JP2022161888A - 信号テスト - Google Patents

信号テスト Download PDF

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Publication number
JP2022161888A
JP2022161888A JP2022064352A JP2022064352A JP2022161888A JP 2022161888 A JP2022161888 A JP 2022161888A JP 2022064352 A JP2022064352 A JP 2022064352A JP 2022064352 A JP2022064352 A JP 2022064352A JP 2022161888 A JP2022161888 A JP 2022161888A
Authority
JP
Japan
Prior art keywords
signal
destination
source
test
function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022064352A
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English (en)
Japanese (ja)
Other versions
JP2022161888A5 (https=
Inventor
ハッサン ムハマド
Hassan Muhammad
ローゼンブッシュ イェンス
Jens Rosenbusch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Publication of JP2022161888A publication Critical patent/JP2022161888A/ja
Publication of JP2022161888A5 publication Critical patent/JP2022161888A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2022064352A 2021-04-09 2022-04-08 信号テスト Pending JP2022161888A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102021108930.1A DE102021108930B3 (de) 2021-04-09 2021-04-09 Signalprüfung
DE102021108930.1 2021-04-09

Publications (2)

Publication Number Publication Date
JP2022161888A true JP2022161888A (ja) 2022-10-21
JP2022161888A5 JP2022161888A5 (https=) 2025-02-25

Family

ID=83361495

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022064352A Pending JP2022161888A (ja) 2021-04-09 2022-04-08 信号テスト

Country Status (3)

Country Link
US (1) US12196803B2 (https=)
JP (1) JP2022161888A (https=)
DE (1) DE102021108930B3 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000059351A (ja) * 1998-08-14 2000-02-25 Nec Corp シリアルデータ監視装置
JP2016025641A (ja) * 2014-07-24 2016-02-08 エヌ・ティ・ティ・コミュニケーションズ株式会社 通信システム、通信装置、データ通信方法、及びプログラム
JP2021143890A (ja) * 2020-03-11 2021-09-24 株式会社東芝 故障検出回路及び半導体装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6917916B2 (en) * 2001-12-13 2005-07-12 Motorola, Inc. Method and apparatus for testing digital channels in a wireless communication system
EP2752768B1 (en) * 2003-05-28 2016-11-02 Polaris Innovations Limited Error detection in a circuit module
US7945831B2 (en) * 2008-10-31 2011-05-17 Texas Instruments Incorporated Gating TDO from plural JTAG circuits
US8026726B2 (en) 2009-01-23 2011-09-27 Silicon Image, Inc. Fault testing for interconnections
US20160349320A1 (en) * 2015-05-26 2016-12-01 Qualcomm Incorporated Remote bus wrapper for testing remote cores using automatic test pattern generation and other techniques

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000059351A (ja) * 1998-08-14 2000-02-25 Nec Corp シリアルデータ監視装置
JP2016025641A (ja) * 2014-07-24 2016-02-08 エヌ・ティ・ティ・コミュニケーションズ株式会社 通信システム、通信装置、データ通信方法、及びプログラム
JP2021143890A (ja) * 2020-03-11 2021-09-24 株式会社東芝 故障検出回路及び半導体装置

Also Published As

Publication number Publication date
US20220326298A1 (en) 2022-10-13
DE102021108930B3 (de) 2022-10-13
US12196803B2 (en) 2025-01-14

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