JP2007043024A

JP2007043024A - Circuit for electrical inspection of printed board circuit and its forming method

Info

Publication number: JP2007043024A
Application number: JP2005243383A
Authority: JP
Inventors: Tomojiro Sakurai; 友次郎櫻井
Original assignee: Individual
Current assignee: Individual
Priority date: 2005-07-29
Filing date: 2005-07-29
Publication date: 2007-02-15

Abstract

<P>PROBLEM TO BE SOLVED: To minimize an amount of used contact pins increasing involved by high sophistication of a printed board circuit, to inhibit minimization of contact pins increasing in cost, and to make it easy to manufacture contact pin of an inspection jig in an inspection of a printed board circuit formed on a board material. <P>SOLUTION: At least two different inspection circuits A, B, ... where adjacent board circuits 3a, 3b do not collaborate are formed through extending circuits 4a, 4b, ... 5a, 5b, ... extending from both ends of a plurality of printed board circuits 3a, 3b, .... <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、基板材料に各種の回路を形成したプリント基板回路の電気的検査を効率的に行うプリント基板回路の電気的検査用回路及びその形成方法に関するものである。 The present invention relates to a circuit for electrical inspection of a printed circuit board for efficiently performing electrical inspection of a printed circuit board in which various circuits are formed on a substrate material, and a method for forming the circuit.

従来、この種の基板材料に形成される各種のプリント基板回路に断線や混線等の不具合があると致命的欠陥となるため、その有無を可能な限り検査することが求められている。 Conventionally, if various types of printed circuit boards formed on this type of substrate material have a defect such as disconnection or cross-connection, it becomes a fatal defect, and therefore it is required to inspect as much as possible.

このようなプリント基板回路の断線、混線の検査を電気的に行う方法や装置は、すでに種々なものが用いられているが、各プリント基板回路の端末に何らかの電気的接触を行わせて検査する方法が最も基本的で、プリント基板回路の使用実態に近く確実であるため多く用いられている。 Various methods and apparatuses for electrically inspecting the disconnection and crosstalk of such printed circuit board circuits have already been used. Inspect the terminals of each printed circuit board by making some electrical contact. The method is the most basic and is often used because it is close to the actual use of printed circuit boards and is reliable.

この場合各種の回路を形成して型抜きされたプリント基板単体の段階で検査することもあるが、量産や検査効率の点から基板材料、すなわち、型抜きする前の回路形成された基板材料の段階で検査することが一般的に多く行われており、これらの検査は主として基板回路端末数に応じて接触ピンを設置した検査用冶具を有する検査装置が用いられ（図７参照）、これらの検査装置に回路を形成したプリント基板を電気的に接続して検査に供されている。 In this case, various types of circuits may be formed and inspected at the stage of the printed board alone, but from the viewpoint of mass production and inspection efficiency, the substrate material, that is, the substrate material on which the circuit is formed before die cutting is used. In general, many inspections are performed in stages, and these inspections are mainly performed by an inspection apparatus having an inspection jig provided with contact pins according to the number of circuit board terminals (see FIG. 7). A printed circuit board on which a circuit is formed in an inspection apparatus is electrically connected for inspection.

このような検査用冶具を用いた検査装置に供される複数の回路を形成したプリント基板は、そのプリント基板回路の端末を検査用ランドとするが、隣接する回路の端末の間隔が狭小の場合には、その狭い間隔に対応した接触ピンを検査用冶具に設けなければならず、図８に模式図として示すように、型抜き前の基板材料１の余白部分２にプリント基板回路３の端末を延出して延長回路４、５を形成し、その延長回路４、５の端部を検査用ランド６として、図７に示す検査用冶具１１に設けられている接触ピン１２相互の間隔を広げ、接触ピン１２の極小化をできるだけ防ごうとする方法が行われている。 A printed circuit board on which a plurality of circuits used for an inspection apparatus using such an inspection jig is formed uses the terminal of the printed circuit board as an inspection land, but the interval between the terminals of adjacent circuits is narrow In this case, contact pins corresponding to the narrow gap must be provided in the inspection jig, and as shown in a schematic diagram in FIG. 8, the terminal of the printed circuit board 3 is formed in the blank portion 2 of the substrate material 1 before die cutting. Are extended to form the extension circuits 4 and 5, and the ends of the extension circuits 4 and 5 are used as inspection lands 6 to widen the distance between the contact pins 12 provided in the inspection jig 11 shown in FIG. 7. In order to minimize the contact pin 12 as much as possible, a method has been carried out.

しかし、従来用いられているこれらの電気的手段による検査装置に用いられている検査用冶具は、近年プリント基板回路が精細化し、液晶用のプリント基板などにみられるように、回路端末の間隔が狭くなるにしたがって、接触ピンを極小化しなければならなくなり、このため検査用冶具の作製が困難となりかつ高額化を招いている。 However, the inspection jigs used in the inspection devices using these electrical means that have been used in the past have recently been developed with finer printed circuit boards and the intervals between the circuit terminals as seen in printed circuit boards for liquid crystals. As the size becomes narrower, the contact pin must be minimized, which makes it difficult to produce an inspection jig and increases the cost.

このため、図８に示すように、基板材料１に形成される複数の基板回路３、３・・・の端末にそれぞれ長さの異なる延長回路４、５を延出して、その端部に形成される検査用ランド６の位置をずらして、接触ピン相互の間隔を広げる方法を採用しているが、検査に必要な接触ピンの使用個数は減らず、また、検査用ランド６を形成する基板材料１の余白に制限がある場合には、十分な検査用ランド６の間隔が確保できず、極小ピンの使用が不可欠となっていた。 For this reason, as shown in FIG. 8, the extension circuits 4 and 5 having different lengths are extended to the ends of the plurality of substrate circuits 3, 3. Although the method of shifting the position of the inspection lands 6 to be expanded and increasing the distance between the contact pins is adopted, the number of contact pins required for inspection does not decrease, and the substrate on which the inspection lands 6 are formed When the margin of the material 1 is limited, a sufficient interval between the inspection lands 6 cannot be secured, and it is indispensable to use a tiny pin.

本発明は、基板材料に形成されたプリント基板回路の検査において、このプリント基板回路の高精細化に伴って増加する接触ピンの使用を最小限に止め、かつ高額化する接触ピンの極小化を抑止して、プリント基板回路の回路検査における検査用冶具の作製を容易にすることを目的にするものである。 The present invention minimizes the use of contact pins, which increase with the increase in definition of the printed circuit board circuit, and minimizes the contact pins that are expensive in the inspection of the printed circuit board formed on the substrate material. The purpose is to make it easier to manufacture inspection jigs in circuit inspection of printed circuit boards.

本発明に係るプリント基板回路の電気的検査用回路は、基板材料に形成される複数のプリント基板回路の両方の端末から各々延長回路を延出し、このプリント基板回路の両端に設けられた延長回路を、隣接するプリント基板回路が別異の検査用回路を形成するように結線して、始端部とするプリント基板回路の延長回路を検査用ランドの起点とし、また、終端部とするプリント基板回路の延長回路を検査用ランドの終点として、検査用冶具に設けられる接触ピンと接触して、隣接するプリント基板回路が共働しない少なくとも二つ以上の別異の検査用回路を形成してなることを特徴とするものである。 The circuit for electrical inspection of a printed circuit board circuit according to the present invention extends an extension circuit from both terminals of a plurality of printed circuit boards formed on a substrate material, and is provided at both ends of the printed circuit board circuit. Are connected so that adjacent printed circuit boards form different inspection circuits, and an extended circuit of the printed circuit board as the starting end is used as the starting point of the inspection land, and the printed circuit board circuit is used as the terminating end. The extension circuit is used as an end point of the inspection land, and is in contact with a contact pin provided on the inspection jig to form at least two or more different inspection circuits in which adjacent printed circuit boards do not cooperate. It is a feature.

さらに、本発明に係るプリント基板回路の電気的検査用回路の形成方法は、基板材料に形成されるプリント基板回路の両方の端末から各々延長回路を延出し、このプリント基板回路の両端に設けられた延長回路を、隣接しないひとつおきないしは複数個おきに他のプリント基板回路の端末の延長回路に結線し、プリント基板回路の他方の端末に設けられる延長回路を、同様に、隣接しないひとつおきないしは複数個おきに他のプリント基板回路の端末の延長回路に結線して、複数のプリント基板回路からなる一つの検査用回路を形成し、以下順次、隣接するプリント基板回路の延長回路を反復して結線して他の検査用回路を形成し、隣り合うプリント基板回路に形成される検査用回路が別異の検査用回路として、始端部とするプリント基板回路の延長回路を検査用ランドの起点とし、また、終端部とするプリント基板回路の延長回路を検査用ランドの終点として接触ピンと接触して、隣接するプリント基板回路が共働しない少なくとも二つ以上の別異の検査用回路を形成してなることを特徴とするものである。 Furthermore, in the method for forming a circuit for electrical inspection of a printed circuit board according to the present invention, the extension circuit is extended from both ends of the printed circuit board formed on the substrate material, and is provided at both ends of the printed circuit board. In the same way, every other non-adjacent extension circuit is connected to an extension circuit of a terminal of another printed circuit board circuit. Connect to the extension circuit of the terminal of other printed circuit board circuit every other plural number to form one inspection circuit consisting of a plurality of printed circuit board circuits, and repeat the extension circuit of the adjacent printed circuit board circuit sequentially. Connected to form another inspection circuit, and the inspection circuit formed on the adjacent printed circuit board is a different inspection circuit, and the printed circuit At least two or more adjacent printed circuit boards do not work together, with the extension circuit of the printed circuit board as the starting point of the inspection land and the terminal circuit extended circuit of the printed circuit board as the end point of the inspection land. A different inspection circuit is formed.

さらに、プリント基板回路の電気的検査用回路の形成方法は、基板材料に形成される複数のプリント基板回路において、その略中間部分に位置するプリント基板回路の一方の端末から延出される延長回路の端末に形成される検査用ランドを起点とし、側端部分に位置するプリント基板回路の他方の端末から延出される延長回路の端末に形成される検査用ランドを終点として、複数の延長回路を一定の方向に結線して、複数のプリント基板回路に検査用回路を少なくとも二つ以上、隣接するプリント基板回路が同一の検査用回路とならないように形成してなることを特徴とするものである。 Furthermore, a method for forming a circuit for electrical inspection of a printed circuit board includes: a plurality of printed circuit boards formed on a substrate material; an extension circuit extending from one terminal of the printed circuit board circuit positioned substantially at an intermediate portion thereof; Multiple extension circuits are fixed starting from the inspection land formed at the terminal, and the inspection land formed at the terminal of the extension circuit extending from the other terminal of the printed circuit board located at the side edge. In this case, at least two inspection circuits are formed on a plurality of printed circuit boards, and adjacent printed circuit boards are formed so as not to be the same inspection circuit.

さらに、プリント基板回路の電気的検査用回路の形成方法は、基板材料に形成される複数のプリント基板回路において、基板材料の一側端部側に位置するプリント基板回路の一方の端末から延出される延長回路の端末を検査用ランドの起点とし、基板材料の反対側端部側に位置するプリント基板回路の端末から延出される延長回路の端末を検査用ランドの終点として、隣接するプリント基板回路を外してそれぞれのプリント基板回路の延長回路を結線して、一つの検査用回路を形成すると共に、この一つの検査用回路を形成しないプリント基板回路の端末に設けられる延長回路を、前記一つの検査回路を形成するプリント基板回路の延長回路の結線と交叉しないように結線して、他の検査用回路を形成してなることを特徴とするものである。 Further, a method of forming a circuit for electrical inspection of a printed circuit board includes: a plurality of printed circuit boards formed on the substrate material; and a method of extending from one end of the printed circuit board circuit located on one end side of the substrate material. Adjacent printed circuit board with the terminal of the extended circuit as the starting point of the inspection land and the terminal of the extended circuit extending from the terminal of the printed circuit board located on the opposite end side of the substrate material as the end point of the inspection land The extension circuit of each printed circuit board circuit is connected to form one inspection circuit, and the extension circuit provided at the terminal of the printed circuit board circuit that does not form one inspection circuit is connected to the one circuit board. It is characterized in that another inspection circuit is formed by connecting so as not to cross the connection of the extension circuit of the printed circuit board forming the inspection circuit.

さらに、プリント基板回路の電気的検査用回路の形成方法は、隣接するプリント基板回路が共働しない少なくとも二つ以上の別異の検査用回路とする検査用回路群を、基板材料に形成される複数のプリント基板回路に並列状に形成してなることを特徴とするものである。 Further, according to the method for forming an electrical inspection circuit for a printed circuit board circuit, an inspection circuit group including at least two different inspection circuits in which adjacent printed circuit boards do not work together is formed on the substrate material. It is characterized by being formed in parallel on a plurality of printed circuit boards.

本発明に係るプリント基板回路の電気検査用回路及びその形成方法によれば、プリント基板回路から延出される延長回路を結線して検査に必要な検査用回路を形成することにより、検査用回路の数を減少して検査用冶具に取り付けられる接触ピンの数を減らすことができる。 According to the circuit for electrical inspection of a printed circuit board circuit and a method for forming the same according to the present invention, an inspection circuit necessary for the inspection is formed by connecting an extension circuit extending from the printed circuit board circuit. The number of contact pins attached to the inspection jig can be reduced by reducing the number.

さらに、検査用回路の両端に形成される検査用ランドの間隔を広げることが容易になり、プリント基板回路の精細化に伴う高価な極小ピンの使用度合いを減少し、かつ、検査用冶具を簡単容易に作製して、検査設備及び検査に掛かる費用を軽減することができる。 Furthermore, it is easy to widen the interval between inspection lands formed at both ends of the inspection circuit, reduce the degree of use of expensive tiny pins associated with the refinement of the printed circuit board, and simplify the inspection jig. It can be easily manufactured, and the cost for inspection equipment and inspection can be reduced.

また、基板材料に形成される複数のプリント基板回路は、隣接するプリント基板回路が別の検査用回路となるように、その両端末から延出される延長回路で結線されるため、検査途中における断線および隣同士のプリント基板回路の混線を確実に検出することができる。 In addition, a plurality of printed circuit boards formed on the substrate material are connected by extension circuits extending from both terminals so that the adjacent printed circuit board becomes another inspection circuit, so that the disconnection occurs during the inspection. In addition, it is possible to reliably detect crosstalk between adjacent printed circuit boards.

以下、本発明の実施の形態について添付図面に基づいて説明する。
添付図面において、図１ないし図６は、本発明に係るプリント基板回路の電気的検査用回路及びその形成方法を示す代表的な模式図であり、図７は電気検査装置を示す略示図である。Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings.
In the attached drawings, FIGS. 1 to 6 are typical schematic diagrams showing a circuit for electrical inspection of a printed circuit board according to the present invention and a method for forming the circuit, and FIG. 7 is a schematic diagram showing an electrical inspection apparatus. is there.

図１は本発明に係る電気的検査用回路の代表的な配列形態を模式図によって示すもので、基板材料１に形成される複数すなわち１６本のプリント基板回路３ａ、３ｂ・・・３ｐの両端末から余白部分２に延出される延長回路４ａ、４ｂ・・・４ｐおよび５ａ、５ｂ・・・５ｐを直列的に結線して、隣接するプリント基板回路３ａ、３ｂが共働しない少なくとも二列の別異の検査用回路Ａ、Ｂを形成してなるものである。 FIG. 1 is a schematic diagram showing a typical arrangement of electrical inspection circuits according to the present invention. Both a plurality of 16 printed circuit boards 3a, 3b,. The extension circuits 4a, 4b... 4p and 5a, 5b... 5p extending from the terminal to the margin part 2 are connected in series so that the adjacent printed circuit boards 3a and 3b do not work together. Different inspection circuits A and B are formed.

すなわち、複数のプリント基板回路３ａ、３ｂ・・・３ｐは、その両方の端末から適宜の長さを有する延長回路４ａ、４ｂ・・・４ｐおよび５ａ、５ｂ・・・５ｐを延出して、隣接しないひとつおきのプリント基板回路３ａ、３ｃ・・・３ｏの一方の端末に延出された延長回路４ａ、４ｃ・・・４ｏを結線して接続し、さらに、プリント基板回路３ａ、３ｃ・・・３ｏの他方の端末に延出される延長回路５ａ、５ｃ・・・５ｏも、同様に、隣接しないひとつおきのプリント基板回路３ａ、３ｃ・・・３ｏの他方の端末に設けられた延長回路５ａ、５ｃ・・・５ｏを結線し接続して一つのループ状の検査用回路Ａを形成する。 That is, the plurality of printed circuit boards 3a, 3b,... 3p are extended by extending extension circuits 4a, 4b... 4p and 5a, 5b. The extension circuits 4a, 4c,... 4o extended to one end of every other printed circuit board circuit 3a, 3c... 3o are connected and connected, and the printed circuit boards 3a, 3c. Similarly, the extension circuits 5a, 5c,... 5o extended to the other terminal of 3o are extended circuits 5a provided at the other terminals of every other printed circuit board circuit 3a, 3c,. 5c... 5o are connected and connected to form one loop-like inspection circuit A.

この検査用回路Ａを形成するプリント基板回路３ａ、３ｃ・・・３ｏは、中間部分に位置するプリント基板回路３ｉの延長回路４ｉの端部に形成される検査用ランド６ｉをその起点７ｉとし、基板材料１の側端側、すなわち図面において、上側端側に位置するプリント基板回路３ａの延長回路４ａの端部の検査用ランド６ａを終点８ａとするものである。 The printed circuit board circuits 3a, 3c,... 3o forming the inspection circuit A have the inspection land 6i formed at the end of the extension circuit 4i of the printed circuit board circuit 3i located at the intermediate portion as the starting point 7i. The inspection land 6a at the end of the extension circuit 4a of the printed circuit board circuit 3a located on the side end side of the substrate material 1, that is, the upper end side in the drawing, is the end point 8a.

さらに、検査用回路Ａを形成しないプリント基板回路３ｂ、３ｄ・・・３ｐの両端末に各々に設けられた延長回路４ｂ、４ｄ・・・４ｐおよび５ｂ、５ｅ・・・５ｐを同様直列状に結線して接続し、隣接するプリント基板回路３ａ、３ｃ・・・３ｏと共働しない別異のループ状の検査用回路Ｂを形成する。 Further, the extension circuits 4b, 4d,... 4p and 5b, 5e,... 5p provided at both terminals of the printed circuit board circuits 3b, 3d,. Wired and connected to form a different loop-shaped inspection circuit B that does not cooperate with the adjacent printed circuit boards 3a, 3c,.

この検査用回路Ｂを形成するプリント基板回路３ｂ、３ｄ・・・３ｐは、中間部分に位置するプリント基板回路３ｈの延長回路４ｈの端部に形成される検査用ランド６ｈをその起点７ｈとし、基板材料１の側端側すなわち図面において、下側端側に位置するプリント基板回路３ｐの延長回路４ｐの端部の検査用ランド６ｐを終点８ｐとするものである。 The printed circuit board circuits 3b, 3d,... 3p forming the inspection circuit B have the inspection land 6h formed at the end of the extension circuit 4h of the printed circuit board circuit 3h located at the intermediate portion as the starting point 7h. The inspection land 6p at the end of the extension circuit 4p of the printed circuit board circuit 3p located on the side end side of the substrate material 1, that is, the lower end side in the drawing, is the end point 8p.

なお、検査用回路Ａにおいて中間部分に位置するプリント基板回路３ｉの検査用ランド６ｉをその起点７ｉとし、上側端側に位置するプリント基板回路３ａの検査用ランド６ａを終点８ａとして説明したが、この上側端側に位置するプリント基板回路３ａの検査用ランド６ａを始点とし、中間部分に位置するプリント基板回路３ｉの検査用ランド６ｉをその終点７ｉとするものでもよく、検査用回路Ｂにおいても同様である。 In the inspection circuit A, the inspection land 6i of the printed circuit board circuit 3i located in the intermediate portion is described as the starting point 7i, and the inspection land 6a of the printed circuit board circuit 3a located on the upper end side is described as the end point 8a. The inspection land 6a of the printed circuit board circuit 3a located on the upper end side may be set as the starting point, and the inspection land 6i of the printed circuit board circuit 3i positioned in the intermediate portion may be set as the end point 7i. It is the same.

また、プリント基板回路３ａ、３ｂ・・・３ｐの両端末から延出される延長回路４ａ、４ｂ・・・４ｐおよび５ａ、５ｂ・・・５ｐは、検査用ランド６ａ、６ｈ、６ｉ、６ｐを形成する延長回路４ａ、４ｉ、５ｈ、５ｐを除いて、その起点７ｈ、７ｉとなる延長回路４ｉ、５ｈより長く延出されて囲繞するように直列状に結線して連結される。 Further, the extension circuits 4a, 4b,... 4p and 5a, 5b,... 5p extending from both terminals of the printed circuit boards 3a, 3b,... 3p form inspection lands 6a, 6h, 6i, 6p. Except for the extension circuits 4a, 4i, 5h, and 5p, the extension circuits 4i and 5h that are the starting points 7h and 7i are connected and connected in series so as to extend and surround the extension circuits 4i and 5h.

なお、略中間に隣接して位置するプリント基板回路３ｈ、３ｉの延長回路５ｈ、４ｉに形成される検査用ランド６の起点７は並列せずに、対角状、すなわち反対端側の延長回路５ｈ、４ｉとする。 Note that the starting points 7 of the inspection lands 6 formed in the extension circuits 5h and 4i of the printed circuit board circuits 3h and 3i positioned substantially adjacent to each other are not parallel, but are diagonal, that is, extension circuits on the opposite end side. 5h, 4i.

上記のように隣接するプリント基板回路３ａと３ｂ、３ｂと３ｃ・・・が共働しない少なくとも二つの別異の検査回路Ａ、Ｂを形成したプリント基板回路３ａ、３ｂ・・・３ｐは、図７に示すように、検査装置１０の検査用冶具１１の下板にセッティングされて、複数の検査用ランド６、６・・・を検査用冶具１１の上板に対応して設けられる複数の接触ピン１２、１２・・・と接触させて電気的に接続されて検査に供されるものである。 As described above, the printed circuit board circuits 3a, 3b,... 3p in which at least two different inspection circuits A, B in which the adjacent printed circuit boards 3a, 3b, 3b, 3c,. As shown in FIG. 7, a plurality of contacts are set on the lower plate of the inspection jig 11 of the inspection apparatus 10 and the plurality of inspection lands 6, 6... Are provided corresponding to the upper plate of the inspection jig 11. It is brought into contact with the pins 12, 12...

図２に示すプリント基板回路の電気的検査用回路の模式図は、複数すなわち１７本のプリント基板回路３ａ、３ｂ・・・３ｐにおいて、隣接するプリント基板回路３ａと３ｂと３ｃ・・・が共働しない少なくとも三つの別異の渦巻状の検査用回路Ａ、Ｂ、Ｃを形成した例で、この場合においては、６本のプリント基板回路３ａ、３ｄ、３ｇ、３ｊ、３ｍ、３ｐからなる検査用回路Ａと、５本のプリント基板回路３ｂ、３ｅ、３ｈ、３ｌ、３ｏからなる検査用回路Ｂと、６本のプリント基板回路３ｃ、３ｆ、３ｉ、３ｋ、３ｎ、３ｑからなる検査用回路Ｃが形成されている。 The schematic diagram of the circuit for electrical inspection of the printed circuit board shown in FIG. 2 shows that a plurality of, that is, 17 printed circuit boards 3a, 3b,. An example in which at least three different spiral inspection circuits A, B, and C that do not work are formed. In this case, an inspection that includes six printed circuit boards 3a, 3d, 3g, 3j, 3m, and 3p. Circuit A, inspection circuit B composed of five printed circuit boards 3b, 3e, 3h, 3l, 3o, and inspection circuit composed of six printed circuit boards 3c, 3f, 3i, 3k, 3n, 3q C is formed.

検査用回路Ａを形成するプリント基板回路３ａ、３ｄ、３ｇ、３ｊ、３ｍ、３ｐは、その中間に位置するプリント基板回路３ｊの延長回路４ｊに形成される検査用ランド６ｊを起点７ｊとして、また、図示において、上側端側に位置されるプリント基板回路３ａの延長回路４ａの端部に形成される検査用ランド６ａを終点８ａとしている。 The printed circuit board circuits 3a, 3d, 3g, 3j, 3m, and 3p forming the inspection circuit A start from the inspection land 6j formed in the extension circuit 4j of the printed circuit board circuit 3j located in the middle, and In the drawing, the inspection land 6a formed at the end of the extension circuit 4a of the printed circuit board circuit 3a located on the upper end side is defined as an end point 8a.

また、検査用回路Ｂを形成するプリント基板回路３ｂ、３ｅ、３ｈ、３ｌ、３ｏは、検査用回路Ａの起点７ｊとは反対側に、その中間に位置するプリント基板回路３ｈの延長回路５ｈに形成される検査用ランド６ｈを起点７ｈとして、また、上側端側に位置されるプリント基板回路３ｂの延長回路４ｂの端部に形成される検査用ランド６ｂを終点８ｂとしている。 Further, the printed circuit board circuits 3b, 3e, 3h, 3l, and 3o forming the inspection circuit B are connected to the extension circuit 5h of the printed circuit board circuit 3h located on the opposite side to the starting point 7j of the inspection circuit A. The formed inspection land 6h is set as the starting point 7h, and the inspection land 6b formed at the end of the extension circuit 4b of the printed circuit board 3b located on the upper end side is set as the end point 8b.

さらに、検査用回路Ｃを形成するプリント基板回路３ｃ、３ｆ、３ｉ、３ｋ、３ｎ、３ｑは、検査用回路Ｂの起点７ｈと並列するように、その中間に位置するプリント基板回路３ｉの延長回路５ｉに形成される検査用ランド６ｉを起点７ｉとして、下側端側に位置されるプリント基板回路３ｑの延長回路５ｑの端部に形成される検査用ランド６ｑを終点８ｑとしている。 Further, the printed circuit board circuit 3c, 3f, 3i, 3k, 3n, 3q forming the inspection circuit C is an extension circuit of the printed circuit board circuit 3i positioned in the middle so as to be parallel to the starting point 7h of the inspection circuit B. The inspection land 6i formed at 5i is set as the starting point 7i, and the inspection land 6q formed at the end of the extension circuit 5q of the printed circuit board 3q located on the lower end side is set as the end point 8q.

このように隣接するプリント基板回路を同一の検査用回路としない３列の検査用回路Ａ、Ｂ、Ｃはその起点７ｈ、７ｉ、７ｊは同一端末側の延長回路４ｈ、４ｉ、４ｊおよび５ｈ、５ｉ、５ｊに並列せず、いずれか２つを反対端側すなわち対角状に位置させ、また、並列する起点７ｈと７ｉおよび終点８ａ、８ｂは延長回路５ｈと５ｉ、４ａと４ｂはその長さを変えて、その検査用ランド６ａと６ｂ、６ｈと６ｉを相互に余裕ある間隔を得ることができ、また、接触ピン１２の極小化を防ぐことができるものである。 Thus, the three printed circuit A, B, and C that do not use the same printed circuit board as the same printed circuit are the starting points 7h, 7i, and 7j are the extension circuits 4h, 4i, 4j, and 5h on the same terminal side, 5i and 5j are not juxtaposed, but two of them are positioned at opposite ends, that is, diagonally, and the parallel start points 7h and 7i and end points 8a and 8b are extension circuits 5h and 5i, and 4a and 4b are their lengths. In other words, the inspection lands 6a and 6b, 6h and 6i can be provided with a sufficient space between each other, and the contact pins 12 can be prevented from being minimized.

図３に示すプリント基板回路の電気的検査用回路の模式図は、複数すなわち１９本のプリント基板回路３ａ、３ｂ・・・３ｓにおいて、隣接するプリント基板回路３ａ、３ｂ、３ｃ・・・３ｓがそれぞれ共働しない６列の別異の検査用回路Ａ、Ｂ・・・Ｆを形成した配列例で、この場合においては、４本のプリント基板回路３ａ、３ｇ、３ｉ、３ｑからなる検査用回路Ａと、３本のプリント基板回路３ｂ、３ｈ、３ｐからなる検査用回路Ｂと、３本のプリント基板回路３ｃ、３ｊ、３ｏからなる検査用回路Ｃ、３本のプリント基板回路３ｄ、３ｌ、３ｎからなる検査用回路Ｄ、３本のプリント基板回路３ｆ、３ｋ、３ｒからなる検査用回路Ｅ、また、３本のプリント基板回路３ｅ、３ｍ、３ｓからなる検査用回路Ｆがそれぞれ形成されている。 3 is a schematic diagram of a circuit for electrical inspection of a printed circuit board circuit. In a plurality, that is, 19 printed circuit board circuits 3a, 3b,... 3s, adjacent printed circuit board circuits 3a, 3b, 3c,. In this example, six rows of different test circuits A, B,... F are formed, and in this case, the test circuit is composed of four printed circuit boards 3a, 3g, 3i, and 3q. A, an inspection circuit B composed of three printed circuit boards 3b, 3h, 3p, an inspection circuit C composed of three printed circuit boards 3c, 3j, 3o, three printed circuit boards 3d, 3l, An inspection circuit D composed of 3n, an inspection circuit E composed of three printed circuit boards 3f, 3k and 3r, and an inspection circuit F composed of three printed circuit boards 3e, 3m and 3s are formed. Have

検査用回路Ａ、Ｂ、Ｃ、Ｄは、基板材料１の上端側に位置する４本のプリント基板回路３ａ、３ｂ、３ｃ、３ｄの延長回路５ａ、５ｂ、５ｃ、５ｄの端部に形成される検査用ランド６ａ、６ｂ、６ｃ、６ｄを終点８ａ、８ｂ、８ｃ、８ｄとし、また、検査用回路Ｅ、Ｆは、基板材料１の下端側に位置する２本のプリント基板回路３ｒ、３ｓの延長回路４ｒ、４ｓを終点８ｒ、８ｓとして、それぞれの検査用回路Ａ、Ｂ、Ｃ、Ｄ、Ｅ、Ｆの始点７ｈ、７ｉ、７ｊ、７ｋ、７ｌ、７ｍは、隣接するプリント基板回路に形成される検査用ランド６ｈ、６ｊ、６ｌと６ｉ、６ｋ、６ｍの位置を反対側として、他の検査用回路に形成される延長回路の結線が間に介在するように配列されているものである。 The inspection circuits A, B, C and D are formed at the ends of the extension circuits 5a, 5b, 5c and 5d of the four printed circuit boards 3a, 3b, 3c and 3d located on the upper end side of the substrate material 1. The inspection lands 6a, 6b, 6c, 6d are end points 8a, 8b, 8c, 8d, and the inspection circuits E, F are two printed circuit boards 3r, 3s located on the lower end side of the substrate material 1. The extension circuits 4r and 4s are end points 8r and 8s, and the starting points 7h, 7i, 7j, 7k, 7l, and 7m of the inspection circuits A, B, C, D, E, and F are connected to the adjacent printed circuit boards. The inspection lands 6h, 6j, 6l and 6i, 6k, 6m formed are arranged on the opposite side so that the connection of extension circuits formed in other inspection circuits is interposed therebetween. is there.

図４に示すプリント基板回路の電気的検査用回路の模式図は、図１に示す少なくとも二つの別異の検査回路ＡとＢ、ＣとＤ、ＥとＦをそれぞれ１単位とする３つの検査回路群を、基板材料１に形成されている２６本のプリント基板回路３ａ、３ｂ、３ｃ…３ｚ上に形成してなるもので、４本のプリント基板回路３ａ、３ｃ、３ｅ、３ｇからなる検査用回路Ａと、同様４本のプリント基板回路３ｂ、３ｄ、３ｆ、３ｈからなる検査用回路Ｂを、隣接するプリント基板回路３ａと３ｂ・・・が同一の検査用回路を形成しないように結線して一つの検査用回路群を形成し、以下同様にして他の検査用回路群を形成する。この実施態様においては、３つの検査用回路群が形成されている。なお、このような配列構成は、基板材料１に十分な延長回路４ａ・・・、５ａ・・・を形成するための余白部分２が少ない場合等に有効な配列構成である。 The schematic diagram of the circuit for electrical inspection of the printed circuit board shown in FIG. 4 shows three inspections each including at least two different inspection circuits A and B, C and D, and E and F shown in FIG. A circuit group is formed on 26 printed circuit boards 3a, 3b, 3c,... 3z formed on the substrate material 1, and is an inspection comprising four printed circuit boards 3a, 3c, 3e, 3g. The circuit A for inspection and the circuit B for inspection comprising the same four printed circuit boards 3b, 3d, 3f and 3h are connected so that the adjacent printed circuit boards 3a and 3b... Do not form the same inspection circuit. Thus, one inspection circuit group is formed, and other inspection circuit groups are formed in the same manner. In this embodiment, three test circuit groups are formed. Note that such an arrangement is an arrangement that is effective when there are few margins 2 for forming sufficient extension circuits 4a... 5a.

この配列態様においては２４本のプリント基板回路３ａ、３ｂ、３ｃ…３ｘにより３つの検査用回路群が形成され、プリント基板回路３ｙ、３ｚが余るが、この残余のプリント基板回路３ｙ、３ｚは延長回路４ｙ、４ｚ、５ｙ、５ｚを結線せずに、それぞれ検査用ランド６ｙ、６ｚを形成して一方を始点７ｙ、７ｚとし、他方を終点８ｙ、８ｚとして単独の検査用回路Ｇ、Ｈを形成するもので、この場合検査用ランド６ｙ、６ｚが並列して近接しないように延長回路４ｙ、４ｚおよび５ｙ、５ｚの延長長さを変え、あるいは、いずれかを折曲して検査用ランドに間隔を取ることが望ましい。 In this arrangement mode, three test circuit groups are formed by 24 printed circuit board circuits 3a, 3b, 3c,... 3x, and the printed circuit board circuits 3y and 3z are left, but the remaining printed circuit boards 3y and 3z are extended. Without connecting the circuits 4y, 4z, 5y and 5z, the inspection lands 6y and 6z are formed, respectively, and one is used as the start point 7y and 7z, and the other is the end point 8y and 8z, and a single test circuit G and H is formed. In this case, the extension lengths of the extension circuits 4y, 4z, 5y, and 5z are changed so that the inspection lands 6y and 6z do not approach each other in parallel, or one of the extension lands is bent to be spaced from the inspection lands. It is desirable to take.

図５に示すプリント基板回路の電気的検査用回路形成の模式図は、基板材料１の上端側に形成されるプリント基板回路３ａ、３ｂ・・・から、隣接するプリント基板回路３ｂ・・・を除いて、下端側までのプリント基板回路３ｋを結線して、ひとつの検査用回路Ａを形成し、その残余のプリント基板回路３ｂ、３ｄ・・・を用いて別異の検査用回路Ｂ、Ｃを形成した配列例を示すものである。 5 is a schematic diagram of the circuit formation for electrical inspection of the printed circuit board circuit. From the printed circuit board circuits 3a, 3b... Formed on the upper end side of the substrate material 1, the adjacent printed circuit board circuit 3b. In addition, the printed circuit board circuit 3k up to the lower end side is connected to form one inspection circuit A, and the remaining printed circuit board circuits 3b, 3d,. The example of an arrangement | sequence which formed is shown.

検査用回路Ａは、複数すなわち１１本のプリント基板回路の３ａ、３ｂ、３ｃ…３ｋの上側端部側に位置するプリント基板回路３ａの一方の端末に延出される延長回路５ａの端末を検査用ランド６ａの起点７ａとし、下端側に位置するプリント基板回路３ｋの端末に延出される延長回路５ｋの検査用ランド６ｋを終点８ｋとして、隣接しない６本のプリント基板回路３ａ、３ｃ、３ｅ、３ｇ、３ｉ、３ｋの延長回路４ａ、４ｃ、４ｅ、４ｇ、４ｉ、４ｋおよび５ａ、５ｃ、５ｅ、５ｇ、５ｉ、５ｋを直列的に結線して回路形成される。 The inspection circuit A is used for inspecting the terminals of the extension circuit 5a extending to one terminal of the printed circuit board circuit 3a located on the upper end side of a plurality of, ie, 11 printed circuit boards 3a, 3b, 3c. The non-adjacent six printed circuit boards 3a, 3c, 3e, 3g are set as the starting point 7a of the land 6a and the inspection land 6k of the extension circuit 5k extending to the terminal of the printed circuit board circuit 3k located on the lower end side as the end point 8k. 3i, 3k extension circuits 4a, 4c, 4e, 4g, 4i, 4k and 5a, 5c, 5e, 5g, 5i, 5k are connected in series to form a circuit.

また、この検査用回路Ａに含まれない３本のプリント基板回路３ｂ、３ｆ、３ｊによって検査用回路Ｂを形成するもので、この検査用回路Ｂは、検査用回路Ａを形成するよう結線された延長回路４ａと４ｃ、４ｅと４ｇ、４ｉと４ｋに囲繞される延長回路４ｂ、４ｆ、４ｊの端部に検査用ランド６ｂ、６ｆ、６ｊを形成し、そのうちに２つを起点７ｂ、７ｆとし、残余の検査用ランド６ｊを終点８ｊとし、反対端に形成される延長回路５ｂ、５ｆ、５ｊは、検査用回路Ａを形成するプリント基板回路３ｃと３ｅ、３ｇと３ｉの延長回路５ｃと５ｅ、５ｇと５ｉの結線の外側で直列的に結線される。 Further, the inspection circuit B is formed by three printed circuit boards 3b, 3f, and 3j that are not included in the inspection circuit A. The inspection circuit B is connected to form the inspection circuit A. The test lands 6b, 6f and 6j are formed at the ends of the extension circuits 4b, 4f and 4j surrounded by the extension circuits 4a and 4c, 4e and 4g, 4i and 4k, and two of them are the starting points 7b and 7f. The remaining inspection lands 6j are the end points 8j, and the extension circuits 5b, 5f, and 5j formed at the opposite ends are the printed circuit board circuits 3c and 3e that form the inspection circuit A, and the extension circuits 5c of 3g and 3i. It is connected in series outside the connection of 5e, 5g and 5i.

さらに、この二つの検査回路Ａ、Ｂを形成しない残余のプリント基板回路３ｄ、３ｈは、その一方の延長回路４ｄ、４ｈを、検査用回路Ａを形成するよう結線された延長回路４ｅ、４ｇを跨架して結線され、プリント基板回路３ｄの延長回路５ｄに形成される検査用ランド６ｄを起点７ｄとし、プリント基板回路３ｈの延長回路５ｈに形成される検査用ランド６ｈを終点８ｈとする検査回路Ｃを形成してなるものである。 Further, the remaining printed circuit boards 3d and 3h that do not form the two inspection circuits A and B are provided with one of the extension circuits 4d and 4h, and the extension circuits 4e and 4g connected to form the inspection circuit A. An inspection land 6d formed over the extended circuit 5d of the printed circuit board circuit 3d and extending over the extended circuit 5d as the starting point 7d, and an inspection land 6h formed in the extended circuit 5h of the printed circuit board circuit 3h as the end point 8h The circuit C is formed.

図６は、図５に示すプリント基板回路の電気検査用回路形成において、基板材料１に２６本のプリント基板回路３ａ、３ｂ・・・３ｚが形成されているもので、その上端側から下端側に連続し、かつ隣接するプリント基板回路を別の検査用回路とする長い検査用回路Ａ、Ｂを形成し、この検査用回路Ａ、Ｂを構成しないプリント基板回路からなる二つの別異の検査用回路Ｃ、Ｄを形成してなる配列例である。 6 shows a circuit board material 1 in which 26 printed circuit boards 3a, 3b,... 3z are formed in the circuit formation for electrical inspection of the printed circuit board shown in FIG. And two different inspections composed of printed circuit boards that do not constitute the inspection circuits A and B. The inspection circuits A and B are formed in a long manner. This is an arrangement example in which the circuits C and D are formed.

検査用回路Ａを形成する９本のプリント基板回路３ａ、３ｅ、３ｇ、３ｋ、３ｍ、３ｑ、３ｓ、３ｗ、３ｙは、一端側の２本の延長回路４ａと４ｅ，４ｇと４ｋ、４ｍと４ｑ、４ｓと４ｗおよび他端側の２本の延長回路５ｅと５ｇ、５ｋと５ｍ、５ｑと５ｓ、５ｗと５ｙとを直列的に結線して、プリント基板回路３ａの延長回路５ａの端部の検査用ランド６ａを起点７ａとし、プリント基板回路３ｙの延長回路４ｙの端部の検査用ランド６ｙを終点８ｙとして回路形成される。 The nine printed circuit boards 3a, 3e, 3g, 3k, 3m, 3q, 3s, 3w, and 3y that form the inspection circuit A have two extension circuits 4a and 4e, 4g, 4k, and 4m on one end side. 4q, 4s and 4w, and two extension circuits 5e and 5g, 5k and 5m, 5q and 5s, 5w and 5y on the other end side are connected in series, and the end of the extension circuit 5a of the printed circuit board circuit 3a The circuit is formed with the inspection land 6a as the starting point 7a and the inspection land 6y at the end of the extension circuit 4y of the printed circuit board 3y as the end point 8y.

検査用回路Ｂを形成する９本のプリント基板回路３ｂ、３ｄ、３ｈ、３ｊ、３ｎ、３ｐ、３ｔ、３ｖ、３ｚは、上記検査用回路Ａに平行するように略同様に配列結線されるもので、一端側の２本の延長回路４ｂと４ｄ，４ｈと４ｊ、４ｎと４ｐ、４ｔと４ｖおよび他端側の２本の延長回路５ｄと５ｈ、５ｊと５ｎ、５ｐと５ｔ、５ｖと５ｚとを直列的に結線して、プリント基板回路３ｂの延長回路５ｂの端部の検査用ランド６ｂを起点７ｂとし、プリント基板回路３ｚの延長回路４ｚの端部の検査用ランド６ｚを終点６ｚとして回路形成される。 The nine printed circuit boards 3b, 3d, 3h, 3j, 3n, 3p, 3t, 3v, 3z forming the inspection circuit B are arranged and connected in substantially the same manner so as to be parallel to the inspection circuit A. Then, two extension circuits 4b and 4d, 4h and 4j, 4n and 4p, 4t and 4v on one end side, and two extension circuits 5d and 5h, 5j and 5n, 5p and 5t, 5v and 5z on the other end side Are connected in series, the inspection land 6b at the end of the extension circuit 5b of the printed circuit board circuit 3b is the starting point 7b, and the inspection land 6z at the end of the extension circuit 4z of the printed circuit board circuit 3z is the end point 6z. A circuit is formed.

検査用回路Ｃは、４本のプリント基板回路３ｃ、３ｉ、３ｏ、３ｕから形成され、検査用回路Ｂを形成する延長回路４ｂと４ｄ，４ｈと４ｊ、４ｎと４ｐ、４ｔと４ｖの結線に囲繞される延長回路４ｃ、４ｉ、４ｏ、４ｕの端部を検査用ランド６ｃ、６ｉ、６ｏ、６ｕとして、この検査用ランド６ｃ、６ｉ、６ｏを始点７ｃ、７ｉ、７ｏとし、検査用ランド６ｕを終点８ｕとし、他方の延長回路５ｃ、５ｉ、５ｏ、５ｕは、検査用回路Ａ、Ｂの回路形成の外側で直列的に結線されて回路形成されている。 The inspection circuit C is formed of four printed circuit boards 3c, 3i, 3o, and 3u, and is connected to the extension circuits 4b and 4d, 4h and 4j, 4n and 4p, and 4t and 4v that form the inspection circuit B. The ends of the extended circuits 4c, 4i, 4o, and 4u surrounded are designated as inspection lands 6c, 6i, 6o, and 6u. The inspection lands 6c, 6i, and 6o are designated as starting points 7c, 7i, and 7o. The other extension circuits 5c, 5i, 5o, and 5u are connected in series outside the circuit formation of the inspection circuits A and B to form a circuit.

検査用回路Ｄは、４本のプリント基板回路３ｆ、３ｌ、３ｒ、３ｘから形成され、その配列構成は検査用回路Ｃと同様で、検査用回路Ａを形成する延長回路５ｅと５ｇ、５ｋと５ｍ、５ｑと５ｓ、５ｗと５ｙの結線に囲繞される延長回路５ｆ、５ｌ、５ｒ、５ｘの端部を検査用ランド６ｆ、６ｌ、６ｒ、６ｘとして、この検査用ランド６ｆ、６ｌ、６ｒを始点７ｆ、７ｌ、７ｒとし、検査用ランド６ｘを終点８ｘとし、他方の延長回路４ｆ、４ｌ、４ｒ、４ｘは、検査回路Ａ、Ｂの回路形成の外側で直列的に結線されて回路形成されている。 The inspection circuit D is formed of four printed circuit boards 3f, 3l, 3r, and 3x. The arrangement configuration is the same as the inspection circuit C, and the extension circuits 5e, 5g, and 5k that form the inspection circuit A are provided. The ends of the extension circuits 5f, 5l, 5r, and 5x surrounded by the connections of 5m, 5q and 5s, 5w and 5y are designated as inspection lands 6f, 6l, 6r, and 6x, and the inspection lands 6f, 6l, and 6r are The starting points 7f, 7l, and 7r are set, the inspection land 6x is set as the end point 8x, and the other extension circuits 4f, 4l, 4r, and 4x are connected in series outside the circuit formation of the inspection circuits A and B to form a circuit. ing.

以上においては、基板材料１の片面にプリント基板回路３ａ、３ｂ・・・を形成した例で説明したが、これに限らず両面にプリント基板回路３ａ、３ｂ・・・形成したもの、あるいは、多層構造や部品実装用のプリント基板回路３ａ、３ｂ・・・をもつ基板材料１であっても、上記の検査用回路Ａ、Ｂ・・・が形成可能なであれば適用することができる。また、基板材料１から型抜きした後のプリント基板単体であっても、端子部に接続するコネクターなどに上記回路設定を行えば、同様に効率的な検査回路Ａ、Ｂ・・・を形成することができるものである。 In the above description, the printed board circuits 3a, 3b,... Are formed on one side of the board material 1. However, the present invention is not limited to this, and the printed board circuits 3a, 3b,. Even the substrate material 1 having the printed circuit boards 3a, 3b,... For structure and component mounting can be applied as long as the above-described inspection circuits A, B,. Further, even if the printed circuit board is single-cut from the substrate material 1, if the above circuit setting is performed on the connector connected to the terminal portion, the efficient inspection circuits A, B. It is something that can be done.

少なくとも２つの検査用回路を形成してなるプリント基板回路の電気的検査用回路を示す模式図である。 It is a schematic diagram which shows the circuit for an electrical test | inspection of the printed circuit board circuit formed by forming at least 2 circuit for a test | inspection. 同じく３つの検査回路を形成してなるプリント基板回路の電気的検査用回路を示す模式図である。 It is a schematic diagram which shows the circuit for an electrical test | inspection of the printed circuit board circuit similarly formed of three test | inspection circuits. 同じく６つの検査回路を形成してなるプリント基板回路の電気てき検査用回路を示す模式図である。 It is a schematic diagram which shows the circuit for an electric wire inspection of the printed circuit board circuit similarly formed of six inspection circuits. 少なくとも２つの検査回路からなる検査回路群を形成してなるプリント基板回路の電気的検査用回路を示す模式図である。 It is a schematic diagram showing a circuit for electrical inspection of a printed circuit board circuit formed by forming an inspection circuit group consisting of at least two inspection circuits. 一つの検査用回路と残余のプリント基板回路に形成される検査用回路を含むプリント基板回路の電気的検査用回路形成を示す模式図である。 It is a schematic diagram showing the circuit formation for electrical inspection of the printed circuit board circuit including the inspection circuit formed in one inspection circuit and the remaining printed circuit board circuit. 同じく２つの検査用回路と残余のプリント基板回路に形成される検査用回路を含むプリント基板回路の電気的検査用回路を示す模式図。 The schematic diagram which shows the circuit for an electrical test | inspection of the printed circuit board circuit similarly including the circuit for a test | inspection formed in two inspection circuits and the remaining printed circuit board circuits. 検査装置を示す略示図である。 It is a schematic diagram showing an inspection device. 従来のプリント基板回路の電気てき検査用回路の一例を示す模式図である。 It is a schematic diagram which shows an example of the circuit for an electric leakage inspection of the conventional printed circuit board circuit.

Explanation of symbols

１基板材料
２基板材料１の余白部分
３、３ａ、３ｂ・・・３ｚプリント基板回路
４、４ａ、４ｂ・・・４ｚプリント基板回路３の一方の延長回路
５、５ａ、５ｂ・・・５ｚプリント基板回路３の他方の延長回路
６、６ａ、６ｂ・・・６ｚ検査用ランド
７、７ａ、７ｂ・・・７ｚ起点
８、８ａ、８ｂ・・・８ｚ終点
１０検査装置
１１検査用冶具
１２接触ピン
Ａ、Ｂ・・・Ｆ検査回路DESCRIPTION OF SYMBOLS 1 Board | substrate material 2 Margin part of board | substrate material 1 3, 3a, 3b ... 3z Printed circuit board circuit 4, 4a, 4b ... 4z One extension circuit of the printed circuit board circuit 5, 5a, 5b ... 5z Print The other extension circuit of the substrate circuit 3, 6, 6a, 6b,... 6z, the inspection lands 7, 7, a, 7b,... 7z, the starting point 8, 8, a, 8b,. A, B ... F Inspection circuit

Claims

Extension circuits are extended from both terminals of a plurality of printed circuit boards formed on the substrate material, and the extension circuits provided at both ends of the printed circuit board are connected to different inspection circuits on adjacent printed circuit boards. The extension circuit of the printed circuit board circuit, which is the starting end, is connected to form the starting end of the inspection land, and the extended circuit of the printed circuit board, which is the end portion, is the end point of the inspection land. An electrical inspection of a printed circuit board characterized by forming at least two or more different loop-shaped inspection circuits in contact with the provided contact pins so that adjacent printed circuit boards of the substrate material do not cooperate Circuit.

Extending each extension circuit from both ends of the printed circuit board circuit formed in the substrate material,
The extension circuit provided at both ends of this printed circuit board circuit is connected in series to the extension circuit of the terminal of another printed circuit board circuit every other or every other non-adjacent,
Similarly, an extension circuit provided at the other end of the printed circuit board circuit is connected in series to an extension circuit of every other one or a plurality of other printed circuit board terminals that are not adjacent to each other, and is formed of a plurality of printed circuit boards. Forming one test circuit,
Subsequently, the extension circuit of the adjacent printed circuit board circuit is sequentially repeated and connected in series to form another inspection circuit, and the inspection circuit formed on the adjacent printed circuit board circuit is a different inspection circuit. ,
The extension circuit of the printed circuit board circuit as the start end is the starting point of the inspection land, and the extension circuit of the printed circuit board circuit as the end is the end point of the inspection land,
A method for forming an electrical inspection circuit for a printed circuit board, comprising forming at least two or more different inspection circuits on the circuit board of the printed circuit board.

In a plurality of printed circuit boards formed on a substrate material, starting from an inspection land formed at a terminal of an extended circuit extended from one terminal of the printed circuit board located at a substantially intermediate portion, at a side end portion A plurality of extension circuits are connected in a certain direction with an inspection land formed at an end of an extension circuit extending from the other end of the printed circuit board being positioned as an end point, and an inspection circuit is connected to the plurality of circuit boards. 3. The method of forming a circuit for electrical inspection of a printed circuit board circuit according to claim 2, wherein at least two or more are formed such that adjacent printed circuit boards do not become the same circuit for inspection.

In a plurality of printed circuit boards formed in the substrate material, starting from the inspection land of the terminal of the extended circuit extending from one terminal of the printed circuit board located on one end side of the substrate material, With the inspection land of the terminal of the extended circuit extended from the terminal of the printed circuit board circuit located on the opposite side end side as the end point, the adjacent printed circuit board circuit is removed and the extended circuit of each printed circuit board circuit is connected, An extension circuit provided at a terminal of another printed circuit board that forms one inspection circuit and does not form the one inspection circuit is connected to an extension circuit of the printed circuit board that forms the one inspection circuit. 3. A method for forming an electrical inspection circuit for a printed circuit board circuit according to claim 2, wherein the other inspection circuit is formed by connecting the wires so as not to cross each other.

3. An inspection circuit group, which is at least two or more different inspection circuits in which adjacent printed circuit boards do not cooperate, is formed in parallel on a plurality of printed circuit boards formed on a substrate material. A method for forming a circuit for electrical inspection of a printed circuit board circuit according to claim.