JP4079579B2 - Wet processing equipment - Google Patents

Wet processing equipment Download PDF

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Publication number
JP4079579B2
JP4079579B2 JP2000189576A JP2000189576A JP4079579B2 JP 4079579 B2 JP4079579 B2 JP 4079579B2 JP 2000189576 A JP2000189576 A JP 2000189576A JP 2000189576 A JP2000189576 A JP 2000189576A JP 4079579 B2 JP4079579 B2 JP 4079579B2
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Japan
Prior art keywords
substrate
processing apparatus
wet processing
treatment
roller
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Expired - Fee Related
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JP2000189576A
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Japanese (ja)
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JP2002009041A (en
Inventor
義基 古賀
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Tianma Japan Ltd
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NEC LCD Technologies Ltd
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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • ing And Chemical Polishing (AREA)
  • Weting (AREA)

Abstract

PROBLEM TO BE SOLVED: To solve the problem that a particle adheres again by allowing treatment liquid to remain near the center of a substrate that is highlighted according to enlargement in the size of the substrate since plane treatment is carried out to a glass substrate, in a method for performing washing treatment to the substrate that is being conveyed with slant attitude on a substrate conveyance path that is slanted in a surface that orthogonally crosses a conveyance direction as the washing method of the glass substrate. SOLUTION: In a curved state where the center part of a substrate 1 becomes higher, treatment liquid 8 flows and is discharged from the center of the substrate 1 to an end part without stagnation to allow the surface of the substrate 1 to be subjected to chemical liquid or pure water spry treatment, thus eliminating the need for draining the chemical liquid on the front and rear surfaces of the substrate to prevent the chemical liquid after the chemical liquid treatment from being taken out, and at the same time reducing the readhesion of the particle to the surface of the substrate after the pure water spray treatment.

Description

【0001】
【発明の属する技術分野】
本発明は、基板の処理装置、特に、基板表面のエッチング、又は、基板表面の洗浄に用いられるウェット処理装置に関するものである。
【0002】
【従来の技術】
従来、ガラス基板の洗浄方法として、例えば、特開平08−039742号公報には、搬送方向に対して直交した面内で傾斜した基板搬送路の上を、傾斜姿勢で搬送されつつある基板に洗浄処理をする方法が示されている。
【0003】
【発明が解決しようとする課題】
しかしながら、この洗浄処理方法は、ガラス基板に対しては平面処理であるが為に、基板のサイズ拡大に伴ってクローズアップされてくる基板中央付近での処理液の滞留によるパーティクルの再付着という問題に対しては解決策とはなっていなかった。さらに、傾斜した搬送路では、下がった方の搬送ローラの方に基板の負荷が偏ってしまい、搬送の安定性がないという問題もある。
【0004】
本発明の目的は、エッチング液、或いは、洗浄液の基板中央付近での滞留による問題を解決することのできるウェット処理装置を提供することにある。
【0005】
【課題を解決するための手段】
本発明のウェット処理装置は、基板を搬送しながら前記基板の上方から前記基板の表面に前記基板の表面を処理する処理液を滴下させるウェット処理装置であって、前記基板の両端を上乗せローラ及び搬送ローラでその上下側からそれぞれ挟み、前記搬送ローラと同軸に回転し該搬送ローラより僅かに径の大きい中間ローラを前記基板の下方のみに配置し、前記基板の中央部を該基板の下側から上方に押し上げて該基板を湾曲させ、前記基板の搬送を行うことを特徴とする、或いは、前記中間ローラと前記搬送ローラとの間に設けられ、前記中間ローラより径が小さく、かつ前記搬送ローラより径が大きい中間ローラであって、前記搬送ローラと同軸に回転し、前記基板の下方のみに配置され、前記基板を下側から上方に押し上げることにより該基板を湾曲させ、前記基板の搬送を行う中間ローラをさらに備える、というもので、前記基板の両端の上下の搬送ローラ以外の中間ローラは、その直径が、前記基板の両端の下の搬送ローラの直径よりも長く、前記中間ローラは、前記基板の中央部に近づくほどその径が長くなり、前記基板の中央部でその径が最大の長さとなる、というものである。
【0006】
上述のウェット処理装置は、前記基板の表面への前記処理液の滴下が、スプレーにより行われ、さらに具体的には、前記基板の表面への前記処理液の滴下が、前記基板の上方に設けられた複数のスプレーノズルからのスプレーにより行われる、或いは、前記基板の表面への前記処理液の滴下が、前記基板の上方に設けられた一つのスプレーノズルからのスプレーにより行われ、前記一つのスプレーノズルは、前記基板の中央部の真上に位置し、前記基板が、薄膜トランジスタを搭載する透明基板である、という形態を採り得る。
【0007】
【発明の実施の形態】
次に、本発明の実施形態を説明する前に、本発明の特徴について記しておく。本発明のウェット処理装置は、基板の表裏面を枚葉式にウエット処理する際、基板を湾曲した状態を保持したままで薬液処理及び純水処理を行い、パーティクルの基板への再付着を低減し、基板を薬液処理した後の基板の表面からの液切り作業を不要とするものである。
【0008】
即ち、基板の裏面両端部に搬送ローラを配置し、搬送ローラの中間に搬送ローラより径が大きい中間ローラで支持する。基板の表面端部には上乗せローラが設けられ、上述の裏面両端部の搬送ローラとペアとなって基板の両端を挟み込み、基板の上方には、薬液処理及び純水処理用のスプレーノズルが取り付けられている。基板は上乗せローラと搬送ローラで基板端部を挟み、中間ローラで基板裏面中心線を押し付けることで湾曲し、その状態にて搬送しながら薬液処理及び純水スプレー処理を順次行う。
【0009】
次に、本発明の第1の実施形態を図1に基づいて説明する。図1は、本発明の第1の実施形態のウェット処理装置を基板の搬送方向に直交する平面で搬送中の基板と共に切断したときの様子を示す模式断面図である。
【0010】
まず、ガラス等の材料からなる基板1の裏面両端部に搬送ローラ2を配置し、搬送ローラ2の中間には搬送ローラ2より径が大きい中間ローラ3で基板1を支持している。基板1の中央部の中間ローラ3の他に、基板1の両端部と中間ローラ3との間にも中間ローラ4が設けられており、中間ローラの径は、基板1の中央部の中間ローラ3の径が最も大きく、搬送ローラ2に向かうに従って徐々にその径が小さくなるようにそれぞれの径が設定される。
【0011】
この実施形態では、中間ローラを3つ設けた例を示しているが、中間ローラとしては、基板の中央部の中間ローラのみの場合、基板の中央部の中間ローラ以外に4以上の偶数倍の中間ローラを設けた場合等も本実施形態の変形例として考えられる。
【0012】
上記の基板1の裏面両端部の搬送ローラ2に加えて、基板1の表面端部には上乗せローラ5が設けられ、基板1の上方には、スプレーパイプ6に複数本のスプレーノズル7が取り付けられ、これらの組み合わせにより、ウェット処理装置20が構成されている。
【0013】
基板1は上乗せローラ5と搬送ローラ2で基板1の両端部を挟み込み、中間ローラ3で基板1の裏面の中央部を押し上げ、中間ローラ4で基板1の中央部での押し上げを支持することで、基板1の中央部が高くなる湾曲した形状で基板1を保持している。
【0014】
この湾曲の度合いに関しては、基板の材料により異なるが、液晶パネル用に採用されているガラス基板等では、例えば、平面形状が680mm×880mm、厚さが0.7mmのサイズのガラス製基板の場合、湾曲させる上限値としては、ガラス製基板の中央部が平坦なときよりも70mm突き出る状態であり、湾曲させる下限値としては、ガラス基板両端部の搬送ローラの高低差にガラス基板の厚さを加えた値が必要である。
【0015】
次に、ウェット処理装置20の動作について、図1を参照して説明する。
【0016】
まず、モータ、ギヤを用いた駆動部(図示省略)により、搬送ローラ2、中間ローラ3、4、上乗せローラ5を基板1を搬出する方向(紙面に垂直ないずれかの方向)に回転させることで基板1を湾曲した状態を保持したまま搬送する。
【0017】
次に、基板1の上方に配置しているスプレーパイプ6に処理液8を供給し、スプレーノズル7により基板1の表面に処理液8を吐出し、薬液処理及び純水スプレー処理を順次行う。
【0018】
本実施形態の効果として、まず第一に、基板1の洗浄処理において、基板1の表面での洗浄処理液の滞留による洗浄処理液中の浮遊パーティクルの基板1表面への再付着が低減できるということである。
【0019】
その理由は、基板1の中央部が高くなる湾曲した状態で、基板1の表面に純水スプレー処理を行う為、洗浄処理液が基板1の中央部から端部に、洗浄処理により発生したパーティクルを含んだ処理水が停滞することなく図中矢印Xの方向に流れ、排出される。
【0020】
第二の効果として、薬液処理後の薬液持ち出し防止の為に行う基板1の表裏面の薬液の液切り作業が不要となる。
【0021】
その理由は、基板1の薬液処理後、基板1の中央部が高くなる湾曲した状態で基板1を水洗処理槽に搬送する為、薬液が基板1に停滞することなく流れ落ち、基板1の表面から排出される。
【0022】
次に、本発明の第2の実施形態を図2に基づいて説明する。図2は、本発明の第2の実施形態のウェット処理装置を基板の搬送方向に直交する平面で搬送中の基板と共に切断したときの様子を示す模式断面図である。
【0023】
まず、基板1の裏面両端部に搬送ローラ2を配置し、搬送ローラ2の中間に搬送ローラより径が大きい中間ローラ3で基板1を支持する。基板1の表面端部には上乗せローラ5が設けられ、基板1の中央部上方に薬液処理及び純水処理用のスプレーノズル17が取り付けられ、これらの組み合わせにより、ウェット処理装置30が構成されている。
【0024】
この実施形態では、基板1の上方に基板1の中央部の上方に位置するスプレーノズル17のみを設け、スプレーノズル17を大流量仕様のノズルにすることで、洗浄処理により発生したパーティクルを含んだ洗浄処理水が、基板1の中央部から端部に、第1の実施形態よりもさらに停滞することなく流れていく為、パーティクルの基板1の表面への再付着を一層低減させることができる。
【0025】
【発明の効果】
以上に説明したように、本発明のウェット処理装置は、基板の中央部が高くなる湾曲した状態で、基板の表面に薬液処理、或いは、純水スプレー処理を行う為、処理液が基板の中央部から端部に停滞することなく流れ、排出されるので、薬液処理後の薬液持ち出し防止の為に行う基板の表裏面の薬液の液切り作業が不要となると共に、純水スプレー処理後のパーティクルの基板の表面への再付着を低減させることができる。
【図面の簡単な説明】
【図1】本発明の第1の実施形態のウェット処理装置を示す模式断面図である。
【図2】本発明の第2の実施形態のウェット処理装置を示す模式断面図である。
【符号の説明】
1 基板
2 搬送ローラ
3、4 中間ローラ
5 上乗せローラ
6 スプレーパイプ
7、17 スプレーノズル
8 処理液
20、30 ウェット処理装置
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a substrate processing apparatus, and more particularly to a wet processing apparatus used for etching a substrate surface or cleaning a substrate surface.
[0002]
[Prior art]
Conventionally, as a glass substrate cleaning method, for example, in Japanese Patent Application Laid-Open No. 08-039742, a substrate that is being transported in an inclined posture is cleaned on a substrate transport path inclined in a plane orthogonal to the transport direction. The method of processing is shown.
[0003]
[Problems to be solved by the invention]
However, since this cleaning method is a planar process for glass substrates, the problem of reattachment of particles due to retention of the processing liquid near the center of the substrate, which is close-up as the size of the substrate increases. Was not a solution. Further, in the inclined conveyance path, there is a problem that the substrate load is biased toward the lower conveyance roller and the conveyance stability is not stable.
[0004]
An object of the present invention is to provide a wet processing apparatus capable of solving the problem caused by retention of an etching solution or a cleaning solution near the center of a substrate.
[0005]
[Means for Solving the Problems]
The wet processing apparatus of the present invention is a wet processing apparatus that drops a processing liquid for processing the surface of the substrate onto the surface of the substrate from above the substrate while transporting the substrate, and includes both rollers on both ends of the substrate, An intermediate roller that is sandwiched from the upper and lower sides of the conveyance roller and rotates coaxially with the conveyance roller and slightly larger in diameter than the conveyance roller is disposed only below the substrate, and the central portion of the substrate is located below the substrate The substrate is conveyed by pushing it upward from the curved surface , or provided between the intermediate roller and the conveyance roller, having a smaller diameter than the intermediate roller, and the conveyance An intermediate roller having a diameter larger than that of the roller, which rotates coaxially with the transport roller, is disposed only below the substrate, and pushes the substrate upward from below. The substrate is curved, further comprising an intermediate roller for transporting the substrate, those of the upper and lower intermediate roller other than the transport rollers at both ends of the substrate has a diameter, the transport rollers under both ends of the substrate The diameter of the intermediate roller becomes longer as it approaches the central part of the substrate, and the diameter becomes the maximum length at the central part of the substrate.
[0006]
In the wet processing apparatus described above, the treatment liquid is dropped onto the surface of the substrate by spraying. More specifically, the treatment liquid is dropped onto the surface of the substrate above the substrate. The treatment liquid is sprayed from a plurality of spray nozzles, or the treatment liquid is dropped onto the surface of the substrate by spraying from one spray nozzle provided above the substrate. The spray nozzle may be positioned directly above the central portion of the substrate, and the substrate may be a transparent substrate on which a thin film transistor is mounted.
[0007]
DETAILED DESCRIPTION OF THE INVENTION
Next, before describing the embodiments of the present invention, the features of the present invention will be described. The wet processing apparatus according to the present invention reduces the reattachment of particles to the substrate by performing chemical treatment and pure water treatment while keeping the substrate curved when the front and back surfaces of the substrate are wet processed in a single wafer manner. However, the operation of draining the liquid from the surface of the substrate after the substrate is subjected to the chemical treatment is unnecessary.
[0008]
That is, a conveyance roller is disposed at both ends of the back surface of the substrate, and is supported by an intermediate roller having a diameter larger than that of the conveyance roller in the middle of the conveyance roller. An upper roller is provided at the front end of the substrate, and the both ends of the substrate are paired with the above-described transport rollers at both ends of the back surface. A spray nozzle for chemical treatment and pure water treatment is attached above the substrate. It has been. The substrate is bent by sandwiching the end of the substrate between the loading roller and the conveying roller, and pressing the center line on the back surface of the substrate with the intermediate roller, and sequentially performing the chemical treatment and the pure water spray treatment while conveying in this state.
[0009]
Next, a first embodiment of the present invention will be described with reference to FIG. FIG. 1 is a schematic cross-sectional view showing a state when the wet processing apparatus according to the first embodiment of the present invention is cut along with a substrate being transported along a plane perpendicular to the substrate transport direction.
[0010]
First, the conveyance rollers 2 are arranged at both ends of the back surface of the substrate 1 made of a material such as glass, and the substrate 1 is supported by an intermediate roller 3 having a diameter larger than that of the conveyance rollers 2 in the middle of the conveyance rollers 2. In addition to the intermediate roller 3 at the center of the substrate 1, an intermediate roller 4 is provided between both ends of the substrate 1 and the intermediate roller 3. The diameter of the intermediate roller is the intermediate roller at the center of the substrate 1. Each diameter is set so that the diameter of 3 is the largest, and the diameter gradually decreases toward the transport roller 2.
[0011]
In this embodiment, an example in which three intermediate rollers are provided is shown. However, as the intermediate roller, in the case of only the intermediate roller in the central portion of the substrate, the number of even multiples of 4 or more is provided in addition to the intermediate roller in the central portion of the substrate. A case where an intermediate roller is provided is also considered as a modification of the present embodiment.
[0012]
In addition to the transport rollers 2 at both ends of the back surface of the substrate 1, an upper roller 5 is provided at the front surface end portion of the substrate 1, and a plurality of spray nozzles 7 are attached to the spray pipe 6 above the substrate 1. The wet processing apparatus 20 is configured by a combination of these.
[0013]
The substrate 1 is sandwiched between the both ends of the substrate 1 by the loading roller 5 and the transport roller 2, the intermediate roller 3 pushes up the central portion of the back surface of the substrate 1, and the intermediate roller 4 supports the push-up at the central portion of the substrate 1. The substrate 1 is held in a curved shape in which the central portion of the substrate 1 is raised.
[0014]
Although the degree of curvature differs depending on the material of the substrate, in the case of a glass substrate or the like used for a liquid crystal panel, for example, a planar substrate having a size of 680 mm × 880 mm and a thickness of 0.7 mm. The upper limit value for curving is a state in which the central portion of the glass substrate protrudes 70 mm more than when the glass substrate is flat, and the lower limit value for curving is the thickness of the glass substrate to the difference in height of the transport rollers at both ends of the glass substrate. The added value is required.
[0015]
Next, the operation of the wet processing apparatus 20 will be described with reference to FIG.
[0016]
First, the transport roller 2, the intermediate rollers 3, 4 and the loading roller 5 are rotated in the direction of unloading the substrate 1 (any direction perpendicular to the paper surface) by a drive unit (not shown) using a motor and a gear. Then, the substrate 1 is conveyed while maintaining the curved state.
[0017]
Next, the processing liquid 8 is supplied to the spray pipe 6 disposed above the substrate 1, the processing liquid 8 is discharged onto the surface of the substrate 1 by the spray nozzle 7, and chemical liquid processing and pure water spray processing are sequentially performed.
[0018]
As an effect of the present embodiment, first of all, in the cleaning process of the substrate 1, the reattachment of floating particles in the cleaning process liquid due to the stay of the cleaning process liquid on the surface of the substrate 1 can be reduced. That is.
[0019]
The reason is that, since the surface of the substrate 1 is subjected to a pure water spray process in a curved state in which the central part of the substrate 1 is raised, particles generated by the cleaning process from the central part of the substrate 1 to the end part thereof. The treated water containing water flows in the direction of arrow X in the figure without stagnation and is discharged.
[0020]
As a second effect, it is not necessary to drain the chemical solution on the front and back surfaces of the substrate 1 in order to prevent the chemical solution from being taken out after the chemical treatment.
[0021]
The reason for this is that, after the chemical treatment of the substrate 1, the substrate 1 is transported to the washing treatment tank in a curved state where the central portion of the substrate 1 is raised. Discharged.
[0022]
Next, a second embodiment of the present invention will be described with reference to FIG. FIG. 2 is a schematic cross-sectional view showing a state in which the wet processing apparatus according to the second embodiment of the present invention is cut along with a substrate being transported along a plane orthogonal to the substrate transport direction.
[0023]
First, the transport roller 2 is disposed at both ends of the back surface of the substrate 1, and the substrate 1 is supported by the intermediate roller 3 having a diameter larger than that of the transport roller in the middle of the transport roller 2. An upper roller 5 is provided at the surface end of the substrate 1, and a spray nozzle 17 for chemical treatment and pure water treatment is attached above the central portion of the substrate 1, and a wet treatment apparatus 30 is configured by combining these. Yes.
[0024]
In this embodiment, only the spray nozzle 17 located above the central portion of the substrate 1 is provided above the substrate 1 and the spray nozzle 17 is a nozzle having a large flow rate specification so that particles generated by the cleaning process are included. Since the cleaning water flows from the central portion to the end portion of the substrate 1 without further stagnation than in the first embodiment, the reattachment of particles to the surface of the substrate 1 can be further reduced.
[0025]
【The invention's effect】
As described above, the wet processing apparatus according to the present invention performs the chemical solution processing or the pure water spray processing on the surface of the substrate in a curved state where the central portion of the substrate is raised, so that the processing liquid is in the center of the substrate. Since the liquid flows and is discharged without stagnation from one part to the other, there is no need to remove the chemical solution on the front and back surfaces of the substrate to prevent the chemical solution from being taken out after the chemical treatment, and the particles after the pure water spray treatment Can be reduced on the surface of the substrate.
[Brief description of the drawings]
FIG. 1 is a schematic cross-sectional view showing a wet processing apparatus according to a first embodiment of the present invention.
FIG. 2 is a schematic cross-sectional view showing a wet processing apparatus according to a second embodiment of the present invention.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Substrate 2 Conveyance roller 3, 4 Intermediate roller 5 Overlay roller 6 Spray pipe 7, 17 Spray nozzle 8 Treatment liquid 20, 30 Wet treatment device

Claims (8)

基板を搬送しながら前記基板の上方から前記基板の表面に前記基板の表面を処理する処理液を滴下させるウェット処理装置であって、前記基板の両端を上乗せローラ及び搬送ローラでその上下側からそれぞれ挟み、前記搬送ローラと同軸に回転し該搬送ローラより僅かに径の大きい中間ローラを前記基板の下方のみに配置し、前記基板の中央部を該基板の下側から上方に押し上げて該基板を湾曲させ、前記基板の搬送を行うことを特徴とするウェット処理装置。  A wet processing apparatus for dropping a processing liquid for processing the surface of the substrate onto the surface of the substrate from above the substrate while transporting the substrate, both ends of the substrate being placed on the upper and lower sides by rollers and transport rollers, respectively. An intermediate roller having a diameter slightly larger than that of the transport roller is disposed only below the substrate, and the center portion of the substrate is pushed upward from the lower side of the substrate to rotate the substrate. A wet processing apparatus which is bent and transports the substrate. 前記搬送ローラに、前記湾曲した基板を支持する傾斜部が形成されたことを特徴とする、請求項1記載のウェット処理装置。  The wet processing apparatus according to claim 1, wherein an inclined portion that supports the curved substrate is formed on the transport roller. 前記中間ローラと前記搬送ローラとの間に設けられ、前記中間ローラより径が小さく、かつ前記搬送ローラより径が大きい中間ローラであって、前記搬送ローラと同軸に回転し、前記基板の下方のみに配置され、前記基板を下側から上方に押し上げることにより該基板を湾曲させ、前記基板の搬送を行う中間ローラをさらに備えることを特徴とする、請求項1又は2記載のウェット処理装置。  An intermediate roller provided between the intermediate roller and the transport roller and having a diameter smaller than that of the intermediate roller and larger than that of the transport roller. The intermediate roller rotates coaxially with the transport roller, and only below the substrate. 3. The wet processing apparatus according to claim 1, further comprising an intermediate roller that is disposed in the upper surface and bends the substrate upward from the lower side to bend the substrate and transport the substrate. 4. 前記基板の表面への前記処理液の滴下が、スプレーにより行われる請求項1乃至3のいずれか1項に記載のウェット処理装置。Dropping of the treatment liquid to the surface of the substrate, a wet processing apparatus according to any one of claims 1 to 3 is carried out by spraying. 前記基板の表面への前記処理液の滴下が、前記基板の上方に設けられた複数のスプレーノズルからのスプレーにより行われる請求項4記載のウェット処理装置。  The wet processing apparatus according to claim 4, wherein the treatment liquid is dropped onto the surface of the substrate by spraying from a plurality of spray nozzles provided above the substrate. 前記基板の表面への前記処理液の滴下が、前記基板の上方に設けられた一つのスプレーノズルからのスプレーにより行われる請求項4記載のウェット処理装置。  The wet processing apparatus according to claim 4, wherein the treatment liquid is dropped onto the surface of the substrate by spraying from one spray nozzle provided above the substrate. 前記一つのスプレーノズルは、前記基板の中央部の真上に位置する請求項6記載のウェット処理装置。  The wet processing apparatus according to claim 6, wherein the one spray nozzle is located directly above a central portion of the substrate. 前記基板が、薄膜トランジスタを搭載する透明基板である請求項1乃至7のいずれか1項に記載のウェット処理装置。The wet processing apparatus according to claim 1, wherein the substrate is a transparent substrate on which a thin film transistor is mounted.
JP2000189576A 2000-06-23 2000-06-23 Wet processing equipment Expired - Fee Related JP4079579B2 (en)

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JP4478474B2 (en) * 2003-06-30 2010-06-09 セントラル硝子株式会社 Delivery method of bent glass plate
JP4881575B2 (en) * 2005-04-28 2012-02-22 芝浦メカトロニクス株式会社 Substrate transfer device
JP2009141321A (en) * 2007-12-10 2009-06-25 Samsung Electro-Mechanics Co Ltd Substrate transfer apparatus
WO2011077960A1 (en) * 2009-12-25 2011-06-30 シャープ株式会社 Support device and drying device including the same
KR101373306B1 (en) 2013-12-20 2014-03-11 김문환 Apparatus for etching glass substrate and method of etching glass substrate using the same
JP6289922B2 (en) * 2014-01-30 2018-03-07 芝浦メカトロニクス株式会社 Substrate processing apparatus and substrate processing method
WO2018090303A1 (en) * 2016-11-17 2018-05-24 深圳市柔宇科技有限公司 Conveying device, and glass cleaning device
JP7332391B2 (en) * 2018-09-28 2023-08-23 芝浦メカトロニクス株式会社 Substrate transfer device and substrate processing device
CN110047735A (en) * 2019-04-02 2019-07-23 深圳市华星光电技术有限公司 Metal structure wet process processing method, TFT preparation method, TFT and display device
KR102413110B1 (en) * 2020-07-28 2022-06-24 신파워 컴패니 리미티드 Horizontal wet process method of a flexible substrate
CN113560297B (en) * 2021-06-28 2022-10-14 吴江南玻华东工程玻璃有限公司 Curved glass cleaning device and using method

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