JP5127637B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP5127637B2
JP5127637B2 JP2008222644A JP2008222644A JP5127637B2 JP 5127637 B2 JP5127637 B2 JP 5127637B2 JP 2008222644 A JP2008222644 A JP 2008222644A JP 2008222644 A JP2008222644 A JP 2008222644A JP 5127637 B2 JP5127637 B2 JP 5127637B2
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Japan
Prior art keywords
reagent
probe
measurement target
measurement
liquid level
Prior art date
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JP2008222644A
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English (en)
Japanese (ja)
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JP2010054476A5 (https=
JP2010054476A (ja
Inventor
美智男 熊田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Canon Medical Systems Corp
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Toshiba Corp
Toshiba Medical Systems Corp
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Priority to JP2008222644A priority Critical patent/JP5127637B2/ja
Publication of JP2010054476A publication Critical patent/JP2010054476A/ja
Publication of JP2010054476A5 publication Critical patent/JP2010054476A5/ja
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JP2008222644A 2008-08-29 2008-08-29 自動分析装置 Active JP5127637B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008222644A JP5127637B2 (ja) 2008-08-29 2008-08-29 自動分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008222644A JP5127637B2 (ja) 2008-08-29 2008-08-29 自動分析装置

Publications (3)

Publication Number Publication Date
JP2010054476A JP2010054476A (ja) 2010-03-11
JP2010054476A5 JP2010054476A5 (https=) 2011-10-13
JP5127637B2 true JP5127637B2 (ja) 2013-01-23

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ID=42070547

Family Applications (1)

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JP2008222644A Active JP5127637B2 (ja) 2008-08-29 2008-08-29 自動分析装置

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JP (1) JP5127637B2 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011203115A (ja) * 2010-03-25 2011-10-13 Sysmex Corp 試料分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2692413B2 (ja) * 1991-04-26 1997-12-17 株式会社日立製作所 自動分析装置およびそれに用いる試薬取扱方法
JPH0666813A (ja) * 1992-08-17 1994-03-11 Toshiba Corp 自動分析装置
JP3063564B2 (ja) * 1995-03-17 2000-07-12 株式会社日立製作所 自動分析装置
JP2000321283A (ja) * 1999-05-13 2000-11-24 Toshiba Corp 自動分析装置
JP4068772B2 (ja) * 1999-11-05 2008-03-26 株式会社堀場製作所 自動分析装置
JP3779613B2 (ja) * 2001-12-26 2006-05-31 株式会社東芝 自動化学分析装置及び試薬間干渉情報提供装置

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JP2010054476A (ja) 2010-03-11

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