JP2008245049A5 - - Google Patents

Claims (9)

A radiation source;
A radiation solid detector for detecting radiation irradiated by the radiation source;
A defect detection means for detecting pixel defect position information of the radiation fixed detector;
Control means for controlling the timing at which the defect detection means detects pixel defect position information;
Having at least one of an exposure dose measuring means for measuring the exposure dose irradiated to the fixed radiation detector and a temperature measuring means for measuring the temperature of the fixed radiation detector;
The control means includes a pixel by the defect detection means based on at least one of a measurement result of the exposure dose measurement means and a measurement result of the temperature measurement means, and an elapsed time after the pixel defect is detected by the defect detection means. A radiographic imaging apparatus that calculates timing for detecting defect position information.   The control means includes at least one of a temperature change, a cumulative exposure dose, a single exposure dose, and pixel defect position information of the radiation fixed detector after the pixel defect position information is detected by the defect detection means. An elapsed time after detection is detected, and the defect detection means when at least one of the detected temperature change, the cumulative exposure dose, the single exposure dose, and the elapsed time exceeds an allowable value The radiographic image capturing apparatus according to claim 1, wherein pixel defect position information is detected by the method.   The radiographic imaging apparatus according to claim 1, wherein the control unit waits for detection of pixel defect position information by the defect detection unit when detecting a request for imaging. It said control means further is detected pixel defect position information by the closing process during the defect detection means, the closing start time after the detection of the pixel defect position information at the time of treatment, the pixel defect position information by the defect detecting means The radiographic imaging device according to claim 1, wherein the radiographic imaging device is not detected.   The control means sets an allowable value of the elapsed time based on at least one of the cumulative exposure dose measured by the exposure dose measurement means and the temperature detected by the fixed radiation detector. 5. The radiographic image capturing apparatus according to any one of 4 above.   6. The defect detection unit according to claim 1, wherein a logical sum of the pixel defect detected at the time of update and the pixel defect of the pixel defect position information before the update is obtained as new pixel defect position information. The radiographic imaging apparatus as described. A radiation source;
A radiation solid detector for detecting radiation irradiated by the radiation source;
A defect detection means for detecting pixel defect position information of the radiation fixed detector;
Control means for controlling the timing at which the defect detection means detects pixel defect position information;
Said control means, by detecting the pixel defect position information by the closing process during the defect detection means, and, when starting after the pixel defect position information is detected by the defect detecting means during the closing process, the defect detection A radiographic apparatus that does not detect pixel defect position information by means. A pixel defect information acquisition method for acquiring pixel defect position information of a fixed radiation detector,
Elapsed time since the detection of the pixel defect position information, and temperature change, cumulative exposure dose, and single exposure dose of the radiation fixed detector since the detection of the pixel defect position information Detect one,
Pixel defect information for updating pixel defect position information of the radiation fixed detector when any one of the detected elapsed time, temperature change, cumulative exposure dose, and single exposure dose exceeds a set value Acquisition method. A pixel defect information acquisition method for acquiring pixel defect position information of a fixed radiation detector,
Based on at least one of the temperature of the radiation fixed detector and the radiation dose of the radiation detector, the update time interval of the pixel defect position information of the radiation fixed detector is set,
Compare the elapsed time since the detection of the pixel defect position information and the update time interval,
A pixel defect information acquisition method for acquiring pixel defect position information of the fixed radiation detector and updating the pixel defect position information when the elapsed time exceeds the update time interval.