JP2006275612A5 - - Google Patents

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Publication number
JP2006275612A5
JP2006275612A5 JP2005091990A JP2005091990A JP2006275612A5 JP 2006275612 A5 JP2006275612 A5 JP 2006275612A5 JP 2005091990 A JP2005091990 A JP 2005091990A JP 2005091990 A JP2005091990 A JP 2005091990A JP 2006275612 A5 JP2006275612 A5 JP 2006275612A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005091990A
Other languages
Japanese (ja)
Other versions
JP4518494B2 (en
JP2006275612A (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2005091990A priority Critical patent/JP4518494B2/en
Priority claimed from JP2005091990A external-priority patent/JP4518494B2/en
Priority to TW094145474A priority patent/TWI271505B/en
Priority to CNB200610005927XA priority patent/CN100507530C/en
Priority to KR1020060006935A priority patent/KR100660400B1/en
Publication of JP2006275612A publication Critical patent/JP2006275612A/en
Publication of JP2006275612A5 publication Critical patent/JP2006275612A5/ja
Application granted granted Critical
Publication of JP4518494B2 publication Critical patent/JP4518494B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2005091990A 2005-03-28 2005-03-28 Land pattern inspection method and inspection apparatus Expired - Fee Related JP4518494B2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005091990A JP4518494B2 (en) 2005-03-28 2005-03-28 Land pattern inspection method and inspection apparatus
TW094145474A TWI271505B (en) 2005-03-28 2005-12-21 Method for examining land pattern and apparatus for examining the same
CNB200610005927XA CN100507530C (en) 2005-03-28 2006-01-19 Welding disk pattern inspection method and inspection device
KR1020060006935A KR100660400B1 (en) 2005-03-28 2006-01-23 Land pattern inspection method and apparatus therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005091990A JP4518494B2 (en) 2005-03-28 2005-03-28 Land pattern inspection method and inspection apparatus

Publications (3)

Publication Number Publication Date
JP2006275612A JP2006275612A (en) 2006-10-12
JP2006275612A5 true JP2006275612A5 (en) 2008-03-06
JP4518494B2 JP4518494B2 (en) 2010-08-04

Family

ID=37030156

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005091990A Expired - Fee Related JP4518494B2 (en) 2005-03-28 2005-03-28 Land pattern inspection method and inspection apparatus

Country Status (4)

Country Link
JP (1) JP4518494B2 (en)
KR (1) KR100660400B1 (en)
CN (1) CN100507530C (en)
TW (1) TWI271505B (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5234639B2 (en) * 2009-01-31 2013-07-10 株式会社メガトレード Through-hole inspection equipment
CN101995223B (en) * 2009-08-25 2013-05-08 比亚迪股份有限公司 Chip appearance detection method and system
CN102595024B (en) * 2011-12-16 2014-10-22 飞狐信息技术（天津）有限公司 Method and device for restoring digital video images
CN104020222B (en) * 2014-06-18 2016-06-22 长春光华微电子设备工程中心有限公司 Fully-automatic supersonic aluminum wire press welder weld quality prediction system
CN104535587A (en) * 2014-12-23 2015-04-22 安徽科鸣三维科技有限公司 PCBA solder joint inspection method based on machine vision
JP6496159B2 (en) * 2015-02-23 2019-04-03 株式会社Ｓｃｒｅｅｎホールディングス Pattern inspection apparatus and pattern inspection method
TWI521476B (en) * 2015-04-17 2016-02-11 銘傳大學 Automatic optical inspection method of periodic patterns
CN106651989B (en) * 2016-12-21 2020-04-21 北京信息科技大学 Nested circle fitting method and device for micro-hole centering
CN109950165B (en) * 2019-02-19 2021-06-04 长江存储科技有限责任公司 Test structure and test method
CN118070749B (en) * 2024-04-17 2024-07-23 淄博芯材集成电路有限责任公司 Substrate shrinkage method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01269035A (en) * 1988-04-21 1989-10-26 Ibiden Co Ltd Instrument for inspecting printed circuit board
JP2001267722A (en) * 2000-03-23 2001-09-28 Ngk Spark Plug Co Ltd Method for inspecting printed wiring board
JP3589424B1 (en) * 2003-12-22 2004-11-17 株式会社メガトレード Board inspection equipment

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