JP2020017665A - 放射線検出素子の作製方法および放射線検出素子 - Google Patents
放射線検出素子の作製方法および放射線検出素子 Download PDFInfo
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- JP2020017665A JP2020017665A JP2018140379A JP2018140379A JP2020017665A JP 2020017665 A JP2020017665 A JP 2020017665A JP 2018140379 A JP2018140379 A JP 2018140379A JP 2018140379 A JP2018140379 A JP 2018140379A JP 2020017665 A JP2020017665 A JP 2020017665A
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Abstract
Description
図1は、本実施の形態の放射線検出素子10の一例を示す模式図である。
なお、上記実施の形態で説明した放射線検出素子10は、更に、中間層を備えた構成であってもよい。
本実施の形態では、上記実施の形態で説明した放射線検出素子10を搭載した放射線検出器の一例を説明する。
本実施例1では、図3に示す放射線検出素子10Aを作製した。但し、第2中間層26は含まない構成とした。
上記実施例1の放射線検出素子10の作製方法における、有機層形成工程100において、有機半導体溶液17をドロップキャストすることで形成した有機半導体層16を、窒素ブロー下で常温環境に8時間放置した後に真空環境下に60分放置した点(調整工程200)以外は、実施例1と同様にして、放射線検出素子10を作製した。
上記実施例1の放射線検出素子10の作製方法における、有機層形成工程100において、有機半導体溶液17をドロップキャストすることで形成した有機半導体層16を、窒素ブロー下で60℃の環境に3時間放置した点(調整工程200)以外は、実施例1と同様にして、放射線検出素子10を作製した。
上記実施例1の放射線検出素子10の作製方法における、有機層形成工程100において、第1中間層24上にドロップキャストすることで塗布した塗布直後の有機半導体層16の厚みを、50μmに調整した点(調整工程200)以外は、実施例1と同様にして、放射線検出素子10を作製した。
上記実施例1の放射線検出素子10の作製方法における、有機層形成工程100において、第1中間層24上にドロップキャストすることで塗布した塗布直後の有機半導体層16の厚みを50μmに調整した点(調整工程200)と、有機半導体溶液17をドロップキャストすることで形成した有機半導体層16を、窒素ブロー下において、50℃の環境に4時間放置した後に、常温環境下に10時間放置し、さらに45℃の環境下に1.5時間放置した点(調整工程200)以外は、実施例1と同様にして、放射線検出素子10を作製した。
上記実施例1の放射線検出素子10の作製方法において、有機半導体層16上に第2導電層18を形成した(第2導電層形成工程102)後に、第1導電層14、第1中間層24、有機半導体層16、および第2導電層18の積層体19を、140℃で10分間加熱した(加熱工程)。
上記比較例1の比較放射線検出素子の作製方法における、有機層形成工程100において、第1中間層24上にドロップキャストすることで塗布した塗布直後の有機半導体層16の厚みを、50μmに調整した点以外は、比較例1と同様にして、比較放射線検出素子を作製した。
上記実施例1〜実施例5で作製した放射線検出素子10、および、比較例1〜比較例2で作製した比較放射線検出素子について、有機半導体層16の含有溶媒量を測定した。
12 支持基板
14 第1導電層
16 有機半導体層
17 有機半導体溶液
18 第2導電層
20 封止部材
Claims (12)
- 支持基板上に形成された第1導電層上に有機半導体溶液を塗布して有機半導体層を形成する有機層形成工程と、
前記有機半導体層上に第2導電層を形成する第2導電層形成工程と、
前記支持基板上に形成された前記第1導電層、前記有機半導体層、および前記第2導電層の積層体を、封止部材によって封止する封止工程と、
前記封止部材によって封止された前記積層体に熱を加える加熱工程と、
を備え、
前記有機層形成工程および前記第2導電層形成工程の少なくとも一方は、
前記有機半導体層の含有溶媒量が所定範囲となるように、前記有機半導体層および前記第2導電層の形成環境を調整する調整工程を含む、
放射線検出素子の作製方法。 - 前記調整工程は、前記有機半導体層へ送る風の風量、温度、気圧、および前記有機半導体溶液の溶媒濃度、の少なくとも1つを前記形成環境として調整する、
請求項1に記載の放射線検出素子の作製方法。 - 前記有機半導体層の含有溶媒量の前記所定範囲は、
0.005重量%より多く、且つ、11重量%未満の範囲である、
請求項1または請求項2に記載の放射線検出素子の作製方法。 - 前記有機半導体層の含有溶媒量の前記所定範囲は、
0.01重量%以上2.5重量%以下の範囲である、
請求項1〜請求項3の何れか1項に記載の放射線検出素子の作製方法。 - 前記有機半導体層の厚みが1μm以上である、請求項1〜請求項4の何れか1項に記載の放射線検出素子の作製方法。
- 前記有機半導体層の厚みは、10μm以上1000μm以下である、請求項1〜請求項5の何れか1項に記載の放射線検出素子の作製方法。
- 前記有機半導体層は、第1導電型の第1化合物と、第2導電型の第2化合物と、を含む、請求項1〜請求項6の何れか1項に記載の放射線検出素子の作製方法。
- 前記第1化合物は、
ポリ(3−メチルチオフェン)、ポリ(3−ブチルチオフェン)、ポリ(3−ヘキシルチオフェン)、ポリ(3−オクチルチオフェン)、ポリ(3−デシルチオフェン)、ポリ(3−ドデシルチオフェン)、ポリ(3−フェニルチオフェン)、ポリ(3−(p−アルキルフェニルチオフェン))、ポリ(3−ブチルイソチオナフテン)、ポリ(3−ヘキシルイソチオナフテン)、ポリ(3−オクチルイソチオナフテン)、ポリ(3−デシルイソチオナフテン)、および、ポリエチレンジオキシチオフェンよりなる群から選択される少なくとも1つを含む、請求項7に記載の放射線検出素子の作製方法。 - 前記第1化合物は、ポリ(3−ヘキシルチオフェン)を含む、請求項7または請求項8に記載の放射線検出素子の作製方法。
- 前記第2化合物は、
C60H36、C70H36、[6,6]−フェニルC61酪酸メチルエステル、[6,6]−フェニルC71酪酸メチルエステル、インデン−C60ビス付加物、ジヒドロナフチル−C60ビス付加物、および、ジヒドロナフチル−C70ビス付加物よりなる群から選択される少なくとも1つを含む、
請求項7〜請求項9の何れか1項に記載の放射線検出素子の作製方法。 - 前記第2化合物は、[6,6]−フェニルC71酪酸メチルエステルを含む、請求項7〜請求項10の何れか1項に記載の放射線検出素子の作製方法。
- 支持基板と、第1導電層と、有機半導体層と、第2導電層と、有機半導体層と、前記第1導電層、前記有機半導体層、および前記第2導電層の積層体の封止部材と、を備え、
前記有機半導体層の溶媒含有量が、0.005重量%より多く、且つ、11重量%未満の範囲である、
放射線検出素子。
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