JP2013036849A - Equivalent circuit analyzing apparatus and equivalent circuit analyzing method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an equivalent circuit analyzing apparatus that, when there is an error in any element constant of an equivalent circuit estimated from the frequency characteristic of a device under test (DUR), does not require the measuring person to judge which element constant is to be changed and how in order to eliminate this error, and enables the person to obtain accurate element constant by simple operation.SOLUTION: An equivalent circuit analyzing apparatus 1 comprises a touch panel 10; a measuring unit 2 that measures the frequency characteristic of the complex impedance of a DUT 90 and causes the touch panel 10 to display the characteristic in a graph; an estimating unit 3 that estimates each element constant of the equivalent circuit on the basis of the frequency characteristic of the DUT 90; a theoretical characteristic calculating unit 5 that calculates the frequency characteristic of the equivalent circuit and causes its graph and each element constant to be displayed; and an element constant change processing unit 6 that, after touching the pertinent region of the graph of the equivalent circuit displayed on the touch panel 10, matches that touch position to a shifting operation accomplished on the touch panel and thereby changes the element constant of the equivalent circuit.

Description

  The present invention relates to an equivalent circuit analysis apparatus and method for measuring a frequency characteristic of a complex impedance of a measurement object and estimating an element constant of an electrical equivalent circuit from the frequency characteristic.

  Electrical components such as resistors, capacitors, coils, diodes, transistors, primary / secondary batteries, solar cells, and filters are used as measurement objects (hereinafter also referred to as DUTs), and the signal voltage for measurement is swept through the frequency. There is known an impedance measuring apparatus that measures the frequency characteristic of complex impedance from the voltage and the flowing current, and displays the measured frequency characteristic in a graph on a display panel. Some of these impedance measuring apparatuses have an equivalent circuit analysis function for estimating an element constant of an electrical equivalent circuit of a measurement object from the frequency characteristics of the measured complex impedance.

  For example, in Patent Document 1, frequency characteristics of a complex impedance are measured, an element constant of an equivalent circuit that minimizes an evaluation function is calculated by a Monte Carlo method, and the calculated function constant is used as an evaluation function as a start value of a local search method. Describes an equivalent circuit analysis method for calculating an element constant at which the element constant becomes a minimum value and further repeating these calculations a predetermined number of times to obtain the element constant.

  However, no matter what estimation method is used, an error may occur in the estimation result of the element constant. Therefore, the theoretical frequency characteristic of the equivalent circuit is calculated with the estimated element constant so that the measurer can determine whether there is an error in the estimation result, and the graph of the theoretical frequency characteristic obtained is It is conceivable to display on the display panel together with the graph of the DUT measurement result. The measurer compares both graphs, and if there is almost no difference between the two graphs, the estimated element constant correctly represents the DUT. It is determined that the DUT is not correctly represented. If there is any difference between the two graphs, the measurer manually changes (adjusts) the estimated value of the element constant manually, and causes the device to display the graph of the theoretical frequency characteristics of the equivalent circuit again. By making it coincide with the measurement result graph, it is possible to obtain an element constant with less error.

  However, the equivalent circuit of the DUT is configured by combining elements such as one or more resistors, capacitors, and coils. Therefore, there is a problem that it is difficult for the measurer to determine which element constant value should be changed.

JP 2010-249749 A

  The present invention has been made to solve the above problems, and when there is an error in the element constant of the equivalent circuit estimated from the frequency characteristics of the complex impedance of the measurement object, any element is used to eliminate this error. To provide an equivalent circuit analysis apparatus and an equivalent circuit analysis method capable of obtaining an accurate element constant by a simple operation without requiring a measurer to determine how to change the constant. Objective.

  In order to achieve the above object, an equivalent circuit analysis apparatus according to claim 1 of the present invention includes a touch panel having an image display function and a contact detection function, and a complex object to be measured. Each of a predetermined equivalent circuit combining a plurality of electric elements based on the frequency characteristics of the measurement object measured by the measurement unit and the measurement unit that measures the frequency characteristics of the impedance and displayed on the touch panel as a graph An estimation unit that estimates an element constant; a theoretical characteristic calculation unit that calculates a frequency characteristic of a theoretical complex impedance of the equivalent circuit and displays the element constant in a graph; and Corresponding to the moving operation of moving the contact position on the touch panel after touching the portion of the graph of the displayed equivalent circuit, Characterized in that it comprises an element constant changing unit for changing the the element constants of valence circuit.

  The equivalent circuit analysis apparatus according to claim 2 is the equivalent circuit analysis apparatus according to claim 1, wherein the element constant change information for moving the part is associated with the part of the graph of the equivalent circuit in advance. A movement information storage unit is provided, and the element constant change processing unit reads the change information corresponding to the movement operation from the movement information storage unit and changes the element constant.

  An equivalent circuit analysis device according to a third aspect is the one according to the first or second aspect, wherein the element constant change processing unit moves the part to a contact position where the element operation was last stopped by the moving operation. Further, the element constant is changed.

  An equivalent circuit analysis device according to a fourth aspect is the device according to any one of the first to third aspects, wherein the element constant change processing unit is configured so that the part is not detected until the contact is not detected by the moving operation. The element constant is changed so as to move.

  The equivalent circuit analysis device according to claim 5 is the device according to any one of claims 1 to 4, wherein the element constant change processing unit changes the element constant by a predetermined change rate. To do.

  The equivalent circuit analysis method described in claim 6 is a measurement step of measuring a frequency characteristic of a complex impedance of a measurement object and displaying the frequency characteristic on a touch panel having a display function of an image and a detection function of an operation by contact; An estimation step for estimating each element constant of a predetermined equivalent circuit obtained by combining a plurality of electrical elements based on the frequency characteristics of the measurement object measured in the measurement step, and a frequency of a theoretical complex impedance of the equivalent circuit A theoretical characteristic calculation step for calculating the characteristics and displaying the respective element constants in a graph on the touch panel, and a contact position after contacting the portion of the equivalent circuit graph displayed on the touch panel A moving operation detecting step for detecting a moving operation for moving the touch panel on the touch panel, and detecting by the moving operation detecting step The in correspondence to the moving operation, characterized in that it comprises an element constant change processing step of changing the the element constants of the equivalent circuit.

  The equivalent circuit analysis method described in claim 7 is the equivalent circuit analysis method according to claim 6, wherein the change information of the element constant for moving the part is associated with the part of the graph of the equivalent circuit in advance. It is stored in a movement information storage unit, and in the element constant changing step, the change information corresponding to the movement operation is read from the movement information storage unit, and the element constant is changed.

  The equivalent circuit analysis method described in claim 8 is the method described in claim 6 or 7, wherein, in the element constant changing step, the part is moved to the contact position last stopped by the moving operation. The element constant is changed.

  An equivalent circuit analysis method according to a ninth aspect is the method according to any one of the sixth to eighth aspects, wherein in the element constant change processing step, the part is changed until contact is not detected by the moving operation. The element constant is changed so as to move.

  The equivalent circuit analysis method described in claim 10 is the one described in any one of claims 6 to 9, wherein the element constant is changed by a predetermined change rate in the element constant change processing step. To do.

  According to the equivalent circuit analysis device and the equivalent circuit analysis method of the present invention, after touching the portion of the graph of the equivalent circuit displayed on the touch panel, the contact position is moved on the touch panel to correspond to the moving operation. In order to change the element constant of the equivalent circuit, when there is an error in the element constant, it is necessary for the measurer to determine which element constant should be changed in order to eliminate this error. In addition, an accurate element constant with no error can be obtained by a direct and simple operation of moving the graph.

  The change information of the element constant associated with the part of the graph of the equivalent circuit is stored in advance in the movement information storage unit, the change information corresponding to the movement operation is read from the movement information storage unit, and based on this change information When changing the element constant, the element constant can be changed by a simple process.

  When changing the element constant so that the portion of the graph of the equivalent circuit moves to the contact position that was last stopped by the moving operation, the graph of the object to be measured can be matched with the graph of the equivalent circuit by a simpler operation. And an accurate element constant can be obtained more easily.

  When changing the element constant so that the part of the graph of the equivalent circuit moves until contact is not detected by the moving operation, the measurer confirms the movement (change) of the part of the graph of the equivalent circuit, By stopping contact when the part moves to a good position, the element constant at that time can be obtained.

  When the element constant is changed by a predetermined change rate, the arithmetic processing can be easily performed.

It is a block diagram of an equivalent circuit analysis device to which the present invention is applied. It is a flowchart for demonstrating the equivalent circuit analysis method to which this invention is applied. It is a schematic diagram which shows the example of a display of the touchscreen used for the equivalent circuit analysis apparatus to which this invention is applied. FIG. 4 is a schematic diagram illustrating an example of a moving operation for moving a part of a graph of the equivalent circuit illustrated in FIG. 3. FIG. 4 is a schematic diagram illustrating an example of a moving operation for moving a part of a graph of the equivalent circuit illustrated in FIG. 3. It is an example of the equivalent circuit of a measurement object. It is an example of the impedance frequency characteristic and phase frequency characteristic of each equivalent circuit shown in FIG. It is the frequency characteristic data (graph) of effective resistance for demonstrating the estimation method of the element constant in the equivalent circuit a. It is conductance frequency characteristic data (graph) for explaining a method of estimating an element constant in the equivalent circuit d. It is an example of the reference table memorize | stored in the movement information storage part. It is a schematic diagram which shows the other example of a touch panel used for the equivalent circuit analyzer to which this invention is applied. It is a flowchart for demonstrating the other equivalent circuit analysis method to which this invention is applied. It is a schematic diagram which shows the example of movement operation | movement of the graph of the phase frequency characteristic of the equivalent circuit b.

  Hereinafter, although the form for implementing this invention is demonstrated in detail, the scope of the present invention is not limited to these forms.

  An equivalent circuit analysis apparatus 1 to which the present invention is applied includes a measurement unit 2, an estimation unit 3, a theoretical characteristic calculation unit 5, an element constant change processing unit 6, a movement information storage unit 7, as shown by functional blocks in FIG. And the touch panel 10, the frequency characteristic of the complex impedance of the measurement object (DUT) 90 is measured, and the estimation unit 3 can estimate each element constant of the equivalent circuit from the frequency characteristic. Note that the estimation unit 3, the theoretical characteristic calculation unit 5, the element constant change processing unit 6 and the like shown in the figure are, as an example, one or more CPUs (not shown) that control the operation of the apparatus 1 as a whole. Is realized by operating in accordance with software pre-stored in a memory (not shown) and performing arithmetic processing. Further, the equivalent circuit analysis apparatus 1 is configured so that a program corresponding to a flowchart of FIG. 2 described later is stored in advance in a memory and can operate according to the flowchart. Note that a conventional impedance measuring device is used as the measuring unit 2, a computer (for example, a personal computer) is used as the other estimating unit 3, theoretical characteristic calculating unit 5, element constant change processing unit 6, and touch panel 10, and the two are combined. The equivalent circuit analysis apparatus 1 of the present invention may be used.

  The touch panel 10 is a combination of a display device such as a liquid crystal panel or CRT capable of displaying an image and a position input device such as a touch pad. The touch panel 10 has an image display function, and a finger or a dedicated pen touches the screen. Sometimes, it has a contact operation detection function that outputs position information on the touched screen. The touch panel 10 is used as a display unit and an operation unit of the equivalent circuit analysis device 1.

  A specific operation of the equivalent circuit analysis apparatus 1 will be described with reference to FIGS. Here, the flowchart shown in FIG. 2 shows an equivalent circuit analysis method to which the present invention is applied, and the operation of the equivalent circuit analysis apparatus 1 will be described along this.

  In the measurement step S1 shown in FIG. 2, the measurement unit 2 sweeps the frequency from the start frequency to the end frequency from an AC signal source (not shown) via the probes 21a and 21b, and generates a measurement signal voltage (DUT). ) 90 and the voltage and current are measured by a known measurement method such as the two-terminal method or the four-terminal method, and the frequency characteristics of the complex impedance of the DUT 90 are measured from the voltage and current. Moreover, the measurement part 2 displays the graph 31 of the frequency characteristic of the complex impedance which the measurement part 2 measured on the graph display area 11 of the touch panel 10, as shown in FIG. As a frequency characteristic of the complex impedance, for example, the measurement unit 2 displays a frequency characteristic (impedance frequency characteristic) of the absolute value of the complex impedance and / or a frequency characteristic (phase frequency characteristic) of the phase in a graph. In the graph display area 11, the impedance frequency characteristic graph, the phase frequency characteristic graph, or both characteristic graphs can be switched by the operator operating the touch panel 10. You can switch freely. In the example shown in the figure, the graph 31 represents the phase frequency characteristic θ. It should be noted that the method for expressing the complex impedance frequency characteristics displayed on the touch panel 10 in graph form includes conductance (G) -susceptance (B) characteristics, effective resistance (Rs) -reactance (X) characteristics, a dynamic admittance circle, or a dynamic impedance circle. As described above, it can be expressed by various known expression methods.

  Next, in the estimation step S2, the estimation unit 3 calculates each element constant of a predetermined equivalent circuit obtained by combining a plurality of electrical elements based on the frequency characteristics of the complex impedance of the DUT 90 measured by the measurement unit 2 in the measurement step S1. presume. The electric elements constituting the equivalent circuit are a resistor (element constant R), a capacitor (element constant C), and a coil (element constant L). The equivalent circuit is configured by connecting at least two of a resistor, a capacitor, and a coil. The number of electric elements used for the equivalent circuit is not particularly limited, and a plurality of electric elements of the same type may be used. The estimation unit 3 outputs the estimated element constants to the theoretical characteristic calculation unit 5.

  Examples of equivalent circuits are shown in equivalent circuits a to d in FIG. The equivalent circuit a is mainly used when measuring a coil or resistance, the equivalent circuit b is used when measuring a coil with a large loss, the equivalent circuit c is used when measuring a high resistance, and the equivalent circuit d. Is used when measuring capacitors. FIG. 7 illustrates an example of the impedance frequency characteristic Z and the phase frequency characteristic θ of the equivalent circuits a to d.

  As described above, it is preferable that a plurality of equivalent circuits be set in advance so that the measurer can select one equivalent circuit by operating the touch panel 10. The estimation unit 3 can estimate each element constant of the equivalent circuits a to d. The measurer operates the touch panel 10 to select an equivalent circuit to be used in advance before the measurement step S1 or the estimation step S2.

As an example in which the estimation unit 3 estimates each element constant, a case where the equivalent circuit a is selected will be described. In the case of the equivalent circuit a, the estimation unit 3 calculates the effective resistance (resistance) Rs of the complex impedance at each frequency from the measurement data of the measurement unit 2, and estimates each element constant from the effective resistance Rs. Since it is a well-known matter that the complex impedance can be expressed by the effective resistance Rs and the reactance X, description of the calculation method and the like will be omitted. When the frequency characteristic of the effective resistance Rs shown in the graph 25 of FIG. 8 is measured by the measurement unit 2, the estimation unit 3 first obtains the maximum value P in the graph 25 (measurement data). The frequency at the maximum value P is the parallel resonance frequency ωp. Next, the estimation unit 3 obtains two frequencies (quadrant frequencies) ω ₁ and ω _{2 at} which the graph 25 becomes 1/2 of the maximum value P. Next, the estimation unit 3 calculates the resonance sharpness Q by the following equation.
Q = ωp / (ω ₂ −ω ₁ )

Next, the estimation unit 3 calculates the element constant C of the capacitor of the equivalent circuit a by the following equation.
C = Q / (ωp × P)

Next, the estimation unit 3 calculates the element constant L of the coil of the equivalent circuit a by the following equation.
L = (2 × Q ² ) / (ωp ² × C × (2 × Q ² −1))

Next, the estimation unit 3 calculates the element constant R of the resistance of the equivalent circuit a by the following equation.
R = L / (C × P)

  Thus, the estimation of each element constant of the equivalent circuit “a” is completed.

In the case of a series resonant circuit such as the equivalent circuit d, the estimation unit 3 calculates the conductance G of complex admittance (another expression method of complex impedance) at each frequency from the measurement data of the measurement unit 2, Each element constant is estimated from the conductance G. Since it is a well-known matter that the complex admittance can be expressed by conductance G and susceptance B, description of the calculation method and the like will be omitted. When the frequency characteristic of the conductance G shown in the graph 26 of FIG. 9 is measured by the measurement unit 2, the estimation unit 3 first obtains the maximum value M in the graph 26 (measurement data). The frequency at the maximum value M is the series resonance frequency ωm. Next, the estimation unit 3 obtains two frequencies (quadrant frequencies) ω ₁ and ω _{2 at} which the graph 26 is ½ of the maximum value M. Next, the estimation unit 3 calculates the resonance sharpness Q by the following equation.
Q = ωm / (ω ₂ −ω ₁ )

Next, the estimation unit 3 calculates the element constant L of the coil of the equivalent circuit d by the following equation.
L = Q / (ωm × M)

Next, the estimation unit 3 calculates the element constant C of the capacitor of the equivalent circuit d by the following equation.
C = (2 × Q ² ) / (ωm ² × L × (2 × Q ² −1))

Next, the estimation unit 3 calculates the element constant R of the resistance of the equivalent circuit d by the following equation.
R = (L × M) / C

  This completes the estimation of each element constant of the equivalent circuit d.

Even in the case of other equivalent circuits, the R, C, and L element constants are estimated based on the parallel resonance frequency ωp, the series resonance frequency ωm, the two quadrant frequencies ω ₁ and ω ₂ , and the sharpness Q of the resonance. can do. Note that each element constant of the equivalent circuit may be estimated by another known estimation method.

  The estimation unit 3 outputs the estimated element constants to the theoretical characteristic calculation unit 5.

  Next, in the theoretical characteristic calculation step S3, the theoretical characteristic calculation unit 5 calculates the frequency characteristic of the theoretical complex impedance of the equivalent circuit with each element constant estimated by the estimation unit 3 in the estimation step S2. Here, the theoretical complex impedance of the equivalent circuit means that the complex impedance of the resistor is R, the complex impedance of the capacitor is 1 / (jωC), and the complex impedance of the coil is jωL, and these correspond to the connection of the equivalent circuit. And synthesized. Since the complex impedance synthesis is a well-known matter, a description thereof will be omitted. By varying the frequency of the synthesized complex impedance from the start frequency to the end frequency, the theoretical characteristic calculator 5 calculates the frequency characteristic (for example, impedance frequency characteristic, phase frequency characteristic) of the theoretical complex impedance of the equivalent circuit. Note that admittance may be used for the calculation, or other parameters that can be calculated from the complex impedance and phase may be used. The theoretical characteristic calculation unit 5 performs calculation in a format suitable for the graph displayed on the touch panel 10.

  As shown in FIG. 3, the theoretical characteristic calculation unit 5 displays a graph 32 of the calculated frequency characteristic (phase frequency characteristic) of the equivalent circuit in the graph display area 11 of the touch panel 10. The line type is changed so that the graph 31 of the measured frequency characteristic is displayed with a solid line and the graph 32 of the frequency characteristic of the equivalent circuit is displayed with a broken line so that the difference between the two graphs 31 and 32 can be understood visually. It is preferable to display the graphs 31 and 32 in a color-coded manner so that each can be identified. Furthermore, it is preferable that both graphs 31 and 32 are displayed so as to be superimposed on the same axis so that the vertical axis and the horizontal axis are aligned. The theoretical characteristic calculator 5 displays the element constants R, C, and L in the element constant display area 12 of the touch panel 10. The theoretical characteristic calculation unit 5 outputs each element constant and data of the graph 32 to the element constant change processing unit 6.

  As shown in the figure, when the graph 31 of the phase frequency characteristics of the DUT 90 and the graph 32 of the phase frequency characteristics of the equivalent circuit are displayed on the touch panel 10, the measurer visually observes the difference between the two graphs 31 and 32. Discriminate large areas. In this example, the difference between the graphs 31 and 32 is large in the low frequency region (the left end side in the figure). For example, in the case of a DUT 90 having a very high Q value, such an error is a peak or valley having a very sharp impedance characteristic. May occur and may occur as a result.

  As described above, when there is a difference between the graphs 31 and 32, the measurer touches the portion 40 having a large difference in the graph 32 of the equivalent circuit displayed on the touch panel 10, and then sets the contact position on the touch panel 10. Perform the move operation to move with. Specifically, as shown in FIG. 4, the touch panel is configured so that the measurer touches the part 50 of the graph 32 where the difference is large and slides the finger 50 while keeping the touch panel 10 in contact. 10 is moved in the direction of the lower side (the lower side of the figure). As shown in FIG. 5, the measurer moves the finger 50 to the graph 31 of the DUT 90 and stops. That is, the measurer moves the finger 50 to the graph 31 by bringing the finger 50 into contact with the part 40 of the graph 32 as a moving operation.

  When the element constant change processing unit 6 detects such a movement operation (moving operation detection step S4), in the next change stop step S5, the element constant change processing unit 6 finally stops after the finger 50 is moved by the movement operation. It is detected whether or not the part 40 has moved to the touched position. In this case, since the part 40 has not been moved yet, the process proceeds to the element constant changing process step S6.

  In the element constant change processing step S6, the element constant change processing unit 6 changes the element constant of the equivalent circuit so as to move the portion 40 in response to the moving operation. Specifically, as an example, element constant change information for moving the portion 40 is stored in advance in the movement information storage unit 7 (see FIG. 1) in association with the portion 40 of the graph 32 of the equivalent circuit. The element constant change processing unit 6 reads the change information corresponding to the movement operation from the movement information storage unit 7 and changes the element constant.

  Here, the movement information storage unit 7 shown in FIG. 1 is configured by, for example, a nonvolatile semiconductor memory (for example, ROM or flash ROM), and is a graph of frequency characteristics of complex impedance in the equivalent circuits a to d of FIG. In order to move the specific part, change information indicating which element constant in the equivalent circuit should be changed is stored in advance. Here, “the part of the graph of the frequency characteristic” is, for example, a frequency lower than the parallel or series resonance frequency, a frequency higher than the resonance frequency, within a predetermined range of the resonance frequency (near the resonance frequency), and 1 / of the resonance frequency. If the frequency is specified in a relative region with respect to the resonance frequency, such as a frequency of 2 or less, or if it is a complex equivalent circuit, the order of the resonance frequencies such as the third series resonance frequency from the low frequency side, It is specified by type, or specified by a numerical value (relative value or absolute value) such that the phase is 90 degrees or less and the phase is 90 degrees or more. In addition, you may prescribe | regulate how the specific site | part of the graph of a frequency characteristic can be prescribed | regulated. “Move a part of the graph” means that the value of the part of the graph is increased (decreased), the slope of the graph is increased (decreased), the frequency is increased (lower), etc. In this case, the feature near the specific part is changed. In the movement information storage unit 7, for example, as shown in FIG. 10, the equivalent circuit type (ad), the graph type (for example, the impedance frequency characteristic Z or the phase frequency characteristic θ), the part of the graph, The change information of the element constant corresponding to the moving direction of the finger 50 is stored in a reference table format. As the element constant change information, as shown in the figure, for example, a change target element constant, change contents, and change rate are stored. Although not shown in the figure, if there are other types of graphs that can be displayed, such as the graph of effective resistance Rs, reactance X, conductance G, and susceptance B, for example, the graphs correspond to the types of other graphs. Change information may be recorded.

  In the example shown in FIGS. 3 to 5, the graph 32 is for the equivalent circuit a and the phase frequency characteristic θ, and the portion 40 of the graph 32 in contact with the finger 50 is “a lower frequency side than the parallel resonance frequency ωp”. Since the moving direction of the finger 50 is the direction in which θ is decreased (downward), this corresponds to the condition in the first (first) column of the reference table of FIG. The element constant change processing unit 6 discriminates this condition, and reads change information with contents “change element constant R to a large value” and “change rate is 1%” from the first column of the reference table. Thereby, the element constant change processing unit 6 greatly changes the element constant R estimated by the estimation unit 3 by a change rate (1%). Note that the change rate is set to a small value such that the portion 40 of the graph 32 can be finely adjusted.

  The element constant change processing unit 6 outputs each element constant including the changed element constant R to the theoretical characteristic calculation unit 5 and returns to the theoretical characteristic calculation step S3.

  Subsequently, in the theoretical characteristic calculation step S3, the theoretical characteristic calculation unit 5 calculates the frequency characteristic of the equivalent circuit with the changed element constant, displays the changed frequency characteristic graph 32 on the touch panel 10, and after the change. The element constant of is displayed. The graph 32 after the change is closer to the graph 31 than before the change.

  Subsequently, in the change stop step S5, the element constant change processing unit 6 detects whether or not there is the part 40 at the contact position where the finger 50 is finally stopped by the moving operation. The last stopped contact position may be stored in a memory (not shown) by the element constant change processing unit 6 so that the finger 50 may be separated from the touch panel 10 or may remain in contact. . As a stop condition, for example, when it is detected that the finger 50 is stopped at the same position for a predetermined time such as 0.5 seconds, the element constant change processing unit 6 records the contact position as the stop position. . When it is detected that the contact position starts to move again after the stop, the element constant change processing unit 6 clears the stop position and sets the stop position as the stop position.

  When the region 40 has not moved to the stop position of the finger 50, the loop of steps S3, S5, and S6 is repeated. Each time this loop processing is performed, the element constant R is changed by 1% larger than the original element constant R, and the part 40 gradually approaches the graph 31. Finally, as shown in FIG. To do. If the calculation speed is fast, the part 40 moves so as to follow the finger 50 that is moving by performing a moving operation. If the process is slow, the part 40 gradually approaches the position where the finger 50 is stopped by the moving operation. Regardless of the processing speed, the part 40 moves to the contact position where the finger 50 was last stopped, that is, the position of the graph 32 of the DUT 90, and the processing of FIG.

  In this way, by simply performing a direct and simple operation of moving the finger 50 so that the part 40 of the graph 32 having a large difference approaches the graph 31, the part 40 automatically matches the graph 31 automatically. An accurate element constant without error can be obtained. Even in the other example shown in FIG. 10, the element constant can be changed by performing a moving operation on the part of the graph.

  As shown in FIG. 10, in the phase frequency characteristic θ of the equivalent circuit a, only “lower frequency side than the parallel resonance frequency ωp” is registered in the reference table as a part of the graph, and other parts are registered. This is because there is an error in the estimation of the element constant, and the change correction is necessary because it is almost the case of the registered “lower frequency side than the parallel resonance frequency ωp”. In this way, only a part that may cause an error due to the estimation of the element constant and need to move the part of the graph may be registered in the reference table, or even if any part of the graph is touched The movement information for each part of the graph may be comprehensively registered in the reference table without omission so that the movement information corresponding to the part is in the reference table. Further, as shown in FIG. 11, in the element constant display area 12, the operation button 14a for increasing / decreasing the value of the element constant R, the operation button 14b for increasing / decreasing the value of the element constant C, and the value of the element constant L are increased / decreased. Therefore, the operation button 14c is displayed on the touch panel 10 so that both the element constant changing operation by the operation buttons 14a to 14c and the element constant changing operation by moving the part 40 with the finger 50 can be performed. Also good.

  Further, processing may be performed as shown in the flowchart of FIG. The flowchart of FIG. 6 is obtained by replacing the change stop step S5 of the flowchart of FIG. 2 with another change stop step S9. Since steps S1 to S4 and S6 are the same, the same reference numerals are given and detailed description is omitted.

  In the change stop step S9 of FIG. 12, it is detected whether the finger 50 that has performed the moving operation is in direct contact with the touch panel 10 or separated. When the finger 50 remains in contact with the touch panel 10, the loop of steps S3, S9, and S6 is repeated. When the finger 50 is separated from the touch panel 10 and contact is not detected, the loop process is terminated. When the processing is performed in this manner, for example, in FIG. 5, when the finger 50 is moved from the graph 32 to the lower side than the graph 31 and the finger 50 is brought into contact with the touch panel 10 as it is, the element is processed by loop processing. The constant is changed by the change rate, and the portion 40 of the graph 32 gradually moves downward. If the finger 50 is released from the touch panel 10 when the part 40 just overlaps (matches) the graph 31, the movement of the part 40 stops and an accurate element constant is obtained.

  When the part 40 of the graph 32 has moved past the graph 31, the finger 50 is once released from the touch panel 10, contacts the part 40 again, and then moves the finger 50 upward in the touch panel 10. When this movement operation is detected, the element constant change processing unit 6 reads the change information in the second column of the reference table of FIG. 10 from the movement information storage unit 7, and changes the element constant R by 1%. As a result, when the part 40 moves upward and overlaps the graph 31, the measurer only has to release the finger 50 from the touch panel 10.

  When the finger 50 is in contact with the touch panel 10 by combining the flowcharts of FIGS. 2 and 12, a loop process including the element constant changing process step S6 and the theoretical characteristic calculating step S3 is performed, and the last of the finger 50 is processed. This loop process may be stopped when the part 40 moves to the stop position and when the finger 50 moves away from the touch panel 10.

  Further, a loop process including an element constant changing process step S6 and a theoretical characteristic calculating step S3 is performed until the change stop steps S5 and S9 are satisfied, and the element constant is repeatedly reached until the finger 50 is stopped and / or the finger 50 is released. However, the element constant is changed only once each time the moving operation is performed without performing the loop process including the change stop step S5. You may do it. For example, when the finger 50 is moved downward after contacting the part 40, the element constant change processing step S6 is performed only once, the element constant R is changed once, and the graph 32 and the element constant are displayed. Further, when the finger 50 is moved after being brought into contact with the part 40, the element constant change processing step S6 is performed once again, the element constant R is changed once, and the graph 32 and the element constant are displayed. In this case, it is necessary to perform a moving operation for moving the portion 40 downward after touching the portion 40 many times until the portion 40 matches the graph 31.

  Moreover, although the example in which the change rate is a fixed value has been described, the change rate may be varied based on the distance between the region 40 and the finger 50. For example, when the distance between the part 40 and the finger 50 is larger than a first threshold (for example, a predetermined number of pixels such as 100 pixels), a preset change rate (for example, 1%) is multiplied by a multiple ( For example, when the distance between the part 40 and the finger 50 is closer than a second threshold (for example, a predetermined number of pixels such as 20 pixels), the change rate is reduced to a plurality (for example, 1/2). 0.5% of the above). By changing the change rate in this way, the part 40 can be quickly and accurately moved to the contact position of the finger 50.

  Further, the example in which the element constant is changed at the change rate has been described. For example, a predetermined change value to be added to or subtracted from the element constant is set in advance so that the element constant R is changed by 0.1Ω. You may make it change an element constant with a predetermined change value.

  FIG. 13 shows an example in which, for example, the slope of the graph 35 of the phase frequency characteristic θ in the equivalent circuit b is increased to match the graph 34 of the phase frequency characteristic θ of the measurement object. When the multi-point (two-point) detection type touch panel 10 is used, the fingers 50a and 50b are brought into contact with the portions 41a and 41b of the graph 35 sandwiching the resonance frequency ωp in the vicinity of the resonance frequency ωp, and the finger 50a is moved. The movement operation may be performed at two points so as to move the finger 50b in the upward direction and the downward direction. In this case, it corresponds to the sixth column from the top of the “element condition change information” in the reference table shown in FIG. 10, and in the element constant change processing step S6, the element constant change processing unit 6 sets the value of the element constant R to 1%. Change a lot.

  In the same figure, when the touch panel 10 is a one-point detection type, for example, the region 41a, 41b is moved by moving the region 41a (or only the region 41b) upward (or downward) so as to approach the graph 34. May be changed so as to be closer to the graph 35. Further, if the finger 50a or the like is not brought close to the graph 34 from the graph 35, but the part 42 of the resonance frequency ωp of the graph 35 is touched with the finger 50a and moved upward, the inclination near the resonance frequency ωp of the graph 35 is increased. The movement direction (change mode) of the part may be determined in association with the movement direction of the finger 50 so that the inclination is changed to be small when the movement is changed largely and moved downward.

1 is an equivalent circuit analyzer, 2 is a measurement unit, 3 is an estimation unit, 5 is a theoretical characteristic calculation unit, 6 is an element constant change processing unit, 7 is a movement information storage unit, 10 is a touch panel, 11 is a graph display area, 12 Is an element constant display area, 14a, 14b and 14c are increase / decrease buttons (setting operation buttons), 21a and 21b are probes, 25 is a graph (data) of frequency characteristics of effective resistance Rs, and 26 is a graph of frequency characteristics of conductance G. (Data), 31 is a graph of the complex impedance (phase frequency characteristic) measured by the measuring unit 2, 32 is a graph of the theoretical complex impedance (phase frequency characteristic) of the equivalent circuit a, and 34 is the complex measured by the measuring unit 2. Impedance (phase frequency characteristic) graph, 35 is a theoretical complex impedance (phase frequency characteristic) graph of the equivalent circuit b, 40 · 41a. 41b and 42 are parts, 50, 50a and 50b are fingers of the measurer, 90 is an object to be measured, a, b, c and d are equivalent circuits, C is an element constant of the capacitor, L is an element constant of the coil, R is The element constant of the resistor, Rs is the effective resistance, G is the conductance, P · M is the maximum value, Z is the impedance frequency characteristic, θ is the phase frequency characteristic, ω ₁ and ω ₂ are the quadrant frequencies, ωp is the parallel resonance frequency, and ωm is Series resonance frequency.

Claims (10)

A touch panel having an image display function and a contact detection function;
Measuring the frequency characteristics of the complex impedance of the object to be measured, and displaying the graph on the touch panel as a graph,
Based on the frequency characteristics of the measurement object measured by the measurement unit, an estimation unit that estimates each element constant of a predetermined equivalent circuit combining a plurality of electrical elements;
Calculating a theoretical complex impedance frequency characteristic of the equivalent circuit, displaying the graph on the touch panel and displaying each element constant thereof, and a theoretical characteristic calculation unit;
An element constant change for changing the element constant of the equivalent circuit in response to a moving operation of moving the contact position on the touch panel after contacting the portion of the equivalent circuit graph displayed on the touch panel An equivalent circuit analyzing apparatus comprising a processing unit. A movement information storage unit that stores in advance the change information of the element constant for moving the part in association with the part of the graph of the equivalent circuit,
The equivalent circuit analysis apparatus according to claim 1, wherein the element constant change processing unit reads the change information corresponding to the movement operation from the movement information storage unit and changes the element constant.   3. The equivalent circuit analysis device according to claim 1, wherein the element constant change processing unit changes the element constant so that the part moves to a contact position last stopped by the moving operation. 4. .   4. The equivalent according to claim 1, wherein the element constant change processing unit changes the element constant so that the part moves until contact is not detected by the moving operation. 5. Circuit analysis device.   The equivalent circuit analysis apparatus according to claim 1, wherein the element constant change processing unit changes the element constant by a predetermined change rate. A measurement step of measuring the frequency characteristics of the complex impedance of the measurement object, and displaying it in a graph on a touch panel having an image display function and a touch operation detection function;
An estimation step for estimating each element constant of a predetermined equivalent circuit obtained by combining a plurality of electric elements based on the frequency characteristics of the measurement object measured in the measurement step;
A theoretical characteristic calculation step of calculating a frequency characteristic of the theoretical complex impedance of the equivalent circuit, displaying the graph on the touch panel and displaying each element constant thereof,
A movement operation detecting step for detecting a movement operation for moving the contact position on the touch panel after contacting a portion of the graph of the equivalent circuit displayed on the touch panel;
An equivalent circuit analysis method comprising: an element constant change processing step for changing the element constant of the equivalent circuit in correspondence with the movement operation detected in the movement operation detection step. In association with the part of the graph of the equivalent circuit, change information of the element constant for moving the part is stored in advance in the movement information storage unit,
The equivalent circuit analysis method according to claim 6, wherein in the element constant changing step, the element constant is changed by reading the change information corresponding to the movement operation from the movement information storage unit.   The equivalent circuit analysis method according to claim 6 or 7, wherein, in the element constant changing step, the element constant is changed so that the part moves to a contact position last stopped by the moving operation.   The equivalent according to any one of claims 6 to 8, wherein, in the element constant changing processing step, the element constant is changed so that the part moves until contact is not detected by the moving operation. Circuit analysis method.   10. The equivalent circuit analysis method according to claim 6, wherein the element constant is changed by a predetermined change rate in the element constant change processing step.

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