JP2012222070A - Liquid management system - Google Patents

Liquid management system Download PDF

Info

Publication number
JP2012222070A
JP2012222070A JP2011084456A JP2011084456A JP2012222070A JP 2012222070 A JP2012222070 A JP 2012222070A JP 2011084456 A JP2011084456 A JP 2011084456A JP 2011084456 A JP2011084456 A JP 2011084456A JP 2012222070 A JP2012222070 A JP 2012222070A
Authority
JP
Japan
Prior art keywords
liquid
mixing tank
concentration
cleaning
cleaning liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2011084456A
Other languages
Japanese (ja)
Other versions
JP5791939B2 (en
Inventor
Hiroshi Sugawara
広 菅原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Organo Corp
Original Assignee
Organo Corp
Japan Organo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Organo Corp, Japan Organo Co Ltd filed Critical Organo Corp
Priority to JP2011084456A priority Critical patent/JP5791939B2/en
Publication of JP2012222070A publication Critical patent/JP2012222070A/en
Application granted granted Critical
Publication of JP5791939B2 publication Critical patent/JP5791939B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

PROBLEM TO BE SOLVED: To provide a management system in which the concentration and the volume of liquid can be maintained within a certain range while circulating the liquid between a mixing tank and a cleaning device.SOLUTION: The liquid management system has: a mixing tank 4 in which a cleaning liquid containing alcohol and pure water is prepared; alcohol supply means for supplying alcohol to the mixing tank 4; pure water supply means for supplying pure water to the mixing tank 4; circulation means for circulating the cleaning liquid between the mixing tank 4 and a cleaning device 100; liquid volume measuring means for measuring the volume of the cleaning liquid in the mixing tank 4; concentration measuring means for measuring the component concentration of the cleaning liquid; first control means for performing liquid volume adjustment processing based on the measurement results of the liquid volume measuring means; and second control means for performing concentration adjustment processing based on the measurement results of the concentration measuring means.

Description

本発明は、半導体ウエハやLCD(Liquid Crystal Display)基板、MEMS(Micro Electro Mechanical Systems)等の洗浄や乾燥に用いられる液体を管理するシステムに関するものである。   The present invention relates to a system for managing a liquid used for cleaning and drying of semiconductor wafers, LCD (Liquid Crystal Display) substrates, MEMS (Micro Electro Mechanical Systems), and the like.

半導体ウエハ等の洗浄や乾燥には、アルコールと水の混合液が用いられることがある。特許文献1には、イソプロピルアルコール(IPA(isopropyl alcohol))と超純水とを混合させた液体を洗浄液として用いる半導体ウエハの洗浄・乾燥装置が記載されている。具体的には、特許文献1に記載されている装置は、ウエハの洗浄・乾燥が行われる処理槽と、処理槽に供給される洗浄液をあらかじめ所定濃度に調整する洗浄液混合ユニットと、洗浄液混合ユニットから洗浄槽へ洗浄液を移動させる洗浄液供給部とを備えている。   A mixture of alcohol and water may be used for cleaning or drying a semiconductor wafer or the like. Patent Document 1 describes a semiconductor wafer cleaning / drying apparatus using a liquid obtained by mixing isopropyl alcohol (IPA (isopropyl alcohol)) and ultrapure water as a cleaning liquid. Specifically, the apparatus described in Patent Document 1 includes a processing tank in which wafers are cleaned and dried, a cleaning liquid mixing unit that adjusts a cleaning liquid supplied to the processing tank to a predetermined concentration in advance, and a cleaning liquid mixing unit. And a cleaning liquid supply section for moving the cleaning liquid from the cleaning tank to the cleaning tank.

上記洗浄液混合ユニットは、IPAタンクと、該IPAタンクに接続された混合タンクとを有する。また、混合タンクは、外部に設けられている超純水の供給源とも接続されている。さらに、IPAタンクと混合タンクとを繋ぐパイプの途中には、IPA補充ポンプが設けられている。一方、洗浄液供給部には、処理槽へ供給される洗浄液内のIPA濃度を測定するIPA濃度計が設けられている。   The cleaning liquid mixing unit includes an IPA tank and a mixing tank connected to the IPA tank. The mixing tank is also connected to a supply source of ultrapure water provided outside. Furthermore, an IPA replenishment pump is provided in the middle of the pipe connecting the IPA tank and the mixing tank. On the other hand, the cleaning liquid supply unit is provided with an IPA concentration meter that measures the IPA concentration in the cleaning liquid supplied to the treatment tank.

上記構成を備えた特許文献1に記載の装置では、所定量のIPAおよび超純水が混合タンクへそれぞれ独立して供給され、所定濃度の洗浄液が作られる。そして、混合タンク内の洗浄液が、洗浄液供給部を介して処理槽へ供給される。   In the apparatus described in Patent Document 1 having the above-described configuration, a predetermined amount of IPA and ultrapure water are independently supplied to the mixing tank, and a cleaning liquid having a predetermined concentration is produced. Then, the cleaning liquid in the mixing tank is supplied to the treatment tank via the cleaning liquid supply unit.

ここで、洗浄液中のIPA濃度の低下がIPA濃度計によって検知されると、IPA補充ポンプが作動され、IPAタンクから混合タンクへIPAが追加供給される。すなわち、IPAの補充によってIPA濃度の調整が図られる。   Here, when a decrease in the IPA concentration in the cleaning liquid is detected by the IPA densitometer, the IPA replenishment pump is activated, and IPA is additionally supplied from the IPA tank to the mixing tank. That is, the IPA concentration is adjusted by replenishing IPA.

特開2003−297795号公報([0023]〜[0027]、[0037]〜[0038]、図1)Japanese Patent Laying-Open No. 2003-29795 ([0023] to [0027], [0037] to [0038], FIG. 1)

半導体ウエハ等の洗浄においては、IPA濃度が一定の洗浄液が常に一定量で循環していることが理想である。即ち、混合タンク内の洗浄液の量(液面)が一定範囲内に維持されていることが理想である。しかし、実際には、混合タンク内の液面は変化する。例えば、系内を循環する洗浄液からはIPAのみでなく水分も蒸発する。また、洗浄液の一部が洗浄対象であるウエハに付着して系外に持ち出されることもある。このような場合、混合タンク内の洗浄液の液面は低下する。一方、水分が洗浄対象であるウエハに付着して系内に持ち込まれることもある。この場合、混合タンク内の洗浄液の液面は上昇する。この点、特許文献1に記載されている半導体ウエハの洗浄・乾燥装置では、混合タンク内の洗浄液の液面は管理されていない。よって、特許文献1に記載されている半導体ウエハの洗浄・乾燥装置では、洗浄液の濃度調整の際に混合タンク内の洗浄液の量(液面)が考慮されることはない。しかし、混合タンク内の洗浄液の液面が上昇している状態、即ち、系内の洗浄液量が増加している状態で洗浄液の濃度調整を実行すると、濃度調整に必要なIPAの量が増加してしまう。なお、特許文献1に記載されている半導体ウエハの洗浄・乾燥装置における混合タンク内には複数のレベルセンサが設けられているが、かかるレベルセンサは、混合タンクに供給される超純水の量を計測するものであって、超純水とIPAとが混合された洗浄液の量(液面)を管理するためのものではない。   In cleaning a semiconductor wafer or the like, it is ideal that a cleaning solution having a constant IPA concentration is always circulated in a constant amount. That is, it is ideal that the amount (liquid level) of the cleaning liquid in the mixing tank is maintained within a certain range. However, in practice, the liquid level in the mixing tank changes. For example, not only IPA but also water evaporates from the cleaning liquid circulating in the system. Also, part of the cleaning liquid may adhere to the wafer to be cleaned and be taken out of the system. In such a case, the liquid level of the cleaning liquid in the mixing tank decreases. On the other hand, moisture may adhere to the wafer to be cleaned and be brought into the system. In this case, the liquid level of the cleaning liquid in the mixing tank rises. In this regard, in the semiconductor wafer cleaning / drying apparatus described in Patent Document 1, the liquid level of the cleaning liquid in the mixing tank is not managed. Therefore, in the semiconductor wafer cleaning / drying apparatus described in Patent Document 1, the amount (liquid level) of the cleaning liquid in the mixing tank is not considered when adjusting the concentration of the cleaning liquid. However, if the cleaning liquid concentration is adjusted when the level of the cleaning liquid in the mixing tank is rising, that is, when the amount of the cleaning liquid in the system is increasing, the amount of IPA required for concentration adjustment increases. End up. Note that a plurality of level sensors are provided in the mixing tank in the semiconductor wafer cleaning / drying apparatus described in Patent Document 1, but the level sensors are used for the amount of ultrapure water supplied to the mixing tank. However, it is not for managing the amount (liquid level) of the cleaning liquid in which ultrapure water and IPA are mixed.

また、特許文献1に記載されている半導体ウエハの洗浄・乾燥装置では、IPAの補充によって洗浄液の濃度調整が行われる。しかし、IPA濃度が所定値を超えてしまった場合、これを回復することはできない。よって、洗浄液の濃度を調整する際には、IPA濃度が所定値を超えないように、IPAの補充と濃度測定を何度も繰り返しながら、所定濃度に徐々に近づける必要があり、一回のIPA補充量も少量とならざるを得ない。総じて、洗浄液の濃度調整に時間と手間を要する。特に、半導体ウエハの洗浄では、洗浄液の濃度を高精度に管理する必要があるため、洗浄液の濃度調整には多大な時間と手間を要する。   In the semiconductor wafer cleaning / drying apparatus described in Patent Document 1, the concentration of the cleaning liquid is adjusted by replenishment with IPA. However, if the IPA concentration exceeds a predetermined value, this cannot be recovered. Therefore, when adjusting the concentration of the cleaning liquid, it is necessary to gradually approach the predetermined concentration while repeating the replenishment of IPA and the concentration measurement many times so that the IPA concentration does not exceed the predetermined value. The amount of replenishment must be small. In general, it takes time and labor to adjust the concentration of the cleaning solution. In particular, in the cleaning of semiconductor wafers, it is necessary to manage the concentration of the cleaning liquid with high accuracy. Therefore, it takes a lot of time and labor to adjust the concentration of the cleaning liquid.

さらに、特許文献1には、交互に切り替えて使用可能な複数の混合タンクを設けることが記載されている。しかし、洗浄液の循環を停止させることなく混合タンクを切り換えると、切り替えの前後で循環液量の変動が生じるなど、安定した洗浄液の供給が困難となる。また、混合タンクの切り替え前後で、洗浄液が入れ替わるので、洗浄液の状態(濃度、温度、汚染状態など)が変化し、プロセス(洗浄、乾燥)に影響が出るおそれがある。   Further, Patent Document 1 describes that a plurality of mixing tanks that can be used alternately are provided. However, when the mixing tank is switched without stopping the circulation of the cleaning liquid, it becomes difficult to supply a stable cleaning liquid, for example, the amount of the circulating liquid fluctuates before and after the switching. Further, since the cleaning liquid is changed before and after the mixing tank is switched, the state of the cleaning liquid (concentration, temperature, contamination state, etc.) may change, and the process (cleaning, drying) may be affected.

本発明は上記課題に鑑みてなされたものであり、その目的は、洗浄装置との間でアルコールと純水を含む液体を循環させつつ、該液体の濃度および量を一定の範囲内に維持可能な管理システムを提供することである。   The present invention has been made in view of the above problems, and its purpose is to maintain the concentration and amount of the liquid within a certain range while circulating the liquid containing alcohol and pure water between the cleaning devices. Is to provide a simple management system.

アルコールと純水を含む液体を該液体を用いて対象物を洗浄する洗浄装置に供給する液体管理システムであって、アルコールと純水が供給され、前記液体が調製される混合槽と、前記混合槽にアルコールを供給するアルコール供給手段と、前記混合槽に純水を供給する純水供給手段と、前記混合槽と前記洗浄装置との間で前記液体を循環させる循環手段と、前記混合槽内の前記液体の量を測定する液量測定手段と、前記混合槽内の前記液体の成分濃度を測定する濃度測定手段と、前記液量測定手段の測定結果に基づいて前記アルコール供給手段および前記純水供給手段を制御することにより、前記混合槽内の前記液体の量を所定の液量範囲内に維持する液量調整処理を実行する第一の制御手段と、前記濃度測定手段の測定結果に基づいて前記アルコール供給手段と前記純水供給手段の双方または一方を制御することにより、前記混合槽内の前記液体の成分濃度を所定の濃度範囲内に維持する濃度調整処理を実行する第二の制御手段と、を有する。   A liquid management system for supplying a liquid containing alcohol and pure water to a cleaning device for cleaning an object using the liquid, wherein the liquid is supplied with alcohol and pure water, and the liquid is prepared, and the mixing An alcohol supply means for supplying alcohol to the tank; a pure water supply means for supplying pure water to the mixing tank; a circulating means for circulating the liquid between the mixing tank and the cleaning device; Liquid amount measuring means for measuring the amount of the liquid, concentration measuring means for measuring the component concentration of the liquid in the mixing tank, the alcohol supply means and the pure water based on the measurement result of the liquid amount measuring means By controlling the water supply means, a first control means for performing a liquid amount adjustment process for maintaining the amount of the liquid in the mixing tank within a predetermined liquid amount range, and a measurement result of the concentration measuring means Based on the above Second control means for executing concentration adjustment processing for maintaining the concentration of the liquid component in the mixing tank within a predetermined concentration range by controlling both or one of the alcohol supply means and the pure water supply means; Have.

本発明によれば、洗浄装置との間で液体を循環させつつ、該液体の濃度および量を一定の範囲内に維持することができる。   According to the present invention, it is possible to maintain the concentration and amount of the liquid within a certain range while circulating the liquid to and from the cleaning device.

本発明の第一の実施形態を示すブロック図である。It is a block diagram which shows 1st embodiment of this invention. 本発明の第二の実施形態を示すブロック図である。It is a block diagram which shows 2nd embodiment of this invention. 本発明の第三の実施形態を示すブロック図である。It is a block diagram which shows 3rd embodiment of this invention.

(実施形態1)
以下、本発明の第1の実施形態について詳細に説明する。図1は、本実施形態に係る液体管理システム1Aの基本構成を示すブロック図である。
(Embodiment 1)
Hereinafter, a first embodiment of the present invention will be described in detail. FIG. 1 is a block diagram showing a basic configuration of a liquid management system 1A according to the present embodiment.

図1に示すように、本実施形態に係る液体管理システム1Aは、半導体ウエハの洗浄装置100と接続され、該洗浄装置100に対して洗浄・乾燥液を供給する。なお、ここでは洗浄装置100に関する詳しい説明は省略するが、該洗浄装置100は、液体管理システム1Aから供給される洗浄・乾燥液を用いて半導体ウエハの洗浄を行う洗浄槽を少なくとも備えている。   As shown in FIG. 1, a liquid management system 1 </ b> A according to the present embodiment is connected to a semiconductor wafer cleaning apparatus 100 and supplies a cleaning / drying liquid to the cleaning apparatus 100. Although a detailed description of the cleaning device 100 is omitted here, the cleaning device 100 includes at least a cleaning tank that cleans the semiconductor wafer using the cleaning / drying liquid supplied from the liquid management system 1A.

図1に示すように、液体管理システム1Aは、アルコール(本実施形態ではIPA)と純水(本実施形態では超純水)が供給され、洗浄・乾燥液(以下、「洗浄液」と総称する。)が調製される混合槽4と、IPAを混合槽4に供給するアルコール供給手段と、超純水を混合槽4に供給する純水供給手段と、混合槽4に接続された濃度測定手段と、廃液タンク6および当該システム1Aを統括的に制御する制御部7とを有する。   As shown in FIG. 1, the liquid management system 1A is supplied with alcohol (IPA in this embodiment) and pure water (ultra pure water in this embodiment), and is collectively referred to as a cleaning / drying liquid (hereinafter referred to as “cleaning liquid”). .) Is prepared, alcohol supply means for supplying IPA to the mixing tank 4, pure water supply means for supplying ultrapure water to the mixing tank 4, and concentration measuring means connected to the mixing tank 4. And a control unit 7 that comprehensively controls the waste liquid tank 6 and the system 1A.

アルコール供給手段は、図1に示すIPA供給源2、配管10および弁15aを少なくとも有する。   The alcohol supply means includes at least the IPA supply source 2, the pipe 10, and the valve 15a shown in FIG.

IPA供給源2は、例えば、IPAが貯留された容器と、その容器内のIPAを混合槽4に圧送する手段とを有する。IPAを圧送する手段の具体例としては、窒素ガスやポンプ等が挙げられる。配管10は、IPA供給源2と混合槽4とを接続しており、IPA供給源2から混合槽4へIPAを導入するための流路を形成している。弁15aは、配管10に設けられるとともに、制御部7によって制御されており、IPAの導入開始又は導入停止やIPAの導入量などを調節する。   The IPA supply source 2 includes, for example, a container in which IPA is stored, and a unit that pumps the IPA in the container to the mixing tank 4. Specific examples of means for pumping IPA include nitrogen gas and a pump. The pipe 10 connects the IPA supply source 2 and the mixing tank 4, and forms a flow path for introducing IPA from the IPA supply source 2 to the mixing tank 4. The valve 15 a is provided in the pipe 10 and is controlled by the control unit 7 to adjust the start or stop of IPA introduction, the amount of IPA introduction, and the like.

純水供給手段は、図1示す超純水供給源3、配管11および弁15bを少なくとも有する。   The pure water supply means has at least the ultrapure water supply source 3, the pipe 11 and the valve 15b shown in FIG.

配管11は、超純水供給源3と混合槽4とを接続しており、超純水供給源3から混合槽4へ超純水を導入するための流路を形成している。弁15bは、配管11に設けられるとともに、制御部7によって制御されており、超純水の導入開始又は導入停止や超純水の導入量などを調節する。超純水供給源3は、配管11を介して混合槽4と直接的に接続された超純水製造装置であってよい。また、超純水供給源3は、超純水製造装置によって製造された超純水を貯留するタンクと、該タンクに貯留されている超純水を配管11を介して混合槽4へ圧送するポンプ等を有していてもよい。   The pipe 11 connects the ultrapure water supply source 3 and the mixing tank 4, and forms a flow path for introducing ultrapure water from the ultrapure water supply source 3 to the mixing tank 4. The valve 15 b is provided in the pipe 11 and is controlled by the control unit 7, and adjusts the start or stop of introduction of ultrapure water, the introduction amount of ultrapure water, and the like. The ultrapure water supply source 3 may be an ultrapure water production apparatus that is directly connected to the mixing tank 4 via the pipe 11. The ultrapure water supply source 3 pumps a tank for storing ultrapure water produced by the ultrapure water production apparatus and the ultrapure water stored in the tank to the mixing tank 4 via the pipe 11. You may have a pump etc.

IPAと超純水の供給直後の混合槽4内の洗浄液の濃度を均一にするため、混合槽4には攪拌機構が備えられているのが好ましく、例えば、ポンプ等による洗浄液の循環、ガス(N2等)を吹き込んで攪拌できるようにされているのが好ましい。 In order to make the concentration of the cleaning liquid in the mixing tank 4 immediately after the supply of IPA and ultrapure water uniform, the mixing tank 4 is preferably provided with a stirring mechanism. For example, circulation of cleaning liquid by a pump or the like, gas ( N 2 or the like) is preferably blown in and stirred.

混合槽4と濃度測定手段(濃度測定装置5)とは、配管12を介して互いに接続されている。混合槽4と廃液タンク6とは、配管13を介して互いに接続されている。混合槽4と洗浄装置100とは、供給用の配管14aおよび回収用の配管14bを介して互いに接続されている。   The mixing tank 4 and the concentration measuring means (concentration measuring device 5) are connected to each other via a pipe 12. The mixing tank 4 and the waste liquid tank 6 are connected to each other via a pipe 13. The mixing tank 4 and the cleaning apparatus 100 are connected to each other via a supply pipe 14a and a recovery pipe 14b.

ここで、混合槽4内の洗浄液の成分濃度と、混合槽4から流出した直後の洗浄液の成分濃度とは実質的に同一である。よって、配管14a上に濃度測定装置5を設けた場合も、14aから分岐させた配管に濃度測定装置5を接続した場合も、混合槽4内の洗浄液の成分濃度を測定することが可能である。すなわち、本発明における洗浄液の成分濃度測定には、混合槽4内の洗浄液の成分濃度を測定することと、混合槽4から流出した直後の洗浄液の成分濃度を測定することの双方が含まれる。   Here, the component concentration of the cleaning liquid in the mixing tank 4 and the component concentration of the cleaning liquid immediately after flowing out of the mixing tank 4 are substantially the same. Therefore, it is possible to measure the component concentration of the cleaning liquid in the mixing tank 4 both when the concentration measuring device 5 is provided on the pipe 14a and when the concentration measuring device 5 is connected to a pipe branched from the pipe 14a. . That is, the measurement of the cleaning liquid component concentration in the present invention includes both the measurement of the cleaning liquid component concentration in the mixing tank 4 and the measurement of the cleaning liquid component concentration immediately after flowing out of the mixing tank 4.

次に、上記構成を有する液体管理システム1Aの動作について説明する。まず、制御部7によって、図1に示す弁15a、15bが同時に、または順次に開かれるとともに、IPA供給源2および超純水供給源3からIPAおよび超純水が混合槽4へ供給される。ここでは、予め定められている一定の割合でIPAと超純水とが供給される。換言すれば、理想的な成分濃度(以下「理想濃度」と呼ぶ。)を有する洗浄液が得られるように予め定められた量のIPAと超純水とがそれぞれ供給される。これにより、混合槽4内でIPAと超純水とが混合され洗浄液が作られる。もっとも、この時点では、混合槽4内の洗浄液の成分濃度が理想濃度と完全に一致しているとは限らない。なぜなら、混合槽4には一定の割合でIPAと超純水とが供給されるが、この割合は計算上の割合だからである。   Next, the operation of the liquid management system 1A having the above configuration will be described. First, the control unit 7 opens the valves 15a and 15b shown in FIG. 1 simultaneously or sequentially and supplies IPA and ultrapure water from the IPA supply source 2 and the ultrapure water supply source 3 to the mixing tank 4. . Here, IPA and ultrapure water are supplied at a predetermined rate. In other words, a predetermined amount of IPA and ultrapure water are respectively supplied so as to obtain a cleaning liquid having an ideal component concentration (hereinafter referred to as “ideal concentration”). Thereby, IPA and ultrapure water are mixed in the mixing tank 4 to produce a cleaning liquid. However, at this time, the component concentration of the cleaning liquid in the mixing tank 4 does not always completely match the ideal concentration. This is because IPA and ultrapure water are supplied to the mixing tank 4 at a constant rate, but this rate is a calculated rate.

混合槽4にIPAおよび超純水が供給され、所定量の洗浄液が作られると、弁15a、15bが閉じられる。次いで、濃度調整処理が開始される。具体的には、制御部7による制御の下、配管12を介して混合槽4内の洗浄液の一部が抜き取られ、その成分濃度が濃度測定装置5によって測定される。その後、濃度測定装置5による測定結果に応じて弁15aと弁15bの双方または一方が再度開かれるとともに、IPA供給源2と超純水供給源3の双方または一方によって、IPAと超純水の双方または一方が混合槽4へ補充される。より具体的には、混合槽4内の洗浄液の成分濃度を理想濃度に一致させるべく、濃度測定装置5による濃度測定と、IPAおよび/または超純水の補充とが何度か繰り返される。また、所定量の洗浄液を作るためのIPAおよび超純水の混合槽4への供給と、濃度調整処理とを同時に実行することもできる。具体的には、IPAおよび超純水を混合槽4に供給しつつ、混合槽4内の洗浄液の一部を抜き取って成分濃度を測定し、その測定結果に応じて弁15aと弁15bの双方または一方を開閉したり、開度を調整したりしてもよい。いずれにしても、本実施形態における制御部7は、第二の制御手段として機能する。   When IPA and ultrapure water are supplied to the mixing tank 4 to produce a predetermined amount of cleaning liquid, the valves 15a and 15b are closed. Next, the density adjustment process is started. Specifically, a part of the cleaning liquid in the mixing tank 4 is extracted via the pipe 12 under the control of the control unit 7, and the concentration of the component is measured by the concentration measuring device 5. Thereafter, both or one of the valve 15a and the valve 15b are opened again according to the measurement result by the concentration measuring device 5, and both the IPA supply source 2 and the ultrapure water supply source 3 are used. Both or one is replenished to the mixing tank 4. More specifically, the concentration measurement by the concentration measuring device 5 and the replenishment of IPA and / or ultrapure water are repeated several times so that the component concentration of the cleaning liquid in the mixing tank 4 matches the ideal concentration. Further, the supply of IPA and ultrapure water to the mixing tank 4 for producing a predetermined amount of cleaning liquid and the concentration adjustment process can be performed simultaneously. Specifically, while supplying IPA and ultrapure water to the mixing tank 4, a part of the cleaning liquid in the mixing tank 4 is extracted to measure the component concentration, and both the valve 15a and the valve 15b are measured according to the measurement result. Or one side may be opened and closed, and an opening degree may be adjusted. Anyway, the control part 7 in this embodiment functions as a 2nd control means.

濃度測定のために抜き取られた洗浄液は、汚染の度合いに応じて混合槽4に戻されるか、廃棄(廃液タンク6に送ってもよく、別のラインで排出してもよい。)される。濃度測定装置5が配管14aから分岐されて接続されている場合は、配管14aに戻すか、洗浄装置100に送ってもよい。もっとも、濃度測定装置5としてカールフィッシャー水分計を用いる場合には、洗浄液に試薬を添加する必要がある。よって、濃度測定後の洗浄液は混合槽4へ戻さない方が好ましい。   The cleaning liquid extracted for the concentration measurement is returned to the mixing tank 4 or discarded (may be sent to the waste liquid tank 6 or discharged through another line) depending on the degree of contamination. When the concentration measuring device 5 is branched from the pipe 14 a and connected, it may be returned to the pipe 14 a or sent to the cleaning device 100. However, when a Karl Fischer moisture meter is used as the concentration measuring device 5, it is necessary to add a reagent to the cleaning liquid. Therefore, it is preferable not to return the cleaning liquid after concentration measurement to the mixing tank 4.

上記のようにして理想濃度またはこれに近似した濃度の洗浄液が作られると、混合槽4から洗浄装置100への洗浄液の供給と回収が開始される。具体的には、循環手段によって混合槽4内の洗浄液が配管14aを介して洗浄装置100の洗浄槽へ供給され、使用済の洗浄液が配管14bを介して混合槽4に回収される。この間、洗浄装置100では、供給された洗浄液を用いて半導体ウエハの洗浄や乾燥が行われる。すなわち、洗浄液は、液体管理システム1A(混合槽4)と洗浄装置100(洗浄槽)との間を循環する。   When a cleaning liquid having an ideal concentration or a concentration close thereto is produced as described above, supply and recovery of the cleaning liquid from the mixing tank 4 to the cleaning device 100 is started. Specifically, the cleaning liquid in the mixing tank 4 is supplied to the cleaning tank of the cleaning apparatus 100 through the pipe 14a by the circulation means, and the used cleaning liquid is collected in the mixing tank 4 through the pipe 14b. Meanwhile, in the cleaning apparatus 100, the semiconductor wafer is cleaned and dried using the supplied cleaning liquid. That is, the cleaning liquid circulates between the liquid management system 1A (mixing tank 4) and the cleaning apparatus 100 (cleaning tank).

ここで、混合槽4内には不図示の液量測定手段(レベルセンサ)が設けられており、混合槽4内の洗浄液の液面(液量)が連続的または断続的に監視されている。制御部7は、レベルセンサの監視結果に基づいて液量調整処理を実行する。具体的には、レベルセンサによる監視によって、混合槽4内の洗浄液の液量が、所定の液量範囲(混合槽4と洗浄装置100との間を循環可能で、洗浄槽における半導体ウエハの洗浄・乾燥に十分な量の範囲)を超えて減少していることが検知されると、弁15a、15bが開かれ、IPA供給源2および超純水供給源3から混合槽4へIPAおよび超純水が一定の割合で供給される。一方、レベルセンサによる監視によって、混合槽4内の洗浄液の液量が、所定の液量範囲を超えて増加していることが検知されると、制御部7は、廃液手段を制御して、混合槽4内の洗浄液の一部を廃棄させる。具体的には、配管13上の不図示の弁を開かせ、混合槽4内の洗浄液の一部を廃液タンク6へ廃棄させる。このようにして、混合槽4内には、理想濃度またはこれに近似した濃度を有する洗浄液が常に一定量だけ保持される。すなわち、本実施形態における制御部7は、第一の制御手段としても機能する。   Here, a liquid level measuring means (level sensor) (not shown) is provided in the mixing tank 4, and the liquid level (liquid level) of the cleaning liquid in the mixing tank 4 is continuously or intermittently monitored. . The control unit 7 executes a liquid amount adjustment process based on the monitoring result of the level sensor. Specifically, the amount of the cleaning liquid in the mixing tank 4 can be circulated between a predetermined liquid amount range (between the mixing tank 4 and the cleaning device 100 by monitoring with a level sensor, and the semiconductor wafer is cleaned in the cleaning tank. When a decrease in excess of the range sufficient for drying) is detected, the valves 15a, 15b are opened, and the IPA and ultrapure water source 3 and the ultrapure water source 3 are transferred to the mixing tank 4. Pure water is supplied at a constant rate. On the other hand, when it is detected by monitoring by the level sensor that the amount of the cleaning liquid in the mixing tank 4 has increased beyond a predetermined liquid amount range, the control unit 7 controls the waste liquid means, A part of the cleaning liquid in the mixing tank 4 is discarded. Specifically, a valve (not shown) on the pipe 13 is opened, and a part of the cleaning liquid in the mixing tank 4 is discarded to the waste liquid tank 6. In this way, a constant amount of cleaning liquid having an ideal concentration or a concentration close thereto is always held in the mixing tank 4. That is, the control unit 7 in this embodiment also functions as a first control unit.

しかし、上記のように洗浄液が循環する間にも、様々な要因によって洗浄液の成分濃度が変化する。最も一般的な濃度変化は、IPA濃度の低下であるが、それ以外の濃度変化もあり得る。そこで、洗浄液の循環中においても、上記濃度調整処理が連続的または断続的に実行される。具体的には、制御部7の制御の下、洗浄液の成分濃度が濃度測定装置5によって連続的または断続的に測定され、洗浄液の成分濃度が所定の濃度範囲を超えて変化している場合には、IPAと超純水の双方または一方が混合槽4へ補充される。具体的には、濃度測定装置5の測定結果に応じて、弁15aと弁15bの双方または一方が開かれるとともに、IPA供給源2と超純水供給源3の双方または一方が作動されて、IPAと超純水の双方または一方が混合槽4へ補充される。   However, while the cleaning liquid circulates as described above, the component concentration of the cleaning liquid changes due to various factors. The most common concentration change is a decrease in IPA concentration, but other concentration changes are possible. Therefore, the concentration adjustment process is performed continuously or intermittently even during the circulation of the cleaning liquid. Specifically, the component concentration of the cleaning liquid is continuously or intermittently measured by the concentration measuring device 5 under the control of the control unit 7 and the component concentration of the cleaning liquid changes beyond a predetermined concentration range. , Both or one of IPA and ultrapure water is replenished to the mixing tank 4. Specifically, according to the measurement result of the concentration measuring device 5, both or one of the valve 15a and the valve 15b is opened, and both or one of the IPA supply source 2 and the ultrapure water supply source 3 are operated. Both or one of IPA and ultrapure water is replenished to the mixing tank 4.

ここで、濃度調整に必要なIPAの量をなるべく少なくする観点からは、濃度調整処理の実行に先立って液量調整処理を実行することが好ましい。さらに、液量調整処理では、混合槽4内の洗浄液の量が所定の液量範囲内であって、かつ、該液量範囲の上限に達しない量に調整し、濃度調整処理では、混合槽4内の洗浄液の量が液量範囲の上限を超えないように、IPAと純水の双方または一方を供給する。   Here, from the viewpoint of reducing the amount of IPA required for concentration adjustment as much as possible, it is preferable to execute the liquid amount adjustment processing prior to the execution of the concentration adjustment processing. Further, in the liquid amount adjustment process, the amount of the cleaning liquid in the mixing tank 4 is adjusted to an amount that is within a predetermined liquid amount range and does not reach the upper limit of the liquid amount range. IPA and / or pure water are supplied so that the amount of the cleaning liquid in 4 does not exceed the upper limit of the liquid amount range.

濃度測定装置5としては、超音波濃度計、比抵抗計、赤外分光計、ブリックス計、比重計などを用いることもできる。また、液量測定手段としては、ロードセルを用いて混合槽4の荷重から混合槽4内の液量を求めるものでもよい。   As the concentration measuring device 5, an ultrasonic densitometer, a specific resistance meter, an infrared spectrometer, a Brix meter, a specific gravity meter, or the like can be used. Moreover, as a liquid quantity measurement means, the liquid quantity in the mixing tank 4 may be calculated | required from the load of the mixing tank 4 using a load cell.

なお、上述の配管上には必要に応じてポンプや弁が設置される。また、必要に応じてフィルタを設置することもできる。さらに、配管上に熱交換器を設置して洗浄液の温度管理を行ってもよい。   In addition, a pump and a valve are installed on the above-described piping as necessary. Moreover, a filter can also be installed as needed. Furthermore, the temperature of the cleaning liquid may be controlled by installing a heat exchanger on the pipe.

さらに、半導体ウエハの洗浄・乾燥により洗浄液が不純物で汚染された場合などには、洗浄液を入れ替えてもよいが、本発明の実施形態であれば、汚染された洗浄液の一部を配管13を介して廃液タンク6に抜き出し、IPAおよび超純水を混合槽4に供給することによって、不純物を希釈して理想濃度の洗浄液を作ることができる。これにより、汚染された洗浄液の全てを入れ替えなくても、洗浄工程を停止させることなく、理想濃度の洗浄液を洗浄装置に供給できる。該洗浄液の抜き出しと不純物の希釈は、別々に行ってもよいし、同時に行ってもよい。不純物を希釈するためのIPAと超純水の使用量を少なくするには、洗浄液の一部を抜き出して容量を少なくしてからIPAおよび超純水を混合槽4に供給して、不純物の希釈を行うことが好ましい。洗浄液が不純物で汚染された場合であって、混合槽4の液量が低下している場合には、汚染された洗浄液を廃液タンク6に抜き出さずにIPAおよび超純水を混合槽4に供給することによって、不純物を希釈して理想濃度の洗浄液を作ることができる。洗浄液の不純物濃度を監視するには、例えば、配管14a、14bまたは12上またはこれらの分岐ラインや、混合槽4に直接接続されたサンプリングラインを介して、微粒子検出器(微粒子計)を設け、洗浄液中の微粒子(不純物)の量を監視すればよい。また、不純物が光を吸収する性質を持つ場合には、吸光光度計によって不純物の量を監視することもできる。   Further, when the cleaning liquid is contaminated with impurities by cleaning and drying of the semiconductor wafer, the cleaning liquid may be replaced. However, in the embodiment of the present invention, a part of the contaminated cleaning liquid is passed through the pipe 13. Then, by extracting the waste liquid tank 6 and supplying IPA and ultrapure water to the mixing tank 4, the impurities can be diluted to produce a cleaning liquid having an ideal concentration. Thereby, the cleaning liquid with the ideal concentration can be supplied to the cleaning apparatus without stopping the cleaning process without replacing all of the contaminated cleaning liquid. The extraction of the cleaning liquid and the dilution of impurities may be performed separately or simultaneously. In order to reduce the amount of IPA and ultrapure water used for diluting the impurities, a part of the cleaning solution is extracted to reduce the volume, and then IPA and ultrapure water are supplied to the mixing tank 4 to dilute the impurities. It is preferable to carry out. When the cleaning liquid is contaminated with impurities and the amount of liquid in the mixing tank 4 is reduced, the IPA and ultrapure water are added to the mixing tank 4 without extracting the contaminated cleaning liquid into the waste liquid tank 6. By supplying, it is possible to dilute impurities and make an ideal concentration cleaning solution. In order to monitor the impurity concentration of the cleaning liquid, for example, a particulate detector (particulate meter) is provided on the pipe 14a, 14b or 12 or a branch line thereof, or a sampling line directly connected to the mixing tank 4. The amount of fine particles (impurities) in the cleaning liquid may be monitored. In addition, when the impurity has a property of absorbing light, the amount of the impurity can be monitored by an absorptiometer.

(実施形態2)
次に、本発明の第2の実施形態について詳細に説明する。図2は、本実施形態に係る液体管理システム1Bの基本構成を示すブロック図である。
(Embodiment 2)
Next, a second embodiment of the present invention will be described in detail. FIG. 2 is a block diagram showing a basic configuration of the liquid management system 1B according to the present embodiment.

本実施形態に係る液体管理システム1Bは、調製槽20を有する点以外は、実施形態1に係る液体管理システム1Aと本質的に同一の構成を有する。よって、液体管理システム1Aと共通する構成については図2中に同一の符号を付して説明を省略する。   The liquid management system 1B according to the present embodiment has essentially the same configuration as the liquid management system 1A according to the first embodiment, except that the preparation tank 20 is provided. Therefore, about the structure which is common with 1 A of liquid management systems, the same code | symbol is attached | subjected in FIG. 2, and description is abbreviate | omitted.

本実施形態におけるアルコール供給手段は、IPA供給源2、配管10、弁15a、配管21および配管21上に設けられた弁(不図示)を少なくとも有する。配管21は、IPA供給源2と調製槽20とを接続しており、IPA供給源2から調製槽20へIPAを供給するための流路を形成している。配管21上に設けられている不図示の弁は、制御部7によって制御されており、IPAの導入開始又は導入停止やIPAの導入量などを調節する。   The alcohol supply means in this embodiment has at least the IPA supply source 2, the pipe 10, the valve 15 a, the pipe 21, and a valve (not shown) provided on the pipe 21. The pipe 21 connects the IPA supply source 2 and the preparation tank 20, and forms a flow path for supplying IPA from the IPA supply source 2 to the preparation tank 20. A valve (not shown) provided on the pipe 21 is controlled by the control unit 7 and adjusts the introduction start or introduction stop of IPA, the introduction amount of IPA, and the like.

また、純水供給手段は、超純水供給源3、配管11、弁15b、配管22および配管22上に設けられた弁(不図示)を少なくとも有する。配管22は、超純水供給源3と調製槽20とを接続しており、超純水供給源3から調製槽20へ超純水を供給するための流路を形成している。配管21上に設けられている不図示の弁は、制御部7によって制御されており、超純水の導入開始又は導入停止や超純水の導入量などを調節する。   The pure water supply means has at least the ultrapure water supply source 3, the pipe 11, the valve 15 b, the pipe 22, and a valve (not shown) provided on the pipe 22. The pipe 22 connects the ultrapure water supply source 3 and the preparation tank 20, and forms a flow path for supplying ultrapure water from the ultrapure water supply source 3 to the preparation tank 20. A valve (not shown) provided on the pipe 21 is controlled by the control unit 7 to adjust the start or stop of introduction of ultrapure water, the introduction amount of ultrapure water, and the like.

調製槽20内には、撹拌手段が設けられており、調製槽20に供給されたIPAと超純水とが短時間のうちに均一に混合される。   A stirring means is provided in the preparation tank 20, and the IPA supplied to the preparation tank 20 and ultrapure water are uniformly mixed in a short time.

次に、上記構成を有する液体管理システム1Bの動作について説明する。まず、制御部7の制御の下、配管21、22にそれぞれ設けられている不図示の弁が開かれ、IPA供給源2および超純水供給源3からIPAおよび超純水が調製槽20へ供給される。ここでは、予め定められている一定の割合でIPAと超純水とが供給される。これにより、調製槽20内でIPAと超純水とが混合され、洗浄液が作られる。   Next, the operation of the liquid management system 1B having the above configuration will be described. First, under the control of the control unit 7, valves (not shown) provided in the pipes 21 and 22 are opened, and IPA and ultrapure water are supplied from the IPA supply source 2 and the ultrapure water supply source 3 to the preparation tank 20. Supplied. Here, IPA and ultrapure water are supplied at a predetermined rate. Thereby, IPA and ultrapure water are mixed in the preparation tank 20, and a washing | cleaning liquid is made.

上記のようにして、調製槽20内で洗浄液が作られた後、必要に応じて、洗浄液が混合槽4へ供給される(移される)。調製槽20内の洗浄液の量が少なくなると、配管21、22上の弁が再度開かれ、IPA供給源2および超純水供給源3からIPAおよび超純水が調製槽20へ再度供給され、調製槽20内で洗浄液が作られ、貯えられる。混合槽4と洗浄装置100(洗浄槽)との間では、循環手段によって洗浄液の循環が開始され、半導体ウエハの洗浄、乾燥処理が行われる。一方、調製槽20内で作られ、貯えられていた洗浄液は、制御部7による制御の下、必要に応じて混合槽4へ供給される。例えば、制御部7は、混合槽4内における洗浄液の液量が所定の液量範囲を超えて減少した場合に、調製槽20内の洗浄液を混合槽4へ供給して混合槽4内の液量を補う補充処理を実行する。かかる補充処理には、洗浄液が不純物で汚染された場合に、混合槽4内の洗浄液の一部を廃液タンク6に抜き出した後に、調製槽20内の洗浄液を混合槽4へ供給し、不純物を希釈して不純物濃度を低下させる工程が含まれる場合もある。さらに、洗浄液が不純物で汚染された場合であって、混合槽4の液量が低下している場合には、汚染された洗浄液を廃液タンク6に抜き出すことなく、調製槽20内の洗浄液を混合槽4に供給することによって、不純物を希釈して理想濃度の洗浄液を作る工程が含まれる場合もある。いずれにしても、本実施形態における制御部7は、調製槽20内の洗浄液を混合槽4へ供給する補充処理を実行する第三の制御手段として機能する。   After the cleaning liquid is made in the preparation tank 20 as described above, the cleaning liquid is supplied (transferred) to the mixing tank 4 as necessary. When the amount of the cleaning liquid in the preparation tank 20 decreases, the valves on the pipes 21 and 22 are opened again, and IPA and ultrapure water are supplied again from the IPA supply source 2 and the ultrapure water supply source 3 to the preparation tank 20, A cleaning liquid is made and stored in the preparation tank 20. Between the mixing tank 4 and the cleaning apparatus 100 (cleaning tank), the circulation of the cleaning liquid is started by the circulation means, and the semiconductor wafer is cleaned and dried. On the other hand, the cleaning liquid made and stored in the preparation tank 20 is supplied to the mixing tank 4 as needed under the control of the control unit 7. For example, the control unit 7 supplies the cleaning liquid in the preparation tank 20 to the mixing tank 4 and supplies the liquid in the mixing tank 4 when the amount of the cleaning liquid in the mixing tank 4 decreases beyond a predetermined liquid amount range. The replenishment process which supplements quantity is performed. In such replenishment processing, when the cleaning liquid is contaminated with impurities, a part of the cleaning liquid in the mixing tank 4 is extracted into the waste liquid tank 6 and then the cleaning liquid in the preparation tank 20 is supplied to the mixing tank 4 to remove impurities. In some cases, a step of diluting to lower the impurity concentration is included. Furthermore, when the cleaning liquid is contaminated with impurities and the amount of liquid in the mixing tank 4 is reduced, the cleaning liquid in the preparation tank 20 is mixed without extracting the contaminated cleaning liquid into the waste liquid tank 6. By supplying to the tank 4, the process of diluting impurities to produce an ideal concentration cleaning liquid may be included. Anyway, the control part 7 in this embodiment functions as a 3rd control means which performs the replenishment process which supplies the cleaning liquid in the preparation tank 20 to the mixing tank 4. FIG.

なお、液体管理システム1Bにおいても、制御部7による制御の下、液量調整処理と濃度調整処理とが随時行われる。例えば、混合槽4と洗浄装置100との間の洗浄液の循環過程において、調製槽20で作られた洗浄液を必要に応じて混合槽4に供給するとともに(上記補充処理を実行するとともに)、濃度測定装置5による測定結果に応じて、混合槽4内の洗浄液の成分濃度を理想濃度に一致させるべく、IPAと超純水の双方または一方が混合槽4へ補充される。すなわち、本実施形態における制御部7は、第1の制御手段および第二の制御手段としても機能する。   In the liquid management system 1B, the liquid amount adjustment process and the concentration adjustment process are performed as needed under the control of the control unit 7. For example, in the circulation process of the cleaning liquid between the mixing tank 4 and the cleaning apparatus 100, the cleaning liquid made in the preparation tank 20 is supplied to the mixing tank 4 as necessary (with the above replenishment process) and the concentration Depending on the measurement result by the measuring device 5, both or one of IPA and ultrapure water is replenished to the mixing tank 4 so that the component concentration of the cleaning liquid in the mixing tank 4 matches the ideal concentration. That is, the control unit 7 in the present embodiment also functions as a first control unit and a second control unit.

ここでは、調製槽20内で作られた洗浄液を混合槽4へ移動させる場合について説明した。しかし、混合槽4および調製槽20のそれぞれにおいて洗浄液を同時に作ってもよい。この場合、液体管理システム1Aと同様に、混合槽4へのIPAおよび超純水の供給および濃度調整が行われ、混合槽4内で洗浄液が作られる。これと同時に、配管21、22にそれぞれ設けられている不図示の弁が開かれ、IPA供給源2および超純水供給源3からIPAおよび超純水が調製槽20へ一定の割合で供給される。これにより、混合槽4および調製槽20のそれぞれにおいて、IPAと超純水が所定割合で混合された洗浄液が同時に作られる。この場合も、調製槽20内の洗浄液は、必要に応じて混合槽4へ供給される。   Here, the case where the cleaning liquid made in the preparation tank 20 is moved to the mixing tank 4 has been described. However, the cleaning liquid may be simultaneously prepared in each of the mixing tank 4 and the preparation tank 20. In this case, similarly to the liquid management system 1A, supply of IPA and ultrapure water to the mixing tank 4 and concentration adjustment are performed, and a cleaning liquid is produced in the mixing tank 4. At the same time, valves (not shown) provided in the pipes 21 and 22 are opened, and IPA and ultrapure water are supplied from the IPA supply source 2 and the ultrapure water supply source 3 to the preparation tank 20 at a constant rate. The Thereby, in each of the mixing tank 4 and the preparation tank 20, a cleaning liquid in which IPA and ultrapure water are mixed at a predetermined ratio is simultaneously formed. Also in this case, the cleaning liquid in the preparation tank 20 is supplied to the mixing tank 4 as necessary.

いずれにしても、本実施形態に係る液体管理システム1Bでは、IPAと超純水とが一定の割合で混合された洗浄液が調製槽20内に常に準備されている。よって、洗浄液の補充や濃度調整、不純物の希釈・低減をより迅速に行うことができる。さらに、混合槽4に直接IPAおよび超純水を供給して洗浄液の濃度を調節する場合以上に、洗浄液の成分濃度の変動を小さくすることができる。   In any case, in the liquid management system 1B according to the present embodiment, a cleaning liquid in which IPA and ultrapure water are mixed at a constant ratio is always prepared in the preparation tank 20. Therefore, replenishment of the cleaning liquid, concentration adjustment, and dilution / reduction of impurities can be performed more quickly. Furthermore, the fluctuations in the component concentration of the cleaning liquid can be reduced more than when the concentration of the cleaning liquid is adjusted by supplying IPA and ultrapure water directly to the mixing tank 4.

なお、図2に示されている配管レイアウトは一例であり、適宜変更することが可能である。例えば、図2に示されている配管21は、配管10を介してIPA供給源2に接続してもよい。換言すれば、配管21を配管10から分岐させてもよい。また、図2に示されている配管22は、配管11を介して超純水供給源3に接続してもよい。換言すれば、配管22を配管11から分岐させてもよい。   In addition, the piping layout shown by FIG. 2 is an example, and can be changed suitably. For example, the pipe 21 shown in FIG. 2 may be connected to the IPA supply source 2 via the pipe 10. In other words, the pipe 21 may be branched from the pipe 10. Further, the pipe 22 shown in FIG. 2 may be connected to the ultrapure water supply source 3 through the pipe 11. In other words, the pipe 22 may be branched from the pipe 11.

また、調製槽20内にレベルセンサを設けて、洗浄液の液面管理を行ってもよい。この場合、レベルセンサによる監視によって、調製槽20内の洗浄液の液面低下が検知されたときには、IPAおよび超純水が調製槽20へ供給される。   Further, a level sensor may be provided in the preparation tank 20 to perform the liquid level management of the cleaning liquid. In this case, when the level of the cleaning liquid in the preparation tank 20 is detected by monitoring with the level sensor, IPA and ultrapure water are supplied to the preparation tank 20.

(実施形態3)
次に、本発明の第3の実施形態について詳細に説明する。図3は、本実施形態に係る液体管理システム1Cの基本構成を示すブロック図である。
(Embodiment 3)
Next, a third embodiment of the present invention will be described in detail. FIG. 3 is a block diagram showing a basic configuration of the liquid management system 1C according to the present embodiment.

本実施形態に係る液体管理システム1Cは、平準化槽30を有する点以外は、実施形態2に係る液体管理システム1Bと本質的に同一の構成を有する。よって、液体管理システム1Bと共通する構成については図3中に同一の符号を付して説明を省略する。   The liquid management system 1C according to the present embodiment has essentially the same configuration as the liquid management system 1B according to the second embodiment, except that the leveling tank 30 is provided. Therefore, about the structure which is common in the liquid management system 1B, the same code | symbol is attached | subjected in FIG. 3, and description is abbreviate | omitted.

本実施形態におけるアルコール供給手段は、IPA供給源2、配管10、弁15a、配管21、配管21上の弁(不図示)、配管34および配管34上の弁36aを少なくとも有する。配管34は、配管21から分岐しており、IPA供給源2から平準化槽30へIPAを供給するための流路を形成している。配管34上に設けられている弁36aは、制御部7によって制御されており、IPAの導入開始又は導入停止やIPAの導入量などを調節する。   The alcohol supply means in this embodiment has at least the IPA supply source 2, the pipe 10, the valve 15 a, the pipe 21, the valve (not shown) on the pipe 21, the pipe 34, and the valve 36 a on the pipe 34. The pipe 34 is branched from the pipe 21 and forms a flow path for supplying IPA from the IPA supply source 2 to the leveling tank 30. The valve 36a provided on the pipe 34 is controlled by the control unit 7 and adjusts the start or stop of introduction of IPA, the introduction amount of IPA, and the like.

また、純水供給手段は、超純水供給源3、配管11、弁15b、配管22、配管22上の弁(不図示)、配管35および配管35上の弁36bを少なくとも有する。配管35は、配管22から分岐しており、超純水供給源3から平準化槽30へ超純水を供給するための流路を形成している。配管35上に設けられている弁36bは、制御部7によって制御されており、超純水の導入開始又は導入停止や超純水の導入量などを調節する。   The pure water supply means has at least the ultrapure water supply source 3, the pipe 11, the valve 15 b, the pipe 22, a valve (not shown) on the pipe 22, a pipe 35, and a valve 36 b on the pipe 35. The pipe 35 is branched from the pipe 22 and forms a flow path for supplying ultrapure water from the ultrapure water supply source 3 to the leveling tank 30. The valve 36b provided on the pipe 35 is controlled by the control unit 7, and adjusts the start or stop of introduction of ultrapure water, the introduction amount of ultrapure water, and the like.

平準化槽30は、調製槽20と混合槽4との間に位置し、配管31を介して調製槽20に接続され、配管32を介して混合槽4に接続されている。また、平準化槽30は、配管33を介して濃度測定装置5に接続されている。図3では、濃度測定装置5は混合槽4および平準化槽30の双方に接続されている。すなわち、本実施形態における濃度測定装置5は、第一の濃度測定手段および第二の濃度測定手段の双方として機能する。しかし、混合槽4用の濃度測定装置と、平準化槽30用の濃度測定装置を別々に設けてもよい。   The leveling tank 30 is located between the preparation tank 20 and the mixing tank 4, is connected to the preparation tank 20 via a pipe 31, and is connected to the mixing tank 4 via a pipe 32. Further, the leveling tank 30 is connected to the concentration measuring device 5 through a pipe 33. In FIG. 3, the concentration measuring device 5 is connected to both the mixing tank 4 and the leveling tank 30. That is, the concentration measuring device 5 in this embodiment functions as both the first concentration measuring means and the second concentration measuring means. However, a concentration measuring device for the mixing tank 4 and a concentration measuring device for the leveling tank 30 may be provided separately.

次に、上記構成を有する液体管理システム1Cの動作について説明する。まず、制御部7の制御の下、配管21、22上に設けられている不図示の弁が開かれるとともに、IPA供給源2および超純水供給源3からIPAおよび超純水が調製槽20へそれぞれ供給される。ここでは、予め定められている一定の割合でIPAと超純水とが供給される。これにより、調製槽20内でIPAと超純水が混合され、洗浄液が作られる。   Next, the operation of the liquid management system 1C having the above configuration will be described. First, under the control of the control unit 7, valves (not shown) provided on the pipes 21 and 22 are opened, and IPA and ultrapure water are supplied from the IPA supply source 2 and the ultrapure water supply source 3 to the preparation tank 20. Supplied to each. Here, IPA and ultrapure water are supplied at a predetermined rate. Thereby, IPA and ultrapure water are mixed in the preparation tank 20, and a washing | cleaning liquid is made.

上記のようにして、調製槽20内で洗浄液が作られた後、洗浄液が調製槽20から平準化槽30へ供給される(移される)。次いで、濃度調整処理が実行される。具体的には、制御部7による制御の下、配管33を介して平準化槽30内の洗浄液の一部が抜き取られ、その成分濃度が濃度測定装置5によって測定される。その後、濃度測定装置5による測定結果に応じて弁36aと弁36bの双方または一方が開かれるとともに、IPA供給源2および/または超純水供給源3からIPAおよび/または超純水を平準化槽30へ補充される。より具体的には、平準化槽30内の洗浄液の成分濃度を理想濃度に一致させるべく、濃度測定装置5による濃度測定とIPAおよび/または超純水の補充とが何度か繰り返される。   After the cleaning liquid is made in the preparation tank 20 as described above, the cleaning liquid is supplied (transferred) from the preparation tank 20 to the leveling tank 30. Next, density adjustment processing is executed. Specifically, a part of the cleaning liquid in the leveling tank 30 is extracted via the pipe 33 under the control of the control unit 7, and the concentration of the component is measured by the concentration measuring device 5. Thereafter, both or one of the valves 36a and 36b is opened according to the measurement result by the concentration measuring device 5, and the IPA and / or ultrapure water is leveled from the IPA supply source 2 and / or the ultrapure water supply source 3. The tank 30 is replenished. More specifically, the concentration measurement by the concentration measuring device 5 and the replenishment of IPA and / or ultrapure water are repeated several times so that the component concentration of the cleaning liquid in the leveling tank 30 matches the ideal concentration.

上記のようにして作られた平準化槽30内の洗浄液は、制御部7の制御の下、必要に応じて混合槽4へ供給される。例えば、制御部7は、混合槽4内における洗浄液の液量が所定の液量範囲を超えて減少した場合に、平準化槽30内の洗浄液を混合槽4へ供給して混合槽4内の液量を補う補充処理を実行する。かかる補充処理には、混合槽4内における洗浄液が不純物で汚染された場合に、混合槽4内の洗浄液の一部を廃液タンク6に抜き出した後に、平準化槽30内の洗浄液を混合槽4へ供給し、不純物を希釈して不純物濃度を低下させる工程が含まれる場合もある。さらに、洗浄液が不純物で汚染された場合であって、混合槽4の液量が低下している場合には、汚染された洗浄液を廃液タンク6に抜き出すことなく、平準化槽30内の洗浄液を混合槽4に供給することによって、不純物を希釈して理想濃度の洗浄液を作る工程が含まれる場合もある。いずれにしても、本実施形態における制御部7は、第三の制御手段として機能する。   The cleaning liquid in the leveling tank 30 produced as described above is supplied to the mixing tank 4 as needed under the control of the control unit 7. For example, the controller 7 supplies the cleaning liquid in the leveling tank 30 to the mixing tank 4 and supplies the cleaning liquid in the mixing tank 4 when the amount of the cleaning liquid in the mixing tank 4 decreases beyond a predetermined liquid amount range. A replenishment process for supplementing the liquid volume is executed. In the replenishment process, when the cleaning liquid in the mixing tank 4 is contaminated with impurities, a part of the cleaning liquid in the mixing tank 4 is extracted into the waste liquid tank 6 and then the cleaning liquid in the leveling tank 30 is mixed with the mixing tank 4. In some cases, there is a step of reducing the impurity concentration by diluting impurities. Further, when the cleaning liquid is contaminated with impurities and the amount of liquid in the mixing tank 4 is reduced, the cleaning liquid in the leveling tank 30 is removed without extracting the contaminated cleaning liquid into the waste liquid tank 6. By supplying to the mixing tank 4, the process of diluting impurities to produce a cleaning solution with an ideal concentration may be included. Anyway, the control part 7 in this embodiment functions as a 3rd control means.

なお、本実施形態に係る液体管理システム1Cにおいても、洗浄液が調製槽20から平準化槽30へ移動した後に、調製槽20内の洗浄液量が少なくなると、制御部7よって配管21、22上の弁が再度開かれる。さらに、洗浄液が平準化槽30から混合槽4へ移動した後に、平準化槽30の洗浄液量が少なくなると、調製槽20に準備されている洗浄液が平準化槽30に供給される(移される)。すなわち、本実施形態に係る液体管理システム1Cでは、IPAと超純水とが一定の割合で混合された洗浄液が調製槽20内に常に準備されている。さらに、理想濃度に調整された洗浄液が平準化槽30内に常に準備されている。調製槽20内に準備されている洗浄液は、必要に応じて平準化槽30へ供給され、平準化槽30内に準備されている洗浄液は、必要に応じて混合槽4へ供給される。よって、洗浄液の補充や濃度調整、不純物の希釈、低減をより迅速かつ高精度で行うことができる。さらに、混合槽4に直接IPAおよび超純水を供給して洗浄液の濃度を調節する場合以上に、洗浄液の成分濃度の変動を小さくすることができる。   Also in the liquid management system 1C according to the present embodiment, when the amount of the cleaning liquid in the preparation tank 20 decreases after the cleaning liquid has moved from the preparation tank 20 to the leveling tank 30, the controller 7 causes the pipes 21 and 22 on The valve is opened again. Further, after the cleaning liquid moves from the leveling tank 30 to the mixing tank 4, when the amount of the cleaning liquid in the leveling tank 30 decreases, the cleaning liquid prepared in the preparation tank 20 is supplied (transferred) to the leveling tank 30. . That is, in the liquid management system 1 </ b> C according to the present embodiment, a cleaning liquid in which IPA and ultrapure water are mixed at a constant ratio is always prepared in the preparation tank 20. Further, a cleaning liquid adjusted to an ideal concentration is always prepared in the leveling tank 30. The cleaning liquid prepared in the preparation tank 20 is supplied to the leveling tank 30 as necessary, and the cleaning liquid prepared in the leveling tank 30 is supplied to the mixing tank 4 as needed. Therefore, replenishment of the cleaning liquid, concentration adjustment, dilution and reduction of impurities can be performed more quickly and with high accuracy. Furthermore, the fluctuations in the component concentration of the cleaning liquid can be reduced more than when the concentration of the cleaning liquid is adjusted by supplying IPA and ultrapure water directly to the mixing tank 4.

本実施形態に係る液体管理システム1Cにおいても、制御部7による制御の下、濃度調整処置と液量調整処理とが随時行われ、洗浄液の成分濃度を理想濃度とするための維持、管理が図られることは勿論である。すなわち、本実施形態における制御部7は、第一の制御手段および第二の制御手段としても機能する。   Also in the liquid management system 1 </ b> C according to the present embodiment, the concentration adjustment treatment and the liquid amount adjustment processing are performed as needed under the control of the control unit 7, and the maintenance and management for setting the component concentration of the cleaning liquid to the ideal concentration are achieved. Of course. That is, the control unit 7 in this embodiment also functions as a first control unit and a second control unit.

なお、本実施形態に係る液体管理システム1Cにおいても、混合槽4、調製槽20、平準化槽30のうちの2以上の槽において同時に洗浄液を作ることができる。   In the liquid management system 1 </ b> C according to this embodiment, the cleaning liquid can be simultaneously produced in two or more of the mixing tank 4, the preparation tank 20, and the leveling tank 30.

なお、図3に示されている配管レイアウトは一例であり、適宜変更することが可能である。例えば、図3では、IPA供給源2と平準化槽30とを接続する配管34が配管21から分岐され、超純水供給源3を平準化槽30とを接続する配管35が配管22から分岐されている。しかし、IPA供給源2と平準化槽30とを独立した配管によって直接接続してもよい。また、超純水供給源3と平準化槽30とを独立した配管によって直接接続してもよい。   In addition, the piping layout shown by FIG. 3 is an example, and can be changed suitably. For example, in FIG. 3, a pipe 34 connecting the IPA supply source 2 and the leveling tank 30 is branched from the pipe 21, and a pipe 35 connecting the ultrapure water supply source 3 to the leveling tank 30 is branched from the pipe 22. Has been. However, the IPA supply source 2 and the leveling tank 30 may be directly connected by an independent pipe. Further, the ultrapure water supply source 3 and the leveling tank 30 may be directly connected by an independent pipe.

また、平準化槽30内にレベルセンサを設けて、洗浄液の液面管理を行ってもよい。この場合、レベルセンサによる監視によって、平準化槽30内の洗浄液の液面低下が検知されたときには、IPA供給源2からIPAが、超純水供給源3から超純水が平準化槽30へ供給され、または調製槽20から洗浄液が供給される。一方、レベルセンサによる監視によって、平準化槽30内の洗浄液の液面上昇が検知されたときには、不図示の配管を介して平準化槽30内の洗浄液の一部が排出される。   Further, a level sensor may be provided in the leveling tank 30 to manage the liquid level of the cleaning liquid. In this case, when a level drop of the cleaning liquid in the leveling tank 30 is detected by monitoring with the level sensor, IPA from the IPA supply source 2 and ultrapure water from the ultrapure water supply source 3 to the leveling tank 30 are detected. The cleaning liquid is supplied from the preparation tank 20. On the other hand, when an increase in the level of the cleaning liquid in the leveling tank 30 is detected by monitoring with the level sensor, a part of the cleaning liquid in the leveling tank 30 is discharged via a pipe (not shown).

1A 液体管理システム
1B 液体管理システム
1C 液体管理システム
2 IPA供給源
3 超純水供給源
4 混合槽
5 濃度測定装置
6 廃液タンク
7 制御部
10、11、21、22、31、32、34、35 配管
15a、15b、36a、36b 弁
20 調製槽
30 平準化槽
DESCRIPTION OF SYMBOLS 1A Liquid management system 1B Liquid management system 1C Liquid management system 2 IPA supply source 3 Ultrapure water supply source 4 Mixing tank 5 Concentration measuring device 6 Waste liquid tank 7 Control part 10, 11, 21, 22, 31, 32, 34, 35 Piping 15a, 15b, 36a, 36b Valve 20 Preparation tank 30 Leveling tank

Claims (4)

アルコールと純水を含む液体を該液体を用いて対象物を洗浄する洗浄装置に供給する液体管理システムであって、
アルコールと純水が供給され、前記液体が調製される混合槽と、
前記混合槽にアルコールを供給するアルコール供給手段と、
前記混合槽に純水を供給する純水供給手段と、
前記混合槽と前記洗浄装置との間で前記液体を循環させる循環手段と、
前記混合槽内の前記液体の量を測定する液量測定手段と、
前記混合槽内の前記液体の成分濃度を測定する濃度測定手段と、
前記液量測定手段の測定結果に基づいて前記アルコール供給手段および前記純水供給手段を制御することにより、前記混合槽内の前記液体の量を所定の液量範囲内に維持する液量調整処理を実行する第一の制御手段と、
前記濃度測定手段の測定結果に基づいて前記アルコール供給手段と前記純水供給手段の双方または一方を制御することにより、前記混合槽内の前記液体の成分濃度を所定の濃度範囲内に維持する濃度調整処理を実行する第二の制御手段と、を有する洗浄液管理システム。
A liquid management system for supplying a liquid containing alcohol and pure water to a cleaning apparatus for cleaning an object using the liquid,
A mixing tank in which alcohol and pure water are supplied to prepare the liquid;
Alcohol supply means for supplying alcohol to the mixing tank;
Pure water supply means for supplying pure water to the mixing tank;
A circulating means for circulating the liquid between the mixing tank and the cleaning device;
A liquid amount measuring means for measuring the amount of the liquid in the mixing tank;
Concentration measuring means for measuring the component concentration of the liquid in the mixing tank;
Liquid amount adjustment processing for maintaining the amount of the liquid in the mixing tank within a predetermined liquid amount range by controlling the alcohol supply unit and the pure water supply unit based on the measurement result of the liquid amount measurement unit. First control means for executing
A concentration that maintains the component concentration of the liquid in the mixing tank within a predetermined concentration range by controlling both or one of the alcohol supply unit and the pure water supply unit based on the measurement result of the concentration measurement unit. And a second control means for executing the adjustment process.
請求項1に記載の洗浄液管理システムであって、
前記液量測定手段が、前記混合槽内の前記液体の液面を監視するレベルセンサである、洗浄液管理システム。
The cleaning liquid management system according to claim 1,
The cleaning liquid management system, wherein the liquid amount measuring means is a level sensor that monitors the liquid level of the liquid in the mixing tank.
請求項1に記載の洗浄液管理システムであって、
前記混合槽内の前記液体を排出する廃液手段を有し、
前記第一の制御手段によって実行される前記液量調整処理には、前記液量測定手段の測定結果に基づいて前記廃液手段を制御して、前記混合槽内の前記液体の量を前記液量範囲内に維持する工程が含まれる、洗浄液管理システム。
The cleaning liquid management system according to claim 1,
Having waste liquid means for discharging the liquid in the mixing tank;
In the liquid amount adjustment process executed by the first control unit, the waste liquid unit is controlled based on the measurement result of the liquid amount measuring unit, and the amount of the liquid in the mixing tank is changed to the liquid amount. A cleaning fluid management system that includes a process of maintaining within range.
請求項1又は請求項2に記載の洗浄液管理システムであって、
前記第二の制御手段による前記濃度調整処理の実行に先立って前記第一の制御手段による前記液量調整処理が実行され、
前記液量調整処理では、前記混合槽内の前記液体の量が前記液量範囲内であって、かつ、該液量範囲の上限に達しない量に調整され、
前記濃度調整処理では、前記混合槽内の前記液体の量が前記液量範囲の上限を超えないように、アルコールと純水の双方または一方が前記混合槽に供給される、洗浄液管理システム。
The cleaning liquid management system according to claim 1 or 2,
Prior to the execution of the concentration adjustment process by the second control means, the liquid amount adjustment process by the first control means is executed,
In the liquid amount adjustment process, the amount of the liquid in the mixing tank is adjusted to an amount that is within the liquid amount range and does not reach the upper limit of the liquid amount range,
In the concentration adjustment process, a cleaning liquid management system in which both or one of alcohol and pure water is supplied to the mixing tank so that the amount of the liquid in the mixing tank does not exceed the upper limit of the liquid amount range.
JP2011084456A 2011-04-06 2011-04-06 Liquid management system Active JP5791939B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011084456A JP5791939B2 (en) 2011-04-06 2011-04-06 Liquid management system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011084456A JP5791939B2 (en) 2011-04-06 2011-04-06 Liquid management system

Publications (2)

Publication Number Publication Date
JP2012222070A true JP2012222070A (en) 2012-11-12
JP5791939B2 JP5791939B2 (en) 2015-10-07

Family

ID=47273282

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011084456A Active JP5791939B2 (en) 2011-04-06 2011-04-06 Liquid management system

Country Status (1)

Country Link
JP (1) JP5791939B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101503172B1 (en) * 2013-11-20 2015-03-16 주식회사 엘지실트론 Apparatus for supplying liquid chemical

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003158111A (en) * 2001-11-19 2003-05-30 Kaijo Corp Chemical concentration controller for semiconductor processor
JP2003297795A (en) * 2002-02-28 2003-10-17 A-Tech Ltd Cleaner and dryer, and cleaning and drying method of semiconductor wafer
JP2003532286A (en) * 2000-04-25 2003-10-28 マットソン、ウェット、プロダクツ、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング Apparatus and method for processing semiconductor wafer
JP2007109738A (en) * 2005-10-11 2007-04-26 Tokyo Electron Ltd Liquid processor, processing liquid supply method and processing liquid supply program
JP2009536783A (en) * 2006-04-04 2009-10-15 エアー・リキッド・エレクトロニクス・ユー.エス.・エルピー Process fluid recovery method and process fluid recovery apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003532286A (en) * 2000-04-25 2003-10-28 マットソン、ウェット、プロダクツ、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング Apparatus and method for processing semiconductor wafer
JP2003158111A (en) * 2001-11-19 2003-05-30 Kaijo Corp Chemical concentration controller for semiconductor processor
JP2003297795A (en) * 2002-02-28 2003-10-17 A-Tech Ltd Cleaner and dryer, and cleaning and drying method of semiconductor wafer
JP2007109738A (en) * 2005-10-11 2007-04-26 Tokyo Electron Ltd Liquid processor, processing liquid supply method and processing liquid supply program
JP2009536783A (en) * 2006-04-04 2009-10-15 エアー・リキッド・エレクトロニクス・ユー.エス.・エルピー Process fluid recovery method and process fluid recovery apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101503172B1 (en) * 2013-11-20 2015-03-16 주식회사 엘지실트론 Apparatus for supplying liquid chemical

Also Published As

Publication number Publication date
JP5791939B2 (en) 2015-10-07

Similar Documents

Publication Publication Date Title
KR102339333B1 (en) Substrate liquid processing apparatus, and substrate liquid processing method
KR101751626B1 (en) Flow adjustment mechanism, diluted drug solution supply mechanism, liquid treatment device, and operation method thereof
KR102378353B1 (en) Substrate liquid processing method and substrate liquid processing apparatus
US20070034231A1 (en) Substrate treating apparatus and method
US20190067048A1 (en) Substrate processing apparatus and substrate processing method
US11185896B2 (en) Substrate liquid processing apparatus, substrate liquid processing method, and computer-readable storage medium having substrate liquid processing program stored thereon
US10067514B2 (en) Substrate processing apparatus and liquid mixing method
JP5819987B2 (en) Liquid management system and liquid management method
JP5780810B2 (en) Liquid management system
US10458010B2 (en) Substrate liquid processing apparatus, substrate liquid processing method, and storage medium
JP5791939B2 (en) Liquid management system
JP6608515B2 (en) Substrate liquid processing method and substrate liquid processing apparatus
KR100938242B1 (en) Chemicals supplying system
TWI777097B (en) Substrate processing apparatus and substrate processing method
KR102103508B1 (en) Apparatus and method for treating substrate
KR100759017B1 (en) Apparatus for supplying chemical
US11229856B2 (en) Etching solution recycling system and method for wafer etching apparatus
JP6545841B2 (en) Flow rate adjustment mechanism, diluted chemical solution supply mechanism, liquid processing apparatus and operation method thereof
JP6022765B2 (en) Liquid management system
JP6095887B2 (en) Liquid management system
KR20220027980A (en) Substrate processing system and processing liquid preparation method

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20131128

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20140418

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20141113

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20141118

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150407

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150605

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20150728

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150805

R150 Certificate of patent or registration of utility model

Ref document number: 5791939

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250