JP2010026421A - Peripheral exposure apparatus and peripheral exposure method - Google Patents

Peripheral exposure apparatus and peripheral exposure method Download PDF

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JP2010026421A
JP2010026421A JP2008190707A JP2008190707A JP2010026421A JP 2010026421 A JP2010026421 A JP 2010026421A JP 2008190707 A JP2008190707 A JP 2008190707A JP 2008190707 A JP2008190707 A JP 2008190707A JP 2010026421 A JP2010026421 A JP 2010026421A
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substrate
exposure
stage
receiving
transport
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JP5311006B2 (en
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Kentaro Tsutsui
健太郎 筒井
Yasuaki Matsumoto
泰明 松本
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Toppan Inc
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Toppan Printing Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a peripheral exposure apparatus that is applied to a large substrate, has simple and small apparatus constitution, reduces the apparatus cost, and reduces failure loss caused by a particle; and to provide a peripheral exposure method. <P>SOLUTION: In the peripheral exposure apparatus, an exposure apparatus exposes a periphery out of the exposure region of a predetermined mask pattern formed on a rectangular substrate. The peripheral exposure apparatus includes a receiving/delivering mechanism for receiving and delivering a substrate, a substrate direction-changing mechanism for horizontally rotating the substrate by 90° in the longitudinal or lateral direction, a conveying mechanism that is installed between the receiving/delivering mechanism and the substrate direction-changing mechanism and horizontally conveys the substrate by reciprocating action, and an exposure mechanism formed of a pair of exposure heads installed adjustable to the substrate width on both sides of a conveyance passage of the conveying mechanism. The receiving/delivering mechanism, substrate direction changing mechanism, and conveying mechanism can horizontally convey the substrate by reciprocating action. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、液晶表示装置等を製造するための、矩形状の大型基板の表面上に形成された感光層のうち、所定のマスクパターンの露光領域外周辺の不要な領域を露光して、その部分の感光層を事前に感光させる周辺露光装置に関する。   The present invention exposes an unnecessary area outside the exposure area of a predetermined mask pattern in a photosensitive layer formed on the surface of a large rectangular substrate for manufacturing a liquid crystal display device, etc. The present invention relates to a peripheral exposure apparatus that exposes a partial photosensitive layer in advance.

液晶表示装置用のカラーフィルタの製造工程は、一般に、感光性樹脂に顔料や染料などの着色剤を分散混入した着色感光性樹脂や透明な感光性樹脂を、ガラス基板上に、スピンコート法あるいはスピンレスコート法で均一厚さに塗布、乾燥し、フォトリソグラフ法によりこのレジスト膜に対して所望形状のパターン露光を施し、現像してポストベークを施す操作を、必要数だけ繰り返すことにより行われる。ここで、通常、基板周辺部に幅が数mm程度の帯状の余白、あるいはさらに広い余白を作るようにマスクパターンの露光位置が設定されている。   In general, a manufacturing process of a color filter for a liquid crystal display device is performed by applying a colored photosensitive resin or a transparent photosensitive resin obtained by dispersing and mixing a colorant such as a pigment or a dye into a photosensitive resin on a glass substrate. The resist film is coated and dried to a uniform thickness by a spinless coating method, and the resist film is subjected to pattern exposure in a desired shape by a photolithographic method, followed by developing and post-baking by repeating the necessary number of times. . Here, the exposure position of the mask pattern is usually set so as to create a strip-shaped margin having a width of about several millimeters or a wider margin in the periphery of the substrate.

このため、フォトリソグラフ法でポジ型感光性樹脂を使用すると、現像処理後、基板周辺部に未露光の感光性樹脂が帯状に残存することになる。この残存した不要な感光性樹脂は、後の処理プロセス処理中にダストの発生等の悪影響を及ぼすことがある。そこで、前記マスクパターンの露光前または後に、かかる不要な感光性樹脂領域を露光し、現像処理して除去する必要がある。   For this reason, when a positive photosensitive resin is used in the photolithographic method, the unexposed photosensitive resin remains in a strip shape around the substrate after development. The remaining unnecessary photosensitive resin may have adverse effects such as generation of dust during the subsequent processing process. Therefore, before or after the exposure of the mask pattern, it is necessary to expose the unnecessary photosensitive resin region and to remove it by developing.

従来、前記不要な感光性樹脂領域を露光する周辺露光装置としては、矩形のガラス基板の表面全体に光を照射可能な照明光学系を有し、ガラス基板との間にマスクパターンが露光される、または露光された領域を遮蔽するマスクを配置して、一括露光するものが知られていた。しかしながら、ガラス基板は年々大型化し、最近では第6世代(1500mm×1800mm)、あるいは第8世代(2160mm×2400mm)と呼ばれる大型ガラス基板が使われている。そのため、前記した一括露光装置では、照明光学系およびマスクが大きくなりコストが高くなるだけでなく、エネルギー効率が悪く、材料技術的にも対応が困難となっている。   Conventionally, the peripheral exposure apparatus that exposes the unnecessary photosensitive resin region has an illumination optical system that can irradiate light on the entire surface of a rectangular glass substrate, and a mask pattern is exposed to the glass substrate. Alternatively, a mask that shields an exposed area is arranged to perform batch exposure. However, the glass substrate has become larger year by year, and recently, a large glass substrate called the sixth generation (1500 mm × 1800 mm) or the eighth generation (2160 mm × 2400 mm) has been used. For this reason, the above-described collective exposure apparatus not only increases the illumination optical system and the mask and increases the cost, but also has poor energy efficiency and is difficult to cope with in terms of material technology.

そこで、矩形状のガラス基板の周辺部のみを一定の幅で露光する方式が提案されている。特許文献1には、基板保管部から、露光装置の露光ステージに向けて角形基板の搬送を行う搬送手段と、その搬送途中に、任意の形状のパターンを露光できる周辺露光光学系とを設けた周辺露光装置が開示されている。基板の長辺長さをカバーできる棒状ランプと、駆動するブラインドの動作によって所望する形状の周辺露光を行うものである。また、特許文献2には、周辺部の露光に必要な紫外線照射ヘッド走査手段と、直交する方向に移動させる紫外線照射ヘッド移動手段と、基板の基準辺との傾きを検出する手段と、移動の制御手段を備えた周辺露光装置が開示されている。前者に比べて後者は安価な装置構成が可能となっている。さらに、特許文献3にも、基板の一辺側の案内ガイドとこのガイドに沿って移動する移動機構と、この移動機構に沿って移動自在な光源部が、ワーク(基板)周辺を露光しながら周回する周辺露光装置が開示されている。いずれも露光ヘッドの駆動あるいはブラインドの駆動が基板のパターン部の直上を移動する構成であるため、摺動部からのパーティクルの発生に最新の注意を払う必要がある。   Therefore, a method has been proposed in which only the peripheral portion of the rectangular glass substrate is exposed with a certain width. Patent Document 1 includes a transport unit that transports a rectangular substrate from the substrate storage unit toward the exposure stage of the exposure apparatus, and a peripheral exposure optical system that can expose a pattern of an arbitrary shape during the transport. A peripheral exposure apparatus is disclosed. Peripheral exposure of a desired shape is performed by the operation of a rod lamp capable of covering the long side length of the substrate and the driving blind. Further, Patent Document 2 discloses an ultraviolet irradiation head scanning unit necessary for exposure of the peripheral portion, an ultraviolet irradiation head moving unit that moves in an orthogonal direction, a unit that detects the inclination of the reference side of the substrate, A peripheral exposure apparatus having a control means is disclosed. Compared to the former, the latter enables a cheaper device configuration. Further, in Patent Document 3, a guide guide on one side of a substrate, a moving mechanism that moves along the guide, and a light source unit that can move along the moving mechanism circulate while exposing the periphery of the workpiece (substrate). A peripheral exposure apparatus is disclosed. In any case, since the driving of the exposure head or the driving of the blind moves directly above the pattern portion of the substrate, it is necessary to pay close attention to the generation of particles from the sliding portion.

また、発塵源がすくなく、角形基板の露光辺を一辺ずつ一括に露光することが可能として、特許文献4には、水平方向に配置した棒状光源を有する露光ユニットと、角形基板を載置するステージとからなり、前記ステージは、前記棒状光源の軸方向と直交する方向と回転方向の2軸のみ移動し得るように構成した周辺露光装置が開示されている。この場合
、周辺露光装置全体はコンパクトであるが、露光ユニットは基板長辺に合わせた長さが必要であり、しかも回転するステージを跨ぐ形で保持されるため、露光装置の光学系の寸法が非常に大きくなりコストが高くなる。
Further, since there are not many dust generation sources and the exposure sides of the square substrate can be exposed collectively one by one, in Patent Document 4, an exposure unit having a bar-shaped light source arranged in the horizontal direction and a square substrate are placed. There is disclosed a peripheral exposure apparatus that includes a stage, and that the stage can move only in two directions, a direction orthogonal to the axial direction of the rod-shaped light source and a rotational direction. In this case, the entire peripheral exposure apparatus is compact, but the exposure unit needs to have a length that matches the long side of the substrate and is held across the rotating stage. Very large and expensive.

これに対して、基板周辺の残渣を除去する方法として、特許文献5では、カラーフィルタのインライン処理装置として、ガラス基板の2辺の端面を一度に処理する方法が開示されている。ここでは、ガラス基板はスライドテーブル上に載置されて移動して、第一のオゾン・紫外線処理機で2辺の周縁部に残っていたレジスト残渣が分解され、続いてスライドテーブルが移動し、回転装置部でガラス基板は90度回転された後、ガラス基板の未処理の別の2辺の幅に合わせた第二のオゾン・紫外線処理機に移動して、別の2辺の周縁部に残っていたレジスト残渣が分解される方法が開示されている。しかし、上記した方法では、基板の搬送方向が一方向でシンプルな構成が可能であるが、装置が長く大きくなり、特に大型基板では装置コストが高くなる。そこで、図1に示すように、基板10を往復搬送させて、長辺処理と短辺処理とを別々の露光ヘッド50,51で実施している例があるが、片辺用露光ヘッド51が基板直上を移動する構成となるため、先に述べたように、摺動部からのパーティクルの発生に細心の注意を払う必要がある。また長辺露光用、短辺露光用それぞれ個別の露光ヘッドを持ち、さらに片方の露光ヘッドを基板幅一杯に大きく動かす構成となるため、装置コストが高くなる問題があった。   On the other hand, as a method for removing residues around the substrate, Patent Document 5 discloses a method for processing two end faces of a glass substrate at a time as an inline processing apparatus for a color filter. Here, the glass substrate is placed and moved on the slide table, the resist residue remaining on the peripheral edge of the two sides is decomposed by the first ozone / ultraviolet treatment machine, and then the slide table is moved, After the glass substrate is rotated 90 degrees in the rotating device section, the glass substrate is moved to the second ozone / ultraviolet treatment machine in accordance with the width of the other two unprocessed sides of the glass substrate. A method is disclosed in which the remaining resist residue is decomposed. However, in the above-described method, the substrate can be transported in one direction and a simple configuration is possible. However, the apparatus becomes long and large, and the cost of the apparatus is high particularly in a large substrate. Therefore, as shown in FIG. 1, there is an example in which the substrate 10 is reciprocated and the long side processing and the short side processing are performed by separate exposure heads 50 and 51. Since the structure moves directly above the substrate, it is necessary to pay close attention to the generation of particles from the sliding portion as described above. In addition, there is a problem that the apparatus cost is increased because each of the long-side exposure and the short-side exposure has a separate exposure head, and one of the exposure heads is moved to the full width of the substrate.

従来の周辺露光装置においては、装置稼動した場合、露光ヘッドの移動や遮蔽用のブラインドの駆動、あるいは、露光部での基板(ステージ)回転等があるためパーティクルと基板とを完全に隔離することは困難であり、摺動部あるいは回転部から発生するパーティクルや、摺動抵抗を低減するためのグリス飛散などが基板上に付着することで、不良基板製作による不良ロス、必要メンテナンスによる製造機会ロスが発生する。従来の装置内においても、発生したパーティクルを除去する試みとして排気をかけるなどの対策が実施されてきた。しかしながら、発生源について0化する対策を鑑みていないのが実情であった。
特開平05−190448号公報 特開平07−283122号公報 特開平11−154639号公報 特開2001−350271号公報 特開2001−100021号公報
In the conventional peripheral exposure apparatus, when the apparatus is operated, the particles and the substrate are completely separated because of the movement of the exposure head, the driving of the blind for shielding, or the rotation of the substrate (stage) in the exposure unit. This is difficult, because particles generated from sliding parts or rotating parts and grease scattering to reduce sliding resistance adhere to the substrate, resulting in defective loss due to defective substrate manufacturing and manufacturing opportunity loss due to necessary maintenance. Will occur. Even in the conventional apparatus, measures such as exhausting have been implemented as an attempt to remove the generated particles. However, the actual situation is that the generation source is not taken into consideration.
JP 05-190448 A JP 07-283122 A JP-A-11-154039 JP 2001-350271 A Japanese Patent Laid-Open No. 2001-100021

本発明は、上記問題点に鑑みなされたもので、大型基板への適用が可能で、装置構成が簡単で小さく、かつ、装置コストが低減でき、さらに、パーティクル起因の不良ロスを低減できる周辺露光装置および周辺露光方法の提供を課題としている。   The present invention has been made in view of the above problems, and can be applied to a large-sized substrate, the apparatus configuration is simple and small, the apparatus cost can be reduced, and the peripheral exposure that can reduce the defect loss caused by particles. An object is to provide an apparatus and a peripheral exposure method.

本発明の請求項1に係る発明は、露光装置により矩形の基板上に形成される所定のマスクパターンの露光領域外の周辺を露光する周辺露光装置において、
基板の受け入れ・払い出しを行う受け入れ・払い出し機構と、基板を水平にタテ・ヨコ90度回転させる基板方向転換機構と、前記受け入れ・払い出し機構と前記基板方向転換機構との間に設置され基板を往復動作で水平搬送する搬送機構と、前記搬送機構の搬送路の両側で基板幅に調整可能に設置された一対の露光ヘッドからなる露光機構とを具備し、且つ、受け入れ・払い出し機構と基板方向転換機構と搬送機構とはそれぞれ基板を往復水平搬送できることを特徴とする周辺露光装置である。

また、本発明の請求項2に係る発明は、請求項1に記載する周辺露光装置により、少なくとも、(1)〜(9)で構成される処理段階を具備することを特徴とする周辺露光方法である。
(1)基板の載置搬送用ステージへの受け入れ段階、(2)往路での露光処理用に基板を整列する往路基板整列段階、(3)搬送路両側に設置された一対の露光ヘッドの紫外光照射エリアを、往路での基板幅に対応させた位置に移動・固定する往路露光位置設定段階、(4)基板をステージごと搬送し、往路で基板の搬送方向に平行な2辺側を、搬送路両側の前記一対の露光ヘッドで露光処理する往路露光段階、(5)基板を載置したステージを、正転または逆転で90度回転する基板方向転換段階、(6)復路での露光処理用に基板を整列する復路基板整列段階、(7)前記一対の露光ヘッドの紫外光照射エリアを復路での基板幅に対応させた位置に移動・固定する復路露光位置設定段階、(8)基板をステージごと搬送し、復路で基板の搬送方向に平行な2辺側を、前記1対の露光ヘッドで露光処理する復路露光段階、(9)露光済み基板の載置搬送ステージからの払い出し段階。
According to a first aspect of the present invention, there is provided a peripheral exposure apparatus for exposing a periphery outside an exposure area of a predetermined mask pattern formed on a rectangular substrate by an exposure apparatus.
A receiving / dispensing mechanism for receiving / dispensing a substrate, a substrate direction changing mechanism for horizontally rotating the substrate 90 degrees horizontally, and a reciprocating substrate installed between the receiving / dispensing mechanism and the substrate direction changing mechanism. It comprises a transport mechanism that transports horizontally by operation, and an exposure mechanism comprising a pair of exposure heads that can be adjusted to the substrate width on both sides of the transport path of the transport mechanism, and also includes a receiving / dispensing mechanism and a substrate direction change. Each of the mechanism and the transport mechanism is a peripheral exposure apparatus that can reciprocate and horizontally transport a substrate.

According to a second aspect of the present invention, there is provided a peripheral exposure method characterized by comprising at least processing steps (1) to (9) by the peripheral exposure apparatus according to the first aspect. It is.
(1) Stage of receiving substrate on stage for carrying substrate, (2) Outgoing substrate alignment stage for aligning substrates for forward exposure processing, (3) Ultraviolet light of a pair of exposure heads installed on both sides of conveyance path The forward exposure position setting stage for moving / fixing the light irradiation area to a position corresponding to the substrate width in the forward path, (4) transporting the substrate together with the stage, and the two sides parallel to the substrate transport direction in the forward path, Outgoing exposure stage in which exposure processing is performed by the pair of exposure heads on both sides of the conveyance path, (5) Substrate direction changing stage in which the stage on which the substrate is placed is rotated 90 degrees by forward rotation or reverse rotation, and (6) Exposure process in the backward path A return path substrate alignment stage for aligning the substrates for use, (7) a return path exposure position setting stage for moving and fixing the ultraviolet light irradiation area of the pair of exposure heads to a position corresponding to the substrate width in the return path; Is transported along with the stage, and the substrate is The two sides side parallel to the feeding direction, the backward exposure step of the exposure process in the pair of the exposure head, (9) the payout phase from the exposed substrate mounting 置搬 feed stage.

また、本発明の請求項3に係る発明は、前記受け入れ・払い出し機構が、基板の縦横方向を検知して基板を90度回転可能な機構を有することを特徴とする請求項1に記載する周辺露光装置である。   The invention according to claim 3 of the present invention is characterized in that the receiving / dispensing mechanism has a mechanism capable of rotating the substrate 90 degrees by detecting the vertical and horizontal directions of the substrate. It is an exposure apparatus.

また、本発明の請求項4に係る発明は、請求項3に記載する周辺露光装置により、基板の載置搬送用ステージへの受け入れ段階、および前記露光済み基板の載置搬送ステージからの払い出し段階が、基板の縦横方向を検知して基板を90度回転し、基板の受け入れが、基板1枚毎に、基板の載置搬送用ステージの長辺、短辺の方向に対応して行われることを特徴とする請求項2に記載する周辺露光方法である。   According to a fourth aspect of the present invention, there is provided a peripheral exposure apparatus according to the third aspect, wherein the step of receiving the substrate on the mounting / conveying stage and the step of dispensing the exposed substrate from the mounting / conveying stage. However, the vertical and horizontal directions of the substrate are detected, the substrate is rotated 90 degrees, and the substrate is received for each substrate corresponding to the direction of the long side and the short side of the substrate mounting / conveying stage. The peripheral exposure method according to claim 2, wherein:

上記したように、本発明の周辺露光装置では、基板を往復動作させることによって、短辺露光と長辺露光を、一組の基板端部の狭い領域のみを処理することで足りる小型の紫外線を照射可能な露光ヘッドで兼用することが実現できるため、装置をコンパクト化でき、光学系も複雑な構成を必要としないため、装置コストが低減できる。また、両サイドに設置する露光ヘッドは、基板の長辺、短辺の幅に合わせた紫外光照射エリアを調整可能であれば、少ない距離での移動・微動が可能であれば良い。そのため、従来のモーターやガイド等の駆動系や、摺動部から発生したパーティクルを排除するためのカバーや排気配管を取り外す、あるいは、小型化・単純化することができ装置コストを低減できる。さらに、本発明の周辺露光装置では、基板のマスクパターンの露光領域直上を移動あるいは駆動する装置構成が無いため、パーティクル起因の不良ロスを低減することが可能となる。   As described above, in the peripheral exposure apparatus of the present invention, by moving the substrate back and forth, short-side exposure and long-side exposure can be performed with small ultraviolet rays that are sufficient to process only a narrow area at a pair of substrate ends. Since it can be used as an exposure head that can be irradiated, the apparatus can be made compact, and the optical system does not require a complicated configuration, so that the apparatus cost can be reduced. The exposure heads installed on both sides are only required to be movable and finely movable over a short distance as long as the ultraviolet light irradiation area can be adjusted in accordance with the width of the long side and the short side of the substrate. Therefore, it is possible to remove a conventional drive system such as a motor and a guide, a cover for removing particles generated from the sliding portion, and an exhaust pipe, or to reduce the size and simplification, and to reduce the apparatus cost. Furthermore, since the peripheral exposure apparatus of the present invention does not have an apparatus configuration for moving or driving just above the exposure area of the mask pattern of the substrate, it is possible to reduce defect loss due to particles.

また、本発明の周辺露光方法では、基板の受け入れ、払い出しが、基板の縦横方向を検知して基板を90度回転可能な機構により行われ、基板の受け入れが、基板1枚毎に、基板の載置搬送用ステージの長辺、短辺の方向に対応して行なうことが可能なため、受け入れ時には、露光ヘッドの紫外光照射位置を移動させる必要がなく、基板方向転換段階での正転または逆転で90度回転する回転部の動作と基板の往復動作と連携・制御することで、最短のタクトタイムが実現でき、高いスループットが実現できる。   In the peripheral exposure method of the present invention, the substrate is received and dispensed by a mechanism capable of detecting the vertical and horizontal directions of the substrate and rotating the substrate by 90 degrees, and the substrate is received for each substrate. Since it can be performed corresponding to the direction of the long side and the short side of the stage for placing and conveying, there is no need to move the ultraviolet irradiation position of the exposure head at the time of acceptance, By coordinating and controlling the operation of the rotating part that rotates 90 degrees in reverse and the reciprocating operation of the substrate, the shortest tact time can be realized and high throughput can be realized.

以下、本発明に係る周辺露光装置の実施の一形態を、図面に基づいて説明する。   Hereinafter, an embodiment of a peripheral exposure apparatus according to the present invention will be described with reference to the drawings.

図2は、本発明の周辺露光装置の一例を上面から見た概略図である。図3は、本発明の周辺露光方法の一例の処理フローを示す概略図である。   FIG. 2 is a schematic view of an example of the peripheral exposure apparatus of the present invention as viewed from above. FIG. 3 is a schematic diagram showing a processing flow of an example of the peripheral exposure method of the present invention.

本発明の基板露光装置は、図2に示すように、基板の受け入れ・払い出し機構(イ)と、基板を水平にタテ・ヨコ90度回転する基板方向転換機構(ロ)と、この2つの領域の間で基板を往復動作で水平搬送する搬送機構(ハ)と、往復動作で搬送される基板の周囲を各2辺ずつ露光処理する搬送路両側に設置された一対の露光ヘッドからなる露光機構(ニ)とから構成される。なお、本発明の周辺露光機構を構成する各機構を実現するための各装置・部品としては、公知のガラス基板を用いた液晶カラーフィルタ基板のフォトリソ法での作製工程で使用されるものを使うことが可能であり、特定の装置・部品には制限されない。   As shown in FIG. 2, the substrate exposure apparatus according to the present invention includes a substrate receiving / dispensing mechanism (A), a substrate direction changing mechanism (B) for horizontally rotating the substrate 90 degrees horizontally and horizontally, and these two regions. An exposure mechanism consisting of a pair of exposure heads installed on both sides of the transport path for exposing each of the sides of the substrate transported by the reciprocating motion by two sides each. (D). In addition, as each apparatus / part for realizing each mechanism constituting the peripheral exposure mechanism of the present invention, those used in a manufacturing process of a liquid crystal color filter substrate using a known glass substrate by a photolithography method are used. And is not limited to specific devices / parts.

通常ポジ型の感光性樹脂等を塗布された周辺露光対象の基板10は、まず、載置搬送用ステージへ受け入れられ、アライメント機構30により往路での露光処理用に整列される。この時、搬送路両側に設置された一対の露光ヘッド50の紫外光照射エリアは、往路での基板幅に対応させた位置に移動・固定される。なお、同一品種の連続処理において一枚前の基板の幅(すなわち基板の短辺・長辺方向)が同じ場合は露光ヘッド50の紫外光照射エリアの位置は固定されたままでよい。次に、基板10はステージごと搬送され、往路で基板の搬送方向に平行な2辺側を、搬送路両側の一対の露光ヘッド50で露光処理される。ここで、露光ヘッドの光源としては、高圧水銀灯や、通常のランプハウス型の紫外線光源、あるいは棒状光源等を使うことが可能であり、シャッター等の光学制御機構も公知の方法が使用でき、特に制限されない。   The peripheral exposure target substrate 10 coated with a normal positive photosensitive resin or the like is first received by the stage for placement and conveyance, and is aligned by the alignment mechanism 30 for exposure processing in the forward path. At this time, the ultraviolet light irradiation areas of the pair of exposure heads 50 installed on both sides of the transport path are moved and fixed at positions corresponding to the substrate width in the forward path. Note that the position of the ultraviolet light irradiation area of the exposure head 50 may remain fixed if the width of the previous substrate (that is, the short side / long side direction) is the same in continuous processing of the same product type. Next, the substrate 10 is transported together with the stage, and the two sides parallel to the substrate transport direction in the forward path are exposed by a pair of exposure heads 50 on both sides of the transport path. Here, as the light source of the exposure head, a high-pressure mercury lamp, a normal lamp house type ultraviolet light source, or a rod-shaped light source can be used, and a known method can be used for an optical control mechanism such as a shutter. Not limited.

次に、2辺が露光処理された基板11を載置したステージは、公知の図示しない基板回転機構で正転または逆転で90度回転して基板の短辺・長辺方向を転換される。ここで、正転または逆転の選択は、基板が払い出される際の基板の方向を示すオリフラ(基板の4つの角のうちの1つに設けた切欠き)の位置が統一されるように選択される。次に、基板11はアライメント機構31により復路での露光処理用に整列される。さらに、一対の露光ヘッド50は紫外光照射エリアを復路での基板幅に対応させた位置に移動・固定される。次に、基板11はステージごと逆方向に搬送され、復路で2辺が処理された基板11の搬送方向に平行な未処理の2辺側を、1対の露光ヘッド50で露光処理される。   Next, the stage on which the substrate 11 on which the two sides are subjected to exposure processing is rotated 90 degrees by normal rotation or reverse rotation by a known substrate rotation mechanism (not shown) to change the short side / long side direction of the substrate. Here, the selection of normal rotation or reverse rotation is selected so that the position of the orientation flat (notch provided in one of the four corners of the substrate) indicating the direction of the substrate when the substrate is dispensed is unified. The Next, the substrate 11 is aligned by the alignment mechanism 31 for exposure processing in the return path. Further, the pair of exposure heads 50 are moved and fixed at positions where the ultraviolet light irradiation area corresponds to the substrate width on the return path. Next, the substrate 11 is transported in the reverse direction together with the stage, and the unprocessed two sides parallel to the transport direction of the substrate 11 on which two sides are processed in the return path are subjected to exposure processing by the pair of exposure heads 50.

最後に、4辺とも露光処理された処理済み基板12は載置搬送ステージから払い出され、通常は、その後直ちに現像工程に投入されて、マスクパターンの露光領域外に残存していた、光が当たったことで現像液への溶解性が増したポジ型感光性樹脂等が除去される。   Finally, the processed substrate 12 subjected to the exposure processing on all four sides is discharged from the mounting / conveying stage. Usually, the processed substrate 12 is immediately put into the developing process, and the light remaining outside the exposure area of the mask pattern is emitted. The positive photosensitive resin whose solubility in the developer is increased by the contact is removed.

以上説明したように、本発明の周辺露光装置および周辺露光方法は、装置構成が簡単でコンパクト化が可能であり、装置コストも低減可能である。また、機構的に、パーティクルの発生を抑制することが可能であり、不良ロスの低減が期待できる。このため、マザーガラスの寸法が第6世代(1500mm×1800mm)、あるいは第8世代(2160mm×2400mm)と呼ばれる大型ガラス基板を使用したカラーフィルタ基板等の製作に用いる周辺露光装置として極めて有効である。   As described above, the peripheral exposure apparatus and peripheral exposure method of the present invention have a simple apparatus configuration and can be made compact, and the apparatus cost can be reduced. Moreover, it is possible to suppress the generation of particles mechanically, and a reduction in defect loss can be expected. For this reason, the size of the mother glass is extremely effective as a peripheral exposure apparatus used for manufacturing a color filter substrate or the like using a large glass substrate called sixth generation (1500 mm × 1800 mm) or eighth generation (2160 mm × 2400 mm). .

従来の周辺露光装置を示す概略図。Schematic which shows the conventional peripheral exposure apparatus. 本発明の周辺露光装置の一例を上面から見た概略図。1 is a schematic view of an example of a peripheral exposure apparatus according to the present invention as viewed from above. 本発明の基板露光方法の一例の処理フローを示す概略図。Schematic which shows the processing flow of an example of the board | substrate exposure method of this invention.

符号の説明Explanation of symbols

(イ)・・・基板の受け入れ・払い出し機構 (ロ)・・・基板方向転換機構
(ハ)・・・搬送機構 (ニ)・・・露光機構
10・・・基板 11・・・基板(2辺処理) 12・・・基板(4辺処理)
30、31・・・アライメント機構 50,51・・・露光ヘッド
(B) ... Substrate receiving / dispensing mechanism (b) ... Substrate direction changing mechanism (c) ... Transfer mechanism (d) ... Exposure mechanism 10 ... Substrate 11 ... Substrate (2) Side treatment) 12 ... Substrate (4 side treatment)
30, 31 ... alignment mechanism 50, 51 ... exposure head

Claims (4)

露光装置により矩形の基板上に形成される所定のマスクパターンの露光領域外の周辺を露光する周辺露光装置において、
基板の受け入れ・払い出しを行う受け入れ・払い出し機構と、基板を水平にタテ・ヨコ90度回転させる基板方向転換機構と、前記受け入れ・払い出し機構と前記基板方向転換機構との間に設置され基板を往復動作で水平搬送する搬送機構と、前記搬送機構の搬送路の両側で基板幅に調整可能に設置された一対の露光ヘッドからなる露光機構とを具備し、且つ、受け入れ・払い出し機構と基板方向転換機構と搬送機構とはそれぞれ基板を往復水平搬送できることを特徴とする周辺露光装置。
In the peripheral exposure apparatus that exposes the periphery outside the exposure area of the predetermined mask pattern formed on the rectangular substrate by the exposure apparatus,
A receiving / dispensing mechanism for receiving / dispensing a substrate, a substrate direction changing mechanism for horizontally rotating the substrate 90 degrees horizontally, and a reciprocating substrate installed between the receiving / dispensing mechanism and the substrate direction changing mechanism. It comprises a transport mechanism that transports horizontally by operation, and an exposure mechanism comprising a pair of exposure heads that can be adjusted to the substrate width on both sides of the transport path of the transport mechanism, and also includes a receiving / dispensing mechanism and a substrate direction change. A peripheral exposure apparatus characterized in that each of the mechanism and the transport mechanism can transport the substrate back and forth horizontally.
請求項1に記載する周辺露光装置により、少なくとも、(1)〜(9)で構成される処理段階を具備することを特徴とする周辺露光方法。
(1)基板の載置搬送用ステージへの受け入れ段階、
(2)往路での露光処理用に基板を整列する往路基板整列段階、
(3)搬送路両側に設置された一対の露光ヘッドの紫外光照射エリアを、往路での基板幅
に対応させた位置に移動・固定する往路露光位置設定段階、
(4)基板をステージごと搬送し、往路で基板の搬送方向に平行な2辺側を、搬送路両側
の前記一対の露光ヘッドで露光処理する往路露光段階、
(5)基板を載置したステージを、正転または逆転で90度回転する基板方向転換段階、

(6)復路での露光処理用に基板を整列する復路基板整列段階、
(7)前記一対の露光ヘッドの紫外光照射エリアを復路での基板幅に対応させた位置に移
動・固定する復路露光位置設定段階、
(8)基板をステージごと搬送し、復路で基板の搬送方向に平行な2辺側を、前記1対の
露光ヘッドで露光処理する復路露光段階、
(9)露光済み基板の載置搬送ステージからの払い出し段階。
The peripheral exposure method according to claim 1, comprising at least processing steps including (1) to (9).
(1) The stage of receiving the substrate on the stage for placing and conveying,
(2) Outgoing substrate alignment stage for aligning the substrate for the exposure processing in the outward route;
(3) a forward exposure position setting stage in which the ultraviolet light irradiation area of a pair of exposure heads installed on both sides of the transport path is moved and fixed to a position corresponding to the substrate width in the forward path;
(4) A forward exposure stage in which the substrate is transported together with the stage, and the two sides parallel to the substrate transport direction in the forward path are exposed with the pair of exposure heads on both sides of the transport path;
(5) Substrate direction changing stage in which the stage on which the substrate is placed is rotated 90 degrees forward or backward,

(6) a return path substrate alignment stage for aligning the substrates for exposure processing in the return path;
(7) a return exposure position setting step of moving and fixing the ultraviolet light irradiation area of the pair of exposure heads to a position corresponding to the substrate width in the return path;
(8) a return path exposure stage in which the substrate is transported together with the stage, and the two sides parallel to the substrate transport direction on the return path are exposed by the pair of exposure heads;
(9) Discharging stage of the exposed substrate from the mounting / conveying stage.
前記受け入れ・払い出し機構が、基板の縦横方向を検知して基板を90度回転可能な機構を有することを特徴とする請求項1に記載する周辺露光装置。   The peripheral exposure apparatus according to claim 1, wherein the receiving / dispensing mechanism includes a mechanism capable of detecting the vertical and horizontal directions of the substrate and rotating the substrate by 90 degrees. 請求項3に記載する周辺露光装置により、基板の載置搬送用ステージへの受け入れ段階、および前記露光済み基板の載置搬送ステージからの払い出し段階が、基板の縦横方向を検知して基板を90度回転し、基板の受け入れが、基板1枚毎に、基板の載置搬送用ステージの長辺、短辺の方向に対応して行われることを特徴とする請求項2に記載する周辺露光方法。
According to a third aspect of the present invention, in the peripheral exposure apparatus, the step of receiving the substrate on the stage for carrying the substrate and the step of feeding the exposed substrate from the stage for carrying the substrate detect the vertical and horizontal directions of the substrate. 3. The peripheral exposure method according to claim 2, wherein the substrate is received corresponding to the direction of the long side and the short side of the stage for carrying and placing the substrate for each substrate. .
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