JP2014511146A5 - - Google Patents
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- JP2014511146A5 JP2014511146A5 JP2014505353A JP2014505353A JP2014511146A5 JP 2014511146 A5 JP2014511146 A5 JP 2014511146A5 JP 2014505353 A JP2014505353 A JP 2014505353A JP 2014505353 A JP2014505353 A JP 2014505353A JP 2014511146 A5 JP2014511146 A5 JP 2014511146A5
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- dopant material
- silicon
- concentration
- zone
- growth
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- 239000002019 doping agent Substances 0.000 claims 26
- 239000000463 material Substances 0.000 claims 26
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 22
- 229910052710 silicon Inorganic materials 0.000 claims 22
- 239000010703 silicon Substances 0.000 claims 22
- 239000000203 mixture Substances 0.000 claims 5
- 238000005204 segregation Methods 0.000 claims 4
- 239000012530 fluid Substances 0.000 claims 3
- 230000000977 initiatory Effects 0.000 claims 2
- 230000032258 transport Effects 0.000 claims 2
- 238000002844 melting Methods 0.000 claims 1
Claims (10)
前記るつぼの上に突き出る搬送ポイントを有し、制御可能な量のシリコンを前記るつぼ内へ搬送する送給機を含むシリコン搬送システムと、
少なくとも1つのドーパント材料を前記シリコン搬送システムに制御可能に搬送し、それによってドーパント材料を前記るつぼに搬送する少なくとも1つのドーピング機構と
を含む、チョクラルスキー成長システム。 Crucible,
A silicon transfer system having a transfer point protruding above the crucible and including a feeder for transferring a controllable amount of silicon into the crucible;
A Czochralski growth system comprising: at least one doping mechanism for controllably delivering at least one dopant material to the silicon delivery system and thereby delivering the dopant material to the crucible.
i)外部送給ゾーンと流体連通している内部成長ゾーンを有するるつぼを用意する工程と、
ii)前記内部成長ゾーンにシリコン及び前記ドーパント材料を予め投入して混合物を形成し、ここで、前記混合物は、溶融されると、前記ドーパント材料の濃度C/kを有する工程と、
iii)前記混合物を溶融する工程と、
iv)前記内部成長ゾーンからの前記シリコンインゴットの成長を開始する工程と、
v)前記シリコンインゴットを成長させながら、シリコン及び前記ドーパント材料の送給を前記外部送給ゾーン内へ搬送し、前記送給は、溶融されると、前記ドーパント材料の平均濃度Cを有する工程と、
vi)濃度Cの前記ドーパント材料を含む前記シリコンインゴットを除去する工程と
を含む方法。 A method of Czochralski growth of a silicon ingot containing a dopant material at a concentration C having a segregation coefficient k, comprising:
i) providing a crucible having an internal growth zone in fluid communication with an external feed zone;
ii) pre-loading the ingrowth zone with silicon and the dopant material to form a mixture, wherein the mixture, when melted, has a concentration C / k of the dopant material;
iii) melting the mixture;
iv) initiating growth of the silicon ingot from the internal growth zone;
v) Conveying silicon and the dopant material feed into the external feed zone while growing the silicon ingot, the feed having an average concentration C of the dopant material when melted; ,
vi) removing the silicon ingot containing the dopant material at a concentration C.
前記内部成長ゾーンに、シリコン、前記第一のドーパント材料及び前記第二のドーパント材料を予め投入して、混合物を形成し、ここで、前記混合物は、溶融されると、前記第一のドーパント材料の濃度C1/k1及び前記第二のドーパント材料の濃度C2/k2を有し、
前記外部送給ゾーンに、シリコン、溶融されると濃度C1の前記第一のドーパント材料及び溶融されると濃度C2の前記第二のドーパント材料を送給する、請求項6に記載の方法。 The silicon ingot further includes a first dopant material having a segregation coefficient k 1 at a concentration C 1 and further comprising a second dopant material having a segregation coefficient k 2 at a concentration C 2 ;
Silicon, the first dopant material, and the second dopant material are pre-charged into the ingrowth zone to form a mixture, where the mixture, when melted, the first dopant material has a concentration C 1 / k 1 and a concentration C 2 / k 2 of the second dopant material,
Wherein the outer feed zone, silicon, to deliver the second dopant material of the first dopant material when it is melted concentrations C 1 and when it is melted concentration C 2, The method of claim 6 .
i)外部送給ゾーンと流体連通している内部成長ゾーンを有するるつぼを用意する工程と、
ii)前記内部成長ゾーンにシリコン及び前記ドーパント材料を予め投入する工程と、 iii)前記内部成長ゾーンからの前記シリコンインゴットの成長を開始する工程と、 iv)前記内部成長ゾーンにおいて、前記シリコンインゴットを成長させながら、シリコン中の前記ドーパント材料の第一の濃度を維持する工程と、
v)前記外部送給ゾーンにおいて、前記シリコンインゴットを成長させながら、シリコン中の前記ドーパント材料の第二の濃度を維持し、ここで、前記第二の濃度は、前記第一の濃度未満である工程と
を含む方法。 A method of Czochralski growth of a silicon ingot containing a dopant material at a concentration C having a segregation coefficient k, comprising:
i) providing a crucible having an internal growth zone in fluid communication with an external feed zone;
ii) pre-loading silicon and the dopant material into the internal growth zone; iii) starting growth of the silicon ingot from the internal growth zone; and iv) in the internal growth zone, the silicon ingot Maintaining a first concentration of the dopant material in the silicon while growing;
v) maintaining a second concentration of the dopant material in silicon while growing the silicon ingot in the external delivery zone, wherein the second concentration is less than the first concentration. Including the steps.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161475351P | 2011-04-14 | 2011-04-14 | |
US61/475,351 | 2011-04-14 | ||
PCT/US2012/033593 WO2012142463A2 (en) | 2011-04-14 | 2012-04-13 | Silicon ingot having uniform multiple dopants and method and apparatus for producing same |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016099240A Division JP2016179937A (en) | 2011-04-14 | 2016-05-18 | Silicon ingot having uniform multiple dopants and method and apparatus for producing same |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014511146A JP2014511146A (en) | 2014-05-12 |
JP2014511146A5 true JP2014511146A5 (en) | 2015-05-07 |
Family
ID=47010006
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014505353A Pending JP2014511146A (en) | 2011-04-14 | 2012-04-13 | Silicon ingot having a plurality of uniform dopants and method and apparatus for producing the same |
JP2016099240A Pending JP2016179937A (en) | 2011-04-14 | 2016-05-18 | Silicon ingot having uniform multiple dopants and method and apparatus for producing same |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
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JP2016099240A Pending JP2016179937A (en) | 2011-04-14 | 2016-05-18 | Silicon ingot having uniform multiple dopants and method and apparatus for producing same |
Country Status (8)
Country | Link |
---|---|
US (1) | US10202705B2 (en) |
EP (1) | EP2697412B1 (en) |
JP (2) | JP2014511146A (en) |
KR (1) | KR20140097971A (en) |
CN (1) | CN103608496B (en) |
MY (1) | MY173316A (en) |
TW (1) | TWI618678B (en) |
WO (1) | WO2012142463A2 (en) |
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US10724148B2 (en) * | 2014-01-21 | 2020-07-28 | Infineon Technologies Ag | Silicon ingot and method of manufacturing a silicon ingot |
DE102014107590B3 (en) * | 2014-05-28 | 2015-10-01 | Infineon Technologies Ag | Semiconductor device, silicon wafer and method for producing a silicon wafer |
JP6299543B2 (en) * | 2014-09-18 | 2018-03-28 | 信越半導体株式会社 | Resistivity control method and additional dopant injection device |
US10337117B2 (en) | 2014-11-07 | 2019-07-02 | Infineon Technologies Ag | Method of manufacturing a silicon ingot and silicon ingot |
CN104499048A (en) * | 2014-12-07 | 2015-04-08 | 海安县石油科研仪器有限公司 | Monocrystalline silicon growth process based on continuous feeding |
WO2018012654A1 (en) * | 2016-07-14 | 2018-01-18 | 포토멕 주식회사 | Introduction device for manuf+acturing silicon semiconductor ingot, and doping method |
US10920337B2 (en) | 2016-12-28 | 2021-02-16 | Globalwafers Co., Ltd. | Methods for forming single crystal silicon ingots with improved resistivity control |
WO2019051247A1 (en) * | 2017-09-08 | 2019-03-14 | Corner Star Limited | Hybrid crucible assembly for czochralski crystal growth |
CN113272479A (en) * | 2018-10-12 | 2021-08-17 | 环球晶圆股份有限公司 | Controlling dopant concentration in silicon melt to enhance ingot quality |
JP2022529451A (en) | 2019-04-18 | 2022-06-22 | グローバルウェーハズ カンパニー リミテッド | Growth method of single crystal silicon ingot using continuous Czochralski method |
US11111596B2 (en) | 2019-09-13 | 2021-09-07 | Globalwafers Co., Ltd. | Single crystal silicon ingot having axial uniformity |
US11111597B2 (en) | 2019-09-13 | 2021-09-07 | Globalwafers Co., Ltd. | Methods for growing a nitrogen doped single crystal silicon ingot using continuous Czochralski method |
CN115341264A (en) * | 2019-09-13 | 2022-11-15 | 环球晶圆股份有限公司 | Method for growing nitrogen-doped single crystal silicon ingot using Czochralski method and single crystal silicon ingot grown by the method |
TWI784689B (en) * | 2020-09-29 | 2022-11-21 | 日商Sumco股份有限公司 | Method for producing silicon single crystal |
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-
2012
- 2012-04-13 KR KR1020137030047A patent/KR20140097971A/en not_active Application Discontinuation
- 2012-04-13 EP EP12771909.4A patent/EP2697412B1/en active Active
- 2012-04-13 US US13/446,353 patent/US10202705B2/en active Active
- 2012-04-13 CN CN201280028191.1A patent/CN103608496B/en active Active
- 2012-04-13 WO PCT/US2012/033593 patent/WO2012142463A2/en active Application Filing
- 2012-04-13 JP JP2014505353A patent/JP2014511146A/en active Pending
- 2012-04-13 MY MYPI2013003768A patent/MY173316A/en unknown
- 2012-04-16 TW TW101113441A patent/TWI618678B/en active
-
2016
- 2016-05-18 JP JP2016099240A patent/JP2016179937A/en active Pending
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