charge accumulation time. These flaw pixels form the flaw data shown in FIG. 2 based on the factory shipment data describing the type, address, and flaw level. This process is performed outside the image processing apparatus 100. Therefore, the scratch data is stored in the nonvolatile memory 56 before the imaging device 1 is shipped.

  Specifically, the white scratch of the image sensor 14 that needs to be corrected is determined according to the imaging state. Apart from this, defective pixels may be extracted from the captured image during imaging. By performing it at the time of imaging, it is possible to correct defective pixels of a type that sometimes occurs.

  Many white scratches tend to increase in level according to the charge accumulation time of the image sensor 14. Further, even if white scratches have the same level, the level of scratches when an image is generated changes depending on the set ISO sensitivity. The ISO sensitivity is determined by the gain of the image sensor 14 and the gain of the image processing circuit 20.

  Further, in the case of peripheral light amount correction in which gain is applied to the light amount decrease in the peripheral portion of the image due to the characteristics of the lens used for imaging, the level of scratches when the image is similarly changed. That is, when the peripheral light amount correction is performed, if the level of the scratch to be corrected is made uniform, the scratch remains only in the peripheral portion. Therefore, it is necessary to change the level of scratches to be corrected according to the position (distance) from the center of the image.

  FIG. 3 is a scratch level setting table stored in the memory 52 in FIG. 1, and shows a scratch level setting table that is corrected according to the position of the image.

  Also in FIG. 3, the image size is (X × Y), and X, X1, X2, Y, Y1, and Y2 indicate coordinates.

  FIG. 4 is a diagram showing the region shown in FIG.

  As shown in FIG. 4, the captured image is divided into nine regions, and a scratch level is determined for each region as shown in FIG.

  For example, a region 1 in FIG. 4 is a region where 0 ≦ x <X1 and 0 ≦ y <Y1, and the defect level to be corrected is LEVEL3. The same applies to region 2 to region 9.

  FIG. 5 is a diagram showing the scratch level in FIG. 3 stored in the memory 52 in FIG. 1 and the scratch correction level corresponding to the level.

  As shown in FIG. 5, the defect correction level is set to three levels of LEVEL1, LEVEL2, and LEVEL3, and the respective correction levels are set to 100 mV or more, 50 mV or more, and 25 mV or more, respectively.

  That is, the image peripheral portion to which gain is applied to the output is set to a low scratch level to be corrected, and the center to which no gain is applied is set to a high scratch level. In the present embodiment, the area is divided into nine areas, but the present invention is not limited to this. Further, when the peripheral light amount correction is not performed, a scratch correction level is set for the entire area LEVEL1.

  Further, the peripheral light amount reduction characteristic varies depending on the type of lens. Therefore, the scratch level setting table shown in FIG. 3 may be stored in the lens to be mounted. Alternatively, it may be provided depending on the pupil distance of the lens.

  Furthermore, it is desirable that the values of the defect correction levels LEVEL1 to LEVEL3 are appropriately set according to imaging conditions such as charge accumulation time and ISO sensitivity. That is, the scratch correction level is set lower as the accumulation time is longer and the ISO sensitivity is higher.

  The scratch level setting table and the scratch correction level may be stored in the internal memory of the system control circuit 50.

  As described above, the scratch level setting table in FIG. 3 is determined according to the gain correction performed on the captured image, and is compared with the level for each region obtained by dividing the captured image into a plurality of regions. Corresponds to the setting information in which the threshold value is set. Here, the threshold values are LEVEL1, LEVEL2, and LEVEL3. Further, the level is determined according to FIG. 5 in accordance with the scratch correction level of FIG. 2, and this level is compared with a threshold value as will be described later. The memory 52 corresponds to the second storage unit.

  FIG. 6 is a flowchart showing the procedure of the entire imaging process (part 1) executed by the system control circuit 50 in FIG.

  A program for operating the imaging process is stored in a recording medium such as the nonvolatile memory 56, loaded into the memory 52, and executed by the CPU in the system control circuit 50.

  Upon power-on such as battery replacement, the system control circuit 50 initializes flags, control variables, and the like, and performs necessary initial settings for each part of the image processing apparatus 100 (step S101).

  The system control circuit 50 determines the set position of the power switch 72, and determines whether or not the power switch 72 is set to power OFF (step S102). When the power switch 72 is set to power OFF (NO in step S102), an end process is performed (step S103), and then the process returns to step S102. The termination process changes the display of each display unit to the termination state, and records necessary parameters, setting values, and setting modes including flags and control variables in the nonvolatile memory 56. Then, unnecessary power supply of each part of the image processing apparatus 100 including the image display unit 28 is shut off by the power supply control unit 80.

  On the other hand, when the power switch 72 is set to ON (YES in step S102), it is determined whether or not the power is OK (step S104). Whether or not the power supply is OK means whether or not the remaining capacity or the operation status of the power supply unit 86 such as a battery has a problem in the operation of the image processing apparatus 100 by the power supply control unit 80.

  When it is determined that there is a problem (NO in step S104), a predetermined warning is given on the display unit 54 by displaying an image or outputting a sound (step S105), and the process returns to step S102.

  On the other hand, when it is determined that there is no problem with the power supply unit 86 (YES in step S105), the system control circuit 50 determines the setting position of the mode dial switch 60, and whether or not the mode dial switch 60 is set to the imaging mode. Is determined (step S106).

  When the mode dial switch 60 is set to another mode (NO in step S106), the system control circuit 50 executes processing corresponding to the selected mode (step S107), and returns to the processing of step S102 after execution. .

  On the other hand, when the mode dial switch 60 is set to the imaging mode (YES in step S106), it is determined whether or not the recording media 200 and 210 are OK (step S108). Whether or not the recording media 200 and 210 are OK is first determined whether or not the recording media 200 and 210 are loaded. Whether the management information of the images recorded on the recording media 200 and 210 and the operation state of the recording media 200 and 210 have a problem with the operation of the image processing apparatus 100, particularly with respect to the recording / reproducing operation of the image with respect to the recording medium. It is that.

  When it is determined that there is a problem with the recording media 200 and 210 (NO in step S108), a predetermined warning is given to the display unit 54 by displaying an image or outputting a sound (step S105), and then the process of step S102 is performed. Return.

On the other hand, the setting display for displaying various setting states of the image processing apparatus 100 by an image or sound using the (YES at step S108), the system control circuit 50 the display unit 54 when it is determined that there is no problem in step S108 (Step S109).

  Here, when the image display switch of the image display unit 28 is ON, various setting states of the image processing apparatus 100 may be displayed by an image or sound using the image display unit 28.

  FIG. 7 is a flowchart showing the procedure of the entire imaging process (part 2) executed by the system control circuit 50 in FIG.

  In FIG. 7, it is determined whether or not the shutter switch (SW1) 62 is pressed (step S121). When the shutter switch (SW1) 62 is not pressed (NO in step S121), the process returns to step S102. .

  On the other hand, when the shutter switch (SW1) 62 is pressed (YES in step S121), the system control circuit 50 performs distance measurement / photometry processing (step S122). In the photometric process, the flash is set if necessary. In the distance measurement / photometry process, the distance measurement process is performed to focus the imaging lens 310 on the subject, and the photometry process is performed to determine the aperture value and the shutter speed.

  Then, it is determined whether or not the shutter switch (SW2) 64 is pressed (step S132). When the shutter switch (SW2) 64 is not pressed (NO in step S132), the following processing is performed. That is, it is further determined whether or not the shutter switch (SW1) 62 has been released (step S133). In this way, the processes in steps S132 and S133 are repeated until the shutter switch (SW1) 62 is released or the shutter switch (SW2) 64 is pressed.

  When the shutter switch (SW1) 62 is released in step S133 (NO in step S133), the process proceeds to step S102.

  On the other hand, when the shutter switch (SW2) 64 is pressed in step S132 (YES in step S132), the system control circuit 50 determines whether or not the memory 30 has an image storage buffer area in which the captured image can be stored. (Step S134).

  When it is determined that there is no new image storage area in the image storage buffer area of the memory 30 (NO in step S134), a predetermined warning is given to the display unit 54 by displaying an image or outputting sound. (Step S135), the process returns to Step S102.

  As an example in which there is no area where new images can be stored, a state immediately after the maximum number of continuous shots that can be stored in the image storage buffer area of the memory 30 is taken. Specifically, the first image to be read from the memory 30 and written to the recording media 200 and 210 is not yet recorded on the recording media 200 and 210. This state is a state in which one free area cannot be secured in the image storage buffer area of the memory 30 yet.

  When the captured image is compressed and stored in the image storage buffer area of the memory 30, the following determination is made. First, in consideration of the fact that the amount of compressed image data differs depending on the compression mode setting, it is determined in step S134 whether or not the storable area is on the image storage buffer area of the memory 30. It will be.

  On the other hand, when it is determined in step S134 that there is an image storage buffer area capable of storing a captured image in the memory 30 (YES in step S134), the system control circuit 50 captures an image signal that has been captured and accumulated for a predetermined time. 14 to read. Then, the captured image is written in a predetermined area of the memory 30 via the A / D converter 16, the image processing circuit 20 and the memory control circuit 22, or directly from the A / D converter 16 via the memory control circuit 22. An imaging process is executed (step S136). Details of this imaging process will be described later.

  Next, the system control circuit 50 performs defective pixel correction using the data of the defect correction table shown in FIG. 3 (step S139). Details of the defective pixel correction process will be described later.

  Next, development processing (step S140) is performed. At this time, the system control circuit 50 first reads a part of the image written in the predetermined area of the memory 30 via the memory control circuit 22. Then, WB (white balance) integration calculation processing and OB (optical black) integration calculation processing necessary for performing the development processing are performed, and the calculation result is stored in the internal memory or the memory 52 of the system control circuit 50.

  Then, the system control circuit 50 reads a captured image written in a predetermined area of the memory 30 using the memory control circuit 22 and, if necessary, the image processing circuit 20. Next, various development processes including an AWB (auto white balance) process, a gamma conversion process, and a color conversion process are performed using the calculation result stored in the internal memory of the system control circuit 50 or the memory 52. Further, the peripheral light amount correction is also performed here.

  Next, the system control circuit 50 first reads an image written in a predetermined area of the memory 30. Then, image compression processing corresponding to the set mode is performed by the compression / decompression circuit 32 (step S141), and an image that has been captured and finished a series of processing is written in the empty image portion of the image storage buffer area of the memory 30. I do.

  Then, the system control circuit 50 reads an image stored in the image storage buffer area of the memory 30. Next, a recording process for writing the read image to the recording media 200 and 210 such as a memory card and a CompactFlash (registered trademark) card via the interfaces 90 and 94 and the connectors 92 and 96 is started (step S142). This recording start process is executed for an image every time a new image is written in the empty image portion of the image storage buffer area of the memory 30 after completing a series of processes.

  Note that while writing an image on the recording media 200 and 210, a recording medium writing operation display such as blinking an LED is performed on the display unit 54 to indicate that the writing operation is being performed.

  Further, the system control circuit 50 determines whether or not the shutter switch (SW1) 62 has been pressed (step S143). When the shutter switch (SW1) 62 is released (NO in step S143), the process returns to step S102.

  On the other hand, when the shutter switch (SW1) 62 has been pressed (YES in step S143), if single shooting has been set, the process returns to step S132, and the current state until the shutter switch (SW1) 62 is released. Repeat the process. Thereby, a series of processes relating to imaging is completed.

  FIG. 8 is a flowchart showing the procedure of the imaging process in step S136 of FIG.

  In this imaging process, various signals are exchanged between the system control circuit 50 and the aperture control unit 340 or the distance measurement control unit 342 via the interface 120, the connector 122, the connector 322, the interface 320, and the lens system control circuit 350. Done.

  The system control circuit 50 moves the mirror 130 to the mirror up position by a mirror driving unit (not shown) (step S301). Then, according to the photometric data stored in the internal memory of the system control circuit 50 or the memory 52, the aperture control unit 340 drives the aperture 312 to a predetermined aperture value (step S302).

  The system control circuit 50 performs the charge clear operation of the image sensor 14 (step S303), and then starts the charge accumulation of the image sensor 14 (step S304). Then, the shutter controller 40 opens the shutter 12 (step S305), and starts exposure of the image sensor 14 (step S306).

  Next, it is determined whether or not the flash unit 48 is necessary based on the flash flag (step S307), and when necessary (YES in step S307), the flash unit 48 is caused to emit light (step S308).

  The system control circuit 50 waits for the end of exposure of the image sensor 14 according to the photometric data (step S309). When the exposure ends (YES in step S309), the shutter controller 40 closes the shutter 12 (step S310), and the image sensor 14 The exposure is terminated.

  Next, the system control circuit 50 drives the diaphragm 312 to the open diaphragm value by the diaphragm controller 340 (step S311), and moves the mirror 130 to the mirror down position by the mirror driver (not shown) (step S312). .

  It is determined whether or not the set charge accumulation time has elapsed (step S313). When the set charge accumulation time has elapsed (YES in step S313), the system control circuit 50 ends the charge accumulation of the image sensor 14 (step S313). Step S314).

  Thereafter, the image pickup signal is read from the image pickup device 14 (step S315), and the memory control circuit 22 is read from the A / D converter 16, the image processing circuit 20, the memory control circuit 22, or directly from the A / D converter 16. The captured image is written in a predetermined area of the memory 30 via When the series of processes is completed, the present process is terminated and the process returns to the main process.

  FIG. 9 is a flowchart showing the procedure of the scratch correction process in step S139 of FIG.

  In FIG. 9, the system control circuit 50 of the image processing apparatus 100 performs correction target pixel designation processing (step S501).

  Specifically, the system control circuit 50 designates a pixel to be subjected to scratch correction processing according to a plurality of conditions divided according to lens conditions (lens type, pupil distance, aperture value), A defective pixel to be corrected is determined.

  Although only the lens condition is described here, the process is performed by setting the scratch correction level in consideration of other imaging conditions (charge accumulation time of the image sensor 14, ISO sensitivity) or imaging environment (temperature). It is more preferable to specify scratch correction data.

  Next, the address corresponding to the correction target pixel is read (step S502), and the point defect correction process is performed on the corresponding pixel of the captured image written in the predetermined area of the memory 30 using the captured image of the adjacent same color pixel. .

  Here, the system control circuit 50 reads the flaw address for one pixel from the head of the selected flaw correction data, refers to this address information, and specifies the address of the corresponding defective pixel in the captured image written in the memory 30. Is possible.

  Next, the system control circuit 50 reads the value of the same color pixel adjacent to the correction target pixel (step S503). Then, the system control circuit 50 calculates the correction amount of the correction target pixel from the value of the adjacent pixel obtained in step S503 (step S504).

  Subsequently, the system control circuit 50 writes the correction amount of the correction target pixel calculated in step S504 at a corresponding address in the memory 30 (step S505). Thereby, the correction process of the correction target pixel is completed. Steps S503 to S505 correspond to correction means for correcting defective pixels that have been determined to be corrected. Here, the defective pixel may be corrected according to the pupil distance of the optical member or the aperture value.

  Then, the system control circuit 50 determines whether or not all of the specified correction target pixel correction processing has been completed (step S506).

  As a result of the determination in step S506, when all the correction processes are completed (YES in step S506), this process ends. On the other hand, when all the correction processes are not completed (NO in step S506), the process returns to step S502, the address of the next correction target pixel is read, and the same process is repeated thereafter.

  FIG. 10 is a flowchart showing the procedure of the correction target pixel specifying process in step S501 of FIG.

  In FIG. 10, the system control circuit 50 confirms the imaging conditions (step S701). The imaging conditions include ISO sensitivity setting values (for example, 100, 200, 400, 800) and shutter speed (charge accumulation time). Next, the wearing lens conditions (lens type, pupil distance) are confirmed (step S702).

  The scratch level setting table shown in FIG. 3 is selected from the conditions of steps S701 and S702 (step S703). That is, since a plurality of scratch level setting tables are stored in correspondence with the conditions, a table that matches the conditions is selected from them. As described above, a plurality of pieces of defect information corresponding to the imaging conditions of the imaging element 14 are stored.

Subsequently, the defect data in FIG. 2 is scanned to read out defective pixels (step 704). This step S704 is stored position of the defective pixel, and you get a level.

  With reference to the address of the defective pixel, it is determined whether or not the defective pixel is a pixel in any one of regions 1, 3, 7, and 9 in the image (step S705).

If it is determined in the step S705, the time the defective pixel is one of pixels in the area of a region 1,3,7,9 in the image (YES in step S705), determines whether Kizureberu of the defective pixel is LEVEL3 more (Step S706).

  If it is determined in step S706 that the scratch level is LEVEL3 or higher (YES in step S706), the defective pixel is set as a correction target pixel, the address is read (step S711), and the process proceeds to step S712.

  On the other hand, if the result of determination in step S706 is that the scratch level is less than LEVEL3 (NO in step S706), the process proceeds to step S712.

  As a result of the determination in step S705, when the defective pixel is not a pixel in any one of the regions 1, 3, 7, and 9 in the image (NO in step S705), the defective pixel is the region 2 or 4 in the image. , 6 and 8 is discriminated (step S707).

  If the result of determination in step S707 is that the defective pixel is a pixel in any one of regions 2, 4, 6, and 8 in the image (YES in step S707), it is determined whether or not the defect level of the defective pixel is equal to or higher than LEVEL2. (Step S708).

  As a result of the determination in step S708, when the scratch level is LEVEL2 or higher (YES in step S708), the defective pixel is set as a correction target pixel, the address is read (step S711), and the process proceeds to step S712. In Steps S705 to S711, the defective pixel is corrected by comparing the threshold value set in the region where the defective pixel is present according to the setting information with the level of the defective pixel from the acquired position and level of the defective pixel. This corresponds to a determination means for determining whether or not to perform.

  On the other hand, as a result of the determination in step S708, when the scratch level is lower than LEVEL2 (NO in step S708), the process proceeds to step S712.

  As a result of the determination in step S707, when the defective pixel is not a pixel in any one of the regions 2, 4, 6, and 8 in the image (NO in step S707), the defective pixel is in the region 5 in the image. It is determined whether or not it is a pixel (step S709).

  As a result of the determination in step S709, if the defective pixel is a pixel in the area 5 in the image (YES in step S709), it is determined whether or not the defect level of the defective pixel is equal to or higher than LEVEL1 (step S710).

  As a result of the determination in step S710, when the scratch level is LEVEL1 or higher (YES in step S710), the defective pixel is set as a correction target pixel, the address is read (step S711), and the process proceeds to step S712.

  On the other hand, as a result of the determination in step S708, when the scratch level is lower than LEVEL2 (NO in step S708), the process proceeds to step S712.

  If the result of the determination in step S709 is that the defective pixel is not a pixel in the region 5 in the image (NO in step S709), it is determined whether or not all flaw data scans have been completed (step S712).

  As a result of the determination in step S712, when all the scratch data scans are completed (YES in step S712), this process is terminated, and when all the scratch data scans are not completed (NO in step S712), the process proceeds to step S705. Return. As described above, the specification of the correction target pixel in the captured image is completed.

  As described above, the defect correction level is changed depending on the region in the image according to the lens information, and even when correction is performed to gain only a specific region such as peripheral light amount correction, the defect pixel remains without generating a defect correction residue. Correction can be performed.

  In addition, since the defect correction level is lowered only in the area where gain correction is performed, the number of defective pixels to be corrected can be determined optimally, and overcorrection can be prevented.

  In the present embodiment, the defective pixel information is previously formed based on the factory shipment data, but may be acquired from the captured image. Further, when a captured image is taken into a computer and image processing is performed in the computer, the defective pixel may be corrected. Therefore, the defect information may be acquired using the captured image.

  In the present embodiment, whether or not the defective pixel is corrected by comparing the threshold value set in the region where the defective pixel is present with the setting information from the position and level of the defective pixel and the level of the defective pixel. To decide. Since the defective pixel determined to be corrected is corrected, the defective pixel is not corrected more than necessary, and the defective pixel that has not been corrected can be made inconspicuous.

[Second Embodiment]
Since the configuration of the imaging apparatus in the second embodiment is the same as the configuration of the imaging apparatus in the first embodiment, the first embodiment will be used for explanation.

  In general, as a high image quality function, there is a case where correction is applied to gain a specific area such as a face portion of a subject. Even in such a case, it is preferable to change the scratch correction level for correcting the area to which the gain is applied. The specification of the correction target pixel when the gain α is applied to a certain area A will be described using the first embodiment.

  FIG. 11 is a flowchart showing the procedure of the correction target pixel designation process in step S501 of FIG.

  In FIG. 11, first, steps S701 to 704 in FIG. 10 are performed. Next, the address of the defective pixel is referred to. If the defective pixel is in the area A, the flag is set to 1. If the defective pixel is outside the area A, the flag is set to 0 (step S1101).

  Next, it is determined whether or not the defective pixel is a pixel in any one of the regions 1, 3, 7, and 9 in the image (step S1102).

  If the result of the determination in step S1102 is that the defective pixel is a pixel in any one of the areas 1, 3, 7, and 9 in the image (YES in step S1102), the defect level of the defective pixel is determined (step S1103).

  Here, when the flag is 1 and the scratch level is equal to or higher than LEBEL3 / α, an affirmative determination is made, and when the flag is 1 and the scratch level is less than LEBEL3 / α, a negative determination is made. On the other hand, when the flag is 0 and the scratch level is LEVEL 3 or higher, an affirmative determination is made, and when the flag is 1 and the scratch level is less than LEVEL 3, a negative determination is made.

  If the result of determination in step S1103 is affirmative (YES in step S1103), the defective pixel is set as a correction target pixel, the address is read (step S1108), and the process proceeds to step S1109.

  On the other hand, when a negative determination is made as a result of the determination in step S1103 (NO in step S1103), the process proceeds to step S1109.

  As a result of the determination in step S1102, when the defective pixel is not a pixel in any one of the regions 1, 3, 7, and 9 in the image (NO in step S1102), the defective pixel is the region 2 or 4 in the image. , 6 and 8 are discriminated (step S1104).

  As a result of the determination in step S1104, when the defective pixel is a pixel in any one of the regions 2, 4, 6, and 8 in the image (YES in step S1104), the defect level of the defective pixel is determined (step S1105).

  Here, when the flag is 1 and the scratch level is equal to or higher than LEBEL2 / α, an affirmative determination is made, and when the flag is 1 and the scratch level is less than LEBEL2 / α, a negative determination is made. On the other hand, when the flag is 0 and the scratch level is LEVEL 2 or higher, an affirmative determination is made, and when the flag is 1 and the scratch level is less than LEVEL 2, a negative determination is made.

  If the result of determination in step S1105 is affirmative (YES in step S1105), the defective pixel is set as a correction target pixel, the address is read (step S1108), and the process proceeds to step S1109.

  On the other hand, if the result of determination in step S1105 is negative (NO in step S1105), the process proceeds to step S1109.

  As a result of the determination in step S1104, when the defective pixel is not a pixel in any one of the regions 2, 4, 6, and 8 in the image (NO in step S1104), the defective pixel is in the region 5 in the image. It is determined whether or not it is a pixel (step S1106).

  As a result of the determination in step S1106, when the defective pixel is a pixel in the region 5 in the image (YES in step S1106), the defect level of the defective pixel is determined (step S1107).

  Here, when the flag is 1 and the scratch level is equal to or higher than LEBEL1 / α, an affirmative determination is made, and when the flag is 1 and the scratch level is less than LEBEL1 / α, a negative determination is made. On the other hand, when the flag is 0 and the scratch level is LEVEL1 or higher, an affirmative determination is made, and when the flag is 1 and the scratch level is less than LEVEL1, a negative determination is made.

  If the result of determination in step S1107 is affirmative (YES in step S1107), the defective pixel is set as a correction target pixel, the address is read (step S1108), and the process proceeds to step S1109.

  On the other hand, when a negative determination is made as a result of the determination in step S1107 (NO in step S1107), the process proceeds to step S1109.

  If the result of the determination in step S1109 is that the defective pixel is not a pixel in the region 5 in the image (NO in step S1106), it is determined whether or not all flaw data scans have been completed (step S1109).

  As a result of the determination in step S1109, when all the scratch data scans are completed (YES in step S1109), this process is terminated, and when all the scratch data scans are not completed (NO in step S1109), the process proceeds to step S1101. Return. As described above, the specification of the correction target pixel in the captured image is completed.

  When the peripheral light amount correction is not performed, the scratch level is set to LEVEL1 in the entire region, and the same processing is performed. As described above, the second embodiment is an embodiment for correcting a defective pixel in a predetermined region of a captured image.

  As described above, even when a gain is applied to a specific area, the defect pixel can be corrected more preferably by setting a defect level to be corrected accordingly.

[Third Embodiment]
Since the configuration of the imaging apparatus in the third embodiment is the same as the configuration of the imaging apparatus in the first embodiment, the first embodiment will be used for explanation.

  In general, correction may be performed by applying gain to the output depending on the aperture value of the lens at the time of imaging. Therefore, it is preferable to change the flaw level to be corrected depending on the aperture value of the lens.

  In step S702 of FIG. 10 described above, the aperture value is also acquired when the lens condition is confirmed. A scratch correction level is obtained by multiplying the scratch correction level of each scratch level shown in FIG. 5 by a coefficient α in accordance with the aperture value.

  FIG. 12 is a table showing a scratch level coefficient β according to the aperture value (Av).

  FIG. 13 is a diagram showing a scratch level to which FIG. 12 is applied and a scratch correction level corresponding to the level.

  The table in FIG. 12 is a table showing the coefficient β corresponding to the aperture value. For example, when the aperture value Av at the time of imaging is 1.8, the coefficient β is 0.8. When this is multiplied by the scratch correction level in FIG. 5, the scratch correction level is as shown in FIG.

  As described above, the defect pixel can be corrected more preferably by setting the defect level to be corrected in consideration of the gain correction by the aperture value.

(Other embodiments)
The present invention is also realized by executing the following processing. That is, software (program) that realizes the functions of the above-described embodiments is supplied to a system or apparatus via a network or various storage media, and a computer (or CPU, MPU, etc.) of the system or apparatus reads the program code. It is a process to be executed. In this case, the program and the storage medium storing the program constitute the present invention.

DESCRIPTION OF SYMBOLS 1 Imaging device 14 Image pick-up element 20 Image processing circuit 30,52 Memory 42 Distance measurement control part 46 Photometry control part 48 Flash part 50 System control circuit 56 Non-volatile memory 62,64 Shutter switch

Claims (7)

An imaging device that obtains a captured image by imaging a subject with an imaging element via an optical member,
A first memory means for position and lack Ochiire defect information Bell and is associated in the captured image of defective pixels caused by the image pickup device is stored,
Second storage means storing setting information for setting a defect level threshold value of a defective pixel to be corrected for each area of the captured image according to a pupil distance or an aperture value of the optical member ;
Determining means for determining whether or not to correct each defective pixel by comparing the defect information stored in the first storage means with the setting information stored in the second storage means ;
An imaging apparatus comprising: correction means for correcting defective pixels determined to be corrected by the determination means. Wherein in the first storage means, the image pickup apparatus according to claim 1, wherein a plurality of defect information corresponding to an imaging condition is characterized in that it is stored. The missing Ochiire Bell imaging apparatus according to claim 1 or 2, wherein the determined in accordance with the output level of the defective pixel.   The imaging apparatus according to claim 1, wherein the defect information is acquired using the captured image. Wherein the correction means, the image pickup apparatus according to any one of claims 1 to 4, characterized in that to compensate for the defective pixel of a predetermined area of said captured image. With obtaining the captured image by the image pickup by the image pickup device through an optical member of an object, position and lack Ochiire defect information Bell and is associated in the captured image of defective pixels caused by the image pickup device is stored First setting means for storing the setting information for setting the threshold value of the defect level of the defective pixel to be corrected for each region of the captured image in accordance with the pupil distance or the aperture value of the optical member . Two storage means, and a control method of an imaging apparatus comprising:
A determination step for determining whether or not to correct each defective pixel by comparing the defect information stored in the first storage unit and the setting information stored in the second storage unit ;
And a correction step of correcting a defective pixel determined to be corrected by the determination step. With obtaining the captured image by the image pickup by the image pickup device through an optical member of an object, position and lack Ochiire defect information Bell and is associated in the captured image of defective pixels caused by the image pickup device is stored First setting means for storing the setting information for setting the threshold value of the defect level of the defective pixel to be corrected for each region of the captured image in accordance with the pupil distance or the aperture value of the optical member . A program for causing a computer to execute a control method of an imaging apparatus including two storage means,
The control method is:
A determination step for determining whether or not to correct each defective pixel by comparing the defect information stored in the first storage unit and the setting information stored in the second storage unit ;
And a correction step of correcting a defective pixel determined to be corrected by the determination step.

Images