JP2021057534A5 - - Google Patents

Download PDF

Info

Publication number
JP2021057534A5
JP2021057534A5 JP2019181661A JP2019181661A JP2021057534A5 JP 2021057534 A5 JP2021057534 A5 JP 2021057534A5 JP 2019181661 A JP2019181661 A JP 2019181661A JP 2019181661 A JP2019181661 A JP 2019181661A JP 2021057534 A5 JP2021057534 A5 JP 2021057534A5
Authority
JP
Japan
Prior art keywords
semiconductor switching
semiconductor device
switching elements
terminal
detection unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2019181661A
Other languages
Japanese (ja)
Other versions
JP2021057534A (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2019181661A priority Critical patent/JP2021057534A/en
Priority claimed from JP2019181661A external-priority patent/JP2021057534A/en
Priority to PCT/JP2020/032300 priority patent/WO2021065259A1/en
Publication of JP2021057534A publication Critical patent/JP2021057534A/en
Publication of JP2021057534A5 publication Critical patent/JP2021057534A5/ja
Pending legal-status Critical Current

Links

Description

上記目的を達成するために本開示は、
並列接続された複数の半導体スイッチング素子(11,11a)を備えた半導体装置であって、
複数の半導体スイッチング素子は、一部の半導体スイッチング素子のみが、物理情報を検出するための物理情報検出部が設けられた検出部付素子(11a)であり、
検出部付素子は、電極として、主電極(111,112,112a)と、制御用電極(113,114)と、検出用電極(115,115a〜115c)と、を有し、
複数の半導体スイッチング素子における検出部付素子とは異なる他半導体スイッチング素子(11)は、電極として、主電極と制御用電極とを有しており、
他半導体スイッチング素子は、検出部付素子よりも体格が小さく、活性化領域の大きさが同等である
To achieve the above objectives, this disclosure is:
A semiconductor device including a plurality of semiconductor switching elements (11, 11a) connected in parallel.
The plurality of semiconductor switching elements are elements (11a) with a detection unit provided with a physical information detection unit for detecting physical information only in a part of the semiconductor switching elements.
The element with a detection unit has a main electrode (111,112,112a), a control electrode (113,114), and a detection electrode (115,115a to 115c) as electrodes.
The other semiconductor switching element (11), which is different from the element with a detection unit in the plurality of semiconductor switching elements, has a main electrode and a control electrode as electrodes .
The other semiconductor switching element has a smaller physique than the element with a detector, and has the same size of the activation region .

Claims (8)

並列接続された複数の半導体スイッチング素子(11,11a)を備えた半導体装置であって、
複数の前記半導体スイッチング素子は、一部の前記半導体スイッチング素子のみが、物理情報を検出するための物理情報検出部が設けられた検出部付素子(11a)であり、
前記検出部付素子は、電極として、主電極(111,112,112a)と、制御用電極(113,114)と、検出用電極(115,115a〜115c)と、を有し、
複数の前記半導体スイッチング素子における前記検出部付素子とは異なる他半導体スイッチング素子(11)は、電極として、前記主電極と前記制御用電極とを有しており、
前記他半導体スイッチング素子は、前記検出部付素子よりも体格が小さく、活性化領域の大きさが同等である半導体装置。
A semiconductor device including a plurality of semiconductor switching elements (11, 11a) connected in parallel.
The plurality of semiconductor switching elements are elements (11a) with a detection unit provided with a physical information detection unit for detecting physical information only in a part of the semiconductor switching elements.
The element with a detection unit has main electrodes (111, 112, 112a), control electrodes (113, 114), and detection electrodes (115, 115a to 115c) as electrodes.
The other semiconductor switching element (11), which is different from the element with a detection unit in the plurality of semiconductor switching elements, has the main electrode and the control electrode as electrodes .
The other semiconductor switching element is a semiconductor device having a smaller physique than the element with a detection unit and having the same size of the activation region .
前記物理情報は、温度である請求項1に記載の半導体装置。 The semiconductor device according to claim 1, wherein the physical information is temperature. 前記物理情報は、電流値である請求項1に記載の半導体装置。 The semiconductor device according to claim 1, wherein the physical information is a current value. 冷媒が流れる冷却器に取り付けられるものであって、
複数の半導体スイッチング素子は、前記冷媒の流れ方向に沿って配置されており、
前記検出部付素子は、前記他半導体スイッチング素子よりも、前記冷媒の流れ方向の下流側に配置されている請求項1〜のいずれか1項に記載の半導体装置。
It is attached to the cooler through which the refrigerant flows.
The plurality of semiconductor switching elements are arranged along the flow direction of the refrigerant.
The semiconductor device according to any one of claims 1 to 3 , wherein the element with a detection unit is arranged on the downstream side in the flow direction of the refrigerant with respect to the other semiconductor switching element.
複数の前記半導体スイッチング素子を一括して封止している封止部(18)をさらに備えている請求項1〜のいずれか1項に記載の半導体装置。 The semiconductor device according to any one of claims 1 to 4 , further comprising a sealing portion (18) that collectively seals the plurality of the semiconductor switching elements. 前記主電極は、前記半導体スイッチング素子の一面に形成された第1主電極(111)と、前記一面の反対面に形成された第2主電極(112,112a)と、を含み、
前記第1主電極に電気的に接続された第1端子部材(12)と、
前記第2主電極に電気的に接続された第2端子部材(13)と、
前記制御用電極に電気的に接続された制御用端子(191,192)と、
前記検出用電極に電気的に接続された検出用端子(193〜195)と、をさらに備え、
前記封止部は、前記第1端子部材、前記第2端子部材、前記制御用端子、前記検出用端子のそれぞれの端部が露出した状態で、前記第1端子部材、前記第2端子部材、前記制御用端子、前記検出用端子を覆っている請求項に記載の半導体装置。
The main electrode includes a first main electrode (111) formed on one surface of the semiconductor switching element and a second main electrode (112, 112a) formed on the opposite surface of the one surface.
The first terminal member (12) electrically connected to the first main electrode and
A second terminal member (13) electrically connected to the second main electrode and
A control terminal (191, 192) electrically connected to the control electrode and
Further, a detection terminal (193 to 195) electrically connected to the detection electrode is provided.
In the sealing portion, the first terminal member, the second terminal member, the control terminal, and the detection terminal are exposed at their respective ends, and the first terminal member, the second terminal member, and the like. The semiconductor device according to claim 5 , which covers the control terminal and the detection terminal.
複数の前記半導体スイッチング素子は、インバータ回路に設けられている請求項1〜のいずれか1項に記載の半導体装置。 The semiconductor device according to any one of claims 1 to 6 , wherein the plurality of semiconductor switching elements are provided in an inverter circuit. 複数の前記半導体スイッチング素子は、コンバータ回路に設けられている請求項1〜のいずれか1項に記載の半導体装置。 The semiconductor device according to any one of claims 1 to 7 , wherein the plurality of semiconductor switching elements are provided in a converter circuit.
JP2019181661A 2019-10-01 2019-10-01 Semiconductor device Pending JP2021057534A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2019181661A JP2021057534A (en) 2019-10-01 2019-10-01 Semiconductor device
PCT/JP2020/032300 WO2021065259A1 (en) 2019-10-01 2020-08-27 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019181661A JP2021057534A (en) 2019-10-01 2019-10-01 Semiconductor device

Publications (2)

Publication Number Publication Date
JP2021057534A JP2021057534A (en) 2021-04-08
JP2021057534A5 true JP2021057534A5 (en) 2021-09-09

Family

ID=75271272

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019181661A Pending JP2021057534A (en) 2019-10-01 2019-10-01 Semiconductor device

Country Status (2)

Country Link
JP (1) JP2021057534A (en)
WO (1) WO2021065259A1 (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2546978A4 (en) * 2010-03-10 2016-03-16 Hitachi Ltd Power converter
JP5661052B2 (en) * 2012-01-18 2015-01-28 三菱電機株式会社 Power semiconductor module and manufacturing method thereof
JP6256419B2 (en) * 2015-06-24 2018-01-10 株式会社デンソー Semiconductor chip and semiconductor module using the same
DE112017001729B4 (en) * 2016-04-01 2022-11-03 Mitsubishi Electric Corporation semiconductor modules
JP6439750B2 (en) * 2016-05-20 2018-12-19 株式会社デンソー Semiconductor device
JP6745991B2 (en) * 2017-05-30 2020-08-26 三菱電機株式会社 Semiconductor power module

Similar Documents

Publication Publication Date Title
JP2013536424A5 (en)
JP2017090318A5 (en)
US11346879B2 (en) Semiconductor device
WO2016035256A1 (en) Shunt resistor
JP6266206B2 (en) Thermoelectric module
JP2006078478A (en) Film temperature sensor and substrate for temperature measurement
EP2899764A3 (en) Thermoelectric module and heat conversion device including the same
JP2014212309A5 (en)
KR20180064520A (en) Diagnostic device in the assembled state
JP2018060966A5 (en)
JP2019083243A5 (en)
JP2021057534A5 (en)
JP2007234850A5 (en)
JP5710995B2 (en) Semiconductor device
JP5825012B2 (en) Semiconductor device
JP7077717B2 (en) Power converter
JP2015198188A (en) semiconductor module
JP2017117525A (en) heater
JP6532259B2 (en) Temperature sensor
JP2018064059A5 (en)
CN105553454B (en) The method and circuit of the improved reliability of power device for being operated in the case where repeating thermal stress
CN107062977B (en) Cooling device
JP2021034616A5 (en)
CN102378414A (en) Micro-heater with temperature monitoring function
JP5079237B2 (en) Thermistor