JP3221862U - 較正アーチファクトおよび較正アーチファクト用の保持装置 - Google Patents

較正アーチファクトおよび較正アーチファクト用の保持装置 Download PDF

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Publication number
JP3221862U
JP3221862U JP2018004943U JP2018004943U JP3221862U JP 3221862 U JP3221862 U JP 3221862U JP 2018004943 U JP2018004943 U JP 2018004943U JP 2018004943 U JP2018004943 U JP 2018004943U JP 3221862 U JP3221862 U JP 3221862U
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Japan
Prior art keywords
calibration
artifact
elements
coordinate direction
holding
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JP2018004943U
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English (en)
Japanese (ja)
Inventor
ラース、ハイザー
Original Assignee
カール マール ホールティング ゲーエムベーハー
カール マール ホールティング ゲーエムベーハー
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Manufacturing & Machinery (AREA)
  • Multimedia (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2018004943U 2017-12-22 2018-12-19 較正アーチファクトおよび較正アーチファクト用の保持装置 Active JP3221862U (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE202017107883.3U DE202017107883U1 (de) 2017-12-22 2017-12-22 Kalibrierschablone und Halteeinrichtung für eine Kalibrierschablone
DE202017107883.3 2017-12-22

Publications (1)

Publication Number Publication Date
JP3221862U true JP3221862U (ja) 2019-06-27

Family

ID=61083627

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018004943U Active JP3221862U (ja) 2017-12-22 2018-12-19 較正アーチファクトおよび較正アーチファクト用の保持装置

Country Status (3)

Country Link
JP (1) JP3221862U (de)
CN (1) CN210089632U (de)
DE (1) DE202017107883U1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111053561A (zh) * 2019-12-31 2020-04-24 湖南省计量检测研究院 身高测量器校准装置及校准方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112945273B (zh) * 2021-02-03 2023-11-24 江苏信息职业技术学院 一种垂线坐标仪现场校准装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5389774A (en) 1993-11-08 1995-02-14 Optical Gaging Products, Inc. Method and means for calibrating the magnification of zoom optical systems using reticle images
US6704102B2 (en) 2001-02-06 2004-03-09 Metronics, Inc. Calibration artifact and method of using the same
DE10144203A1 (de) 2001-09-08 2003-03-27 Zoller Gmbh & Co Kg E FKM-Lehre
DE202007007786U1 (de) 2007-06-01 2007-08-16 Carl Mahr Holding Gmbh Prüfkörper für optische Messeinrichtungen
DE102015122842B4 (de) 2015-12-27 2019-02-07 Faro Technologies, Inc. Verfahren zum Kalibrieren einer 3D-Messvorrichtung mittels einer Kalibrierplatte

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111053561A (zh) * 2019-12-31 2020-04-24 湖南省计量检测研究院 身高测量器校准装置及校准方法

Also Published As

Publication number Publication date
DE202017107883U1 (de) 2018-01-12
CN210089632U (zh) 2020-02-18

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