JP3271257B2 - Triac durability test equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a triac endurance test apparatus capable of shortening a test period by automatically judging a junction temperature and an optimum test point of an acceleration test.

[0002]

2. Description of the Related Art A conventional triac endurance test apparatus is disclosed, for example, in JP-A-4-264272. In this test device, the load (halogen lamp) is connected in parallel, the control unit switches them and repeatedly turns them on and off, so that the inrush current is increased so that the maximum current always flows through the triac, and the acceleration test is performed. Is going. However, the acceleration test is not limited to the case where the inrush current is large. The inrush current, the test time (ON / OFF), and the T
Considering c (control temperature), eventually T
j (junction temperature, that is, the temperature of the junction) must be determined. Nevertheless, in the prior art, the test apparatus does not consider the above points and is still insufficient from the viewpoint of improving the efficiency of the test.

[0003]

As described above, a conventional triac endurance test apparatus (for example, Japanese Unexamined Patent Publication No.
No. 72, the phase control and zero-crossing
It was possible to flow a large inrush current with the start. However, in the original durability test (acceleration test), it is essential to pay attention to the junction temperature (Tj) of the test object (triac) as well as the inrush current, and the acceleration coefficient of the durability test is calculated. It is important to conduct tests. Nevertheless, the conventional triac durability test apparatus is not the best test for increasing Tj as the inrush current increases, and the ON / OFF duty is deeply involved. Was. Further, the conventional triac test apparatus is excellent in that the inrush current is increased.However, it takes time to calculate the junction temperature, determine whether or not the temperature is saturated, set the conditions, calculate the acceleration coefficient, and the like. Therefore, there is a problem that a burden on a person increases. Furthermore, in the conventional triac test device,
Although it is excellent in that the inrush current is increased, there is a problem that the test period is lengthened because the number of measurement items for performing the test is considerably increased.

A first object of the present invention is to solve these conventional problems and to increase the junction temperature of a device under test by ON / OF.
By calculating for each F condition, the point where the junction temperature becomes the highest can be automatically determined,
An object of the present invention is to provide a triac durability test device capable of improving test efficiency. A second object of the present invention is to
The temperature saturation of the DUT is automatically determined from the current and case temperature.After the temperature saturation, the conditions are changed immediately and all actions for measurement are performed automatically, reducing the burden on humans and An object of the present invention is to provide a triac durability test device capable of improving efficiency. A third object of the present invention is to search for the best test conditions (points) of an equivalent DUT from past data and perform only a measurement in the vicinity thereof, thereby further reducing the time required for the measurement. An object of the present invention is to provide a sex test device.

[0005]

In order to achieve the above object, a triac durability test apparatus according to the present invention comprises: (a) a triac, which is a test object, and a load connected to the triac by switching the load in parallel. A triac endurance test apparatus comprising a loader section, which repeats a conduction state and a non-conduction state of the DUT, sequentially switches the load of the loader section in the non-conduction state, and then switches the load to a conduction state. When the case temperature of the DUT is determined to be saturated and the start of measurement is instructed, the temperature of the DUT, a temperature detector for measuring current and voltage, a current detector, and a voltage detector, respectively. Calculating the internal temperature rise of the device under test from the data of the voltage detection unit, the current detection unit, and the temperature detection unit, and calculating the junction temperature by adding the case temperature to the temperature increase. ON an operation unit, the obtained value that
After accumulating for each / OFF duty, the characteristics of the case temperature and the internal rise temperature of the DUT are created, and the characteristic values are converted into data of the junction temperature characteristics of the DUT, so that the junction temperature becomes the highest. And a control unit for automatically outputting a test condition area. Further, (b) the calculation unit extracts only the vertexes of the detected temperature curve of the case of the DUT, creates a curve connecting the vertices, and calculates the temperature difference or the slope value of the curve. Since the peak value of the current waveform of the DUT is within a predetermined fluctuation value, it is determined whether or not the case temperature of the DUT is saturated, and the temperature data at the time of saturation is determined by the control unit. The control section adds or subtracts a value stored for each duty of a preset ON / OFF condition to or from the temperature data to change the set value, and then resets the arithmetic section. Also features. (C) A memory section is provided in the control section, and before the test, the control section stores the V and I ratings of the DUT and the power of the load in the loader section in the memory section. The stored data is also stored in the memory unit, and a junction temperature curve with respect to a change in ON / OFF duty is created. When a new test is performed, the control unit reads V, I, and V of the DUT from the memory unit. It is also characterized in that the load closest to the load in the loader section is searched, and the ON / OFF duty condition at which the junction temperature is highest among the data in the memory section is selected.

[0006]

In the present invention, the point at which the junction temperature is the highest and the point at which the acceleration test is the largest, that is, the best point, are automatically determined by calculating the junction temperature of the DUT for each ON / OFF condition. Therefore, the test period can be shortened, and the efficiency of the test can be improved. In addition, the temperature saturation of the DUT is automatically determined from the current and the case temperature. After the temperature saturation, the conditions can be changed immediately, and all actions for measurement can be performed automatically. In this case, there is no need to have a person at the time of measurement, so that the burden on the person is reduced.
The efficiency of the test can be improved. Furthermore, by adding a memory unit, the best test conditions (points) of the equivalent DUT can be searched from the past data, and only the measurement in the vicinity thereof needs to be performed. Can be significantly reduced compared to

[0007]

Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 16 is an overall block diagram of a triac durability test apparatus showing the first to third embodiments of the present invention. First, the first embodiment will be described with reference to FIGS.
This will be described with reference to FIG. In FIG. 16, reference numeral 15 denotes a test object,
That is, a triac, a control unit for controlling each unit such as a DUT, a calculation unit and a loader unit, a calculation unit, a current detection unit, a temperature detection unit, a voltage detection unit, a voltage detection unit, and a voltage detection unit.
Reference numeral 6 denotes a loader unit, and reference numeral 17 denotes a memory unit added in the third embodiment. The current, temperature, and voltage detected by the current detection unit 12, the temperature detection unit 13, and the voltage detection unit 14 are:
The calculation is performed by inputting the data to the calculation unit 11, and the control unit 10 is activated based on the calculation result to control the triac 15, which is the device under test. The control unit 10 includes a triac 15
The current and voltage flowing through the load are changed by switching a switch or the like of the loader unit 16 connected to the load.

FIG. 1 is a configuration diagram of a detailed circuit of a power supply system in FIG. As an operation procedure of FIG. 1, first, the control unit 10 supplies the test conditions of ON time / OFF time and O
Set the number of N / OFF times and start measurement or test. The control unit 10 applies RL1, RL2, RL3... RL in the loader unit 16 to the device under test (triac) 15.
A gate signal delayed synchronously with the signal of the switching timing of n is transmitted. Thus, the control unit 10 switches the RL in the loader unit 16 to turn on RL1 to RLn.
RLn are switches such as relays and SSRs. As a result, any of the coil units L _{1 to} L ₃ connected in parallel is connected to the triac.
By sending a gate signal to the device under test (triac) 15 to turn on the device under test (triac), the triac 15 becomes conductive.
C current flows. Next, the ON set by the control unit 10
If the time has passed, the DUT (triac) 15
Stop the gate signal to. Then, after becoming non-conductive, RL1 to RLn in the loader unit 16 are switched to the next RL and turned on. Next, when the set OFF time has elapsed, a gate signal is output from the control unit 10 to the device under test (triac) 15 to make it a conductive state.

This series of operations is repeatedly performed by the control unit 10, and when the user determines that the case temperature of the device under test (triac) 15 is saturated, the control unit 10 manually presses a button or the like. , Voltage detector 1
4. An input current (such as a shunt resistor), an input voltage, and a case temperature flowing through the device under test (triac) 15 are measured by the temperature detector 13 and the current detector 12. The measured data is used to calculate a rise in the internal temperature of the device under test (triac) by the calculation unit 11 and to add the case temperature to obtain a junction temperature. FIG. 4 is a diagram illustrating a method of calculating a current waveform of an inrush current, an internal rise temperature, and a junction temperature by a calculation unit. That is, FIG.
FIG. 4A is a diagram showing a current waveform obtained from a voltage, FIG. 4B is a diagram showing a case temperature of a DUT (triac), and FIG.
(C) is a calculation formula for calculating the internal rise temperature of the triac. First, the current waveform (a) is obtained from the voltage, the internal rise temperature (ΔTj) of the DUT is calculated from the case temperature (b) of the triac (c), and the case temperature is added to this value (ΔTj) to obtain the junction. Find the temperature.

FIG. 2 is a characteristic diagram of the triac case temperature and the internal temperature rise (ΔTj) of the triac.
FIG. 3 is a characteristic diagram of a junction temperature of a triac. Values determined as described above (triac case temperature, triac internal rise temperature (ΔTj))
Are stored in the control unit 10 for each set ON / OFF duty as shown in FIG. As is clear from FIG. 2, as the ON / OFF duty increases,
The value of ΔTj decreases. Conversely, the case temperature of the triac increases as the duty increases. By repeating such a series of operations, the triac case temperature and the triac internal rise temperature (ΔTj) shown in FIG.
A graph for each condition is created. Next, in the control unit 10, the result is converted into a graph of the junction temperature Tj of the triac shown in FIG. That is, the internal rise temperature (ΔTj) of the triac for each duty
Is added to the case temperature (t _i ) to calculate the junction temperature Tj for each duty, and the data is converted. Then, the area indicated by 9 in FIG. 3, that is, the period area A of the test condition in which the junction temperature Tj reaches the maximum temperature is automatically output. Thus, it is possible to automatically determine which test condition is the best test, so that the test can be performed efficiently.

Next, a second embodiment of the present invention will be described with reference to FIGS. 5 to 9 and FIG. 5 is a characteristic diagram of the case temperature of the triac, FIG. 6 is an enlarged view of the case temperature characteristic of the triac of FIG. 5, FIG. 7 is an enlarged view of A of the temperature characteristic of FIG. 6, and FIG. FIG. 9 is an enlarged view of B of the temperature characteristic of FIG. 6, and FIG. 9 is a waveform diagram showing two types of inrush current. In the triac test apparatus shown in FIG. 16, the current, voltage, and temperature are detected by the current detection unit 12, the temperature detection unit 13, and the voltage detection unit 14 during the operation of the first embodiment. Each of the detected data is stored in the arithmetic unit 11
The arithmetic unit 11 makes the following determination. That is, as for the case temperature, the case temperature of the triac shown in FIG. 5 can be measured. When the value is enlarged, an enlarged view as shown in FIG. 6 is obtained. That is, as shown in FIG.
Is ON, that is, the temperature rises only when a current flows (only at points 18 and 20 out of 17 to 20), and when the DUT 15 is OFF, that is, when no current flows (17, 1).
Point 9) Dissipate heat. Therefore, this temperature curve has peaks at A, B, C, and D as shown in FIG. Arithmetic unit 1
In step 1, only these vertexes A to D are taken in the temperature curve, and a temperature curve is created by connecting those points.

A graph created by connecting only the vertices A to D is like a triac case temperature A in FIG. In the data of this curve, the temperature difference between the data of the vertices A to D is equal to or less than the temperature at a predetermined time interval, ie, FIG.
Δt _1, 20 shown by A ′, B ′, C ′, D ′.
_{t 2 21, Δt 3 22,} Δt 4 23, if became temperatures Delta] t ₅ 24, case temperature is than considered to be saturated. In addition to the method of defining the saturation by the temperature difference, there is also a method of defining the triac case temperature B as shown in FIG. That is, FIG. 8 shows A ′, B ′,
The slopes of C 'and the like are obtained by the differential method, and when the slopes between the vertices A to D fall below the slope of the temperature difference, the case temperature is saturated. Consider Next, the current waveform varies depending on the load in the loader unit 16,
The inrush currents A and B can be measured. The peak value of the data, that is, 23 or 25 in the case of FIG. 9A and 28 or 3 in the case of FIG.
0 is read, and if all the peak values of the load in the loader unit 16 are within a certain fluctuation value, the current is considered to be stable.

As described above, since the case temperature of the DUT 15 is stabilized and the change in the current value is almost eliminated, the arithmetic unit 11 allows the internal temperature of the DUT 15 to rise at a constant rise. It is automatically determined that the temperature is saturated, and the temperature data at that time is sent to the control unit 10. At the time when the temperature data arrives from the arithmetic unit 11, the control unit 10 sets the duty (0% to 10%) of the set ON / OFF condition.
(0%) is added or subtracted to change the setting, and then the operation unit 11 is reset. Alternatively, in the current detection unit 12, the temperature detection unit 13, and the voltage detection unit 14,
Start measuring data. As a result, a person directly monitors the temperature of the DUT 15 and, if saturated, automatically judges the saturation and changes the condition without taking any method such as changing the condition setting. The test can be conducted in an appropriate manner.

Next, a third embodiment of the present invention will be described with reference to FIGS.
This will be described with reference to FIG. 10 is a characteristic diagram of ΔtΔC at 20% duty, FIG. 11 is a characteristic diagram of Δt ゜ C at 33% duty, FIG. 12 is a characteristic diagram of Δt ゜ C at 50% duty, and FIG. 13 is Δt at a constant OFF time. FIG. 14 is a characteristic diagram of ゜ C, FIG. 14 is a characteristic diagram of Δt ゜ C when the OFF time is constant, and FIG. 15 is a diagram showing a method of calculating the case temperature (Δt ゜ C) and the internal temperature rise (ΔTj). In the triac test apparatus shown in FIG. 16, the V and I ratings of the device under test 15 and the power (W) of the load in the loader unit 16 are supplied to the memory unit 17 via the control unit 10 before the test. input. Thereafter, the operation is repeated in the same manner as in the first embodiment, and data is measured.
The data stored in the control unit 10 is stored in the memory unit 17 as it is.

By repeating the measurement, FIGS.
A junction temperature curve with respect to a change in ON / OFF duty as shown in FIG. Note that FIG.
The upper characteristic curve in FIG. 15 to FIG. 15 is the triac case temperature, and the lower characteristic curve is the internal rise temperature (ΔTj) of the triac. In addition, it is possible to create a junction temperature characteristic with respect to the relationship between the ON / OFF duty change and the OFF time as shown in FIGS. 13 and 14, and further, as shown in FIG. The characteristics of the case temperature and the internal rise temperature (ΔTj) can be created according to the load (W) in the section 16. Here, when a new test is performed, the V, I of the current DUT 15 and the loader 16
The one closest to the load (W) is searched. next,
An ON / OFF duty condition having the highest junction temperature among the data from the memory unit 17 is selected. The case temperature of the DUT 15 monotonically increases with the change in the ON / OFF duty, and the internal temperature rise monotonously decreases. Therefore, as shown in FIG. , Measurement point selected O
The measurement is performed before and after the N / OFF duty.
For the data (31 to 33), a straight line connecting the data is drawn, and from the graph, which condition has the highest temperature is calculated. That is, the junction temperature Tj of the triac is 31, 3 at that duty.
Case temperature and internal rise temperature (ΔTj) at 2 and 33
Are calculated by adding the values of

As described above, based on the past data, the DUT 1
Since the condition (point) at which the temperature of 5 becomes the highest can be estimated and the measurement for the test can be extremely reduced,
It is possible to effectively reduce the overall test time.

[0017]

As described above, according to the present invention,
Since the operation unit and the control unit automatically determine the junction temperature and the best point of the acceleration test, the durability test period of the triac can be shortened. In addition, since it is automatically determined from the past data whether the temperature is saturated or not, the best point of the test can be determined even when no human is present at the time of measurement. Furthermore, by adding a memory part,
Since the best test point can be estimated and the measurements for the test can be greatly reduced, the overall test period can be further reduced.

[Brief description of the drawings]

FIG. 1 is a configuration diagram of a triac durability test apparatus showing a first embodiment of the present invention.

FIG. 2 is a characteristic diagram showing a case temperature and an internal temperature rise of a triac according to the first embodiment.

FIG. 3 is a diagram illustrating selection of a junction temperature period of a triac according to the first embodiment.

FIG. 4 is an explanatory diagram of a waveform of an inrush current and a method of calculating an internal rising temperature of a triac according to the first embodiment.

FIG. 5 is a measurement curve diagram of a triac case temperature according to the second embodiment of the present invention.

FIG. 6 is a triac case temperature enlarged view showing the second embodiment.

FIG. 7 shows a triac case temperature A showing the second embodiment.
FIG.

FIG. 8 shows a triac case temperature B showing the second embodiment.
FIG.

FIG. 9 is a waveform diagram of an inrush current according to the second embodiment.

FIG. 10 is a characteristic diagram of a case temperature and an internal temperature rise at a 20% duty according to a third embodiment of the present invention.

FIG. 11 is a characteristic diagram of a case temperature and an internal temperature rise at a duty of 33% according to the third embodiment.

FIG. 12 is a characteristic diagram of a case temperature and an internal rise temperature at a 50% duty according to the third embodiment.

FIG. 13 is a characteristic diagram of a case temperature and an internal temperature rise in a constant OFF time according to the third embodiment.

FIG. 14 is a characteristic diagram of a case temperature and an internal temperature rise in a constant OFF time according to a third embodiment.

FIG. 15 is a diagram illustrating a method of calculating a case temperature and an internal temperature increase according to a third embodiment.

FIG. 16 is a block diagram of a triac durability test apparatus showing the first to third embodiments of the present invention.

[Explanation of symbols]

10 control unit, 11 operation unit, 12 current detection unit, 13 temperature detection unit, 14 voltage detection unit, 15
・ Test object (triac), 16 ・ ・ Loader part, 1
7 .. memory unit, RL _i ·· relay, L _i ·· coil load.

Claims (3)

(57) [Claims] 1. A test device comprising a triac as a device under test, and a loader section for switching a load to the device under test and connecting the device in parallel to each other. In the triac endurance test device, which sequentially switches the load of the loader unit in a state and then conducts the load, it is determined that the case temperature of the DUT is saturated by the user, and the start of the measurement is instructed. A temperature detector, a current detector, and a voltage detector for measuring the temperature, current, and voltage of the device under test, and an internal temperature of the device under test from each data of the voltage detector, the current detector, and the temperature detector. A calculating unit for calculating a rise, adding a case temperature to the rise temperature to calculate a junction temperature, and accumulating the obtained values for each ON / OFF duty. A controller that creates characteristics of the source temperature and the internal rise temperature, converts the characteristic value into data of the junction temperature characteristic of the specimen, and automatically outputs a test condition region where the junction temperature is the highest. A triac durability test device comprising: 2. The triac durability test apparatus according to claim 1, wherein the arithmetic unit extracts only a vertex of the detected temperature curve of the case of the DUT and creates a curve connecting the vertex. Whether the case temperature of the DUT is saturated by the temperature difference or the slope value of the curve or by the detected peak value of the current waveform of the DUT being within a predetermined fluctuation value. When the temperature data at the time of saturation is transmitted to the control unit, the control unit adds or subtracts a value accumulated for each duty of a preset ON / OFF condition to or from the temperature data, A triac endurance test apparatus, wherein the operation unit is reset after changing a set value. 3. The triac durability test apparatus according to claim 1, wherein a memory unit is provided in the control unit, and the V and I ratings of the DUT are stored in the memory unit from the control unit before the test. The power of the load is stored, and the data measured thereafter is also stored in the memory unit.
When a new test is performed, the control unit creates a junction temperature curve with respect to the change in the OFF duty, and searches the memory unit for the closest to the V, I of the DUT and the load in the loader unit. ON / J at the highest junction temperature among the data in the memory section
A triac endurance test apparatus characterized by selecting an OFF duty condition.