JP5745655B2 - Electrical test apparatus and electrical test method - Google Patents

Description

  The present invention relates to an electrical test apparatus and method, and more particularly, to an electrical test apparatus and an electrical test method that perform both open circuit check and inductance measurement.

  With the advancement of science and technology, electrical elements are becoming increasingly diverse. In order to ensure the quality of an electric element, generally, before shipment, various inspections and tests on the electric element are performed by a manufacturer. For example, an inductor, a motor, and a coil are electric elements having ordinary inductance characteristics, and a layer short test is usually performed at the time of quality inspection. This inter-layer withstand voltage test generally refers to a withstand voltage test between coils of the same set, finds an electrical element having an inductance characteristic that is already short-circuited or already defective, and a product in which this electrical element is disposed Avoid failure during use.

  However, in the process of actually performing the interlayer withstand voltage test, the spark discharge phenomenon has always occurred when the test is started in a state where the electrical element to be tested is not securely connected to the test apparatus. Frequent spark discharge shortens the service life of the test apparatus and easily breaks the jig connected to the electrical element to be tested. On the one hand, the phenomenon of spark discharge is also regarded as a source of interference that must be avoided because it is likely to interfere with the progress of other electrical tests.

  Note that there may be a slight difference in the inductance values of any two of the shipped electrical elements of the same lot. Therefore, when an interlayer withstand voltage test is performed at the same voltage, as a result, a detection error usually exists and it is not accurately known whether or not an electric element has failed. Therefore, in order to avoid breaking the test apparatus and to reduce the error in measuring the inductance value of the electrical element, the industry seeks an electrical test apparatus and method that combines open circuit inspection and inductance measurement.

  In view of this, the present invention provides an electrical test apparatus that first determines whether or not the device under test is already securely connected to the jig before performing the interlayer withstand voltage test procedure, and can reduce the phenomenon of spark discharge. To do. This electrical test apparatus first determines the inductance value of the device under test before providing the interlayer withstand voltage test procedure, provides an appropriate voltage for the interlayer withstand voltage test, and reduces the measurement error of the inductance value of the device under test. It can also be reduced.

  An embodiment of the present invention includes a resonant circuit module for coupling to a device under test, a resonant circuit module coupled to the resonant circuit module, having a first switch element, wherein the first switch element is off. A first power supply module that provides one voltage to the resonant circuit module; a second that couples to the resonant circuit module and provides a second voltage to the resonant circuit module when the first switch element is on A power supply module, a measurement module for coupling to the resonance circuit module and measuring an electrical signal generated at least when the resonance circuit module receives the first voltage, and the measurement module and the first power supply module A control module that couples and controls on or off of the first switch element by an electrical signal. To provide a device.

  In one embodiment of the present invention, the first voltage provided to the first power supply module is for performing a contact inspection test of the device under test, and the second voltage provided to the second power supply module. This voltage is for performing an interlayer withstand voltage test of the device under test. The control module calculates the inductance value of the device under test from the electrical signal and determines whether the inductance value is within a predetermined range. If the inductance value is within the predetermined range, the control module turns on the first switch element. The control module further couples to the second power supply module, and the second power supply module has a second switch element, and the second switch element is controlled by the control module to be connected to the second power supply module. Output voltage selectively. On the other hand, the control module can further adjust the magnitude of the second voltage in accordance with the magnitude of the inductance value.

  The present invention further provides an electrical test method that can first determine whether the device under test is already securely connected to the jig before performing the interlayer pressure test procedure, thereby reducing the phenomenon of spark discharge. The electrical test method first determines the inductance value of the device under test before performing the procedure of the interlayer withstand voltage test, provides an appropriate interlayer withstand voltage test voltage, and reduces the measurement error of the inductance value of the device under test. It can also be reduced.

  An embodiment of the present invention provides a first voltage to a resonant circuit module for coupling to a device under test when the first switch element is off, and the first switch element is on. At some point, providing a second voltage to the resonant circuit module; measuring an electrical signal generated when the resonant circuit module receives the first voltage; and turning on the first switch element by the electrical signal An electrical test method comprising: controlling off.

  In one embodiment of the present invention, controlling the on / off of the first switch element by an electrical signal calculates the inductance value of the device under test by the electrical signal, and the inductance value is within a predetermined range. And determining whether or not. When the inductance value is within the predetermined range, the first switch element is turned on. Furthermore, the magnitude of the second voltage can be correspondingly adjusted by the magnitude of the inductance value.

  In summary, the electrical test apparatus and method provided in the embodiments of the present invention are such that the device under test is already securely connected to the jig at a low voltage before performing the interlayer withstand voltage test procedure with a high voltage. You can test whether or not. Therefore, according to the present invention, it is possible to avoid the unexpected phenomenon of spark discharge by supplying a high voltage directly. The electrical test apparatus and method can also first determine the inductance value of the device under test before performing the procedure of the interlayer withstand voltage test. Depending on the magnitude of the detected inductance value, the voltage of the interlayer withstand voltage test is correspondingly adjusted to reduce the error of the interlayer withstand voltage test.

  The features and technical contents of the present invention will be further clarified with reference to the following detailed description of the present invention and the accompanying drawings, which are only for explaining the present invention. It is not intended to limit the scope of the claims of the present invention.

It is a functional block diagram which shows the electrical test apparatus by one Embodiment of this invention. It is a circuit schematic diagram which shows the electrical test apparatus by other one Embodiment of this invention. It is a flowchart figure which shows the electrical test method by one Embodiment of this invention. It is a flowchart figure of the electrical test method following FIG.

  FIG. 1 is a functional block diagram showing an electrical test apparatus according to an embodiment of the present invention. As shown in the figure, an electrical test apparatus 1 includes a resonant circuit module 10 for coupling to a device under test 20, a first power supply module 12, a second power supply module 14, and a measurement module 16. And a control module 18. The electrical test apparatus 1 can measure a single device under test 20 or can measure a plurality of devices under test 20 at the same time. That is, the device under test 20 is not necessarily fixed to the resonance circuit module 10. Not necessarily. By way of example, the resonant circuit module 10 has a corresponding test stage, jig or other suitable structure, and the device under test 20 is removably clamped to the structure of the test stage or jig. Or can be arranged. The device under test 20 may be an inductor, a motor, a coil, or other electrical element having inductance characteristics.

  The resonant circuit module 10 should have at least one capacitor. After the device under test 20 having inductance characteristics is coupled to the resonant circuit module 10, the capacitor and the device under test 20 are a set. It is regarded as an LC resonant circuit. Of course, in this embodiment, the circuit elements in the resonant circuit module 10 are not limited, and if the resonant circuit module 10 can constitute a set of resonant circuits with the device under test 20, normal knowledge in the technical field to which the present invention belongs is obtained. Those who have can freely design the resonant circuit module 10.

  The first power supply module 12 is coupled to the resonant circuit module 10 and has a first switch element (not shown in FIG. 1). When the first switch element is off, the first power supply module 12 selectively provides the first voltage to the resonant circuit module 10. For example, when the first switch element is off, the first power supply module 12 in the present embodiment may be in an on or off state, and the first voltage is increased depending on this state. Provide or do not provide (ie, provide selectively). Practically, the first voltage provided to the first power supply module 12 is an alternating voltage of about 1 V (volt), and is used for performing a contact inspection test of the device under test 20. In comparison, the first voltage is much smaller than the voltage used during the conventional interlayer withstand voltage test. That is, when the electrical test apparatus 1 tries to test the device under test 20, the first power supply module 12 first tests whether the device under test 20 is securely disposed in the resonant circuit module 10 with a small voltage. To do. Explaining in an actual example, even if the device under test 20 is not securely arranged in the resonant circuit module 10, the first voltage is very low, so that the phenomenon of spark discharge does not occur, and the test is performed. In addition to reducing the loss of the stage or jig, it is also possible to avoid interfering with other test procedures.

  It should be noted that the first power supply module 12 is separately controlled to be turned on or off by a user or equipment. In this embodiment, the first power supply module 12 is turned on or off. The driving state of the module 12 is not limited. The first switch element controls whether or not the first voltage is fed to the resonance circuit module 10, and in the present embodiment, the first voltage is not necessarily when the first switch element is off. It is not limited to output to. In other words, whether or not the first switch element is on is not necessarily related to whether or not the first power supply module 12 is on. Whether to output the first voltage can be freely selected.

  Of course, those having ordinary knowledge in the art of the present invention may design a similar circuit that outputs a first voltage when the first switch element is on. Therefore, the first switch element is for controlling whether the first power supply module 12 outputs the first voltage, or the first switch element applies the first voltage to the resonance circuit. Anything for controlling whether to feed the module 10 or any other equivalent or similar change should fall within the scope disclosed in the embodiments of the present invention.

  The second power supply module 14 is coupled to the resonant circuit module 10. When the first switch element is on, the second power supply module 14 selectively provides the second voltage to the resonant circuit module 10. By way of example, when the first switch element is on, the second power supply module 14 in this embodiment may be on or off, and this state provides the second voltage. Or do not provide (ie provide selectively). In practice, the second voltage provided to the second power supply module 14 may be 0-3 kV (kilovolts) or higher DC voltage. For example, the second power supply module 14 may supply a DC voltage of 3.5 kV, 4 kV, 4.5 kV, 5 kV, or other appropriate magnitude. Generally, the second voltage is for performing an interlayer withstand voltage test. As an actual example, the device under test 20 is tested by the first power supply module 12, and after confirming that the device under test 20 has already been correctly arranged in the resonant circuit module 10, the first device The switch element is switched to the on state, and stops feeding the first voltage to the resonance circuit module 10. Thereby, the Example of this invention can avoid that an interlayer pressure test receives the interference of a contact test. In one example, the second power supply module 14 may have a second switch element (not shown in FIG. 1), and the second switch element supplies the second voltage to the resonant circuit module 10. You can control whether or not to output.

  Similarly, the second power supply module 14 may be controlled to be turned on or off by a user or equipment. In this embodiment, the second power supply module 14 is turned on when the first switch element or the second switch element is turned on or off. The driving state of the second power supply module 14 is not limited. The second switch element controls whether or not the second voltage is fed to the resonance circuit module 10, and in the present embodiment, the second voltage is not necessarily the second switch element being on or off. There are no restrictions on outputting at certain times. In other words, whether or not the second switch element is on and whether or not the second power supply module 14 is on are not necessarily related to each other. Whether to output the second voltage can be freely selected.

  The measuring module 16 is coupled to the resonant circuit module 10 and is for measuring an electrical signal generated at least when the resonant circuit module 10 receives the first voltage. In practice, the measurement module 16 can be used to measure the electrical response when the resonant circuit module 10 and the device under test 20 receive the first voltage or the second voltage, and particularly the resonant circuit module 10 and the device under test. 20 is used to measure the electrical response that caused the resonance. In one example, the measurement module 16 can be coupled in parallel to the device under test 20, and the measurement module 16 may be a voltmeter or other suitable instrument.

  The control module 18 is coupled to at least the measurement module 16 and the first power supply module 12, and the control module 18 controls on / off of the first switch element according to an electrical signal measured by the measurement module 16. Practically, the control module 18 can calculate the inductance value of the device under test 20 based on this electrical signal and determine whether this inductance value is within a predetermined range. This predetermined range can be determined by deducting a certain percentage of error with reference to the inductance value attached when the device under test 20 is shipped, the percentage of error being 20% or other quality requirements. It may be a percentage to fill. Explaining with an actual example, when the error of the inductance value of the device under test 20 calculated by the control module 18 is too large (for example, 20% higher than the applied inductance value), the control module 18 is controlled by the device under test 20. Can be determined directly, and the inter-layer withstand voltage test is not performed. Conversely, when the inductance value of the device under test 20 calculated by the control module 18 is reliably within the predetermined range, the control module 18 turns on the first switch element and feeds the first voltage to the resonance circuit module 10. To stop doing. Subsequently, the control module 18 turns on the second switch element and feeds the second voltage to the resonance circuit module 10 to perform an interlayer withstand voltage test. In one example, the control module 18 can correspondingly adjust the magnitude of the second voltage according to the magnitude of the inductance value of the device under test 20. Thereby, even if the electrical test apparatus 1 of the Example of this invention tests the to-be-tested apparatus 20 different, the precision of an interlayer withstand voltage test can be maintained.

  FIG. 2 is a schematic circuit diagram showing an electrical test apparatus according to another embodiment of the present invention. As shown in FIG. 2, the resonant circuit module 30 in the electrical test apparatus includes resistors R1 and R2 and a capacitor C1, and the resistor R1 can be regarded as a current limiting resistor, and the capacitor C1 is regarded as a resonant capacitor. Can do. In other words, after the device under test 20 is coupled to the resonance circuit module 30, the capacitor C1 and the device under test 20 having inductance characteristics can be regarded as a set of LC resonance circuits, and are parallel to the device under test 20. The electrical signal is measured by the measuring module 36 that couples with each other. In addition, the 1st power supply module 32 in an electrical test apparatus is provided with the 1st power supply 320, the coupling coil 322, and 1st switch element S1. For example, the first power source 320 may be a facility that can supply an AC voltage. Subsequently, as can be seen from FIG. 2, when the first switch element S1 is open, both ends of the coupling coil 322 have a voltage difference (ie, the first voltage), and the coupling Coil 322 is coupled in series with capacitor C1. Thus, when the first switch element S1 is off, the first voltage is fed to the resonance circuit module 30, particularly the LC resonance circuit composed of the capacitor C1 and the device under test 20, and the contact inspection test is performed. It is possible. After the contact inspection test is completed, when the control module controls the first switch element S1 to be turned on, both ends of the coupling coil 322 are short-circuited and the first voltage is output. Stop and the first power supply module 32 eliminates interference with the next test.

  The second power supply module 34 in the electrical test apparatus includes a second power source 340, diodes 342 and 344 for rectifying and avoiding backflow, resistors R3 and R4, and a voltage provided to the second power source 340. Is provided with a capacitor C2 for generating a second voltage and a second switch element Q1. By way of example, the second power source 340 may be a normal rectifier circuit or other equipment that can supply a DC voltage. Here, although the control module is not shown in the electrical test apparatus of FIG. 2, the control module can control the first switch element S1 and the second switch element Q1. After the control module controls to turn on the first switch element S1, the control module can subsequently turn on the second switch element Q1 and feed the second voltage to the resonant circuit module 30. Then, an interlayer withstand voltage test is performed.

  In order to make a person having ordinary knowledge in the technical field to which the present invention pertains further understand the electrical test apparatus according to the embodiment of the present invention, the electrical test method according to the embodiment of the present invention will be further described below.

  Please refer to FIG. 2, FIG. 3 and FIG. FIG. 3 is a flowchart showing an electrical test method according to an embodiment of the present invention. FIG. 4 is a flowchart showing an electrical test method following FIG. As shown in the figure, in the step S40, when the contact inspection test is performed, the first voltage must be fed to the resonance circuit module 30, so the first switch element S1 is first turned off. Should. Subsequently, in step S <b> 42, the voltage difference (that is, the first voltage) at both ends of the coupling coil 322 is fed to the resonance circuit module 30. In step S44, the measurement module 36 measures the electrical signal after the first voltage of the resonance circuit module 30 is fed. In step S46, the control module can calculate the inductance value of the device under test 20 from this electrical signal. Subsequently, in step S48, the control module can further determine whether or not the inductance value is within a predetermined range (a constant error range). If the inductance value of the device under test 20 is not within the predetermined range, it means that the error of the inductance value of the device under test 20 is too large, and the device under test 20 should belong to a defective product, and the interlayer withstand voltage test is continued. Can not. If the inductance value of the device under test 20 is within the predetermined range, then in step S50, the control module turns on the first switch element S1 so that the first power supply module 32 avoids interference with the next test. (Close). It is worth mentioning that if the inductance value of the device under test 20 is within a predetermined range, it means that the device under test 20 has already been correctly arranged in the resonant circuit module 10, that is, a contact inspection test. It is recognized that

  Subsequently, in the process of the interlayer withstand voltage test, in step S52, it can be seen that the control module can first turn on the second switch element Q1. A person having ordinary knowledge in the technical field to which the present invention pertains first confirms that the capacitor C2 has already been charged under pressure before the second switch element Q1 is turned on, that is, the second switch element Q1 has already been charged. It can be seen that it should be ensured that the voltage can be output stably. In one example, the control module can further adjust the magnitude of the second voltage according to the previously calculated inductance value. Subsequently, in step S54, the second voltage is fed to the LC resonance circuit including the capacitor C1 and the device under test 20 through the resistor R1. Subsequently, in step S56, the measurement module 36 measures the electrical signal after the second voltage of the resonance circuit module 30 is fed. Subsequently, in step S58, the control module can determine whether the device under test 20 has passed the interlayer withstand voltage test.

  The electrical test apparatus and method provided in the embodiments of the present invention can first test whether the device under test is already securely connected to the jig at a low voltage before performing the high voltage interlayer withstand voltage test procedure. . Therefore, according to the present invention, it is possible to avoid a phenomenon of spark discharge unexpectedly by supplying a high voltage directly. This electrical test apparatus and method can also first determine the inductance value of the device under test before performing the procedure of the interlayer withstand voltage test. The voltage of the interlayer withstand voltage test is correspondingly adjusted according to the magnitude of the detected inductance value, and the error of the interlayer withstand voltage test is reduced.

Claims (8)

A resonant circuit module for coupling to the device under test;
An AC power source having a first terminal coupled to the resonant circuit module and a second terminal to be grounded, and a first switch element coupled in parallel to the AC power source, a first power supply module Ru coupling loop Goes to the resonant circuit module to provide a first voltage to the resonant circuit module when the first switching element is off,
A second power supply module that couples to the resonant circuit module and provides a second voltage to the resonant circuit module when the first switch element is on;
A measurement module for coupling to the resonant circuit module and measuring an electrical signal generated at least when the resonant circuit module receives the first voltage;
A control module coupled to at least the measurement module and the first power supply module, and controlling on or off of the first switch element by the electrical signal;
Equipped with a,
The control module calculates an inductance value of the device under test based on the electrical signal, determines whether the inductance value is within a predetermined range, and if the inductance value is within the predetermined range, the control module electrical test apparatus you turn on the first switching element.   The first voltage provided to the first power supply module is for performing a contact inspection test of the device under test, and the second voltage provided to the second power supply module is 2. The electrical test apparatus according to claim 1, wherein the electrical test apparatus is for performing an interlayer withstand voltage test of the device under test. The control module is further coupled to the second power supply module, and the second power supply module has a second switch element, and the second switch element is controlled by the control module. The electrical test apparatus according to claim 1 , wherein the second voltage is selectively output. 4. The electricity according to claim 3 , wherein the control module controls the first switch element to turn on, and then controls the second switch element to turn on to output the second voltage. 5. Test equipment. The electrical test apparatus according to claim 3 , wherein the control module correspondingly adjusts the magnitude of the second voltage according to the magnitude of the inductance value. A first switch element coupled in parallel to an AC power source having a first terminal coupled to a resonant circuit module for coupling to the device under test and a second terminal to be grounded is off. on one occasion, providing a first voltage to the resonant circuit module,
Providing a second voltage to the resonant circuit module when the first switch element is on;
Measuring an electrical signal generated when the resonant circuit module receives the first voltage;
Controlling on or off of the first switch element by the electrical signal;
Equipped with a,
Controlling on or off of the first switch element by the electrical signal,
Calculating an inductance value of the device under test according to the electrical signal;
Determining whether the inductance value is within a predetermined range;
Further comprising
If the inductance value is within the predetermined range, electrical test how to turn on the first switching element. Wherein the first voltage is used to perform the contact inspection testing of the device under test, and the second voltage according to claim 6 is used for performing inter-layer withstand voltage test of the device under test Electrical testing method. Controlling on or off of the first switch element by the electrical signal,
The electrical test method according to claim 6 , further comprising: correspondingly adjusting the magnitude of the second voltage according to the magnitude of the inductance value.

Images