JP2008545153A5 - - Google Patents
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- JP2008545153A5 JP2008545153A5 JP2008518844A JP2008518844A JP2008545153A5 JP 2008545153 A5 JP2008545153 A5 JP 2008545153A5 JP 2008518844 A JP2008518844 A JP 2008518844A JP 2008518844 A JP2008518844 A JP 2008518844A JP 2008545153 A5 JP2008545153 A5 JP 2008545153A5
- Authority
- JP
- Japan
- Prior art keywords
- projection
- exposure apparatus
- sub
- projection exposure
- objectives
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000003287 optical Effects 0.000 claims 5
- 238000003384 imaging method Methods 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
Claims (30)
前記像視野(60、60’、60”)が基板領域(40)に配置され、前記基板領域が所定の走査方向(S)で複数の投影対物レンズ(20)と相対的に移動可能であり、
前記像視野(60、60’、60”)の少なくとも1つが、直線的に延びる複数の側辺によって、前記側辺の最も長い側辺の法線(y1−y7)が走査方向(S)と平行に延びないように制限されていることを特徴とする投影露光装置。 Each of the at least two projection objectives (20) has a projection objective for imaging one object field (50) into one image field (60, 60 ', 60 ");
The image field (60, 60 ′, 60 ″) is disposed in a substrate region (40), and the substrate region is movable relative to a plurality of projection objectives (20) in a predetermined scanning direction (S). ,
At least one of the image fields (60, 60 ′, 60 ″) has a plurality of sides extending linearly, and the normal (y1-y7) of the longest side is the scanning direction (S). A projection exposure apparatus, which is limited so as not to extend in parallel.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102005030839A DE102005030839A1 (en) | 2005-07-01 | 2005-07-01 | Projection exposure system with a plurality of projection lenses |
DE102005030839.2 | 2005-07-01 | ||
PCT/EP2006/063663 WO2007003563A1 (en) | 2005-07-01 | 2006-06-28 | Projection light facility provided with a plurality of projective lenses |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012094123A Division JP6063637B2 (en) | 2005-07-01 | 2012-04-17 | Projection exposure apparatus having a plurality of projection objective lenses |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008545153A JP2008545153A (en) | 2008-12-11 |
JP2008545153A5 true JP2008545153A5 (en) | 2009-07-09 |
JP6116788B2 JP6116788B2 (en) | 2017-04-19 |
Family
ID=36955990
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008518844A Active JP6116788B2 (en) | 2005-07-01 | 2006-06-28 | Projection exposure apparatus having a plurality of projection objective lenses |
JP2012094123A Expired - Fee Related JP6063637B2 (en) | 2005-07-01 | 2012-04-17 | Projection exposure apparatus having a plurality of projection objective lenses |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012094123A Expired - Fee Related JP6063637B2 (en) | 2005-07-01 | 2012-04-17 | Projection exposure apparatus having a plurality of projection objective lenses |
Country Status (4)
Country | Link |
---|---|
JP (2) | JP6116788B2 (en) |
KR (2) | KR101407797B1 (en) |
DE (1) | DE102005030839A1 (en) |
WO (1) | WO2007003563A1 (en) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101484435B1 (en) | 2003-04-09 | 2015-01-19 | 가부시키가이샤 니콘 | Exposure method and apparatus, and device manufacturing method |
TWI609409B (en) | 2003-10-28 | 2017-12-21 | 尼康股份有限公司 | Optical illumination device, exposure device, exposure method and device manufacturing method |
TWI612338B (en) | 2003-11-20 | 2018-01-21 | 尼康股份有限公司 | Optical illuminating apparatus, exposure device, exposure method, and device manufacturing method |
TWI360837B (en) | 2004-02-06 | 2012-03-21 | Nikon Corp | Polarization changing device, optical illumination |
WO2006121009A1 (en) | 2005-05-12 | 2006-11-16 | Nikon Corporation | Projection optical system, exposure apparatus and exposure method |
US20080165333A1 (en) * | 2007-01-04 | 2008-07-10 | Nikon Corporation | Projection optical apparatus, exposure method and apparatus, photomask, and device and photomask manufacturing method |
US8130364B2 (en) * | 2007-01-04 | 2012-03-06 | Nikon Corporation | Projection optical apparatus, exposure method and apparatus, photomask, and device and photomask manufacturing method |
US8451427B2 (en) | 2007-09-14 | 2013-05-28 | Nikon Corporation | Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method |
JP5267029B2 (en) | 2007-10-12 | 2013-08-21 | 株式会社ニコン | Illumination optical apparatus, exposure apparatus, and device manufacturing method |
SG10201602750RA (en) | 2007-10-16 | 2016-05-30 | Nikon Corp | Illumination Optical System, Exposure Apparatus, And Device Manufacturing Method |
EP2179330A1 (en) | 2007-10-16 | 2010-04-28 | Nikon Corporation | Illumination optical system, exposure apparatus, and device manufacturing method |
US8379187B2 (en) | 2007-10-24 | 2013-02-19 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
DE102007051669A1 (en) | 2007-10-26 | 2009-04-30 | Carl Zeiss Smt Ag | Imaging optics, projection exposure apparatus for microlithography with such an imaging optical system and method for producing a microstructured component with such a projection exposure apparatus |
US9116346B2 (en) | 2007-11-06 | 2015-08-25 | Nikon Corporation | Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method |
JP5048869B2 (en) * | 2008-05-20 | 2012-10-17 | ホ チョン,ジン | Optical parts for maskless exposure equipment |
KR100952158B1 (en) * | 2008-05-20 | 2010-04-09 | 진 호 정 | Micro prism array for Mask less Exposure device |
WO2009145048A1 (en) | 2008-05-28 | 2009-12-03 | 株式会社ニコン | Inspection device and inspecting method for spatial light modulator, illuminating optical system, method for adjusting the illuminating optical system, exposure device, and device manufacturing method |
JP5782336B2 (en) * | 2011-08-24 | 2015-09-24 | キヤノン株式会社 | Projection optical system, exposure apparatus, and device manufacturing method |
JP6217651B2 (en) * | 2012-12-18 | 2017-10-25 | 株式会社ニコン | Substrate processing apparatus, device manufacturing system, and device manufacturing method |
JP7018333B2 (en) | 2018-03-08 | 2022-02-10 | 大林道路株式会社 | Double cutter |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL194844C (en) * | 1991-02-08 | 2003-04-03 | Zeiss Carl Fa | Catadioptric reduction objective. |
JPH088169A (en) * | 1994-06-23 | 1996-01-12 | Nikon Corp | Exposure system |
JP3316710B2 (en) * | 1993-12-22 | 2002-08-19 | 株式会社ニコン | Exposure equipment |
JP3348467B2 (en) * | 1993-06-30 | 2002-11-20 | 株式会社ニコン | Exposure apparatus and method |
US5617211A (en) * | 1994-08-16 | 1997-04-01 | Nikon Corporation | Exposure apparatus |
JPH1064807A (en) * | 1996-08-19 | 1998-03-06 | Nikon Corp | Reduced projection scan type aligner |
TW448487B (en) * | 1997-11-22 | 2001-08-01 | Nippon Kogaku Kk | Exposure apparatus, exposure method and manufacturing method of device |
JP2001154368A (en) * | 1999-11-29 | 2001-06-08 | Nikon Corp | Aligner and exposing method |
JP4505666B2 (en) * | 2000-04-19 | 2010-07-21 | 株式会社ニコン | Exposure apparatus, illumination apparatus, and microdevice manufacturing method |
JP2002055059A (en) * | 2000-08-10 | 2002-02-20 | Nikon Corp | Foreign-body inspecting device, aligner and method for exposure |
JP2001201688A (en) * | 2000-12-05 | 2001-07-27 | Nikon Corp | Exposure device, exposing method, illuminator and illuminating method |
JP2005508018A (en) * | 2001-10-30 | 2005-03-24 | アプティカル リサーチ アソシエイツ | Structure and method for reducing aberrations in optical systems |
JP2005512151A (en) * | 2001-12-10 | 2005-04-28 | カール・ツァイス・エスエムティー・アーゲー | Catadioptric reduction objective lens |
JP4322564B2 (en) * | 2003-06-10 | 2009-09-02 | 富士フイルム株式会社 | Pixel position specifying method, image shift correcting method, and image forming apparatus |
JP4874529B2 (en) * | 2003-07-03 | 2012-02-15 | 富士フイルム株式会社 | Image forming apparatus |
JP2006047670A (en) * | 2004-08-04 | 2006-02-16 | Nikon Corp | Aligner and exposure method |
-
2005
- 2005-07-01 DE DE102005030839A patent/DE102005030839A1/en not_active Withdrawn
-
2006
- 2006-06-28 JP JP2008518844A patent/JP6116788B2/en active Active
- 2006-06-28 WO PCT/EP2006/063663 patent/WO2007003563A1/en active Application Filing
- 2006-06-28 KR KR1020127008773A patent/KR101407797B1/en active IP Right Grant
- 2006-06-28 KR KR20077030366A patent/KR101478832B1/en active IP Right Grant
-
2012
- 2012-04-17 JP JP2012094123A patent/JP6063637B2/en not_active Expired - Fee Related
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