JP2023125709A - 画像検査システム及び画像検査方法 - Google Patents

画像検査システム及び画像検査方法 Download PDF

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Publication number
JP2023125709A
JP2023125709A JP2022029957A JP2022029957A JP2023125709A JP 2023125709 A JP2023125709 A JP 2023125709A JP 2022029957 A JP2022029957 A JP 2022029957A JP 2022029957 A JP2022029957 A JP 2022029957A JP 2023125709 A JP2023125709 A JP 2023125709A
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JP
Japan
Prior art keywords
image
wavelengths
wavelength
image data
correct answer
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Pending
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JP2022029957A
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English (en)
Japanese (ja)
Inventor
望 鄭
Wang Zheng
雄一 内田
Yuichi Uchida
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Panasonic Intellectual Property Management Co Ltd
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Panasonic Intellectual Property Management Co Ltd
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Application filed by Panasonic Intellectual Property Management Co Ltd filed Critical Panasonic Intellectual Property Management Co Ltd
Priority to JP2022029957A priority Critical patent/JP2023125709A/ja
Priority to PCT/JP2022/046753 priority patent/WO2023162426A1/fr
Publication of JP2023125709A publication Critical patent/JP2023125709A/ja
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46Measurement of colour; Colour measuring devices, e.g. colorimeters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2022029957A 2022-02-28 2022-02-28 画像検査システム及び画像検査方法 Pending JP2023125709A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2022029957A JP2023125709A (ja) 2022-02-28 2022-02-28 画像検査システム及び画像検査方法
PCT/JP2022/046753 WO2023162426A1 (fr) 2022-02-28 2022-12-19 Système d'inspection d'image et procédé d'inspection d'image

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022029957A JP2023125709A (ja) 2022-02-28 2022-02-28 画像検査システム及び画像検査方法

Publications (1)

Publication Number Publication Date
JP2023125709A true JP2023125709A (ja) 2023-09-07

Family

ID=87765506

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022029957A Pending JP2023125709A (ja) 2022-02-28 2022-02-28 画像検査システム及び画像検査方法

Country Status (2)

Country Link
JP (1) JP2023125709A (fr)
WO (1) WO2023162426A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7501771B1 (ja) 2023-12-13 2024-06-18 株式会社サタケ 光学式判別装置及び光学式選別装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5668157B1 (ja) * 2014-02-05 2015-02-12 佐鳥 新 対象物探索装置、対象物探索プログラムおよび人命救助用探索システム
CA2954625C (fr) * 2014-06-18 2022-12-13 Innopix, Inc. Systeme d'imagerie spectrale pour une detection a distance et non invasive de substances cibles a l'aide de reseaux de filtres spectraux et de reseaux de capture d'image
JP6888770B2 (ja) * 2016-01-28 2021-06-16 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドSiemens Healthcare Diagnostics Inc. 試料内のアーチファクトを分類する方法と装置
CN108872140B (zh) * 2018-05-09 2021-01-19 塔里木大学 一种户外监测红枣品质的方法及装置
JP7450917B2 (ja) * 2020-03-10 2024-03-18 株式会社エヌテック マルチスペクトル画像撮像装置、検査装置及びマルチスペクトル画像撮像方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7501771B1 (ja) 2023-12-13 2024-06-18 株式会社サタケ 光学式判別装置及び光学式選別装置

Also Published As

Publication number Publication date
WO2023162426A1 (fr) 2023-08-31

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