JP5324744B2 - 付着装置及び方法 - Google Patents
付着装置及び方法 Download PDFInfo
- Publication number
- JP5324744B2 JP5324744B2 JP2006533061A JP2006533061A JP5324744B2 JP 5324744 B2 JP5324744 B2 JP 5324744B2 JP 2006533061 A JP2006533061 A JP 2006533061A JP 2006533061 A JP2006533061 A JP 2006533061A JP 5324744 B2 JP5324744 B2 JP 5324744B2
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- JP
- Japan
- Prior art keywords
- voltage
- targets
- target
- substrate
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 17
- 239000000758 substrate Substances 0.000 claims description 95
- 239000000463 material Substances 0.000 claims description 42
- 238000000151 deposition Methods 0.000 claims description 34
- 230000008021 deposition Effects 0.000 claims description 33
- 239000003990 capacitor Substances 0.000 claims description 19
- 238000004804 winding Methods 0.000 claims description 14
- 230000005684 electric field Effects 0.000 claims description 9
- 210000002381 plasma Anatomy 0.000 description 20
- 239000003989 dielectric material Substances 0.000 description 13
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 8
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 8
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 150000002500 ions Chemical class 0.000 description 7
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 6
- 230000007423 decrease Effects 0.000 description 6
- 239000001301 oxygen Substances 0.000 description 6
- 229910052760 oxygen Inorganic materials 0.000 description 6
- 239000007789 gas Substances 0.000 description 5
- 229910052786 argon Inorganic materials 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 239000004020 conductor Substances 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000005137 deposition process Methods 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- 239000013077 target material Substances 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 208000033999 Device damage Diseases 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- -1 argon cations Chemical class 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000007847 structural defect Effects 0.000 description 1
- 150000003482 tantalum compounds Chemical class 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
- C23C14/352—Sputtering by application of a magnetic field, e.g. magnetron sputtering using more than one target
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3444—Associated circuits
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/446,005 US7179350B2 (en) | 2003-05-23 | 2003-05-23 | Reactive sputtering of silicon nitride films by RF supported DC magnetron |
| US10/446,005 | 2003-05-23 | ||
| PCT/US2004/015115 WO2004107411A2 (en) | 2003-05-23 | 2004-05-12 | Deposition apparatus and method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007501333A JP2007501333A (ja) | 2007-01-25 |
| JP2007501333A5 JP2007501333A5 (https=) | 2007-08-02 |
| JP5324744B2 true JP5324744B2 (ja) | 2013-10-23 |
Family
ID=33450968
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006533061A Expired - Fee Related JP5324744B2 (ja) | 2003-05-23 | 2004-05-12 | 付着装置及び方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7179350B2 (https=) |
| EP (1) | EP1634317A2 (https=) |
| JP (1) | JP5324744B2 (https=) |
| TW (1) | TW200502426A (https=) |
| WO (1) | WO2004107411A2 (https=) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7758982B2 (en) * | 2005-09-02 | 2010-07-20 | Hitachi Global Storage Technologies Netherlands B.V. | SiN overcoat for perpendicular magnetic recording media |
| US7517437B2 (en) * | 2006-03-29 | 2009-04-14 | Applied Materials, Inc. | RF powered target for increasing deposition uniformity in sputtering systems |
| US20080083611A1 (en) * | 2006-10-06 | 2008-04-10 | Tegal Corporation | High-adhesive backside metallization |
| US20090246385A1 (en) * | 2008-03-25 | 2009-10-01 | Tegal Corporation | Control of crystal orientation and stress in sputter deposited thin films |
| US8808513B2 (en) * | 2008-03-25 | 2014-08-19 | Oem Group, Inc | Stress adjustment in reactive sputtering |
| US8482375B2 (en) * | 2009-05-24 | 2013-07-09 | Oem Group, Inc. | Sputter deposition of cermet resistor films with low temperature coefficient of resistance |
| GB2473655A (en) * | 2009-09-21 | 2011-03-23 | Mantis Deposition Ltd | Magnetron sputtering techiques and apparatus |
| WO2012095961A1 (ja) * | 2011-01-12 | 2012-07-19 | 日新電機株式会社 | プラズマ装置 |
| US20170178878A1 (en) | 2015-12-21 | 2017-06-22 | IonQuest LLC | Electrically and Magnetically Enhanced Ionized Physical Vapor Deposition Unbalanced Sputtering Source |
| US11359274B2 (en) | 2015-12-21 | 2022-06-14 | IonQuestCorp. | Electrically and magnetically enhanced ionized physical vapor deposition unbalanced sputtering source |
| US12217949B2 (en) | 2015-12-21 | 2025-02-04 | Ionquest Corp. | Magnetically enhanced high density plasma-chemical vapor deposition plasma source for depositing diamond and diamond-like films |
| US11823859B2 (en) * | 2016-09-09 | 2023-11-21 | Ionquest Corp. | Sputtering a layer on a substrate using a high-energy density plasma magnetron |
| US20210230739A1 (en) * | 2020-01-27 | 2021-07-29 | Applied Materials, Inc. | Physical Vapor Deposition Apparatus And Methods With Gradient Thickness Target |
| CN116155231A (zh) * | 2023-02-28 | 2023-05-23 | 苏州敏声新技术有限公司 | 一种体声波谐振器及其制备方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63230872A (ja) * | 1984-05-17 | 1988-09-27 | バリアン・アソシエイツ・インコ−ポレイテツド | タ−ゲツト及び磁気的に強められたr.f.バイアスを分離する分離制限磁場を有するマグネトロン・スパツタ装置 |
| US4661228A (en) * | 1984-05-17 | 1987-04-28 | Varian Associates, Inc. | Apparatus and method for manufacturing planarized aluminum films |
| JPH01116068A (ja) * | 1987-10-28 | 1989-05-09 | Hitachi Ltd | バイアススパッタ装置 |
| US4810347A (en) | 1988-03-21 | 1989-03-07 | Eaton Corporation | Penning type cathode for sputter coating |
| JPH02225662A (ja) * | 1989-02-27 | 1990-09-07 | Tokuda Seisakusho Ltd | スパッタ装置 |
| DE4127262C1 (en) | 1991-08-17 | 1992-06-04 | Forschungsges Elektronenstrahl | Sputtering equipment for coating large substrates with (non)ferromagnetic material - consisting of two sub-targets electrically isolated and cooling plates whose gap in between is that in region of pole units |
| US5415757A (en) * | 1991-11-26 | 1995-05-16 | Leybold Aktiengesellschaft | Apparatus for coating a substrate with electrically nonconductive coatings |
| DE19848636C2 (de) * | 1998-10-22 | 2001-07-26 | Fraunhofer Ges Forschung | Verfahren zur Überwachung einer Wechselspannungs-Entladung an einer Doppelelektrode |
| JP2001003166A (ja) * | 1999-04-23 | 2001-01-09 | Nippon Sheet Glass Co Ltd | 基体表面に被膜を被覆する方法およびその方法による基体 |
| EP1235947A4 (en) | 1999-10-15 | 2009-04-15 | Advanced Energy Ind Inc | METHOD AND DEVICE FOR POLARIZING SUBSTRATE IN MULTIPLE ELECTRODE SPUTTERING SYSTEMS |
| US6824653B2 (en) * | 2003-02-21 | 2004-11-30 | Agilent Technologies, Inc | Magnetron with controlled DC power |
-
2003
- 2003-05-23 US US10/446,005 patent/US7179350B2/en not_active Expired - Lifetime
-
2004
- 2004-05-12 WO PCT/US2004/015115 patent/WO2004107411A2/en not_active Ceased
- 2004-05-12 JP JP2006533061A patent/JP5324744B2/ja not_active Expired - Fee Related
- 2004-05-12 EP EP04752195A patent/EP1634317A2/en not_active Withdrawn
- 2004-05-20 TW TW093114246A patent/TW200502426A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| US7179350B2 (en) | 2007-02-20 |
| US20040231972A1 (en) | 2004-11-25 |
| WO2004107411A3 (en) | 2005-12-29 |
| WO2004107411A2 (en) | 2004-12-09 |
| TW200502426A (en) | 2005-01-16 |
| JP2007501333A (ja) | 2007-01-25 |
| EP1634317A2 (en) | 2006-03-15 |
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