JP4814720B2 - 微粒子測定装置 - Google Patents
微粒子測定装置 Download PDFInfo
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- JP4814720B2 JP4814720B2 JP2006209773A JP2006209773A JP4814720B2 JP 4814720 B2 JP4814720 B2 JP 4814720B2 JP 2006209773 A JP2006209773 A JP 2006209773A JP 2006209773 A JP2006209773 A JP 2006209773A JP 4814720 B2 JP4814720 B2 JP 4814720B2
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Description
図3は、このフローサイトメトリに用いられる従来の微粒子測定装置の概略構成を示す斜視図である。
そこで、本発明の目的は、コストアップを抑制しつつ、微粒子の形状や性質などの計測精度を向上させることが可能な微粒子測定装置を提供することである。
図1は、本発明の一実施形態に係る微粒子測定装置の概略構成を示す側面図、図2(a)は、試料液13とシース液14との温度が等しい時の微粒子から発生した光路を図1のA−A線に沿って示す断面図、図2(b)は、試料液13とシース液14との温度が異なる時の微粒子から発生した光路を図1のA−A線に沿って示す断面図である。
一方、図2(b)において、試料液13の温度がシース液14の温度よりも低くなるように設定した場合には、シース液14の屈折率よりも試料液13の屈折率の方が大きくなる。このため、試料液13中の微粒子7から発生した光は、試料液13からシース液14に入射する時に進路が曲げられ、微粒子7から発生した光の集光効率を向上させることができる。
2 フローセル
3 レーザ光源
4、5 レンズ
6 受光素子
7 微粒子
8 ノズル
9 試料液容器
10 シース液容器
11 ヒータ
12 クーラ
13 試料液
14 シース液
Claims (1)
- 微粒子を含む試料液がシース液で包み込まれた試料流を形成するフローセルと、前記試料流に前記微粒子を発光させる光を照射する光源と、前記試料流に含まれる微粒子からの光を集光する集光レンズと、前記集光レンズにより集光された光の強度を検出する光検出器と、前記微粒子から発せられた光が前記試料流の試料液とシース液との屈折率差により進路を曲げられて前記集光レンズに入射するように、前記試料液の温度を前記シース液の温度より低く制御する温度制御手段とを備えたことを特徴とする微粒子測定装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006209773A JP4814720B2 (ja) | 2006-08-01 | 2006-08-01 | 微粒子測定装置 |
Applications Claiming Priority (1)
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JP2006209773A JP4814720B2 (ja) | 2006-08-01 | 2006-08-01 | 微粒子測定装置 |
Publications (2)
Publication Number | Publication Date |
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JP2008039405A JP2008039405A (ja) | 2008-02-21 |
JP4814720B2 true JP4814720B2 (ja) | 2011-11-16 |
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JP2006209773A Active JP4814720B2 (ja) | 2006-08-01 | 2006-08-01 | 微粒子測定装置 |
Country Status (1)
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JP (1) | JP4814720B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5924118B2 (ja) * | 2012-05-17 | 2016-05-25 | ソニー株式会社 | サンプル送液装置、フローサイトメータ及びサンプル送液方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09288053A (ja) * | 1996-02-22 | 1997-11-04 | Hitachi Ltd | 粒子分析装置 |
JP3305232B2 (ja) * | 1997-06-03 | 2002-07-22 | シスメックス株式会社 | 粒子測定装置 |
JPH11132931A (ja) * | 1997-10-30 | 1999-05-21 | Sysmex Corp | フロー式粒子測定装置 |
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2006
- 2006-08-01 JP JP2006209773A patent/JP4814720B2/ja active Active
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