JP2006179120A - Voltage fluctuation device, program inspecting system and program inspecting method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a voltage fluctuation device which is useful to investigate the cause of a failure by artificially generating a failure condition during data writing and to provide a program inspecting system and a program inspecting method. <P>SOLUTION: The voltage fluctuation device is connected to an electronic equipment, which incorporates a nonvolatile memory and executes a data restoration program when data destruction of the nonvolatile memory is generated by voltage fluctuation during data writing into the nonvolatile memory, through a computer, in which condition setting is conducted for voltage fluctuation control to fluctuate the necessary voltage for data writing. The voltage fluctuation device fluctuates the necessary voltage which is required to inspect the operating condition of the data restoration program and has a control means to conduct the voltage fluctuation control with a prescribed timing starting from the data writing based on the setting data of the voltage fluctuation control received from the computer. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a voltage fluctuation device and program for verifying the operation status of a data restoration program executed when data destruction occurs due to voltage fluctuation during reading and writing of a nonvolatile memory such as an EEPROM stored in a recording medium. The present invention relates to an inspection system and a program inspection method.

  Conventionally, products such as an IC card, a cellular phone, and a digital camera that use a nonvolatile memory such as an EEPROM as a storage element or a recording medium have some reason for writing and reading data to and from the nonvolatile memory included in the recording medium. In preparation for when data supply or data reading fails due to insufficient power supply, a data destruction program for repairing data that has been destroyed due to the failure is incorporated. In particular, in a product or apparatus provided with an EEPROM, the quality can be remarkably enhanced by providing an EEPROM data restoration program.

As an example of the prior art, there is an “IC card failure determination method and apparatus” that can automatically determine the failure of an IC card that has been claimed as a failure in a short time (see, for example, Patent Document 1). Further, there is a “non-contact type IC card failure determination method and apparatus” that can automatically determine a failure of a non-contact type IC card in a short time (see, for example, Patent Document 2).
JP-A-8-338855 Japanese Patent Laid-Open No. 10-288643

  In order to investigate the cause of failure of electrical appliances, IC cards, etc., it is necessary to reproduce the same situation as at the time of failure and analyze the operation of the repair function such as EEPROM. However, there are various use situations of the IC card, and the same situation as at the time of failure cannot be easily reproduced, and it has been difficult to verify whether the repair program is functioning correctly.

  On the other hand, the inventions described in Patent Documents 1 and 2 as the prior art examples are limited to determining the failure of the IC card, and verify whether the repair function such as the EEPROM after the card failure is functioning correctly. It is not possible.

  Based on the above, whether the restoration function of the EEPROM after failure is functioning properly by operating the power supply and changing the supply voltage to reproduce the failure situation during the writing or reading of the recording medium. There was no device, system, or method to verify.

  Therefore, for example, assuming voltage fluctuations during data writing as the cause of failure of a recording medium such as a broken IC card, the cause of the failure is investigated by artificially creating a failure situation due to voltage fluctuation (including power-off). Technology that is useful for the future is desired.

  The present invention has been made in view of the above circumstances, and the power supply necessary for data writing is operated between an electric appliance, an IC card, and a reader / writer to vary the voltage. It is an object of the present invention to provide a voltage fluctuation device, a program inspection system, and a program inspection method capable of confirming the operation of a data restoration program after the data or the environment is surely destroyed by creating a factor or environment.

  In order to achieve this object, the invention according to claim 1 includes a nonvolatile memory, and the data is restored when the data in the nonvolatile memory is destroyed due to voltage fluctuation during the data writing to the nonvolatile memory. The data device is connected to the electronic device that executes the program and the computer in which the voltage fluctuation control condition setting for varying the voltage required for data writing is relayed to check the operation status of the data restoration program. A voltage fluctuation device that fluctuates a voltage required for data loading, and has control means for performing voltage fluctuation control at a predetermined timing from the start of data writing based on voltage fluctuation control setting data received from a computer. It is characterized by.

  The invention described in claim 2 includes a non-volatile memory, and a recording medium that executes a data restoration program when data in the non-volatile memory is destroyed due to voltage fluctuation during data writing to the non-volatile memory; Operation status of the data restoration program connected via a relay between a recording medium and a reader / writer device that reads and writes data and a computer that sets voltage fluctuation control conditions that vary the voltage required for data writing A voltage fluctuation device that fluctuates the voltage required for data writing to check the voltage fluctuation control at a predetermined timing from the start of data writing based on the voltage fluctuation control setting data received from the computer. It has the control means to perform, It is characterized by the above-mentioned.

  According to a third aspect of the present invention, in the second aspect of the present invention, there is provided signal converting means for converting a digital signal received from the control means into an analog signal, and data flowing between the recording medium and the reader / writer device by the control signal of the control means. And a level / direction changing means for receiving a voltage from the signal conversion means and the reader / writer device, and the control means includes setting data for voltage fluctuation control received from the computer, and a reader / writer device. Is generated based on the voltage received from the transmitter, and the variable voltage data is transmitted as a digital signal to the signal conversion means. The signal conversion means converts the received digital signal into an analog signal to change the fluctuation voltage data. Is transmitted to the level / direction changing means, and the fluctuation voltage from the signal converting means is transferred to the recording medium via the level / direction changing means. Characterized in that it is Shin.

  According to a fourth aspect of the present invention, in the second aspect of the present invention, the control means is configured such that the recording medium receives the command data after the completion of reception of the command data transmitted from the reader / writer device to the recording medium based on the setting in the computer. Measures the response time, which is the time it takes for response data to be sent to the reader / writer device, to inform the reader / writer device that the processing based on has been completed. It is characterized by performing.

  The invention according to claim 5 is the invention according to claim 4, wherein the control means determines the order in which the command data is received, and measures the response time of the commands in a predetermined order.

  The invention described in claim 6 is characterized in that, in the invention described in claim 4 or 5, the same operation is continuously performed while shifting the timing of performing the voltage fluctuation control based on the response time.

  The invention according to claim 7 includes an electronic device that includes a non-volatile memory, and executes a data restoration program when data in the non-volatile memory is destroyed due to voltage fluctuation during data writing to the non-volatile memory; Connects a computer in which conditions for voltage fluctuation control for changing the voltage required for data writing are set, and a voltage fluctuation device for changing the voltage required for data writing in order to check the operation status of the data restoration program The voltage variation apparatus includes a control unit that performs voltage variation control at a predetermined timing from the start of data writing based on the voltage variation control setting data received from the computer. Program inspection system.

  The invention according to claim 8 includes a non-volatile memory, a recording medium that executes a data repair program when data in the non-volatile memory is destroyed due to voltage fluctuation during data writing to the non-volatile memory, A reader / writer device that reads data from and writes data to a recording medium, a computer in which voltage fluctuation control conditions for changing the voltage required for data writing are set, and a data document for inspecting the operation status of the data restoration program And a voltage fluctuation device that fluctuates a voltage required for loading, wherein the voltage fluctuation device is predetermined from the start of data writing based on voltage fluctuation control setting data received from a computer. It has the control means which performs voltage fluctuation control at the timing of.

  According to a ninth aspect of the present invention, in the eighth aspect of the present invention, the voltage fluctuation device includes a signal conversion unit that converts a digital signal received from the control unit into an analog signal, and a recording medium and a reader / writer according to the control signal of the control unit. And a level conversion unit for determining a direction of data flowing between the devices and receiving a voltage from the signal conversion unit and the reader / writer device, and the control unit receives the setting data of the voltage fluctuation control received from the computer. And fluctuating voltage data is newly generated based on the voltage received from the reader / writer device, and the fluctuating voltage data is transmitted as a digital signal to the signal converting means. The signal converting means converts the received digital signal into an analog signal. Then, the fluctuation voltage is transmitted to the level / direction changing means, and the fluctuation voltage from the signal converting means is sent to the level / direction changing means. Characterized in that it is sent to the recording medium by.

  According to a tenth aspect of the present invention, in the ninth aspect of the invention, the control means is configured such that the recording medium receives the command data from the end of reception of the command data transmitted from the reader / writer device to the recording medium based on the setting in the computer. Measure response time, which is the time until response data telling the completion of processing based on the response start time to the reader / writer device, and perform voltage fluctuation control at a predetermined timing with reference to the response time To do.

  According to an eleventh aspect of the present invention, in the invention according to the tenth aspect, the control means determines the order in which the command data is received, and measures the response time of the commands in the predetermined order.

  The invention described in claim 12 is characterized in that, in the invention described in claim 10 or 11, the same operation is continuously performed while shifting the timing of performing the voltage fluctuation control based on the response time.

  The invention according to claim 13 includes an electronic device that has a built-in nonvolatile memory, and executes a data restoration program when data in the nonvolatile memory is destroyed due to voltage fluctuation during data writing to the nonvolatile memory. Connects a computer in which voltage fluctuation control conditions for changing the voltage required for data writing are set, and a voltage fluctuation device for changing the voltage required for data writing in order to check the operation status of the data restoration program In this case, the voltage fluctuation control is performed at a predetermined timing from the start of data writing based on the voltage fluctuation control setting data received from the computer by the voltage fluctuation device.

  According to a fourteenth aspect of the present invention, there is provided a recording medium that includes a non-volatile memory, and executes a data restoration program when data in the non-volatile memory is destroyed due to voltage fluctuation during data writing to the non-volatile memory; A reader / writer device that reads data from and writes data to a recording medium, a computer in which voltage fluctuation control conditions for changing the voltage required for data writing are set, and a data document for inspecting the operation status of the data restoration program And a voltage variation device that varies the voltage required for the data loading, the program inspection method comprising the steps of starting data writing based on the voltage variation control setting data received from the computer by the voltage variation device Voltage fluctuation control is performed at a predetermined timing.

  According to a fifteenth aspect of the invention, in the fifteenth aspect of the invention, the voltage fluctuation device newly adds fluctuation voltage data based on the voltage fluctuation control setting data received from the computer and the voltage received from the reader / writer device. The fluctuation voltage data is generated as a digital signal, the digital signal is converted into an analog signal, and then the fluctuation voltage is transmitted to a recording medium.

  According to a sixteenth aspect of the present invention, in the fifteenth aspect of the present invention, the recording medium is controlled by the voltage fluctuation device after completion of reception of command data transmitted from the reader / writer device to the recording medium based on the setting in the computer. Measures the response time, which is the time it takes for response data to notify that the processing based on the data has ended to the reader / writer device, and changes the voltage at a predetermined timing (from 0 to infinity) with reference to the response time. Control is performed.

  The invention described in claim 17 is characterized in that, in the invention described in claim 16, the order in which the command data is received is determined by the voltage fluctuation device, and the response time of the commands in the predetermined order is measured.

  The invention described in claim 18 is characterized in that, in the invention described in claim 16 or 17, the same operation is continuously performed while shifting the timing of performing the voltage fluctuation control based on the response time.

  The invention according to claim 19 is the invention according to any one of claims 13 to 18, wherein the low voltage is applied for a time longer than at least 0.01 seconds during the data writing to the nonvolatile memory. To do.

  According to the present invention, in order to artificially destroy data on a recording medium, it is characterized by creating a failure situation due to voltage fluctuation during data writing, so it can assist in investigating the cause of data destruction and product development It is possible to obtain the necessary information for software development and to verify whether the software can perform recovery operations as designed during software development, thereby contributing to improvement in development quality. .

  The best mode for carrying out the present invention will be described below in detail with reference to the accompanying drawings.

The program inspection system of this embodiment will be described below.
As shown in FIG. 1, the program inspection system of this embodiment includes a voltage fluctuation device 1, a PC 2 that is an information processing device such as a personal computer, a contact IC card 3, and an R / W that reads and writes the IC card. Device 4. In the present embodiment, when various parameters are set by the user in the PC 2, the voltage supplied from the voltage changing device 1 to the IC card 3 is controlled to change based on the setting.

  The voltage fluctuation device 1 includes a card insertion slot into which the IC card 3 is inserted, and an interface for transmitting and receiving data to and from the IC card 3 and the R / W device 4. The IC card 3, the R / W device 4, The transmission / reception of data and signals indicated by arrows in FIG. The voltage fluctuation device 1 has an interface connected to the PC 2, and is connected to, for example, an RS232C cable or the like, and has a CPU board 5 that inputs and outputs data from the R / W device 4. The CPU board performs determination processing related to data writing and control processing based on the determination.

  In addition, the voltage fluctuation device 1 includes a reset button for initializing the device, an LED for displaying an on / off state of the power supply of the device itself, and the like on the device surface (none of which are shown).

  The R / W device 4 originally performs data writing and data reading directly to the IC card 3, but in this embodiment, a board is inserted in the card slot instead of the IC card, and the voltage fluctuation device 1 is connected.

  The IC card 3 is a recording medium that stores a program for self-repairing data when the data is broken, and executes the program by an OS installed therein. In this embodiment, an IC card will be described as an example, but the present invention is not limited to this as long as it is a recording medium storing a data restoration program.

  Although the present embodiment has been described using an IC card, the present invention is applied to electrical appliances and electronic devices having an EEPROM instead of an IC card, such as a portable terminal, a digital camera, a telephone, a FAX, a television, a remote controller, and an air conditioner. You can also In that case, the voltage fluctuation device 1 has an interface for transmitting and receiving data to and from the electronic device, and an interface connected to the PC 2. Further, it has a CPU board 5 that is connected to a PC by, for example, an RS232C cable or the like and inputs / outputs data. The board CPU 5 performs determination processing for data writing and control processing based on the determination. On the other hand, the electronic device has a CPU that controls the EEPROM, which is a nonvolatile memory, and data that is executed when data in the nonvolatile memory is destroyed during data writing to the nonvolatile memory. Storage means for storing the repair program is provided.

The internal configuration of the voltage fluctuation device of this embodiment will be described in detail below.
As shown in FIG. 1, the voltage fluctuation device 1 includes a CPU board 5, a D / A circuit 6, a level / direction changing circuit 7, and low select circuits 8 and 9.

  The CPU board 5 receives parameter data set by the PC 2 (setting data including contents necessary for the control operation of the voltage fluctuation device 1). Based on the received parameter data and the voltage received from the R / W device 4 via the I / O line, the fluctuation voltage data is generated and transmitted to the D / A circuit 6 as a digital signal. Further, the CPU board 5 transmits a control signal for switching control of the E switches 19 and 20 of the level / direction changing circuit 7.

  The D / A circuit 6 converts the digital signal received from the CPU board 5 into an analog signal, and transmits the fluctuation voltage to the level / direction changing circuit 7. The analog-converted variable voltage is also transmitted to the row select circuits 8 and 9.

  The level / direction changing circuit 7 includes two E switches 19 and 20 and a row select circuit 10 as shown in FIG. The level / direction changing circuit 7 selects a lower voltage level from among the voltages from the D / A circuit 6 and the R / W device 4 by the row select circuit 10 and outputs a control signal from the CPU board 5. Based on this, the direction of data between the R / W device 4 and the IC card 3 is switched by the E switches 19 and 20.

  As shown in FIG. 1, the row select circuits 8 and 9 are provided to correspond to the reset signal and the clock signal, respectively. FIG. 2 shows the configuration of the row select circuit. These row select circuits have a function of selecting a lower voltage among the voltages from the D / A circuit 6 and the R / W device 4 in order to match the voltages flowing in other circuits. FIG. 9 shows the input and output characteristics of the low select circuit. The output V0 is always equal to the lower of the input V1 or V2. For example, in FIG. 2, when the voltage level in the low select circuit is V2 ≧ V1, V1 is selected as the voltage flowing through V0. Therefore, even when the voltage fluctuates, the voltage flowing through the apparatus is unified. The row select circuit 10 of the level / direction changing circuit 7 has the same function as the row select circuits 8 and 9.

  Next, with reference to FIG. 4, the operation principle of the voltage control of the voltage fluctuation device which is an embodiment of the present invention will be described.

  FIG. 4 is an image diagram showing a waveform of signal data flowing through the I / O line. ATR (Answer To Reset) is data that flows from the card when the card is inserted into the reader / writer, indicates that the card can receive commands, and transmits basic information of the card to the reader / writer. The CMD (command) is data sent from the reader / writer to the IC card, and the IC card performs an instructed process based on this CMD. The RSP (response) is data for returning to the reader / writer that the card has completed the commanded process. Here, the time from the end of command reception until the start of response is defined as the response time.

  In the voltage fluctuation device according to the present embodiment, there are data flowing through the I / O line where the data is high among the data of ATR, CMD, and RSP. Determine if the CMD is coming. Then, the response time in which the FF data whose data waveform is all 8 bits high is recognized as the voltage fluctuation timing. However, since there is a card in which FF data is output even during reception of ATR, in this case, the data is read 8 times bit by bit, and after the 9th read, it is determined whether the FF data is obtained.

  FIG. 8 shows an image of response time data. If the writing operation of the EEPROM is analyzed in time series, it can be decomposed into three stages as shown in FIG. t1 is the end of command data reception, that is, the start of data writing, and t4 is the start of response data transmission, that is, the end of writing. For example, when command data for data writing is sent from the reader / writer to the IC card, the data writing start stage is from t1 to t2, and the data writing preparation stage is from t2 to t3. Further, the period from t3 to t4 is the end stage of data writing. In addition, data between t1 and t2 is old data, data between t2 and t3 is FF data, and data between t3 and t4 is new data.

  In the start stage, the data in the EEPROM is unchanged, and in the preparation stage, the data in the EEPROM is cleared to FF in order to write new data, and new data is written only in the end stage. Thus, if the voltage supply becomes insufficient in the preparation stage of t2-t3, the data in the EEPROM is neither old data nor new data.

  From the above, for example, if the power supply is reduced between t2 and t3 and the writing operation of the CPU is interrupted, the FF data remains, and the card cannot be used as the data has been falsified. The voltage fluctuation device according to the embodiment of the present invention dares to perform voltage fluctuation control at the timing between t2 and t3.

  The operation of the voltage fluctuation device according to this embodiment will be described below with reference to FIG.

  In this embodiment, the user sets the conditions for each verification of how many times the CMD is received after the power supply is operated, so that the power supply is operated at an appropriate timing to perform voltage fluctuation control. First, the parameters of the CPU board 5 are initialized (step S1), and the E switch is turned on so that the ATR can be received (step S2). The CPU board 5 determines whether various parameter data set by the user has been received from the PC (step S3). Then, when the user presses a “start” button on the PC screen shown in FIG. 7, data indicating successful reception of the parameter data is transmitted to the R / W device 4 (step S4). As shown in FIG. 7, when the automatic restart setting column 22 for automatically setting the timing is checked by the PC, the same operation is continuously performed while gradually shifting the timing until the data is destroyed. Done. In the range where the timing is shifted, the timing is automatically calculated in units of +0.1 s from the set power supply operation timing to the response time.

  Next, whether the reset signal from the R / W device 4 is 1 (high) (step S5), whether data from the I / O line is received (low) (step S6). After the CPU board 5 sequentially determines whether or not 50 μs has elapsed (step S7), the interrupter 1 is initialized (step S8). The initialization of the interrupter 1 makes a processing request to the CPU every 104 μs. In the case of this embodiment, since 1-bit data is 104 μsec, the interrupter 1 starts from about 50 μsec, which is about half of that.

  After initialization, it is determined whether or not ATR reception is completed (step S9). If ATR reception is completed (step S9 / YES), the E switches 19 and 20 are switched (step S10), and the R / W device The data is allowed to flow from 4 to the IC card 3. Then, it is determined whether the command signal or the response signal has ended (step S11). If it has ended (step S11 / YES), the state of the E switch is switched again (step S12).

  Next, the command value of the target value (see 13 in FIG. 7) set by the PC is the command (step S13), and the mode (see 15 and 21 in FIG. 7) is the power operation mode. Whether or not (step S14). If it is not the power supply operation mode (15 in FIG. 7) (step S14 / NO), since the response measurement mode (15 in FIG. 7) is set, the response time is measured (step S18), and the result is PC. To the user (step S17), and the process is restarted (step S1). If it is in the power operation mode (step S14 / YES), the time of the target value set by the PC (14 in FIG. 7) is confirmed (step S15), and the set power operation pattern (16, 17 in FIG. 7) is confirmed. , 18), voltage fluctuation control of the D / A circuit is performed (step S16). After voltage fluctuation, the result is transmitted to the PC (step S17).

  After the voltage fluctuation is completed, the user removes the IC card 3 from the voltage fluctuation device, or removes the board from the R / W device 4 and inserts the IC card 3 into the R / W device 4 to confirm whether or not the operation is normal. Check out. At this time, if the card can be used normally, it can be confirmed that the data restoration program of the IC card has been normally operated after the voltage fluctuation. As another confirmation method, it can also be confirmed by restarting when the time set in the operation time setting field 18 shown in FIG.

  FIG. 7 shows a PC setting screen in this embodiment. After connecting the voltage fluctuation device to the PC using the RS232C cable, the user turns on the voltage fluctuation device and resets it with the reset button. Then, “IC Card Tester” which is application software is started on the PC side. After startup, the screen shown in FIG. 7 is displayed. In the case of automatic restart, the reset operation is executed by a command from the PC.

  On the displayed PC screen, the user first inputs the port ID to which the cable is connected in the port ID setting field 11 in order to select and set the RS232C channel. Next, a predetermined value is input to the command transmission completion determination condition setting field 12, and the position of the target command to be verified is input numerically. Next, one of the modes is selected in the response time measurement mode setting field 15 for measuring the response time or the power operation mode setting field 21. When the power operation mode is selected, the power operation timing is input to the power operation timing setting field 14. Further, what kind of pattern is set is set in the operation pattern setting field 16, and more detailed power supply operation contents are inputted in the operation voltage setting field 17 and the operation time setting field 18.

  Here, the power supply operation mode will be described with reference to FIG. 6A to 6D, the vertical axis represents voltage, the horizontal axis represents time, and the voltage fluctuation state in the operation pattern is shown. In the present embodiment, the following four operation patterns can be set, but the present invention is not limited to these.

  FIG. 6A shows a voltage fluctuation state when a pattern for reducing the voltage level is selected. When this pattern is set, the voltage fluctuation device reduces the voltage 5V required for data writing to 1V or less (for example, within a range of 0.1V to 0.3V) at a predetermined timing based on the setting of the PC. Perform voltage fluctuation control. In this case, the time for applying a low voltage of 1 V or less is longer than 0.01 seconds. The reason is that if it is 0.01 seconds or less, there is a possibility that a data write failure state cannot be created. Therefore, in order to reliably create a data destruction state, it is preferable to apply a low voltage for a time of 1 second or more.

  FIG. 6B shows a voltage fluctuation state when the power-off pattern is selected. When this pattern is set, the voltage fluctuation device performs power-off control at a predetermined timing based on the setting of the PC, and sets the voltage 5V necessary for data writing to 0V.

  FIGS. 6C and 6D show voltage fluctuation states when a noise-giving pattern is selected. When this pattern is set, the voltage fluctuation device makes the voltage 5V necessary for data writing corrugated from a predetermined timing as shown in (c) or temporarily as shown in (d) based on the setting of the PC. To increase the voltage level. Therefore, the noise resistance performance of the IC card can be inspected with this operation pattern.

  Next, the response time measurement mode will be described. When the response time measurement mode 15 is set on the PC screen, the CPU board 5 determines the order in which the command data is received, and measures the response time based on the order. The response time measurement is repeated until the response time measurement is completed. In this embodiment, the response time refers to response data that informs the R / W device that the IC card has finished processing based on the command data after reception of command data transmitted from the R / W device to the IC card is completed. Indicates the time until reply starts.

  When the user presses the “start” button on the PC screen after the above settings are completed, the processing operation of the flowchart shown in FIG. 5 described above starts. Although not shown, a window screen for displaying the status of the tester may be displayed together with the setting screen of FIG.

  In the power supply operation mode, if the voltage fluctuation is successful, an error occurs on the reader / writer side. Therefore, the system can be restarted after appropriate error processing is performed. In the response time measurement mode, it can be restarted as it is.

  As described above, according to the present embodiment, the user manually sets parameters on the PC screen for verifying which response time after receiving the CMD is measured or operating the power supply. The user can set the desired conditions.

  As described above, according to the embodiment of the present invention, it is characterized by artificially creating a failure situation due to voltage fluctuation during data writing by setting the power operation and destroying the data on the recording medium. It is possible to assist in investigating the cause of data corruption, obtain information necessary for product development, and at the time of software development, it is possible to verify whether the software performs recovery operation as designed.

  Also, according to the embodiment of the present invention, it is possible to simulate a situation in which voltage fluctuation occurs during access to an IC card, so whether the card is broken, what kind of phenomenon occurs when it is broken, or the same phenomenon as other cards It can be used to check whether the card user is in trouble or not.

  As mentioned above, although the Example of this invention was described, it is not limited to the said Example, A various deformation | transformation is possible in the range which does not deviate from the summary.

It is a block diagram which shows the whole structure which concerns on the Example of this invention. It is a circuit diagram which shows the structure of the row select circuit based on the Example of this invention. It is a circuit diagram which shows the structure of the level and direction change circuit based on the Example of this invention. It is a figure which shows the received data in the voltage fluctuation apparatus which concerns on the Example of this invention. It is a flowchart which shows the inspection method which concerns on the Example of this invention. It is a figure which shows the pattern of the supply voltage which concerns on the Example of this invention. It is a figure which shows the parameter setting screen which concerns on the Example of this invention. It is a figure which shows the response time in the reception data of the voltage fluctuation apparatus which concerns on the Example of this invention. It is a figure which shows the voltage of the row selection circuit which concerns on the Example of this invention.

Explanation of symbols

1 Voltage fluctuation device 2 PC
3 IC card 4 R / W device 5 CPU board 6 D / A circuit 7 Level / direction changing circuit 8, 9, 10 Low select circuit 11 Port ID setting column 12 Command transmission completion judgment condition setting column 13 Command number setting column 14 Time Setting field 15 Response time measurement mode setting field 16 Operation pattern setting field 17 Operation voltage setting field 18 Operation time setting field 19, 20 E switch 21 Power supply operation mode setting field 22 Automatic restart setting field

Claims (19)

An electronic device that incorporates a non-volatile memory and executes a data restoration program when the data in the non-volatile memory is destroyed due to voltage fluctuations during data writing to the non-volatile memory;
A computer in which voltage fluctuation control condition setting for varying the voltage required for data writing is performed;
And a voltage fluctuation device that fluctuates a voltage necessary for the data writing in order to check the operation status of the data restoration program,
A voltage fluctuation device comprising: control means for performing voltage fluctuation control at a predetermined timing from the start of data writing based on the voltage fluctuation control setting data received from the computer. A non-volatile memory, and a recording medium that executes a data restoration program when the data in the non-volatile memory is destroyed due to voltage fluctuations during data writing to the non-volatile memory;
A reader / writer device for reading and writing data with the recording medium;
A computer in which voltage fluctuation control condition setting for varying the voltage required for data writing is performed;
And a voltage fluctuation device that fluctuates a voltage necessary for the data writing in order to check the operation status of the data restoration program,
A voltage fluctuation device comprising: control means for performing voltage fluctuation control at a predetermined timing from the start of data writing based on voltage fluctuation control setting data received from the computer. Signal conversion means for converting a digital signal received from the control means into an analog signal;
It further comprises a level / direction changing means for determining a direction of data flowing between the recording medium and the reader / writer device based on a control signal of the control means, and receiving a voltage from the signal converting means and the reader / writer device. And
The control means newly generates fluctuation voltage data based on the voltage fluctuation control setting data received from the computer and the voltage received from the reader / writer device, and the signal conversion is performed using the fluctuation voltage data as a digital signal. To the means,
The signal converting means converts the received digital signal into an analog signal, and transmits the fluctuation voltage to the level / direction changing means,
3. The voltage fluctuation device according to claim 2, wherein the fluctuation voltage from the signal conversion means is transmitted to the recording medium via the level / direction changing means.   The control means transmits a response indicating that the recording medium has finished processing based on the command data after completion of reception of command data transmitted from the reader / writer device to the recording medium, based on a setting in the computer. A response time that is a time until data starts to be returned to the reader / writer device is measured, and voltage fluctuation control is performed at a predetermined timing (from 0 to infinity) with reference to the response time. Item 3. The voltage fluctuation device according to Item 2.   5. The voltage fluctuation device according to claim 4, wherein the control means determines the order in which the command data is received and measures response times of commands in a predetermined order.   6. The voltage fluctuation device according to claim 4, wherein the same operation is continuously performed while shifting the timing of performing the voltage fluctuation control based on the response time. An electronic device that incorporates a non-volatile memory and executes a data restoration program when the data in the non-volatile memory is destroyed due to voltage fluctuations during data writing to the non-volatile memory;
A computer in which voltage fluctuation control condition setting for varying the voltage required for data writing is performed;
A program inspection system to which is connected a voltage fluctuation device that fluctuates a voltage required for the data writing in order to inspect the operation status of the data restoration program,
The voltage fluctuation device is:
A program inspection system comprising control means for performing voltage fluctuation control at a predetermined timing from the start of data writing based on voltage fluctuation control setting data received from the computer. A non-volatile memory, and a recording medium that executes a data restoration program when the data in the non-volatile memory is destroyed due to voltage fluctuations during data writing to the non-volatile memory;
A reader / writer device for reading and writing data with the recording medium;
A computer in which voltage fluctuation control condition setting for varying the voltage required for data writing is performed;
A program inspection system to which is connected a voltage fluctuation device that fluctuates a voltage required for the data writing in order to inspect the operation status of the data restoration program,
The voltage fluctuation device is:
A program inspection system comprising control means for performing voltage fluctuation control at a predetermined timing from the start of data writing based on voltage fluctuation control setting data received from the computer. The voltage fluctuation device is:
Signal conversion means for converting a digital signal received from the control means into an analog signal;
It further comprises a level / direction changing means for determining a direction of data flowing between the recording medium and the reader / writer device based on a control signal of the control means, and receiving a voltage from the signal converting means and the reader / writer device. And
The control means newly generates fluctuation voltage data based on the voltage fluctuation control setting data received from the computer and the voltage received from the reader / writer device, and the signal conversion is performed using the fluctuation voltage data as a digital signal. To the means,
The signal converting means converts the received digital signal into an analog signal, and transmits the fluctuation voltage to the level / direction changing means,
9. The program inspection system according to claim 8, wherein the fluctuating voltage from the signal conversion means is transmitted to the recording medium via the level / direction changing means.   The control means transmits a response indicating that the recording medium has finished processing based on the command data after completion of reception of command data transmitted from the reader / writer device to the recording medium, based on a setting in the computer. 10. The program inspection according to claim 9, wherein a response time which is a time until data is started to be returned to the reader / writer device is measured, and voltage fluctuation control is performed at a predetermined timing with reference to the response time. system.   11. The program inspection system according to claim 10, wherein the control means determines the order in which the command data is received, and measures response times of commands in a predetermined order.   The program inspection system according to claim 10 or 11, wherein the same operation is continuously performed while shifting the timing of performing the voltage fluctuation control based on the response time. An electronic device that incorporates a non-volatile memory and executes a data restoration program when the data in the non-volatile memory is destroyed due to voltage fluctuations during data writing to the non-volatile memory;
A computer in which voltage fluctuation control condition setting for varying the voltage required for data writing is performed;
A program inspection method that is performed by connecting a voltage fluctuation device that fluctuates a voltage required for the data writing in order to inspect the operation state of the data restoration program,
A program inspection method comprising: performing voltage fluctuation control at a predetermined timing from the start of data writing based on voltage fluctuation control setting data received from the computer by the voltage fluctuation device. A non-volatile memory, and a recording medium that executes a data restoration program when the data in the non-volatile memory is destroyed due to voltage fluctuations during data writing to the non-volatile memory;
A reader / writer device for reading and writing data with the recording medium;
A computer in which voltage fluctuation control condition setting for varying the voltage required for data writing is performed;
A program inspection method that is performed by connecting a voltage fluctuation device that fluctuates a voltage required for the data writing in order to inspect the operation state of the data restoration program,
A program inspection method comprising: performing voltage fluctuation control at a predetermined timing from the start of data writing based on voltage fluctuation control setting data received from the computer by the voltage fluctuation device.   The voltage fluctuation device newly generates fluctuation voltage data based on the voltage fluctuation control setting data received from the computer and the voltage received from the reader / writer device, the fluctuation voltage data is a digital signal, 15. The program inspection method according to claim 14, wherein after the digital signal is converted into an analog signal, the fluctuation voltage is transmitted to the recording medium.   Based on the setting in the computer, the voltage fluctuation device reports that the recording medium has finished processing based on the command data after the completion of reception of command data transmitted from the reader / writer device to the recording medium. A response time that is a time until response data is started to be returned to the reader / writer device is measured, and voltage fluctuation control is performed at a predetermined timing (from 0 to infinity) with reference to the response time. The program inspection method according to claim 15.   17. The program checking method according to claim 16, wherein the order of receiving the command data is determined by the voltage fluctuation device, and response times of commands in a predetermined order are measured.   18. The program inspection method according to claim 16, wherein the same operation is continuously performed while shifting the timing of performing the voltage fluctuation control based on the response time.   19. The program checking method according to claim 13, wherein a low voltage is applied for a time longer than at least 0.01 seconds during data writing to the nonvolatile memory.

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