JP2012052951A - Probe device and signal measuring device using the same - Google Patents

Probe device and signal measuring device using the same Download PDF

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JP2012052951A
JP2012052951A JP2010196704A JP2010196704A JP2012052951A JP 2012052951 A JP2012052951 A JP 2012052951A JP 2010196704 A JP2010196704 A JP 2010196704A JP 2010196704 A JP2010196704 A JP 2010196704A JP 2012052951 A JP2012052951 A JP 2012052951A
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signal
light
probe device
modulation
signal processing
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JP2010196704A
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Japanese (ja)
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Kenichiro Haga
憲一朗 はが
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Yokogawa Electric Corp
横河電機株式会社
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Priority to JP2010196704A priority Critical patent/JP2012052951A/en
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Abstract

PROBLEM TO BE SOLVED: To ensure the safety due to high insulation between a probe device and a measurement unit and to limit the continuous operation time while ensuring a low grounding capacity for securing a common-mode signal rejection ratio over a wide frequency band. A probe apparatus that does not have a continuous operation time or a signal measuring apparatus using the probe apparatus is realized.
In a probe apparatus that converts a modulated signal, in which an input signal is modulated, into an optical signal and outputs the optical signal, an optical modulation unit that optically modulates incident light incident from the outside in accordance with the modulated signal and emits the light as outgoing light. Prepare.
[Selection] Figure 1

Description

  The present invention relates to a probe apparatus that converts a modulated signal obtained by modulating an input signal into an optical signal and outputs the optical signal, and a signal measuring apparatus using the same, and more particularly, safety due to high insulation between the probe apparatus and the measuring unit. , A probe device that ensures a low ground-to-ground capacity for ensuring a common-mode signal rejection ratio over a wide frequency band, and that is not restricted by a continuous operation time or has a prolonged continuous operation time, and a signal using the probe device The present invention relates to a measuring device.

FIG. 2 is a configuration diagram showing an example of a conventional signal measuring apparatus.
In FIG. 2, the signal measurement device includes a probe device 30 and a measurement unit 40. The probe device 30 includes an amplifier 1, a signal processing driver circuit 2, and a photocoupler 3, and the measurement unit 40 includes a signal processing output circuit 4 and an insulated power supply unit 5.

  The amplifier 1 receives an input signal via the high side (H) input of the probe device 30 and outputs an output signal converted to an appropriate voltage level. The signal processing driver circuit 2 receives the output signal of the amplifier 1 and outputs a modulation signal in accordance with the output signal of the amplifier 1. As a modulation method performed by the signal processing driver circuit 2, there are a case where the output signal of the amplifier 1 is subjected to analog modulation (analog modulation) and a case where digital modulation is applied (digital modulation).

  For example, when analog modulation is performed by the signal processing driver circuit 2, the signal processing driver circuit 2 changes the current value of the modulation signal to be output according to the output signal of the amplifier 1. On the other hand, when the signal processing driver circuit 2 performs digital modulation, the signal processing driver circuit 2 performs A / D conversion on the input output signal of the amplifier 1 and outputs a voltage or current corresponding to the converted digital data. Output.

  The photocoupler 3 converts the modulation signal from the signal processing driver circuit 2 into an optical signal, converts this optical signal into an electric signal again, and outputs it as an output signal. The signal processing output circuit 4 receives the output signal of the photocoupler 3, demodulates the output signal of the photocoupler 3, and outputs it. As a method of modulation performed by the signal processing output circuit 4, analog demodulation (analog demodulation) is performed when the signal processing driver circuit 2 performs analog modulation, and digital processing is performed when the signal processing driver circuit 2 performs digital modulation. Demodulation (digital demodulation).

  For example, when analog demodulation is performed by the signal processing output circuit 4, the signal processing output circuit 4 amplifies and outputs the output of the photocoupler 3 to an appropriate voltage level. On the other hand, when digital demodulation is performed by the signal processing output circuit 4, the digital data output from the photocoupler 3 is D / A converted, and the converted analog signal is output.

  The insulated power supply unit 5 is, for example, an insulated DC-DC converter or transformer in which the primary side (input side) and the secondary side (output side) are electrically insulated, and the amplifier 1 and the signal processing driver circuit. Supply power to 2.

The operation of such a signal measuring device will be described.
An input signal to be measured is input between a high side (H) input and a low side (L) input of the probe device 30. The input signal is input to the amplifier 1, converted to an appropriate voltage level, and then input to the signal processing driver circuit 2. The signal processing driver circuit 2 performs the above-described analog modulation or digital modulation on the output signal of the amplifier 1 and outputs a modulation signal. The signal processing output circuit 4 demodulates and outputs the modulation signal from the signal processing driver circuit 2 input via the photocoupler 3.

  FIG. 3 is a block diagram showing another example of a conventional signal measuring apparatus. Here, the same components as those shown in FIG. In FIG. 3, the signal measuring device includes a probe device 31 and a measuring unit 41. The probe device 31 includes an amplifier 1, a signal processing driver circuit 2, a light emitting element 6, and a battery 7, and the measuring unit 41 includes a signal processing output circuit 4 and a light receiving element 8. The probe device 31 and the measurement unit 41 are connected by an optical fiber F1.

  The light emitting element 6 is a light emitting diode or the like, and converts an output signal from the signal processing driver circuit 2 into an optical signal. The battery 7 is composed of a battery or the like, and supplies power to the amplifier 1 and the signal processing driver circuit 2. The light receiving element 8 receives the optical signal from the light receiving element 6 through the optical fiber F1 and converts it into an electrical signal.

The operation of such a signal measuring device will be described.
Similar to the conventional example shown in FIG. 2, an input signal to be measured is input between the high side (H) input and the low side (L) input of the probe device 30. The input signal is input to the amplifier 1, converted to an appropriate voltage level, and then input to the signal processing driver circuit 2. The signal processing driver circuit 2 performs the above-described analog modulation or digital modulation on the output signal of the amplifier 1 and outputs a modulation signal. The light emitting element 6 converts the modulation signal from the signal processing driver circuit 2 into an optical signal. The light receiving element 8 converts the optical signal transmitted through the optical fiber F1 into an electrical signal and outputs it as an output signal. The signal processing output circuit 4 demodulates and outputs the output signal of the light receiving element 8.

  Patent Document 1 describes a probe that takes in an electric signal and transmits it to a measuring device, and particularly suitable for high voltage and high frequency floating measurement.

  Patent Document 2 describes a power supply device and a semiconductor test system that can be miniaturized even if the voltage applied to the load is variable.

JP 7-218538 A

  In the conventional example shown in FIG. 2, when the input signal is a direct current, insulation between the probe device 30 and the measurement unit 40 can be ensured. In addition, since power can be stably supplied to the probe device 30, continuous measurement for a long time can be performed. However, when the input signal has a high frequency, the impedance to ground is reduced due to the capacitance (floating capacitance) of the insulated power supply unit 5.

  This increases the load effect on the measurement target at high frequencies, and the common-mode signal component having a high frequency of the input signal that has been input flows to the ground through the aforementioned capacitance, thereby removing the common-mode signal in the measurement. There was a problem that the ratio deteriorated. In addition, the withstand voltage, which is a safety standard, is determined by the primary-secondary separation of the photocoupler 3 and the insulated power supply unit 5 in the signal transmission path.

  Further, in the conventional example shown in FIG. 3, since the battery 7 is used, the problem of the grounding capacity of the power supply path is solved, and a high withstand voltage can be realized. However, the continuous operation time is limited by the capacity of the battery 7. There was a problem that became limited.

  Therefore, an object of the present invention is to provide a continuous operation time while ensuring safety due to high insulation between the probe device and the measurement unit and low grounding capacity for ensuring a common-mode rejection ratio over a wide frequency band. It is an object of the present invention to provide a probe device that is not subject to the above-described restrictions or has a continuous operation time extended, and a signal measurement device using the probe device.

The invention described in claim 1
In a probe device that converts a modulated signal, in which an input signal is modulated, into an optical signal and outputs it,
An optical modulator is provided that modulates incident light incident from the outside in accordance with the modulation signal and emits the light as outgoing light.
The invention according to claim 2 is the invention according to claim 1,
The light modulator is
The filter element is capable of variably controlling transmittance or polarization according to the modulation signal.
The invention according to claim 3 is the invention according to claim 1,
The light modulator is
It is an optical switch capable of variably controlling the transmittance or polarization according to the modulation signal.
The invention according to claim 4
The probe device according to any one of claims 1 to 5,
A light emitting element that emits light to be supplied to the light modulation unit of the probe device;
A light receiving element that converts the output light from the light modulation unit into an electrical signal and outputs the electrical signal;
And a signal processing output circuit that demodulates and outputs an output signal from the light receiving element.

The present invention has the following effects.
In the probe apparatus that converts the modulated signal whose input signal is modulated into an optical signal and outputs the optical signal, the probe apparatus includes an optical modulator that optically modulates incident light incident from the outside according to the modulated signal and emits it as outgoing light Since it is not necessary to provide the probe device with a light emitting element as in the conventional case, the power consumption of the probe device can be reduced, the continuous operation time is not limited, or the continuous operation time can be extended.

  In addition, since the probe device and the measurement unit are connected only by an optical fiber, safety due to high insulation between the probe device and the measurement unit can be secured, and a common-mode signal rejection ratio is ensured over a wide frequency band. Therefore, a low grounding capacity can be ensured.

It is the block diagram which showed one Example of the signal measuring apparatus of this invention. It is the block diagram which showed an example of the conventional signal measuring apparatus. It is the block diagram which showed another example of the conventional signal measuring apparatus.

Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is a block diagram showing an embodiment of a signal measuring apparatus according to the present invention. Here, the same components as those in FIG. 2 or FIG. 1 differs from the configuration shown in FIG. 2 or FIG. 3 in that a light modulator 11, a light emitting element 12, and a light receiving element 13 are provided instead of the photocoupler 3 or the light emitting element 6 and the light receiving element 8. The light source 14, the condensing lens 15, the diffuser lens 16, the solar cell 17, and the power supply part 18 are newly provided instead of the point and the insulated power supply part 5 or the battery 7. FIG.

  In FIG. 1, the probe device 32 includes an amplifier 1, a signal processing driver circuit 2, a light modulation unit 11, a diffuser lens 16, a solar cell 17, and a power supply unit 18. The measurement unit 42 includes the signal processing output circuit 4, the light emitting element 12, the light receiving element 13, the light source 14, and the condenser lens 15. The probe device 32 and the measurement unit 42 are connected by optical fibers F2 to F4.

  In the optical modulator 11, the output terminal of the signal processing driver circuit 2 is connected to the control signal terminal, the optical fiber F2 is connected to the incident end, and the optical fiber F3 is connected to the outgoing end. The optical modulation unit 11 is configured by a filter element, an optical switch, or the like that can variably control the transmittance or polarization according to a control signal input to the control signal terminal, and is incident light (before modulation) that is incident through the optical fiber F2. Signal) is modulated in accordance with the output signal of the signal processing driver circuit 2 and emitted from the emission end to the optical fiber F3.

  The light emitting element 12 is composed of a light emitting diode, a laser diode, or the like, and generates light having a single wavelength and having a uniform phase. The light receiving element 13 converts the emitted light (modulated signal) from the light modulation unit 11 incident through the optical fiber F3 into an electrical signal. The light source 14 is composed of a high-intensity light emitting diode or a halogen lamp. The condensing lens 15 condenses the light generated by the light source 14.

  The diffuser lens 16 diffuses the light from the light source 14 transmitted through the optical fiber F4. The solar cell 17 receives light scattered by the diffuser lens 16 and generates electric power. The power supply unit 18 is configured by a DC-DC converter or the like, converts the output voltage from the solar cell 17 to a desired voltage level, and supplies the voltage to the amplifier 1, the signal processing driver circuit 2, and the light modulation unit 11.

The operation of such a signal measuring device will be described.
Light from the light source 14 is collected by the condensing lens 15, enters the optical fiber F 4, and is transmitted to the probe device 32 through the optical fiber F 4. The light emitted from the optical fiber F4 is scattered by the diffuser lens 16 and applied to the solar cell 17. The solar cell 17 generates power with the irradiated light. The power supply unit 18 converts the output voltage from the solar cell 17 to a desired voltage level and supplies it to the amplifier 1, the signal processing driver circuit 2, and the light modulation unit 11.

  An input signal to be measured is input between a high side (H) input and a low side (L) input of the probe device 32. The input signal is input to the amplifier 1, converted to an appropriate voltage level, and then input to the signal processing driver circuit 2. The signal processing driver circuit 2 performs the above-described analog modulation or digital modulation on the output signal of the amplifier 1 and outputs a modulation signal.

  The optical modulation unit 11 optically modulates incident light (premodulation signal) incident via the optical fiber F2 in accordance with the modulation signal input from the signal processing driver circuit 2, and emits the incident light from the emission end to the optical fiber F3. To do. The light receiving element 13 converts the emitted light (modulated signal) from the light modulation unit 11 incident through the optical fiber F3 into an electrical signal. The signal processing output circuit 4 demodulates and outputs the output signal of the light receiving element 8.

  As described above, the light modulation unit 11 modulates the incident light incident through the optical fiber F2 in accordance with the modulation signal input from the signal processing driver circuit 2, and emits the light from the output end to the optical fiber F3. The solar cell 17 generates electric power by the light transmitted through the optical fiber F4. Then, the power supply unit 18 converts the output voltage from the solar cell 17 into a desired voltage level and supplies it to the amplifier 1, the signal processing driver circuit 2, and the light modulation unit 11, whereby the probe device 32 -the measurement unit 42. Since the gaps are connected only by the optical fibers F2 to F4, safety due to high insulation between the probe device 32 and the measurement unit 42 can be secured, and the common-mode signal rejection ratio can be secured over a wide frequency band. It is possible to operate continuously while ensuring a low grounding capacity.

  In addition, the light source 12 having a large power consumption is not provided on the probe device 32 side, and the light source 14 is provided on the measurement unit 42 side and transmitted to the probe device 32, thereby saving the power consumed by the circuit of the probe device 32. It becomes easy to operate the circuit on the probe device 32 even with the amount of power generated by the solar cell 17 by supplying light energy through the optical fiber F4.

  Further, by using optical transmission between the probe device 32 and the measuring unit 42 using an optical fiber, it is possible to perform measurement without receiving interference due to the surrounding electromagnetic field environment as in transmission using radio modulation.

The present invention is not limited to this, and may be as shown below.
(1) In the embodiment shown in FIG. 1, when the signal processing driver circuit 2 performs analog modulation, the signal processing driver circuit 2 changes the current value of the modulation signal to be output in accordance with the output signal of the amplifier 1. However, when the modulation control of the light modulator 11 is voltage control, the voltage value of the modulation signal to be output may be changed.

(2) In the embodiment shown in FIG. 1, the configuration including the light source 14 for power generation of the solar cell 17 is shown, but the configuration in which the solar cell 17 generates power using the light of the light emitting element 12 instead of the light source 14. It may be. In this case, the light source 14 is deleted.

(3) In the embodiment shown in FIG. 1, the power generated by the solar cell 17 is converted by the power supply unit 18 and supplied to the amplifier 1, the signal processing driver circuit 2, and the light modulation unit 11. Instead of the power source 17 and the power supply unit 18, power may be supplied using a battery as shown in FIG. Even in this case, as described above, the light-emitting element 12 with high power consumption is not provided on the probe device 32 side, and the light source 14 is provided on the measurement unit 42 side and transmitted to the probe device 32. Since the consumed power is saved, the continuous operation time can be extended.

(4) In the embodiment shown in FIG. 1, the configuration in which the light generated from the light source 14 is collected by the condenser lens 15 and incident on the optical fiber F4 is shown. If sufficient light can be incident on the fiber F4, the condensing lens 15 may be omitted and light may be incident directly on the optical fiber F4 from the light source 14. Similarly, the configuration in which the light emitted from the optical fiber F4 is scattered by the diffuser lens 16 and applied to the solar cell 17 is shown. However, even if the diffuser lens 16 is not used, sufficient light is applied to the solar cell 17. If possible, the diffuser lens 16 may be removed and the solar cell 17 may be irradiated directly from the optical fiber F4.

4 Signal Processing Output Circuit 11 Light Modulation Unit 12 Light Emitting Element 13 Light Receiving Element 14 Light Source 17 Solar Cell 18 Power Supply Unit 32 Probe Device 42 Measuring Unit

Claims (4)

  1. In a probe device that converts a modulated signal, in which an input signal is modulated, into an optical signal and outputs it,
    A probe apparatus comprising: a light modulation unit configured to light-modulate incident light incident from the outside according to the modulation signal and emit the light as outgoing light.
  2. The light modulator is
    2. The probe device according to claim 1, wherein the probe device is a filter element capable of variably controlling transmittance or polarization according to the modulation signal.
  3. The light modulator is
    2. The probe device according to claim 1, wherein the probe device is an optical switch capable of variably controlling transmittance or polarization according to the modulation signal.
  4. The probe device according to any one of claims 1 to 5,
    A light emitting element that emits light to be supplied to the light modulation unit of the probe device;
    A light receiving element that converts the output light from the light modulation unit into an electrical signal and outputs the electrical signal;
    And a signal processing output circuit for demodulating and outputting an output signal from the light receiving element.
JP2010196704A 2010-09-02 2010-09-02 Probe device and signal measuring device using the same Pending JP2012052951A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
JP2010196704A JP2012052951A (en) 2010-09-02 2010-09-02 Probe device and signal measuring device using the same

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4727976U (en) * 1971-04-16 1972-11-29
JPS63196862A (en) * 1987-02-10 1988-08-15 Sumitomo Electric Ind Ltd Light probe apparatus
JPH0742943U (en) * 1993-12-28 1995-08-11 東光株式会社 Waveform observation device
JPH07218538A (en) * 1994-01-31 1995-08-18 Sony Tektronix Corp Probe for floating measurement
JPH10115644A (en) * 1996-10-11 1998-05-06 Toyota Central Res & Dev Lab Inc Optical integrated voltage sensor
JP2003207725A (en) * 2002-01-10 2003-07-25 Sun Tec Kk Light intensity modulator and light intensity modulating device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4727976U (en) * 1971-04-16 1972-11-29
JPS63196862A (en) * 1987-02-10 1988-08-15 Sumitomo Electric Ind Ltd Light probe apparatus
JPH0742943U (en) * 1993-12-28 1995-08-11 東光株式会社 Waveform observation device
JPH07218538A (en) * 1994-01-31 1995-08-18 Sony Tektronix Corp Probe for floating measurement
JPH10115644A (en) * 1996-10-11 1998-05-06 Toyota Central Res & Dev Lab Inc Optical integrated voltage sensor
JP2003207725A (en) * 2002-01-10 2003-07-25 Sun Tec Kk Light intensity modulator and light intensity modulating device

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