JP5783715B2 - 検査用コンタクトプローブ - Google Patents
検査用コンタクトプローブ Download PDFInfo
- Publication number
- JP5783715B2 JP5783715B2 JP2010283342A JP2010283342A JP5783715B2 JP 5783715 B2 JP5783715 B2 JP 5783715B2 JP 2010283342 A JP2010283342 A JP 2010283342A JP 2010283342 A JP2010283342 A JP 2010283342A JP 5783715 B2 JP5783715 B2 JP 5783715B2
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- JP
- Japan
- Prior art keywords
- inspection
- contact probe
- contact
- cones
- solder ball
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000523 sample Substances 0.000 title claims description 44
- 238000007689 inspection Methods 0.000 title claims description 31
- 229910000679 solder Inorganic materials 0.000 claims description 42
- 230000001154 acute effect Effects 0.000 claims description 3
- 238000011990 functional testing Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Description
図1は本発明に係るコンタクトプローブを組み込んだ検査用ソケット1の部分断面図であって、コンタクトプローブ2はソケット本体10の中に格納されている。
(第2の実施形態)
図4は、本発明の第2の実施形態のコンタクトプローブの検査素子側導電部3の上面図(c)およびB−B断面図(d)である。
2…コンタクトプローブ
3…検査素子側導電部
4…プリント基板側導電部
5…ステム
6…バネ
10…ソケット本体
20…半田ボール
Claims (3)
- 検査対象素子の端子との接触面の内側に鋭角の頂部を有する複数の錐体が形成されている検査用コンタクトプローブであって、
前記検査対象素子の端子は所定の曲率を有する半田ボールであり、
前記錐体の頂部を結ぶ面が前記半田ボールの曲率に近い曲率の凹面を成し、前記複数の錐体が前記半田ボールに突き刺さる深さが一定であり、前記複数の錐体の各々は隣り合う他の錐体と一辺を共有する四角錐体であり、かつ前記半田ボール側から見た形状が前記半田ボールの半径と略同一の半径を有する円を形成していることを特徴とする検査用コンタクトプローブ。 - 前記錐体の数が、9以上である請求項1に記載の検査用コンタクトプローブ。
- 前記錐体の頂角が60度以下である請求項1または請求項2に記載の検査用コンタクトプローブ。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010283342A JP5783715B2 (ja) | 2010-12-20 | 2010-12-20 | 検査用コンタクトプローブ |
TW100140524A TWI529394B (zh) | 2010-12-20 | 2011-11-07 | Check the contact probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010283342A JP5783715B2 (ja) | 2010-12-20 | 2010-12-20 | 検査用コンタクトプローブ |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012132717A JP2012132717A (ja) | 2012-07-12 |
JP5783715B2 true JP5783715B2 (ja) | 2015-09-24 |
Family
ID=46648491
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010283342A Active JP5783715B2 (ja) | 2010-12-20 | 2010-12-20 | 検査用コンタクトプローブ |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5783715B2 (ja) |
TW (1) | TWI529394B (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10274517B2 (en) | 2016-02-15 | 2019-04-30 | Nhk Spring Co., Ltd. | Conductive probe for inspection and semiconductor inspection device |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101439343B1 (ko) | 2013-04-18 | 2014-09-16 | 주식회사 아이에스시 | 포고핀용 탐침부재 |
KR101439342B1 (ko) | 2013-04-18 | 2014-09-16 | 주식회사 아이에스시 | 포고핀용 탐침부재 |
KR101524471B1 (ko) * | 2013-12-12 | 2015-06-10 | 주식회사 아이에스시 | 포고핀용 탐침부재의 플런저 고정 방법 및 이러한 방법으로 제조된 포고핀 구조체 |
JP6084592B2 (ja) * | 2014-08-05 | 2017-02-22 | 株式会社アイエスシーIsc Co., Ltd. | ポゴピン用プローブ部材 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0323576Y2 (ja) * | 1986-02-27 | 1991-05-22 | ||
US5929521A (en) * | 1997-03-26 | 1999-07-27 | Micron Technology, Inc. | Projected contact structure for bumped semiconductor device and resulting articles and assemblies |
JP2000329789A (ja) * | 1999-03-12 | 2000-11-30 | Sony Chem Corp | 針状接点プローブ |
JP4480258B2 (ja) * | 2000-03-29 | 2010-06-16 | 株式会社日本マイクロニクス | 半導体デバイス検査装置における電気的接触装置 |
JP2007218675A (ja) * | 2006-02-15 | 2007-08-30 | Fujitsu Ltd | プローブ及びプローブの製造方法 |
JP2009198238A (ja) * | 2008-02-20 | 2009-09-03 | Totoku Electric Co Ltd | プローブ針及びその製造方法 |
-
2010
- 2010-12-20 JP JP2010283342A patent/JP5783715B2/ja active Active
-
2011
- 2011-11-07 TW TW100140524A patent/TWI529394B/zh active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10274517B2 (en) | 2016-02-15 | 2019-04-30 | Nhk Spring Co., Ltd. | Conductive probe for inspection and semiconductor inspection device |
Also Published As
Publication number | Publication date |
---|---|
TW201237422A (en) | 2012-09-16 |
TWI529394B (zh) | 2016-04-11 |
JP2012132717A (ja) | 2012-07-12 |
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