JP2008151652A5 - - Google Patents

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Publication number
JP2008151652A5
JP2008151652A5 JP2006340098A JP2006340098A JP2008151652A5 JP 2008151652 A5 JP2008151652 A5 JP 2008151652A5 JP 2006340098 A JP2006340098 A JP 2006340098A JP 2006340098 A JP2006340098 A JP 2006340098A JP 2008151652 A5 JP2008151652 A5 JP 2008151652A5
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JP
Japan
Prior art keywords
output
signal generator
signal
power
reflection coefficient
Prior art date
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Application number
JP2006340098A
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English (en)
Japanese (ja)
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JP2008151652A (ja
JP4215798B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2006340098A priority Critical patent/JP4215798B2/ja
Priority claimed from JP2006340098A external-priority patent/JP4215798B2/ja
Priority to PCT/JP2007/073977 priority patent/WO2008075602A1/ja
Priority to TW96148192A priority patent/TW200831917A/zh
Publication of JP2008151652A publication Critical patent/JP2008151652A/ja
Publication of JP2008151652A5 publication Critical patent/JP2008151652A5/ja
Application granted granted Critical
Publication of JP4215798B2 publication Critical patent/JP4215798B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2006340098A 2006-12-18 2006-12-18 測定装置、測定方法、校正装置および校正方法 Expired - Fee Related JP4215798B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006340098A JP4215798B2 (ja) 2006-12-18 2006-12-18 測定装置、測定方法、校正装置および校正方法
PCT/JP2007/073977 WO2008075602A1 (ja) 2006-12-18 2007-12-12 測定装置、測定方法、校正装置および校正方法
TW96148192A TW200831917A (en) 2006-12-18 2007-12-17 Measuring apparatus, measuring method, calibration apparatus, and calibration method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006340098A JP4215798B2 (ja) 2006-12-18 2006-12-18 測定装置、測定方法、校正装置および校正方法

Publications (3)

Publication Number Publication Date
JP2008151652A JP2008151652A (ja) 2008-07-03
JP2008151652A5 true JP2008151652A5 (zh) 2008-08-14
JP4215798B2 JP4215798B2 (ja) 2009-01-28

Family

ID=39536233

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006340098A Expired - Fee Related JP4215798B2 (ja) 2006-12-18 2006-12-18 測定装置、測定方法、校正装置および校正方法

Country Status (3)

Country Link
JP (1) JP4215798B2 (zh)
TW (1) TW200831917A (zh)
WO (1) WO2008075602A1 (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014048063A (ja) 2012-08-29 2014-03-17 Advantest Corp 測定装置および測定方法
CN103645454B (zh) * 2013-12-17 2016-03-23 国家电网公司 一种直流输电系统中直流电流测量设备极性的校验方法
US9632122B2 (en) 2014-06-23 2017-04-25 Keysight Technologies, Inc. Determining operating characteristics of signal generator using measuring device
KR102618559B1 (ko) * 2018-11-27 2023-12-28 삼성전자주식회사 안테나 반사 계수를 측정하기 위한 방법 및 장치
CN110412496B (zh) * 2019-07-29 2021-05-07 中电科思仪科技股份有限公司 集成电路多参数测试仪的测试功能快速自检电路及方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5467021A (en) * 1993-05-24 1995-11-14 Atn Microwave, Inc. Calibration method and apparatus
JPH11211766A (ja) * 1998-01-26 1999-08-06 Advantest Corp 自動キャリブレーション装置
JP2001272428A (ja) * 1999-02-05 2001-10-05 Advantest Corp ネットワークアナライザ、ネットワーク分析方法およびネットワーク分析プログラムを記録した記録媒体
US6614237B2 (en) * 2000-09-18 2003-09-02 Agilent Technologies, Inc. Multiport automatic calibration device for a multiport test system
JP3510866B2 (ja) * 2001-05-14 2004-03-29 アンリツ株式会社 半導体デバイステストシステム
WO2003087856A1 (fr) * 2002-04-17 2003-10-23 Advantest Corporation Analyseur de reseau, procede d'analyse de reseau, correcteur automatique, procede de correction, programme, et support d'enregistrement

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