JP4990034B2 - Shift register circuit and image display apparatus including the same - Google Patents

Shift register circuit and image display apparatus including the same Download PDF

Info

Publication number
JP4990034B2
JP4990034B2 JP2007153434A JP2007153434A JP4990034B2 JP 4990034 B2 JP4990034 B2 JP 4990034B2 JP 2007153434 A JP2007153434 A JP 2007153434A JP 2007153434 A JP2007153434 A JP 2007153434A JP 4990034 B2 JP4990034 B2 JP 4990034B2
Authority
JP
Japan
Prior art keywords
shift register
transistor
terminal
node
register circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2007153434A
Other languages
Japanese (ja)
Other versions
JP2008112550A (en
Inventor
洋一 飛田
Original Assignee
三菱電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2006271555 priority Critical
Priority to JP2006271555 priority
Application filed by 三菱電機株式会社 filed Critical 三菱電機株式会社
Priority to JP2007153434A priority patent/JP4990034B2/en
Publication of JP2008112550A publication Critical patent/JP2008112550A/en
Application granted granted Critical
Publication of JP4990034B2 publication Critical patent/JP4990034B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C19/00Digital stores in which the information is moved stepwise, e.g. shift register stack stores, push-down stores
    • G11C19/28Digital stores in which the information is moved stepwise, e.g. shift register stack stores, push-down stores using semiconductor elements

Abstract

A high-speed shift register circuit is provided. The shift register circuit includes a first transistor supplying a clock signal to a first output terminal, a second transistor discharging the first output terminal, a third transistor supplying the above clock signal to a second output terminal, and a fourth transistor discharging the second output terminal. The gates of the first and third transistors are both connected to a first node, and the gates of the second and fourth transistors are both connected to a second node. The first node is charged by a fifth transistor which is connected between the first node and a first input terminal and which has a gate connected to a second input end.

Description

  The present invention relates to a shift register circuit, and more particularly to a shift register circuit composed of only field effect transistors of the same conductivity type used in, for example, a scanning line driving circuit of an image display device.

  In an image display device such as a liquid crystal display device (hereinafter “display device”), a gate line (scanning line) is provided for each pixel row (pixel line) of a display panel in which a plurality of pixels are arranged in a matrix, and a display signal is displayed. The display image is updated by sequentially selecting and driving the gate lines in the period of one horizontal period. As such a gate line driving circuit (scanning line driving circuit) for sequentially selecting and driving pixel lines, that is, gate lines, a multistage shift register that performs a shift operation that makes a round in one frame period of a display signal is used. Can do.

  The shift register used in the gate line driver circuit is preferably composed of only field effect transistors of the same conductivity type in order to reduce the number of steps in the manufacturing process of the display device. For this reason, various shift registers composed only of N-type or P-type field effect transistors and display devices equipped with the shift registers have been proposed (for example, Patent Documents 1-4). As the field effect transistor, a MOS (Metal Oxide Semiconductor) transistor, a thin film transistor (TFT), or the like is used.

  In addition, a multistage shift register used as a gate line driving circuit is configured by cascading a plurality of shift register circuits provided for each pixel line, that is, for each gate line. In this specification, for convenience of explanation, each of a plurality of shift register circuits constituting a gate line driving circuit (multistage shift register) is referred to as a “unit shift register”.

JP-A-8-87897 Japanese National Patent Publication No. 10-500343 JP 2001-52494 A JP 2002-133890 A JP 2006-24350 A

  As shown in Patent Documents 1-4 (and FIG. 3 of this specification), a conventional unit shift register is a transistor connected between a clock terminal and an output terminal (hereinafter, “output pull-up transistor”). (Transistor Q1 in FIG. 3). The output signal of the unit shift register is output (activated) when its output pull-up transistor is turned on and the clock signal input to the clock terminal is transmitted to the output terminal.

  Therefore, in order to increase the operation speed of the unit shift register, it is necessary that the output signal rise and fall speed (level transition speed) be high. To do so, it is only necessary to increase the drive capability (capability of flowing current) of the output pull-up transistor at the time of signal output. One method is to widen the channel width of the output pull-up transistor, but this involves the problem that the circuit formation area increases.

  Another method for increasing the drive capability of the output pull-up transistor is to keep the gate-source voltage of the output pull-up transistor high even during signal output. Since the source of the output pull-up transistor is connected to the output terminal, the source potential rises when a signal is output.At this time, the gate potential is also boosted by capacitive coupling via the gate-channel capacitance. The gate-source voltage during this period is almost maintained. In other words, in order to increase the gate-source voltage of the output pull-up transistor at the time of signal output, the gate potential of the output pull-up transistor must be sufficiently increased before the signal is output (before the clock signal is input). It needs to be high. For this purpose, it is effective to charge (precharge) the gate electrode at high speed.

  In the unit shift register of Patent Documents 1-4, a diode-connected transistor (hereinafter referred to as “charging transistor”) is connected to the gate electrode of the output pull-up transistor. The gate electrode of the output pull-up transistor is charged by supplying the output signal of the previous unit shift register through this charging transistor.

  However, when the shift register is used as a gate line driving circuit, the rising speed of the output signal is slowed because a gate line that is a large capacitive load is connected to the output terminal of the unit shift register. As a result, the charging speed of the gate electrode of the output pull-up transistor of each unit shift register decreases. As a result, it is difficult to increase the operation speed of each unit shift register, and it is difficult to increase the operation speed of the gate line driving circuit.

  The charging transistor operates in the source follower mode when the gate electrode of the output pull-up transistor is charged. That is, as the charging progresses, the voltage between the gate and the source of the charging transistor becomes smaller, the driving ability is lowered, and the charging speed is lowered. In particular, when the rising speed of the output signal of each unit shift register becomes slow due to the influence of a large capacitive load such as a gate line, the charging transistor is operated in the source follower mode from the initial stage of the charging process. Therefore, the decrease in charging speed becomes significant. This is also a factor that hinders the speeding up of the operation of the gate line driving circuit.

  The present invention has been made to solve the above problems, and in a shift register used in a gate line driving circuit or the like, the charge of the gate electrode of the output pull-up transistor is speeded up, whereby the shift register can be operated at high speed. The purpose is to make it possible.

The shift register circuit according to the present invention is a multi-stage shift register circuit, and each stage of the shift register circuit is connected to the first and second input terminals, the first and second output terminals, and the first clock terminal. A first transistor that supplies an input first clock signal to the first output terminal; a second transistor that discharges the first output terminal; and a third transistor that supplies the clock signal to the second output terminal; And a fourth transistor for discharging the second output terminal, wherein the control electrodes of the first and third transistors are both connected to the first node, and the second and fourth transistors are connected to each other. The control electrodes are both connected to the second node, and the shift register circuit is connected between the first node and the first input terminal and connected to the second input terminal. A fifth transistor having a control electrode, a control electrode connected to a predetermined reset terminal, and a sixth transistor for discharging said first node, in each stage, the first input terminal, itself The first input terminal is connected to the first output terminal, and the second input terminal is connected to the second output terminal of the previous stage .

  According to the shift register circuit of the present invention, the input signal whose level transition is faster than the input signal to the first input terminal is input to the second input terminal, so that the fifth stage is charged at the initial stage of the charging process of the node N1. The transistor can be operated in a non-saturation region, and the node N1 can be charged at high speed and high potential. As a result, the driving capability of the first and third transistors is improved, and the effect of increasing the speed of level transition of the output signals from the first and second output terminals is obtained.

  Furthermore, by connecting different loads to the first and second output terminals, the level transition speeds of the output signals from the first and second output terminals are different from each other. When a plurality of the shift register circuits are connected in cascade, the higher-level one of the output signals of the first and second output terminals is input to the second input terminal of the next stage, and the other is input to the second stage of the next stage. If the signal is input to one input terminal, the above-described effect can be obtained in each of the plurality of cascade-connected shift register circuits.

  Embodiments of the present invention will be described below with reference to the drawings. In addition, in order to avoid duplication and redundant description, elements having the same or corresponding functions are denoted by the same reference symbols in the respective drawings.

<Embodiment 1>
FIG. 1 is a schematic block diagram showing a configuration of a display device according to Embodiment 1 of the present invention, and shows an overall configuration of a liquid crystal display device 10 as a representative example of the display device.

  The liquid crystal display device 10 includes a liquid crystal array unit 20, a gate line driving circuit (scanning line driving circuit) 30, and a source driver 40. As will be apparent from the following description, the shift register according to the embodiment of the present invention is mounted on the gate line driving circuit 30.

The liquid crystal array unit 20 includes a plurality of pixels 25 arranged in a matrix. Each of the pixel rows (hereinafter also referred to as “pixel lines”) is provided with a gate line GL 1 , GL 2 ... (Generically referred to as “gate line GL”). Are also provided with data lines DL 1 , DL 2 ... (Generic name “data line DL”). FIG. 1 representatively shows the pixels 25 in the first and second columns of the first row, and the corresponding gate lines GL 1 and data lines DL 1 and DL 2 .

  Each pixel 25 includes a pixel switch element 26 provided between the corresponding data line DL and the pixel node Np, a capacitor 27 and a liquid crystal display element 28 connected in parallel between the pixel node Np and the common electrode node NC. have. The orientation of the liquid crystal in the liquid crystal display element 28 changes according to the voltage difference between the pixel node Np and the common electrode node NC, and the display brightness of the liquid crystal display element 28 changes in response to this. Thereby, the luminance of each pixel can be controlled by the display voltage transmitted to the pixel node Np via the data line DL and the pixel switch element 26. That is, by applying an intermediate voltage difference between the voltage difference corresponding to the maximum luminance and the voltage difference corresponding to the minimum luminance between the pixel node Np and the common electrode node NC, the intermediate luminance is reduced. Can be obtained. Therefore, gradation brightness can be obtained by setting the display voltage stepwise.

  The gate line driving circuit 30 sequentially selects and drives the gate lines GL based on a predetermined scanning cycle. The gate electrodes of the pixel switch elements 26 are connected to the corresponding gate lines GL. While a specific gate line GL is selected, the pixel switch element 26 is in a conductive state in each pixel connected thereto, and the pixel node Np is connected to the corresponding data line DL. The display voltage transmitted to the pixel node Np is held by the capacitor 27. In general, the pixel switch element 26 includes a TFT formed on the same insulator substrate (glass substrate, resin substrate, etc.) as the liquid crystal display element 28.

The source driver 40 is for outputting a display voltage, which is set stepwise by a display signal SIG that is an N-bit digital signal, to the data line DL. Here, as an example, the display signal SIG is a 6-bit signal and is composed of display signal bits DB0 to DB5. Based on the 6-bit display signal SIG, 2 6 = 64 gradation display is possible in each pixel. Furthermore, if one color display unit is formed by three pixels of R (Red), G (Green), and B (Blue), approximately 260,000 colors can be displayed.

  As shown in FIG. 1, the source driver 40 includes a shift register 50, data latch circuits 52 and 54, a gradation voltage generation circuit 60, a decode circuit 70, and an analog amplifier 80.

  In the display signal SIG, display signal bits DB0 to DB5 corresponding to the display brightness of each pixel 25 are serially generated. That is, the display signal bits DB0 to DB5 at each timing indicate the display luminance in any one pixel 25 in the liquid crystal array unit 20.

  The shift register 50 instructs the data latch circuit 52 to take in the display signal bits DB0 to DB5 at a timing synchronized with the cycle at which the setting of the display signal SIG is switched. The data latch circuit 52 sequentially takes in the serially generated display signal SIG and holds the display signal SIG for one pixel line.

  The latch signal LT input to the data latch circuit 54 is activated at the timing when the display signal SIG for one pixel line is taken into the data latch circuit 52. In response thereto, the data latch circuit 54 takes in the display signal SIG for one pixel line held in the data latch circuit 52 at that time.

  The gradation voltage generation circuit 60 is composed of 63 voltage dividing resistors connected in series between the high voltage VDH and the low voltage VDL, and generates 64 gradation voltages V1 to V64, respectively.

The decode circuit 70 decodes the display signal SIG held in the data latch circuit 54 and outputs it to each of the decode output nodes Nd 1 , Nd 2 ... (Generic name “decode output node Nd”) based on the decode result. The voltage to be selected is selected from the gradation voltages V1 to V64 and output.

As a result, at the decode output node Nd, a display voltage (one of the gradation voltages V1 to V64) corresponding to the display signal SIG for one pixel line held in the data latch circuit 54 is simultaneously (in parallel). ) Is output. In FIG. 1, the decode output nodes Nd 1 and Nd 2 corresponding to the data lines DL 1 and DL 2 in the first column and the second column are representatively shown.

The analog amplifier 80 outputs analog voltages corresponding to the display voltages output from the decode circuit 70 to the decode output nodes Nd 1 , Nd 2 ... To the data lines DL 1 , DL 2 .

The source driver 40 repeatedly outputs a display voltage corresponding to a series of display signals SIG to the data line DL for each pixel line based on a predetermined scanning cycle, and the gate line driving circuit 30 is synchronized with the scanning cycle. By sequentially driving the gate lines GL 1 , GL 2 ..., An image is displayed on the liquid crystal array unit 20 based on the display signal SIG.

  1 illustrates the configuration of the liquid crystal display device 10 in which the gate line driving circuit 30 and the source driver 40 are integrally formed with the liquid crystal array unit 20, the gate line driving circuit 30 and the source driver 40 are illustrated. It is also possible to provide as an external circuit of the liquid crystal array unit 20.

Here, in order to facilitate the description of the present invention, a conventional gate line driving circuit 30 using a shift register will be described. FIG. 2 is a diagram showing a configuration of a conventional gate line driving circuit 30. As shown in FIG. The gate line driving circuit 30 is composed of a shift register composed of a plurality of unit shift registers SR 1 , SR 2 , SR 3 , SR 4 ... Connected in cascade (cascade connection) (hereinafter referred to as unit shift register). SR 1 , SR 2 ... Are collectively referred to as “unit shift register SR”). One unit shift register SR is provided for each pixel line, that is, for each gate line GL.

  The clock generator 31 shown in FIG. 2 inputs two-phase clock signals CLK and / CLK having different phases to the unit shift register SR of the gate line driving circuit 30. These clock signals CLK and / CLK are controlled so as to be sequentially activated at a timing synchronized with the scanning period of the display device. That is, the clock signals CLK and / CLK are complementary signals.

Each unit shift register SR has an input terminal IN, an output terminal OUT, a reset terminal RST, and a clock terminal CK. As shown in FIG. 2, one of the clock signals CLK and / CLK output from the clock generator 31 is supplied to the clock terminal CK of each unit shift register SR. A gate line GL is connected to each output terminal OUT of the unit shift register SR. That is, signals G 1 , G 2 , G 3 ,... (Hereinafter collectively referred to as “output signal G”) output to the output terminal OUT are horizontal (or vertical) scanning pulses for activating the gate line GL. It becomes.

The input terminal IN of the unit shift register SR 1 of the first stage (first stage), a start pulse SP corresponding to the head of each frame period of the image signal is input. The output signal G of the preceding stage is input to the input terminal IN of the second and subsequent unit shift registers SR. That is, the input terminal IN of the second and subsequent unit shift registers SR is connected to the output terminal OUT of the preceding unit shift register SR. Further, the reset terminal RST of each unit shift register SR is connected to the output terminal OUT of the subsequent stage (the next stage in this example).

  In the gate line driving circuit 30 having this configuration, each unit shift register SR is synchronized with the clock signals CLK and / CLK while temporally shifting the signal input from the previous stage (the output signal G of the previous stage). The data is transmitted to the corresponding gate line GL and the next unit shift register SR (details of the operation of the unit shift register SR will be described later). As a result, the series of unit shift registers SR function as a so-called gate line driving unit that sequentially activates the gate lines GL at a timing based on a predetermined scanning cycle.

  FIG. 3 is a circuit diagram showing an example of the configuration of a conventional unit shift register SR. In the gate line driving circuit 30, the configuration of each unit shift register SR connected in cascade is substantially the same, and therefore only the configuration of one unit shift register SR will be representatively described below. Further, all the transistors constituting the unit shift register SR are field effect transistors of the same conductivity type, but here all of them are assumed to be N-type TFTs. In the case of an N-type TFT, the gate is activated (on) at the H (High) level and deactivated (off) at the L (Low) level. In the case of a P-type transistor, the reverse is true.

  As shown in FIG. 3, the conventional unit shift register SR is supplied with the low-potential-side power supply potential VSS in addition to the input terminal IN, output terminal OUT, reset terminal RST, and clock terminal CK already shown in FIG. It has a power supply terminal S1. In the following description, the low-potential-side power supply potential VSS is the reference potential (= 0V) of the circuit. However, in actual use, the reference potential is set based on the voltage of data written to the pixel. VSS is set to -12V or the like.

  In the conventional unit shift register SR shown in FIG. 3, the transistor Q1 is an output pull-up transistor that supplies a clock signal input to the clock terminal CK to the output terminal OUT. The transistor Q2 is an output pull-down transistor that discharges the output terminal OUT by supplying the potential (VSS) of the first power supply terminal S1 to the output terminal OUT. Here, the gate node of the transistor Q1 is defined as “node N1”, and the gate node of the transistor Q2 is defined as “node N2”.

  A capacitive element C1 is provided between the gate and source of the transistor Q1, that is, between the node N1 and the output terminal OUT. The capacitive element C1 is for enhancing the boosting effect of the node N1 accompanying the increase in the level of the output terminal OUT.

  A diode-connected transistor Q3 connected between the node N1 and the input terminal IN is a charging transistor of the node N1. The transistor Q4 is connected between the node N1 and the first power supply terminal S1, and discharges the node N1 by supplying the potential of the first power supply terminal S1 to the node N1. The gate of the transistor Q4 is connected to the reset terminal RST. In this example, the node N2 is also connected to the reset terminal RST.

  The conventional gate line driving circuit 30 is configured by cascading unit shift registers SR of FIG. 3 as shown in FIG. The operation of the conventional unit shift register SR will be described below assuming that the unit shift register SR is used in the gate line driving circuit 30.

As described above, since the configuration of each unit shift register SR constituting the gate line driving circuit 30 is substantially the same, here, the operation of the n-th unit shift register SR n will be representatively described. . Figure 4 is a timing diagram illustrating the operation of the unit shift register SR n.

Here, for simplicity, a description assuming that the clock signal CLK is input to the clock terminal CK of the unit shift register SR n. Further, an output signal G from the output terminal OUT of the i-th unit shift register SR i is represented by a symbol G i . Further, it is assumed that the potential levels of the clock signals CLK and / CLK at the H level (hereinafter simply referred to as “level”) are equal to each other, and the value is VDD. Further, it is assumed that the threshold voltages of the transistors constituting the unit shift register SR are all equal, and the value is Vth.

Referring to FIG. 4, first, as an initial state at time t 0 , node N1 of unit shift register SR n is at L level (VSS) (hereinafter, the state where node N1 is at L level is referred to as “reset state”). ). Also the output signal G n-1 of the preceding unit shift register SR n-1 and the output signal G n + 1 of the next stage unit shift register SR n + 1, is at the L level. In this case, since the transistors Q1, Q2 of the unit shift register SR n are both off, the output terminal OUT is in the floating state, in this initial state and the output signal G n is at L level.

When the output signal G n-1 of the previous stage becomes H level at time t 1 when the clock signal / CLK changes to H level, the transistor Q3 of the unit shift register SR n is turned on, the node N1 is charged, and H level (VDD) −Vth) (hereinafter, a state in which the node N1 is at the H level is referred to as a “set state”). Thereby, the transistor Q1 is turned on. However, since the clock signal CLK is at the L level (VSS) at this time, the output signal G n maintains the L level.

When at time t 2 falls clock signal / CLK, becomes the preceding stage output signal G n-1 is also L level, the transistor Q3 is turned off, the transistor Q4 also remains off, the level of the node N1 is floating At H level (VDD-Vth).

When the clock signal CLK rises at time t 3 , the level of the output terminal OUT (output signal G n ) begins to rise because the transistor Q1 is on and the transistor Q2 is off. At this time, the node N1 is boosted by the coupling via the gate-channel capacitance of the transistor Q1 and the capacitive element C1. Therefore, the transistor Q1 operates in the non-saturated region, and the level of the output signal G n becomes H level (VDD) without any voltage loss corresponding to the threshold voltage Vth of the transistor Q1. As a result, the level of the node N1 rises to approximately 2 × VDD−Vth.

When the output signal G n becomes H level, it is input to the input terminal IN of the next unit shift register SR n + 1 , so that the transistor Q3 is turned on in the unit shift register SR n + 1 . Therefore, at time t 3 , the node N1 of the unit shift register SR n + 1 is charged to VDD−Vth.

When at time t 4 falls clock signal CLK, the also lowered the level of the output signal G n of the unit shift register SR. At this time, the level of the node N1 also decreases and decreases to VDD-Vth due to coupling through the capacitance C1 and the gate-channel capacitance of the transistor Q1. However, even in that case, since the transistor Q1 is kept on, the output signal Gn follows the clock signal CLK and falls to VSS and becomes L level.

When the clock signal / CLK rises at time t 5 , the node N1 is boosted in the next unit shift register SR n + 1 and the output signal G n + 1 becomes H level (VDD). As a result, the reset terminal RST of the unit shift register SR n becomes H level. Accordingly, since transistor Q4 is turned on, node N1 is discharged to L level, and transistor Q1 is turned off. That is, the unit shift register SR n returns to the reset state. Since the reset terminal RST is also connected to the gate (node N2) of the transistor Q2, the transistor Q2 is turned on and the output signal Gn is reliably set to VSS.

When the clock signal / CLK becomes L level at time t 6, since the next-stage output signal G n + 1 becomes L level, the reset terminal RST of the unit shift register SR n becomes L level. As a result, the transistors Q2, Q4 are turned off, the unit shift register SR n returns to the initial state (state at time t 0).

In summary, in the unit shift register SR n , the node N1 is in the L level reset state while the signal (the previous stage output signal G n−1 or the start pulse SP) is not input to the input terminal IN. Since the transistor Q1 is off in the set state, the output signal G is maintained at the L level regardless of the level of the clock signal CLK. When a signal is input to the input terminal IN, the node N1 is set to the H level. In the set state, the transistor Q1 is on, and the transistor Q2 is off at this time, so that the output signal G is output in response to the clock signal CLK becoming H level. Thereafter, when the signal of the reset terminal RST (the next stage gate line drive signal G n + 1 ) is input, the transistor Q1 is turned off by returning to the reset state, so that the output signal G n is maintained at the L level. become.

According to the multi-stage shift register (gate line driving circuit 30) in which the plurality of unit shift registers SR operating in this manner are cascaded as shown in FIG. 2, the start pulse SP is added to the first stage unit shift register SR 1. Is input, and the output signal G is sequentially transmitted to the unit shift registers SR 2 , SR 3 ... While being shifted at a timing synchronized with the clock signals CLK, / CLK. As a result, the gate line driving circuit 30 can sequentially drive the gate lines GL 1 , GL 2 , GL 3 ... With a predetermined scanning cycle.

  Hereinafter, a shift register circuit according to the present invention capable of operating at higher speed than the conventional shift register circuit as shown in FIG. 3 will be described. FIG. 5 is a circuit diagram showing a configuration of unit shift register SR according to the first embodiment of the present invention. As shown in the figure, the unit shift register SR has two input terminals IN and IND and two output terminals OUT and OUTD. Further, similarly to the unit shift register of FIG. 3, a clock terminal CK, a reset terminal RST, and a first power supply terminal S1 are also provided.

  In the present embodiment, all the transistors constituting the unit shift register SR are field effect transistors of the same conductivity type, but here all of them are N-type TFTs. In the case of an N-type TFT, the gate is activated (on) at H level and deactivated (off) at L level. In the case of a P-type transistor, the reverse is true.

  As shown in FIG. 5, the transistors Q1 and Q2 are connected to the first output terminal OUT. The transistor Q1 is connected between the first output terminal OUT and the clock terminal CK, and is an output pull-up transistor (first transistor) that supplies a clock signal input to the clock terminal CK to the first output terminal OUT. is there. The transistor Q2 is connected between the first output terminal OUT and the first power supply terminal S1, and the potential (VSS) of the first power supply terminal S1 is supplied to the first output terminal OUT to supply the first output terminal. An output pull-down transistor (second transistor) that discharges OUT.

  On the other hand, the transistors QD1 and QD2 are connected to the second output terminal OUTD. The transistor QD1 is connected between the second output terminal OUTD and the clock terminal CK, and is an output pull-up transistor (third transistor) that supplies a clock signal input to the clock terminal CK to the second output terminal OUTD. is there. The transistor QD2 is connected between the second output terminal OUTD and the first power supply terminal S1, and discharges the second output terminal OUTD by supplying the potential of the first power supply terminal S1 to the second output terminal OUTD. This is an output pull-down transistor (fourth transistor).

  Thus, the transistors Q1 and Q2 connected to the first output terminal OUT and the transistors QD1 and QD2 connected to the second output terminal OUTD are connected in parallel to each other. The gate (control electrode) of the transistor Q1 and the gate electrode of the transistor QD1 are connected to each other, and the gate of the transistor Q2 and the gate of the transistor QD2 are connected to each other. Here, as shown in FIG. 5, the node (first node) to which the gates of the transistors Q1 and QD1 are connected is defined as “node N1”, and the node (second node) to which the gates of the transistors Q2 and QD2 are connected is “ Node N2 ".

  Also in the unit shift register SR of FIG. 5, the capacitive element C1 is provided between the gate and source of the transistor Q1, that is, between the node N1 and the first output terminal OUT, as in the circuit of FIG. The capacitive element C1 is for increasing the boosting effect of the node N1 accompanying the level increase of the first output terminal OUT. However, the capacitor C1 can be replaced if the gate-channel capacitance of the transistor Q1 is sufficiently large, and may be omitted in such a case.

  Transistors Q3 and Q4 are connected to node N1. The transistor Q3 (fifth transistor) is connected between the node N1 and the first input terminal IN, and its gate is connected to the second input terminal IND. The transistor Q4 (sixth transistor) is connected between the node N1 and the first power supply terminal S1, and discharges the node N1 by supplying the potential of the first power supply terminal S1 to the node N1. . The gate of the transistor Q4 is connected to the reset terminal RST. In the present embodiment, the node N2 is also connected to the reset terminal RST.

FIG. 6 is a block diagram showing a configuration of a gate line driving circuit using the unit shift register SR according to the first embodiment. Also in the present embodiment, the gate line driving circuit 30 includes a shift register including a plurality of unit shift registers SR 1 , SR 2 , SR 3 , SR 4 ... Connected in cascade (cascade connection). . The clock generator 31 shown in FIG. 6 is equivalent to that shown in FIG. 2 and outputs complementary clock signals CLK and / CLK. One of the clock signals CLK and / CLK output from the clock generator 31 is supplied to the clock terminal CK of each unit shift register SR.

The unit shift register SR of the present embodiment has two input terminals IN and IND, but both the input terminals IN and IND of the first stage (first stage) unit shift register SR 1 have both input terminals IN and IND. A start pulse SP is input. In the second and subsequent unit shift registers SR, the first input terminal IN is connected to the first output terminal OUT of the preceding stage, and the second input terminal IND is connected to the second output terminal OUTD of the preceding stage. .

The unit shift register SR of this embodiment has two output terminals OUT and OUTD, and the gate line GL of the display panel is connected to the first output terminal OUT. That is, the output signals G 1 , G 2 , G 3 ,... (Hereinafter collectively referred to as “first output signal G”) from the first output terminal OUT are horizontal (or vertical) for activating the gate line GL. ) Scan pulse. The first output terminal OUT is further connected to its own previous stage reset terminal RST and its own next stage first input terminal IN. On the other hand, the second output terminal OUTD that outputs the output signals GD 1 , GD 2 , GD 3 ,... (Hereinafter collectively referred to as “second output signal GD”) is not connected to the gate line GL, and is exclusively the next one. Connected to the second input terminal IND of the stage.

  Also in the gate line driving circuit 30 having this configuration, each unit shift register SR receives signals (first and second output signals G and GD in the previous stage) input from the previous stage in synchronization with the clock signals CLK and / CLK. While shifting in time, the signal is transmitted to the corresponding gate line GL and its own unit shift register SR. Hereinafter, the operation of the unit shift register SR constituting the gate line driving circuit 30 will be described.

Here again, the operation of the n-th unit shift register SR n will be described representatively. 7, the n-th stage unit shift register SR n of the preceding stage connection unit shift register SR n + 1 of the unit shift register SR n-1 and its subsequent (n-1 th stage) (the n + 1 stage) It is a circuit diagram showing the relationship. The Figure 8 is a timing chart for explaining the operation of the unit shift register SR n. The operation of the unit shift register SR according to the present embodiment shown in FIG. 5 will be described below with reference to FIGS.

For simplicity here, the clock signal CLK is inputted to a clock terminal CK of the unit shift register SR n, the clock signal / CLK is input to the unit shift register SR n-1, SR n + 1 of the clock terminal CK I will explain as a thing. Further, the first output signal G from the first output terminal OUT of the i-th unit shift register SR i is denoted by reference symbol G i , and the second output signal GD from the second output terminal OUTD is also denoted by reference symbol GD i . . Further, it is assumed that the H level of the clock signals CLK and / CLK are equal to each other, and the value is VDD. Further, it is assumed that the threshold voltages of the transistors constituting the unit shift register SR are all equal, and the value is Vth.

Referring to FIG. 8, first, as an initial state at time t 0 , node N1 of unit shift register SR n is at L level (VSS) (hereinafter, the state where node N1 is at L level is referred to as “reset state”). ). The unit shift register SR n-1 1 output signal G n-1 and the second output signal GD n-1, and the first output signal of the unit shift register SR n + 1 G n + 1 and the second output signal GD n +1 is assumed to be L level. In this case, since all the transistors Q1, Q2, QD1, QD2 of the unit shift register SR n is turned off, the first output terminal OUT and the second output terminal OUTD is floating, a first output signal in the initial state It is assumed that G n and the second output signal GD n are at L level.

It is assumed that the first and second output signals G n−1 and GD n−1 in the previous stage become H level at time t 1 when the clock signal / CLK transitions to H level. Then to the transistor Q3 is turned on the unit shift register SR n, the node N1 becomes the H level is charged (VDD-Vth) (hereinafter, the node N1 is called a state of an H level and "set state"). Thereby, the transistors Q1 and QD1 are turned on. However, since the clock signal CLK is at the L level (VSS) at this time, the output signal G n maintains the L level.

When the clock signal / CLK falls at time t 2 , the first and second output signals G n−1 and GD n−1 in the previous stage become L level, but the transistor Q3 is turned off and the transistor Q4 is also kept off. Therefore, the level of the node N1 is floating and maintained at the H level (VDD−Vth).

When the clock signal CLK rises at time t 3 , the transistors Q1 and QD1 are on and the transistors Q2 and QD2 are off at this time. Therefore, the first and second output terminals OUT and OUTD (first and second output signals G n, level of GD n) starts to rise. At this time, the node N1 is boosted by the coupling between the gate-channel capacitances of the transistors Q1 and QD1 and the capacitive element C1. Accordingly, the transistors Q1 and QD1 operate in the non-saturated region, and the levels of the first and second output signals G n and GD n are not accompanied by a voltage loss corresponding to the threshold voltage Vth of the transistors Q1 and QD1, respectively. It becomes H level (VDD). As a result, the level of the node N1 rises to approximately 2 × VDD−Vth.

When the first and second output signals G n and GD n become H level, they are input to the first and second input terminals IN and IND of the unit shift register SR n + 1 at the next stage, so that the unit shift In the register SR n + 1 , the transistor Q3 is turned on. Therefore, at time t 3 , the node N1 of the unit shift register SR n + 1 is charged to VDD−Vth.

Clock signal CLK falls at time t 4, the first and second output signals G n of the unit shift register SR n, the level of GD n lowered. At this time, the level of the node N1 also decreases to VDD−Vth due to coupling through the gate-channel capacitances of the transistors Q1 and QD1 and the capacitive element C1. However, even in this case, the transistors Q1 and QD1 are kept on, so that the first and second output signals G n and GD n follow the clock signal CLK and drop to VSS and become L level.

When the clock signal / CLK rises at time t 5 , the node N1 is boosted in the next unit shift register SR n + 1 and the first and second output signals G n + 1 and GD n + 1 are H. Level (VDD). As a result, the reset terminal RST of the unit shift register SR n becomes H level. Accordingly, since transistor Q4 is turned on, node N1 is discharged to L level, and transistors Q1 and QD1 are turned off. That is, the unit shift register SR n returns to the reset state. Since the reset terminal RST is also connected to the gates (nodes N2) of the transistors Q2 and QD2, the transistors Q2 and QD2 are turned on, and the first and second output signals G n and GD n are reliably set to VSS. The

When the clock signal / CLK becomes L level at time t 6 , the first and second output signals G n + 1 and GD n + 1 of the next stage become L level, and accordingly the reset terminal of the unit shift register SR n RST goes to L level. As a result, the transistor Q2, QD2, Q4, QD4 is turned off, the unit shift register SR n returns to the initial state (state at time t 0).

In summary, in the unit shift register SR n according to the present embodiment, signals (first and second output signals G n−1 and GD n in the previous stage) are applied to the first and second input terminals IN and IND. -1 or the start pulse SP) is not input, the node N1 is in the L level reset state. Since the transistors Q1 and QD1 are off in the reset state, the first and second output signals G and GD are maintained at the L level regardless of the level of the clock signal CLK. When a signal is input to the first and second input terminals IN and IND, the node N1 is set to the H level. In the set state, the transistors Q1 and QD1 are on, and at this time, the transistors Q2 and QD2 are off, so that the first and second output signals G n and GD correspond to the clock signal CLK becoming H level. n is output. Thereafter, when the signal of the reset terminal RST (next-stage gate line drive signal G n + 1 ) is input, the node N1 returns to the L level reset state, and the first and second output signals G n and GD n are It is maintained at the L level.

Such plurality of unit shift registers SR operate is, according to the cascaded multistage shift register (gate line drive circuit 30) as shown in FIGS. 6 and 7, the unit shift register SR 1 of the first stage When the start pulse SP is input, the first and second output signals G and GD are shifted at the timing synchronized with the clock signals CLK and / CLK, and the unit shift registers SR 2 , SR 3.・ ・ In order. As a result, the gate line driving circuit 30 can sequentially drive the gate lines GL 1 , GL 2 , GL 3 ... With a predetermined scanning cycle.

As described above, in the unit shift register SR according to the present embodiment, the transistors Q1 and Q2 connected to the first output terminal OUT and the transistors QD1 and QD2 connected to the second output terminal OUTD are connected in parallel to each other. It is in. Therefore, as shown in FIG. 8, the levels of the first and second output signals G n and GD n logically transition in the same way. Therefore, the logical operation of the gate line driving circuit 30 is the same as that of the conventional unit shift register (see FIGS. 3 and 4). However, the unit shift register SR according to the present embodiment can provide the effects described below.

FIG. 9 is a diagram for explaining the effect of the present invention, and shows a voltage waveform of the node N1 at the time of charging (precharging) and boosting of the node N1 of the unit shift register SR. Note that the times t 1 to t 5 shown in the figure correspond to those shown in FIG.

  In the gate line driving circuit 30 according to the present embodiment, the first output terminal OUTD of each unit shift register SR has a reset terminal RST at the previous stage, a first input terminal IN at the next stage, and a gate that becomes a large capacitive load. Connected to line GL. On the other hand, since the second output terminal OUTD is only connected to the second input terminal IND of the next stage, the load capacitance value is orders of magnitude smaller than that of the first output terminal OUT. Therefore, the second output signal GD of each unit shift register SR can rise faster than the first output signal G.

Looking again at the n-th unit shift register SR n, when the clock signal / CLK rises at time t 1 , as shown in FIG. 9, the second output signal GD n-1 at the previous stage is the first output signal G. Stand up faster than n-1 . As shown in FIG. 7, the first output signal G n−1 is input to the drain (first input terminal IN) of the transistor Q3 that charges the node N1 of the unit shift register SR n , and the gate (second input terminal IND). Is supplied with the second output signal GD n−1 . Therefore, when the levels of the first and second output signals G n−1 and GD n−1 in the previous stage rise, the transistor Q3 of the unit shift register SR n is turned on and the node N1 is charged, which is shown by the solid line in FIG. As a result, the level of the node N1 rises.

At this time, the second output signal GD n-1 in the previous stage rises faster than the first output signal G n−1 , so that the gate potential of the transistor Q3 at the initial stage of the charging process of the node N1 is sufficiently larger than the drain potential. Become. Accordingly, the transistor Q3 operates in the non-saturated region, and the level of the node N1 rises at substantially the same level as the first output signal G n−1 .

Thereafter, as the level of the node N1 rises, the transistor Q3 starts to shift to the operation in the saturation region, and in addition, the rise in the level of the node N1 is delayed due to the time constant based on the parasitic capacitance associated with the node N1. The difference between the level of the node N1 and the level of the first output signal G n-1 in the previous stage gradually increases. At the end of the charging process of the node N1, the transistor Q3 is completely operated in the saturation region, and the level difference is further increased.

When the clock signal / CLK falls at time t 2 , the level of the node N1 is a level that is somewhat lower than the H level (VDD) of the first output signal G n-1 in the previous stage (level V1 shown in FIG. 9). The ascent stops. At time t 2 , since there is a difference in load capacitance value between the first and second output terminals OUT and OUTD of the previous unit shift register SR n−1 , the first output signal G n−1 is output as the second output. The level drops at a slower speed than the signal GD n-1 .

Thereafter, when the clock signal CLK rises at time t 3 , the level of the node N1 is boosted by the gate-channel capacitance of the transistors Q1 and QD1 and the capacitive coupling via the capacitive element C1. Level of the boosted node N1 is maintained until a time t 4 when falls clock signal CLK. During this time t 3 ~t 4, by the node N1 is maintained at a sufficiently high level, the transistor Q1 when the unit shift register SR n outputs first and second output signals G n, the GD n , QD2 driving capability can be maintained high. As a result, the first and second output signals G n and GD n can rise and fall at high speed.

On the other hand, the broken line graph shown in FIG. 9 shows a change in the level of the node N1 in the conventional unit shift register SR (FIG. 3). In the conventional unit shift register SR, since the transistor Q3 is diode-connected, its drain and gate are connected to each other. Therefore, the transistor Q3 always operates in the saturation region. Therefore, from the beginning of the charging process of the node N1, the level of the node N1 becomes lower than the level of the output signal G n-1 of the previous stage by the threshold voltage Vth of the transistor Q3. Furthermore, since the transistor Q3 operates in the source follower mode from the beginning of the charging process of the node N1, the charging speed is not fast. Therefore as shown by the broken line in the graph of FIG. 9, it is impossible to raise the level of the node N1 only to a lower level V2 than the level V1 at the stage of time t 3.

When the potential difference between the level V1 and V2 and [Delta] V, the voltage difference [Delta] V is also maintained when the node N1 is boosted at time t 4. That is, in the unit shift register SR according to the present embodiment, the level of the node N1 between the times t 3 and t 4 can be increased by ΔV compared to the conventional case. Therefore, rising and falling of the first and second output signals G n and GD n are faster than those of the output signal of the conventional unit shift register SR. Therefore, the shift register according to this embodiment can operate at a higher speed than before.

  The above-described effects are obtained when the second output signal GD input to the gate (second input terminal IND) of the transistor Q3 rises at high speed in each of the cascaded unit shift registers SR. The higher the speed, the greater the effect. Therefore, it is desirable that the load capacitance related to the second output terminal OUTD is as small as possible.

  In the present embodiment, as shown in FIGS. 6 and 7, the first output signal G of each unit shift register SR is supplied to the preceding reset terminal RST, the succeeding first input terminal IN, and the gate line GL. The second output signal GD is supplied only to the second input terminal IND at the next stage. However, as shown in FIG. 8, since the first output signal G and the second output signal GD have substantially the same waveform, for example, the second output signal GD may be supplied also to the reset terminal RST in the previous stage. That is, in each unit shift register SR, the first output terminal OUT is connected to the first input terminal IN and the gate line GL in the next stage, and the second output terminal OUTD is connected to the reset terminal RST in the previous stage and the first input terminal IN in the next stage. It is good also as a structure connected to 2 input terminal IND.

  However, by doing so, the capacitive load related to the second output terminal OUTD is increased by the gate capacitance of the transistors Q2 and Q4 of the unit shift register SR of the preceding stage, so that the second load terminal is compared with the case of FIG. 6 and FIG. It should be noted that the rising speed of the output signal GD is reduced and the effect of the present invention is slightly reduced.

  Further, for example, it is not impossible to operate the second output signal GD of each unit shift register SR so as to be supplied to the first input terminal IN of the next stage. However, in that case, the gate capacitance of the next-stage transistors Q1 and QD1 and the capacitive element C1 are applied as a load to the second output terminal OUTD via the next-stage transistor Q3. The capacity load increases accordingly. In particular, the transistor Q1 used for charging the gate line GL has a large channel width and a particularly large gate capacitance. Therefore, the rising speed of the second output signal GD is reduced, and the effect of the present invention is reduced. In order to prevent this, the driving capability of the transistor QD1 may be increased so that the gate capacitance of the transistor Q1 at the next stage can be charged at high speed by the second output signal GD. However, for this purpose, it is necessary to increase the channel width of the transistor QD1, which is not preferable because it increases the circuit formation area.

  In the above description, a constant interval is provided between the period in which the clock signal CLK is at the H level and the period in which / CLK is at the H level. However, this period may be omitted. That is, a two-phase clock may be used in which the clock signal / CLK falls simultaneously with the rise of the clock signal CLK and the clock signal / CLK rises simultaneously with the fall of the clock signal CLK.

  The unit shift register SR of the present embodiment can also be operated using a three-phase clock as in the conventional shift register (see, for example, FIG. 4 of Patent Document 1). In that case, the second output signal GD of the next stage (two subsequent stages) may be inputted to the reset terminal RST of each unit shift register SR, and in this case, the same effect as described above can be obtained. .

<Embodiment 2>
FIG. 10 is a circuit diagram showing a configuration of the unit shift register SR according to the second embodiment of the present invention. In the figure, elements having the same functions as those shown in FIG. 5 are denoted by the same reference numerals.

  The unit shift register SR (FIG. 5) of the first embodiment has one clock terminal CK. However, the unit shift register SR of the second embodiment has two clock terminals CK1 and CK2 as shown in FIG. Have. Hereinafter, the clock terminal CK1 is referred to as a “first clock terminal”, and the clock terminal CK2 is referred to as a “second clock terminal”.

  The first clock terminal CK1 corresponds to the clock terminal CK in the unit shift register SR of FIG. That is, in the present embodiment, the clock signal input to the first clock terminal CK1 is supplied to the first and second output terminals OUT and OUTD via the transistors Q1 and QD1, respectively. The two output signals G and GD are activated.

  On the other hand, a clock signal having a phase different from that input to the first clock terminal CK1 is input to the second clock terminal CK2. For example, in the unit shift register SR in which the clock signal CLK is input to the first clock terminal CK1, the clock signal / CLK is input to the second clock terminal CK2. The gate (node N2) of the transistors Q2 and QD2 is connected to the second clock terminal CK2. Note that the gate of the transistor Q4 is connected to the reset terminal RST as in the first embodiment.

Again representatively describes the unit shift register SR n of the n-th stage, the the first clock terminal CK1 clock signal CLK is inputted, the second clock terminal CK2 as a clock signal / CLK is input Assume that

In the unit shift register SR n according to the first embodiment, the transistors Q2 and QD2 are turned on during the period when the first output signal G n + 1 at the next stage is at the H level, and the first and second output terminals only during that period. OUT and OUTD were set to L level with low impedance. That is, in the other periods, the first and second output terminals OUT and OUTD are floating and at the L level.

In contrast, in the unit shift register SR n according to this embodiment, the transistors Q2, QD2 are turned on every time the clock signal / CLK inputted to the second clock terminal CK2 becomes H-level. Therefore, the first and second output terminals OUT and OUTD are repeatedly set to the low impedance L level at short intervals. Accordingly, the L level potentials of the first and second output signals G n and GD n are more stable. As a result, the malfunction of the gate line driving circuit 30 is prevented and the level of the unselected gate line GL is stabilized, so that display abnormality of the display device is less likely to occur.

<Embodiment 3>
An amorphous silicon thin film transistor (a-Si TFT) is widely used as a field effect transistor constituting a gate line driving circuit of a display device. It has been found that in the a-Si TFT, when the gate electrode is continuously biased, a phenomenon in which the threshold voltage is largely shifted occurs. This phenomenon causes a malfunction of the gate line driving circuit and becomes a problem. Further, it has been found that similar problems occur not only in a-Si TFTs but also in organic TFTs.

  For example, in the unit shift register SR (FIG. 10) of the second embodiment, the gates of the transistors Q2 and QD2 are repeatedly biased to the H level by the clock signal input to the second clock terminal CK2. Therefore, when the unit shift register SR is composed of an a-Si TFT or an organic TFT, the threshold voltages of the transistors Q2 and QD2 shift in the positive direction. As a result, the driving capability of the transistors Q2 and QD2 decreases, and the first and second output terminals OUT and OUTD cannot be set to the L level with sufficiently low impedance. As a result, the effect of the second embodiment is reduced and the gate line driving circuit 30 is likely to malfunction.

  In order to suppress this problem, for example, the channel width of the transistors Q2 and QD2 can be increased to increase the driving capability, but this is not desirable because it increases the circuit formation area. Therefore, Embodiment 3 shows a modification of Embodiment 2 that can solve this problem without increasing the circuit formation area.

  FIG. 11 is a circuit diagram showing a configuration of the unit shift register SR according to the third embodiment. In the figure, elements having the same functions as those shown in FIG. 10 are denoted by the same reference numerals. In the unit shift register SR of FIG. 11, the sources of the transistors Q2 and QD2 are connected to the first clock terminal CK1. That is, a clock signal having a phase different from that input to the gate is input to the sources of the transistors Q2 and QD2. Except for this point, it is the same as the circuit of FIG.

Again representatively describes the unit shift register SR n of the n-th stage, the the first clock terminal CK1 clock signal CLK is inputted, the second clock terminal CK2 as a clock signal / CLK is input Assume that

  Since the clock signals CLK and / CLK are complementary signals, while the clock signal / CLK is at H level and the transistors Q2 and QD2 are turned on, their sources are at L level by the clock signal CLK. Therefore, as in the case of the second embodiment, the transistors Q2 and QD2 can set the first and second output terminals OUT and OUTD to the low impedance L level each time the clock signal / CLK becomes H level. The effect of the second embodiment can be obtained.

  On the contrary, while the clock signal / CLK becomes L level and the transistors Q2 and QD2 are turned off, their sources become H level by the clock signal CLK. That is, the state is equivalent to that the gates of the transistors Q2 and QD2 are negatively biased with respect to the source. As a result, the threshold voltage shifted in the positive direction returns and recovers in the negative direction, so that the drive capability of the transistors Q2 and QD2 is prevented from being lowered, and the above problem is solved. It is clear that the circuit formation area is not increased.

Also in this embodiment, theoretically, a two-phase clock is used in which the clock signal / CLK falls simultaneously with the rise of the clock signal CLK, and the clock signal / CLK rises simultaneously with the fall of the clock signal CLK. Can do. However, practical use when the clock signal CLK, / CLK rising edge of, the variation in the timing of falling, may also occur that the source potential rises while the transistors Q2, QD2 of the unit shift register SR n is not completely turned off . If this happens, the levels of the first and second output terminals OUT and OUTD will rise unnecessarily, causing malfunctions. Therefore, in the present embodiment, as shown in the example of FIG. 4, a certain interval is provided between the period in which the clock signal CLK is at the H level and the period in which the clock signal / CLK is at the H level. Is desirable.

<Embodiment 4>
FIG. 12 is a circuit diagram showing a configuration of the unit shift register SR according to the fourth embodiment. In the figure, elements having the same functions as those shown in FIG. 5 are denoted by the same reference numerals.

  As shown in FIG. 12, the unit shift register SR of the fourth embodiment has a second power supply terminal S2 to which the high potential side power supply potential VDD is supplied. Further, a transistor Q5 connected between the second power supply terminal S2 and the node N2 (the gates of the transistors Q2 and QD2) and a transistor Q6 connected between the node N2 and the first power supply terminal S1 are provided. The gate of the transistor Q5 is connected to the second power supply terminal S2 (that is, the transistor Q5 is diode-connected), and the gate of the transistor Q6 is connected to the node N1 (the gates of the transistors Q1 and QD1). Note that the gate of the transistor Q4 is connected to the reset terminal RST as in the first embodiment.

  The on-resistance of the transistor Q6 is set sufficiently smaller than the on-resistance of the transistor Q5. Therefore, when the node N1 becomes H level and the transistor Q6 is turned on, the node N2 becomes L level. Conversely, when the node N1 is at L level, the transistor Q6 is turned off, and the node N2 is charged by the transistor Q5 and becomes H level. That is, these transistors Q5 and Q6 constitute a ratio type inverter having the node N1 as an input terminal and the node N2 as an output terminal.

Accordingly, in the unit shift register SR of the present embodiment, while the node N1 is in the L level reset state, the node N2 is held at the H level by the inverter composed of the transistors Q5 and Q6, so that the transistors Q2 and QD2 are in the meantime. Turn on. That is, while the unit shift register SR does not output the output signal G (the non-selection period of the gate line GL), the first and second output terminals OUT and OUTD are maintained at the L level with low impedance. Therefore, the L level potentials of the first and second output signals G n and GD n are more stable, and malfunction of the gate line driving circuit 30 is prevented.

  Unlike Embodiments 2 and 3, since it is not necessary to supply a clock signal to the gates of the transistors Q2 and QD2, the AC power consumed by the unit shift register SR can be reduced. That is, there is an advantage that the power consumption of the clock signal generation circuit (clock generator 31 in FIG. 6) is reduced. However, it should be noted that the threshold voltage tends to shift because the gates of the transistors Q2 and QD2 are continuously at the H level.

<Embodiment 5>
In this embodiment, a modification of Embodiment 4 (FIG. 12) is shown. FIG. 13 is a circuit diagram showing a configuration of a unit shift register SR according to the fifth embodiment. In the figure, elements having the same functions as those shown in FIG. 12 are denoted by the same reference numerals. As shown in FIG. 13, the unit shift register SR of the present embodiment includes a transistor Q7 connected between the node N1 and the first power supply terminal S1 (VSS) and having a gate connected to the node N2. Except this, it is the same as the circuit of FIG.

  The transistor Q7 is turned on when the node N2 is at H level and functions to discharge the node N1. Therefore, in the unit shift register SR, the potential of the node N1 is fixed to VSS by the transistor Q7 while the transistors Q1 and QD1 are off (the non-selection period of the gate line GL).

  In the unit shift register SR (FIG. 12) of the fourth embodiment that does not have the transistor Q7, when the clock signal is input to the clock terminal CK during the period when the transistors Q1 and QD1 are off, the gates of the transistors Q1 and QD1 There is a possibility that the level of the node N1 rises due to capacitive coupling via the overlap capacitance between the drains. When the level of the node N1 rises, a current flows through the transistors Q1 and QD1, which may cause a problem that the first and second output signals G and GD become unnecessarily during the non-selection period of the gate line GL. There is. On the other hand, according to the present embodiment, an increase in the level of the node N1 during the non-selection period of the gate line GL is prevented, so that the occurrence of this problem can be suppressed.

<Embodiment 6>
The problem of the increase in the level of the node N1 during the non-selection period of the gate line GL described in the fifth embodiment can occur in any of the unit shift registers SR in the first to fourth embodiments. The present embodiment proposes a unit shift register SR that takes such measures.

  FIG. 14 is a circuit diagram showing a configuration of a unit shift register SR according to the sixth embodiment. In the figure, elements having the same functions as those shown in FIG. 10 are denoted by the same reference numerals. As shown in FIG. 14, the unit shift register SR of the present embodiment includes a capacitive element C2 connected between the node N1 and the second clock terminal CK2, and is the same as the circuit of FIG. 10 except that. It is.

  As in the second embodiment, clock signals having different phases are input to the first and second clock terminals CK1 and CK2. However, in this embodiment, it is necessary to combine the timing at which the clock signal input to the first clock terminal CK1 rises and the timing at which the clock signal input to the second clock terminal CK2 falls at the same time. .

Again representatively describes the unit shift register SR n of the n-th stage, the the first clock terminal CK1 clock signal CLK is inputted, the second clock terminal CK2 as a clock signal / CLK is input Assume that

In the unit shift register SR n, the non-selection period of the gate line GL n, the transistors Q1, QD1 are off, the clock signal CLK of the first clock terminal CK1 rises, the gate-drain of the transistor Q1, QD1 The level of the node N1 tends to increase due to the coupling through the overlap capacity. However, since the clock signal / CLK at the second clock terminal CK2 falls at this time, the level of the node N1 is lowered by the coupling through the capacitive element C2. That is, the capacitive element C2 works to cancel the level increase of the node N1 caused by the clock signal CLK.

  Therefore, according to the present embodiment, a rise in the level of the node N1 during the non-selection period of the gate line GL is prevented, and the first and second output signals G and GD are unnecessarily malfunctioned during the period. Can be suppressed.

  FIG. 14 shows a configuration in which the capacitive element C2 is provided for the unit shift register SR of the second embodiment (FIG. 10), but this embodiment is a circuit of the first, third, and fifth embodiments ( The present invention can also be applied to FIGS. 5, 5, 11 to 13).

<Embodiment 7>
FIG. 15 is a circuit diagram showing a configuration of a unit shift register SR according to the seventh embodiment. In the figure, elements having the same functions as those shown in FIG. 10 are denoted by the same reference numerals.

  As shown in FIG. 15, in the unit shift register SR of the present embodiment, the reset terminal RST terminal (the gate of the transistor Q4) is connected to the second clock terminal CK2 without being connected to the subsequent unit shift register SR. Thus, a clock signal having a phase different from that input to the first clock terminal CK1 is input to the gate of the transistor Q4. More specifically, a clock signal having the same phase as that input to the first clock terminal CK1 of the preceding stage is input to the transistor Q4.

Further, the source of the transistor Q4 is connected to the input terminal IN. As a result, the first output signal G n−1 of the previous stage is input to the source of the transistor Q4. In the circuit of FIG. 15, since the node N2 is connected to the second clock terminal CK2, the circuit of FIG. 10 is changed except that the signals input to the gate and source of the transistor Q4 are changed as described above. It will be the same.

Also here, the n-th unit shift register SR n will be representatively described. It is assumed that the clock signal CLK is input to the first clock terminal CK1 of the unit shift register SR n and the clock signal / CLK is input to the second clock terminal CK2. Note that the operation of the unit shift register SR of the present embodiment is basically the same as that described in the first embodiment, and therefore FIG. 8 will be referred to again for the sake of simplicity.

At time t 1 , the clock signal / CLK input to the first clock terminal CK1 of the unit shift register SR n−1 becomes H level, and the first and second output signals G n−1 and GD n of the preceding stage are included. Suppose that -1 becomes H level. The gate of the transistor Q4 of this time unit shift register SR n becomes H level, the transistor Q4 is not turned on since its source is also at the H level. Therefore, node N1 is charged to H level via transistor Q3. Thereby, the unit shift register SR n shifts from the reset state to the set state.

When the clock signal / CLK falls at time t 2 , the first and second output signals G n−1 and GD n−1 in the previous stage also become L level, but the transistor Q3 is turned off and the transistor Q4 is also kept off. Therefore, the level of the node N1 is floating and maintained at the H level (VDD−Vth).

When the clock signal CLK rises at time t 3 , the node N1 is boosted and the first and second output signals G n and GD n become H level (VDD). When the time t 4 at the clock signal CLK becomes L level, the first and second output signals G n of the unit shift register SR n, GD n also becomes L level. As a result, the level of the node N1 is also lowered to VDD-Vth.

When the At time t 5 rises clock signal / CLK, since this time, the first output signal G n-1 is in the L level, the transistor Q4 is turned on, the node N1 is formed by discharged to L level. That is, the unit shift register SR n returns to the reset state, and the transistors Q1 and QD1 are turned off. When the clock signal / CLK becomes L level thereafter time t 6, the transistor Q4 is returned to off.

As described above, the unit shift register SR according to the seventh embodiment can operate in the same manner as the unit shift register SR of the first embodiment. That is, since the transistor Q3 is charged at high speed using the first and second output signals G n−1 and GD n−1 of the previous stage, the same effect as in the first embodiment can be obtained.

  In this embodiment, each unit shift register SR need not be connected to the next unit shift register. Accordingly, the degree of freedom of circuit layout increases, which can contribute to the reduction of the circuit formation area. However, it should be noted that the AC power of the clock signal generation circuit (clock generator 31 in FIG. 6) increases because the clock signal is continuously supplied to the gate of the transistor Q4.

  In the present embodiment, the first output signal G of the previous stage is input to the source of the transistor Q4 of the unit shift register SR, but the second output signal GD of the previous stage may be input instead. . However, in that case, since the load capacitance applied to the second output terminal OUTD of each unit shift register SR increases, the rising speed of the second output signal GD decreases, and the effect of the present invention is slightly reduced. It should be noted.

  FIG. 15 shows a configuration in which the signals input to the gate and source of the transistor Q4 are changed as described above with respect to the unit shift register SR of the second embodiment (FIG. 10). Can be applied to the transistors Q4 of the circuits of the first and third embodiments (FIGS. 5 and 11 to 14) and the circuits of the eighth to eleventh embodiments (FIGS. 19 to 16) described later. It is.

<Eighth embodiment>
As described above, in the unit shift register SR (FIGS. 12 and 13) according to the fourth and fifth embodiments, the inverter including the transistors Q5 and Q6 while the node N1 is at the L level (the non-selection period of the gate line GL). Holds the node N2 at the H level. Therefore, the transistors Q2 and QD2 that discharge the first and second output terminals OUT and OUTD are kept on during that time. As a result, the first and second output terminals OUT and OUTD are maintained at the low impedance L level, thereby preventing the occurrence of an error signal. However, since the gates of the transistors Q2 and QD2 are continuously set to the H level, the threshold voltages are shifted.

  On the other hand, in the unit shift register SR (FIGS. 10 and 11) of the second and third embodiments, the clock signal / CLK is input to the gates of the transistors Q2 and QD2. That is, the levels of these gates are swung at a constant period and do not continuously become the H level, so that the threshold voltage shift is suppressed. However, since the first and second output terminals OUT and OUTD are in a high impedance state at a constant period, the effect of preventing erroneous signals is lower than that in the fourth and fifth embodiments.

  A unit shift register that can solve these problems is proposed in FIGS. 7 and 11 of Patent Document 5 (Japanese Patent Laid-Open No. 2006-24350). In particular, the unit shift register of FIG. 11 has two output terminals (OUT, CR) as in the present invention. In the eighth embodiment, the technique shown in FIG. 11 of Patent Document 5 is applied to the unit shift register SR of the present invention.

  FIG. 16 is a circuit diagram of the unit shift register SR according to the eighth embodiment. The unit shift register SR is obtained by applying the technique of FIG. 11 of Patent Document 5 to the unit shift register SR (FIG. 13) of the fifth embodiment. In FIG. 16, elements having the same functions as those shown in FIG. 13 are denoted by the same reference numerals. However, the first clock terminal CK1 in FIG. 16 corresponds to the clock terminal CK in FIG.

  The unit shift register SR of FIG. 13 is a ratio type inverter (transistors Q5, Q6 of FIG. 13) as a “pulldown drive circuit” for driving transistors Q2, QD2 for pulling down the first and second output terminals OUT, OUTD. However, the unit shift register SR of FIG. 16 includes a capacitive load type inverter composed of a capacitive element C3 and a transistor Q6 instead.

  In the inverter, the gates (nodes N1) of the transistors Q1 and QD1 are input nodes, and the gates (nodes N2) of the transistors Q2 and QD2 are output terminals. However, the inverter is different from a normal one in that a clock signal input to the first clock terminal CK1 is supplied as a power source. That is, in the inverter, the capacitive element C3 is connected between the node N2 and the first clock terminal CK1. The capacitive element C3 functions not only as a load of the inverter but also as a coupling capacitor that couples the clock signal of the first clock terminal CK1 to the node N2. Similarly to the case of FIG. 13, the transistor Q6 is connected between the node N2 and the first power supply terminal S1, and its gate is connected to the node N1.

  The unit shift register SR further includes a transistor Q8 connected between the first output terminal OUT and the first power supply terminal S1, and a transistor QD8 connected between the second output terminal OUTD and the first power supply terminal S1. I have. The gates of these transistors Q8 and QD8 are both connected to the second clock terminal CK2. A clock signal having a phase different from that input to the first clock terminal CK1 is input to the second clock terminal CK2. As can be seen from comparison with FIG. 10, the transistors Q8 and QD8 correspond to the transistors Q2 and QD2 in the second embodiment.

Here again, the operation of the n-th unit shift register SR n in which the clock signals CLK and / CLK are input to the first and second clock terminals CK1 and CK2, respectively, will be described representatively.

First, the operation in the non-selection period of the gate line GL n will be described. Node N1 of the unit shift register SR n in this period is L level. Since the inverter formed of the capacitive element C3 and the transistor Q6 is activated when power is supplied by the clock signal CLK, the inverter outputs the H level to the node N2 when the clock signal CLK becomes the H level. More specifically, since the transistor Q6 is off while the node N1 is at the L level, the level of the node N2 follows the coupling of the capacitive element C3 and the clock signal CLK goes to the H level. become.

  Therefore, the transistors Q2 and QD2 are turned on every time the clock signal CLK becomes H level, and the first and second output terminals OUT and OUTD are set to L level with low impedance, respectively. On the other hand, the transistors Q8 and QD8 are turned on every time the clock signal / CLK input to the second clock terminal CK2 becomes H level.

  That is, in the non-selection period of the gate line GLn, the pair of transistors Q2 and QD2 and the pair of transistors Q8 and QD8 are alternately turned on in synchronization with the clock signals CLK and / CLK. Therefore, the first and second output terminals OUT and OUTD are set to the L level with low impedance for most of the period, and the effect of suppressing the generation of an erroneous signal is as high as that of the fifth embodiment.

  Further, the gate levels of the transistors Q2, QD2, Q8, and QD8 are respectively swung at a constant period and are not continuously set to the H level, so that the threshold voltage shift is suppressed.

Next, the operation in the selection period of the gate line GL n will be described. During this period, the node N1 of the unit shift register SR n is at the H level. Since the transistor Q6 is turned on while the node N1 is at the H level, the inverter composed of the capacitive element C3 and the transistor Q6 outputs the L level to the node N2. In this period, the clock signal / CLK is at the L level. Accordingly, since the transistors Q2, QD2, Q8, and QD8 are kept off, the unit shift register SRn can normally output the first and second output signals Gn and GDn.

  As described above, according to the present embodiment, it is possible to obtain a high effect of preventing the occurrence of an error signal while preventing the threshold voltage shift of the transistors Q2, QD2, Q8, and QD8 (that is, lowering of driving capability). it can.

<Embodiment 9>
In the present embodiment, the technique used in the third embodiment is applied to the unit shift register SR (FIG. 16) of the eighth embodiment.

  FIG. 17 is a circuit diagram showing a configuration of a unit shift register SR according to the ninth embodiment. In the unit shift register SR, the sources of the transistors Q2 and QD2 are connected to the second clock terminal CK2 and the sources of the transistors Q8 and QD8 are connected to the first clock terminal CK1 with respect to the circuit of FIG. That is, a clock signal having a phase different from that input to the gate is input to the sources of the transistors Q2, QD2, Q8, and QD8. Except for this point, the circuit is the same as the circuit of FIG.

Again representatively describes the unit shift register SR n of the n-th stage, the the first clock terminal CK1 clock signal CLK is inputted, the second clock terminal CK2 as a clock signal / CLK is input Assume that

  Clock signals CLK and / CLK are complementary to each other. Therefore, while the clock signal CLK becomes H level and the transistors Q2 and QD2 are turned on, their sources are set to L level by the clock signal / CLK, and the clock signal / CLK becomes H level and the transistors Q8 and QD8 are turned on. While being turned on, their sources are set to L level by the clock signal CLK. Thus, the transistors Q2, QD2, Q8, and QD8 can discharge the first and second output terminals OUT and OUTD in the same manner as when the source is connected to the first power supply terminal S1.

  While the clock signal CLK becomes L level and the transistors Q2 and QD2 are turned off, their sources are set to H level by the clock signal / CLK, and the clock signal / CLK becomes L level and the transistors Q8 and QD8 are turned off. In the meantime, their sources are set to the H level by the clock signal CLK. That is, when the transistors Q2, QD2, Q8, and QD8 are off, the state is equivalent to the gate being negatively biased with respect to the source. As a result, the threshold voltage shifted in the positive direction returns to the negative direction and recovers, so that the drive capability of the transistors Q2, QD2, Q8, and QD8 is prevented from being lowered.

<Embodiment 10>
FIG. 18 is a circuit diagram showing a configuration of unit shift register SR according to the tenth embodiment. In the unit shift register SR, the transistor Q2 is omitted from the circuit of FIG.

  Without the transistor Q2, the first output terminal OUT has a high impedance except when the clock signal / CLK is at the H level. That is, the effect of preventing the occurrence of an error signal at the first output terminal OUT is almost the same as that of the circuit of FIG. Note that in the case where the display characteristics of the display device are adversely affected by the elimination of the transistor Q2, it can be improved by lowering the VSS level with respect to the pixel potential.

  According to the present embodiment, the circuit area can be reduced by the amount that the transistor Q2 is omitted. In addition, since the parasitic capacitance of the node N2 is reduced and the node N2 is easily charged, the value of the capacitor C3 can be set small. That is, it is possible to reduce the circuit area because the formation area of the capacitor C3 can be reduced. Further, since the power consumed by the gate capacitance of the transistor Q2 is reduced, it is possible to contribute to a reduction in power consumption of the circuit.

  For the purpose of reducing the circuit area, it is conceivable to omit the transistor QD2 instead of the transistor Q2 (if both of the transistors Q2 and QD2 are omitted, it is the same as in the second embodiment (FIG. 10)). ). However, omitting the transistor QD2 is not preferable because a malfunction is more likely to occur than when the transistor Q2 is omitted. The reason is as follows.

  That is, when the transistor QD2 is omitted, the second output terminal OUTD is in a high impedance state when the clock signal of the first clock terminal CK1 rises. The capacitive load at the second output terminal OUTD (ie, the gate capacitance of the transistor Q3 at the next stage) is smaller than the capacitive load at the first output terminal OUT (ie, the capacitance associated with the gate line GL). For this reason, when the second output terminal OUTD is in a high impedance state, the level easily rises compared to when the first output terminal OUT is in a high impedance state due to the influence of noise or the like. That is, the second output signal GD as an erroneous signal is likely to be output. Therefore, it is preferable to leave the transistor QD2 to prevent this.

  The above-described ninth embodiment can also be applied to this embodiment. That is, in the circuit of FIG. 18, the source of the transistor QD2 may be connected to the second clock terminal CK2, and the sources of the transistors Q8 and QD8 may be connected to the first clock terminal CK1.

<Embodiment 11>
FIG. 19 is a circuit diagram showing a configuration of a unit shift register SR according to the eleventh embodiment. The unit shift register SR is obtained by omitting the transistor Q8 from the circuit of FIG. In this case, in the non-selection period of the gate line GL, the first output terminal OUT has a high impedance except when the clock signal CLK is at the H level. Although the timing at which the first output terminal OUT becomes high impedance is different, the effect of preventing the generation of an error signal is almost the same as the circuit of FIG.

  By omitting the transistor Q8, the formation area of the unit shift register SR can be reduced. There is also an advantage that the power consumed by the gate capacitance of the transistor Q8 can be reduced.

  For the purpose of reducing the circuit area, not only the transistor Q8 but also the transistor Q8D may be omitted, but it is preferable to leave the transistor Q8D in order to prevent malfunction. As described above, the second output terminal OUTD has a smaller capacitive load than that of the output terminal OUT. Therefore, when the transistor Q8D is omitted and the second output terminal OUTD is in a high impedance state, the second output signal GD as an error signal due to the influence of noise or the like (as in the case where the transistor Q2D is omitted in the tenth embodiment). (Not). Therefore, it is preferable to leave the transistor Q8D to prevent this.

  The above-described ninth embodiment can also be applied to this embodiment. That is, in the circuit of FIG. 19, the sources of the transistors Q2 and QD2 may be connected to the second clock terminal CK2, and the source of the transistor Q8 may be connected to the first clock terminal CK1.

It is a schematic block diagram which shows the structure of the display apparatus which concerns on embodiment of this invention. It is a block diagram which shows the structure of the conventional gate line drive circuit. It is a circuit diagram which shows the structure of the conventional unit shift register. It is a timing diagram which shows operation | movement of the conventional unit shift register. FIG. 3 is a circuit diagram illustrating a configuration of a unit shift register according to the first embodiment. 1 is a block diagram illustrating a configuration of a gate line driving circuit according to a first embodiment. FIG. 3 is a circuit diagram illustrating a configuration of a gate line driving circuit according to the first embodiment. FIG. 6 is a timing diagram illustrating an operation of the unit shift register according to the first embodiment. 6 is a diagram for explaining an effect of a unit shift register according to Embodiment 1. FIG. FIG. 6 is a circuit diagram illustrating a configuration of a unit shift register according to a second embodiment. FIG. 6 is a circuit diagram illustrating a configuration of a unit shift register according to a third embodiment. FIG. 6 is a circuit diagram illustrating a configuration of a unit shift register according to a fourth embodiment. FIG. 10 is a circuit diagram showing a configuration of a unit shift register according to a fifth embodiment. FIG. 10 is a circuit diagram showing a configuration of a unit shift register according to a sixth embodiment. FIG. 10 is a circuit diagram showing a configuration of a unit shift register according to a seventh embodiment. FIG. 10 is a circuit diagram showing a configuration of a unit shift register according to an eighth embodiment. FIG. 20 is a circuit diagram showing a configuration of a unit shift register according to a ninth embodiment. FIG. 22 is a circuit diagram showing a configuration of a unit shift register according to a tenth embodiment. FIG. 38 is a circuit diagram showing a configuration of a unit shift register according to the eleventh embodiment.

Explanation of symbols

  30 gate line driving circuit, 31 clock generator, SR unit shift register, IN first input terminal, IND second input terminal, OUT first output terminal, OUTD second output terminal, S1 first power supply terminal, S2 second power supply Terminal, CK clock terminal, CK1 first clock terminal, CK2 second clock terminal, RST reset terminal, Q1-Q8 transistor, GL gate line, C1, C2, C3 capacitive element.

Claims (18)

  1. A multi-stage shift register circuit,
    Each stage of the shift register circuit is
    First and second input terminals, first and second output terminals, a first clock terminal and a reset terminal;
    A first transistor for supplying a first clock signal input to the first clock terminal to the first output terminal;
    A second transistor for discharging the first output terminal;
    A third transistor for supplying the first clock signal to the second output terminal;
    A shift register circuit comprising a fourth transistor for discharging the second output terminal,
    The control electrodes of the first and third transistors are both connected to the first node,
    The control electrodes of the second and fourth transistors are both connected to the second node,
    The shift register circuit is
    A fifth transistor having a control electrode connected between the first node and the first input terminal and connected to the second input terminal;
    A sixth transistor having a control electrode connected to the reset terminal and discharging the first node ;
    In each of the above stages,
    The first input terminal is connected to the first output terminal of the previous stage of the first input terminal,
    The shift register circuit, wherein the second input terminal is connected to the second output terminal in the preceding stage of the second input terminal .
  2. The shift register circuit according to claim 1,
    In each of the above stages,
    The shift register circuit, wherein the second node is connected to the reset terminal.
  3. The shift register circuit according to claim 1,
    The shift register circuit, wherein the second node is connected to a second clock terminal to which a second clock signal having a phase different from that of the first clock signal is input.
  4. A shift register circuit according to claim 3,
    In each of the above stages,
    The second transistor is connected between the first output terminal and the first clock terminal,
    The shift transistor circuit, wherein the fourth transistor is connected between the second output terminal and the first clock terminal.
  5. The shift register circuit according to claim 1,
    Each stage is
    A shift register circuit further comprising an inverter having the first node as an input terminal and the second node as an output terminal.
  6. A shift register circuit according to claim 5,
    Each stage is
    A shift register circuit, further comprising a seventh transistor having a control electrode connected to the second node and discharging the first node.
  7. The shift register circuit according to claim 1 ,
    Each stage is
    Apart from the fourth transistor, the eighth transistor to discharge said second output terminal, to have a control electrode connected to the second clock terminal different second clock signal of said first clock signal and the phase are input ,
    A ninth transistor having a control electrode connected to the first node and discharging the second node;
    A shift register circuit further comprising a first capacitor connected between the second node and the first clock terminal.
  8. A shift register circuit according to claim 7,
    In each of the above stages,
    The shift transistor circuit, wherein the fourth transistor is connected between the second output terminal and the second clock terminal.
  9. A shift register circuit according to claim 7 or claim 8,
    Each stage is
    A shift register circuit, further comprising a tenth transistor having a control electrode connected to the second clock terminal and discharging the first output terminal.
  10. A shift register circuit according to claim 9,
    In each of the above stages,
    The shift transistor circuit, wherein the second transistor is connected between the first output terminal and the second clock terminal.
  11. The shift register circuit according to claim 1,
    Each stage is
    An eleventh transistor having a control electrode connected to the first node and discharging the second node;
    A second capacitive element connected between the second node and the first clock terminal;
    In addition to the fourth transistor, further comprising a twelfth transistor for discharging the second output terminal,
    In each of the above stages,
    The control register of the twelfth transistor is connected to a third clock terminal to which a third clock signal having a phase different from that of the first clock signal is input.
  12. A shift register circuit according to claim 11,
    In each of the above stages,
    The shift register circuit, wherein the twelfth transistor is connected between the second output terminal and the first clock terminal.
  13. A shift register circuit according to any one of claims 1 to 12,
    Each stage is
    The shift register circuit further comprising a third capacitor connected between a first clock node and a fourth clock terminal to which a fourth clock signal having a phase different from that of the first clock signal is input.
  14. A shift register circuit according to any one of claims 1 to 13,
    In each stage,
    The shift register circuit, wherein the reset terminal is connected to the first output terminal downstream of itself.
  15. A shift register circuit according to any one of claims 1 to 13,
    In each stage,
    The sixth transistor includes:
    Connecting between the first node and the first or second input terminal;
    The reset terminal includes
    5. A shift register circuit, wherein a fifth clock signal having a phase different from that of the first clock signal is input.
  16. The shift register circuit according to claim 15,
    In each stage,
    The shift register circuit according to claim 5, wherein the fifth clock signal has the same phase as that inputted to the first clock terminal in the preceding stage of the fifth clock signal.
  17. The shift register circuit according to claim 14 or 16,
    In each stage,
    The output signal from the second output terminal, a shift register circuit, wherein the speed of the level transition is faster than the output signal from the first output terminal.
  18. An image display device using the shift register circuit according to any one of claims 14, 16 and 17 as a gate line driving circuit,
    Each of the gate lines on the display panel
    An image display device connected to the first output terminal of each stage.
JP2007153434A 2006-10-03 2007-06-11 Shift register circuit and image display apparatus including the same Active JP4990034B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006271555 2006-10-03
JP2006271555 2006-10-03
JP2007153434A JP4990034B2 (en) 2006-10-03 2007-06-11 Shift register circuit and image display apparatus including the same

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2007153434A JP4990034B2 (en) 2006-10-03 2007-06-11 Shift register circuit and image display apparatus including the same
TW96134458A TW200832334A (en) 2006-10-03 2007-09-14 Shift register circuit and image display apparatus containing the same
US11/856,264 US7738623B2 (en) 2006-10-03 2007-09-17 Shift register circuit and image display apparatus containing the same
KR1020070097685A KR20080031114A (en) 2006-10-03 2007-09-28 Shift register circuit and image display apparatus containing the same
CN2007103003980A CN101221818B (en) 2006-10-03 2007-09-30 Shift register circuit and image display apparatus containing the same

Publications (2)

Publication Number Publication Date
JP2008112550A JP2008112550A (en) 2008-05-15
JP4990034B2 true JP4990034B2 (en) 2012-08-01

Family

ID=39261212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007153434A Active JP4990034B2 (en) 2006-10-03 2007-06-11 Shift register circuit and image display apparatus including the same

Country Status (5)

Country Link
US (1) US7738623B2 (en)
JP (1) JP4990034B2 (en)
KR (1) KR20080031114A (en)
CN (1) CN101221818B (en)
TW (1) TW200832334A (en)

Families Citing this family (61)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101206318B (en) * 2006-12-22 2010-05-19 群康科技(深圳)有限公司 Shifting register and LCD device
TWI340947B (en) * 2006-12-29 2011-04-21 Chimei Innolux Corp Shift register and liquid crystal display
TWI338900B (en) * 2007-08-07 2011-03-11 Au Optronics Corp Shift register array
CN101556832B (en) * 2008-04-10 2012-05-30 北京京东方光电科技有限公司 Shift register and liquid crystal display grid electrode driving device
CN101556831B (en) * 2008-04-10 2011-04-13 北京京东方光电科技有限公司 Shift register
KR100940401B1 (en) * 2008-05-28 2010-02-02 네오뷰코오롱 주식회사 Shift Register and Scan Driver of usign the same
TWI387801B (en) * 2008-07-01 2013-03-01 Chunghwa Picture Tubes Ltd Shift register apparatus and method thereof
KR101511126B1 (en) * 2008-10-30 2015-04-13 삼성디스플레이 주식회사 Gate driving circuit and display device having the gate driving circuit
KR101432764B1 (en) * 2008-11-13 2014-08-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Method for manufacturing semiconductor device
KR101901542B1 (en) * 2008-11-28 2018-09-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Semiconductor device, display device and electronic device including the same
TWI407443B (en) * 2009-03-05 2013-09-01 Au Optronics Corp Shift register
US8872751B2 (en) 2009-03-26 2014-10-28 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device having interconnected transistors and electronic device including the same
US7969226B2 (en) * 2009-05-07 2011-06-28 Semisouth Laboratories, Inc. High temperature gate drivers for wide bandgap semiconductor power JFETs and integrated circuits including the same
JP5405570B2 (en) * 2009-06-15 2014-02-05 シャープ株式会社 Shift register and display device
KR101945676B1 (en) 2009-06-25 2019-02-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Display device
KR101350635B1 (en) 2009-07-03 2014-01-10 엘지디스플레이 주식회사 Dual shift register
WO2011010546A1 (en) 2009-07-24 2011-01-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
CN102024410B (en) 2009-09-16 2014-10-22 株式会社半导体能源研究所 Semiconductor device and electronic appliance
CN102024431B (en) * 2009-09-16 2013-04-03 北京京东方光电科技有限公司 TFT-LCD driving circuit
CN102034553B (en) * 2009-09-25 2013-07-24 北京京东方光电科技有限公司 Shift register and gate line driving device thereof
WO2011070929A1 (en) 2009-12-11 2011-06-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
JP5435481B2 (en) * 2010-02-26 2014-03-05 株式会社ジャパンディスプレイ Shift register, scanning line driving circuit, electro-optical device, and electronic apparatus
KR101838628B1 (en) * 2010-03-02 2018-03-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Pulse signal output circuit and shift register
KR101389120B1 (en) * 2010-03-02 2014-04-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Pulse signal output circuit and shift register
KR101706292B1 (en) * 2010-03-02 2017-02-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Pulse signal output circuit and shift register
EP2549483A4 (en) * 2010-03-19 2016-03-02 Sharp Kk Shift register
US8537094B2 (en) * 2010-03-24 2013-09-17 Au Optronics Corporation Shift register with low power consumption and liquid crystal display having the same
WO2011145666A1 (en) * 2010-05-21 2011-11-24 Semiconductor Energy Laboratory Co., Ltd. Pulse output circuit, shift register, and display device
US9330782B2 (en) * 2010-07-13 2016-05-03 Sharp Kabushiki Kaisha Shift register and display device having the same
TWI413972B (en) * 2010-09-01 2013-11-01 Au Optronics Corp Shift register circuit
CN102467890B (en) * 2010-10-29 2014-05-07 京东方科技集团股份有限公司 Shift register unit, gate drive device and liquid crystal display
TWI437822B (en) * 2010-12-06 2014-05-11 Au Optronics Corp Shift register circuit
TWI414152B (en) * 2010-12-08 2013-11-01 Au Optronics Corp Shift register circuit
CN202008813U (en) 2010-12-23 2011-10-12 北京京东方光电科技有限公司 Grid driver of TFT LCD, drive circuit, and LCD
CN102184699A (en) * 2010-12-30 2011-09-14 友达光电股份有限公司 Resetting circuit
US8718224B2 (en) 2011-08-05 2014-05-06 Semiconductor Energy Laboratory Co., Ltd. Pulse signal output circuit and shift register
TWI469150B (en) * 2011-09-02 2015-01-11 Au Optronics Corp Shift register circuit
TWI527007B (en) * 2011-11-25 2016-03-21 元太科技工業股份有限公司 Driver circuit
JP6099372B2 (en) * 2011-12-05 2017-03-22 株式会社半導体エネルギー研究所 Semiconductor device and electronic equipment
CN102411917A (en) * 2011-12-21 2012-04-11 深圳市华星光电技术有限公司 Drive circuit of liquid crystal panel and liquid crystal display
CN102708796B (en) * 2012-02-29 2014-08-06 京东方科技集团股份有限公司 Gate driver on array unit, gate driver on array circuit and display device
CN102779494B (en) * 2012-03-29 2015-08-05 北京京东方光电科技有限公司 A kind of gate driver circuit, method and liquid crystal display
CN102708926B (en) * 2012-05-21 2015-09-16 京东方科技集团股份有限公司 A kind of shift register cell, shift register, display device and driving method
CN102956186A (en) * 2012-11-02 2013-03-06 京东方科技集团股份有限公司 Shift register, grid drive circuit and liquid crystal display
CN103198781B (en) * 2013-03-01 2015-04-29 合肥京东方光电科技有限公司 Shifting register unit and gate driving device and display device
US9842551B2 (en) * 2014-06-10 2017-12-12 Apple Inc. Display driver circuitry with balanced stress
CN104299590B (en) * 2014-10-30 2016-08-24 京东方科技集团股份有限公司 A kind of shift register, its driving method, gate driver circuit and display device
TWI544474B (en) * 2014-11-19 2016-08-01 友達光電股份有限公司 Shift register
CN104517575B (en) * 2014-12-15 2017-04-12 深圳市华星光电技术有限公司 Shifting register and level-transmission gate drive circuit
CN104732939A (en) * 2015-03-27 2015-06-24 京东方科技集团股份有限公司 Shifting register, grid drive circuit, display device and grid drive method
CN104751816B (en) * 2015-03-31 2017-08-15 深圳市华星光电技术有限公司 Shift-register circuit
CN104795106B (en) * 2015-04-14 2019-04-05 上海天马有机发光显示技术有限公司 Shift register and driving method, driving circuit, array substrate and display device
CN104900189B (en) 2015-06-19 2017-08-01 京东方科技集团股份有限公司 Shift register cell and its driving method, shift register and display device
CN105280135B (en) * 2015-11-25 2018-10-12 上海天马有机发光显示技术有限公司 Shift-register circuit, gate driving circuit and display panel
CN205282053U (en) * 2016-01-04 2016-06-01 北京京东方显示技术有限公司 Shifting register unit and grid drive circuit as well as display device
CN105632561B (en) * 2016-01-05 2018-09-07 京东方科技集团股份有限公司 Shift register and its driving method, gate driving circuit and display device
CN106683607B (en) * 2017-01-05 2019-11-05 京东方科技集团股份有限公司 A kind of shift register, gate driving circuit and display panel
CN106531117B (en) * 2017-01-05 2019-03-15 京东方科技集团股份有限公司 Shift register, its driving method, grid integrated drive electronics and display device
TWI625710B (en) * 2017-04-28 2018-06-01 友達光電股份有限公司 Gate driving circuit and display device using the same
CN108648686A (en) * 2018-07-27 2018-10-12 京东方科技集团股份有限公司 Shift register cell and gate driving circuit
TWI684974B (en) * 2018-12-27 2020-02-11 友達光電股份有限公司 Display apparatus

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6919874B1 (en) 1994-05-17 2005-07-19 Thales Avionics Lcd S.A. Shift register using M.I.S. transistors and supplementary column
FR2720185B1 (en) 1994-05-17 1996-07-05 Thomson Lcd Shift register using M.I.S. of the same polarity.
US5434899A (en) 1994-08-12 1995-07-18 Thomson Consumer Electronics, S.A. Phase clocked shift register with cross connecting between stages
US5949398A (en) * 1996-04-12 1999-09-07 Thomson Multimedia S.A. Select line driver for a display matrix with toggling backplane
JP3777894B2 (en) 1999-08-06 2006-05-24 カシオ計算機株式会社 Shift register and electronic device
JP2002133890A (en) 2000-10-24 2002-05-10 Alps Electric Co Ltd Shift register
KR100797522B1 (en) * 2002-09-05 2008-01-24 삼성전자주식회사 Shift register and liquid crystal display with the same
US7369111B2 (en) * 2003-04-29 2008-05-06 Samsung Electronics Co., Ltd. Gate driving circuit and display apparatus having the same
JP4895538B2 (en) 2004-06-30 2012-03-14 三星電子株式会社Samsung Electronics Co.,Ltd. Shift register, display device having the same, and driving method of the shift register
CN100353460C (en) * 2004-08-16 2007-12-05 友达光电股份有限公司 Shift register and display panel using said shift register
KR101014172B1 (en) * 2004-09-13 2011-02-14 삼성전자주식회사 Driving unit and display apparatus having the same
CN100527198C (en) * 2004-11-09 2009-08-12 友达光电股份有限公司 Drive circuit of picture element array for display panel
JP4899327B2 (en) * 2005-03-15 2012-03-21 カシオ計算機株式会社 Shift register circuit, drive control method thereof, and drive control apparatus
KR101107714B1 (en) * 2005-04-22 2012-01-25 엘지디스플레이 주식회사 A shift register and a method for driving the same
KR101167663B1 (en) * 2005-10-18 2012-07-23 삼성전자주식회사 Gate Pole Driving Circuit and Liquid Crystal Display Having the Same
JP4912023B2 (en) 2006-04-25 2012-04-04 三菱電機株式会社 Shift register circuit
JP2007317288A (en) 2006-05-25 2007-12-06 Mitsubishi Electric Corp Shift register circuit and image display equipped therewith
KR101272337B1 (en) * 2006-09-01 2013-06-07 삼성디스플레이 주식회사 Display device capable of displaying partial picture and driving method of the same
JP5116277B2 (en) * 2006-09-29 2013-01-09 株式会社半導体エネルギー研究所 Semiconductor device, display device, liquid crystal display device, display module, and electronic apparatus

Also Published As

Publication number Publication date
US7738623B2 (en) 2010-06-15
CN101221818B (en) 2011-08-10
CN101221818A (en) 2008-07-16
KR20080031114A (en) 2008-04-08
US20080080661A1 (en) 2008-04-03
JP2008112550A (en) 2008-05-15
TW200832334A (en) 2008-08-01

Similar Documents

Publication Publication Date Title
JP6005207B2 (en) Electro-optic device
US9747854B2 (en) Shift register, gate driving circuit, method for driving display panel and display device
US9373414B2 (en) Shift register unit and gate drive device for liquid crystal display
US8666019B2 (en) Shift register unit and gate drive device for liquid crystal display
US8964932B2 (en) Shift register, gate driving circuit and display
US8031827B2 (en) Shift register
US8614661B2 (en) Shift register unit, gate driving device and liquid crystal display
JP5710046B2 (en) Shift register circuit
EP2498260B1 (en) Shift register and the scanning signal line driving circuit provided there with, and display device
US9881688B2 (en) Shift register
US8654055B2 (en) Gate driving circuit and display device having the gate driving circuit
US7436923B2 (en) Shift register circuit and image display apparatus containing the same
EP2189987B1 (en) Shift register
KR101183431B1 (en) Gate driver
US7627076B2 (en) Shift register circuit and image display apparatus having the same
US8269714B2 (en) Shift register
KR101057891B1 (en) Shift register
JP6076332B2 (en) Display device
US8223112B2 (en) Shift register receiving all-on signal and display device
KR100381064B1 (en) Shift register and image display device
JP4968681B2 (en) Semiconductor circuit, display device using the same, and driving method thereof
JP2013015845A (en) Shift register driving method, shift register and liquid crystal display equipped therewith
JP5090008B2 (en) Semiconductor device and shift register circuit
KR101066493B1 (en) Shift register
US8913709B2 (en) Shift register circuit

Legal Events

Date Code Title Description
RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20080529

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20100513

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120117

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120312

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120403

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120501

R150 Certificate of patent or registration of utility model

Ref document number: 4990034

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150511

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250