JP2006093721A5 - - Google Patents

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Publication number
JP2006093721A5
JP2006093721A5 JP2005291809A JP2005291809A JP2006093721A5 JP 2006093721 A5 JP2006093721 A5 JP 2006093721A5 JP 2005291809 A JP2005291809 A JP 2005291809A JP 2005291809 A JP2005291809 A JP 2005291809A JP 2006093721 A5 JP2006093721 A5 JP 2006093721A5
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Prior art keywords
substrate
exposure
exposure apparatus
liquid
flat plate
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JP2005291809A
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Japanese (ja)
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JP2006093721A (en
JP4164508B2 (en
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Priority to JP2005291809A priority Critical patent/JP4164508B2/en
Priority claimed from JP2005291809A external-priority patent/JP4164508B2/en
Publication of JP2006093721A publication Critical patent/JP2006093721A/en
Publication of JP2006093721A5 publication Critical patent/JP2006093721A5/ja
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Claims (12)

原版のパターンを基板上に投影する投影光学系を有し、前記投影光学系の最終面と前記基板との間隙に液体を満たした状態で前記基板を露光する露光装置であって、
前記投影光学系に対して移動可能で、前記基板を保持する基板ステージと、
前記投影光学系に対して移動可能で、前記基板ステージに保持された前記基板の上面と実質的に同じ高さの上面を有する平面板と、
前記間隙に前記液体を供給する供給手段と、
前記間隙から前記液体を回収する回収手段と、を備え、
先行する基板に対して露光を終了した後かつ後続する基板に対して露光を開始する前において、前記最終面に対向させた前記平面板に対し、前記供給手段による液体供給と前記回収手段による液体回収とを互いに並行して行うことを特徴とする露光装置。
Includes a projection optical system for projecting a pattern of an original onto a substrate, with the gap filled with liquid between a final surface and the substrate of the projection optical system, an exposure apparatus for exposing a substrate,
A substrate stage movable with respect to the projection optical system and holding the substrate;
A flat plate movable with respect to the projection optical system and having an upper surface substantially the same height as the upper surface of the substrate held by the substrate stage ;
Supply means for supplying the liquid to the gap ;
A recovery means for recovering the liquid from the gap ,
After the exposure of the preceding substrate is completed and before the exposure of the subsequent substrate is started, the liquid supply by the supply means and the liquid by the recovery means are applied to the flat plate opposed to the final surface. An exposure apparatus that performs recovery in parallel with each other .
版のパターンを基板上に投影する投影光学系を有し、前記投影光学系の最終面と前記基板との間隙に液体を満たした状態で、前記基板を露光する露光装置であって、
前記投影光学系に対して移動可能で、前記基板を保持する基板ステージと、
前記投影光学系に対して移動可能で、前記基板ステージに保持された前記基板の上面と実質的に同じ高さの上面を有する平面板と、
前記間隙に前記液体を供給する供給手段と、
前記間隙から前記液体を回収する回収手段と、を備え、
前記平面板は、前記基板ステージとは独立して移動することを特徴とする露光装置。
The pattern of the original plate has a projection optical system for projecting onto the substrate, with the gap filled with liquid between a final surface and the substrate of the projection optical system, an exposure apparatus for exposing a substrate,
A substrate stage movable with respect to the projection optical system and holding the substrate;
A plane plate movable relative to the projection optical system and having an upper surface substantially the same height as the upper surface of the substrate held by the substrate stage;
Supply means for supplying the liquid to the gap;
A recovery means for recovering the liquid from the gap,
An exposure apparatus according to claim 1, wherein the planar plate moves independently of the substrate stage.
前記基板ステージに対して基板を交換する間において、前記最終面に対向させた前記平面板に対し、前記供給手段による液体供給と前記回収手段による液体回収とを互いに並行して行うことを特徴とする請求項1に記載の露光装置。During the exchange of the substrate with respect to the substrate stage, the liquid supply by the supply means and the liquid recovery by the recovery means are performed in parallel to the flat plate opposed to the final surface. The exposure apparatus according to claim 1. 前記供給手段は、前記最終面に対向させた前記平面板と前記最終面との間隙に前記液体を供給し、前記回収手段は、前記最終面に対向させた前記平面板と前記最終面との間隙から前記液体を回収することを特徴とする請求項2に記載の露光装置。The supply means supplies the liquid to a gap between the flat plate opposed to the final surface and the final surface, and the recovery means includes the flat plate opposed to the final surface and the final surface. The exposure apparatus according to claim 2, wherein the liquid is collected from the gap. 前記平面板は、前記基板ステージ上に配されていることを特徴とする請求項1に記載の露光装置。The exposure apparatus according to claim 1, wherein the flat plate is disposed on the substrate stage. 先行する基板に対して露光を終了した後かつ後続する基板に対して露光を開始する前において、前記平面板を前記最終面に対向させ、かつ前記基板ステージに対して基板の供給または回収を行うことを特徴とする請求項1乃至請求項5のいずれか1項に記載の露光装置。After the exposure of the preceding substrate is completed and before the exposure of the subsequent substrate is started, the flat plate is opposed to the final surface, and the substrate is supplied to or recovered from the substrate stage. The exposure apparatus according to claim 1, wherein the exposure apparatus is characterized in that: 先行する基板に対して露光を終了した後かつ後続する基板に対して露光を開始する前において、前記平面板を前記最終面に対向させ、かつ前記基板ステージに保持された基板の位置合わせ計測を行うことを特徴とする請求項1乃至請求項5のいずれか1項に記載の露光装置。After the exposure of the preceding substrate is completed and before the exposure of the succeeding substrate is started, the alignment measurement of the substrate held on the substrate stage is performed with the flat plate facing the final surface. The exposure apparatus according to claim 1, wherein the exposure apparatus performs the exposure. 先行する基板に対して露光を終了した後かつ後続する基板に対して露光を開始する前において、前記平面板を前記最終面に対向させ、かつ前記露光装置の維持または管理のための作業を行うことを特徴とする請求項1乃至請求項5のいずれか1項に記載の露光装置。After the exposure of the preceding substrate is completed and before the exposure of the subsequent substrate is started, the flat plate is opposed to the final surface, and work for maintaining or managing the exposure apparatus is performed. The exposure apparatus according to claim 1, wherein the exposure apparatus is characterized in that: 先行する基板に対して露光を終了した後かつ後続する基板に対して露光を開始する前において、前記最終面に対向させた前記平面板に対する液体供給量および液体回収量は、露光時の液体供給量および液体回収量よりも大きいことを特徴とする請求項1乃至請求項8のいずれか1項に記載の露光装置。After the exposure of the preceding substrate is completed and before the exposure of the subsequent substrate is started, the liquid supply amount and the liquid recovery amount with respect to the flat plate opposed to the final surface are the liquid supply at the time of exposure. The exposure apparatus according to claim 1, wherein the exposure apparatus is larger than the amount and the liquid recovery amount. 前記平面板は、ステンレス鋼およびフッ素樹脂のいずれかを含むことを特徴とする請求項1乃至請求項9のいずれか1項に記載の露光装置。The exposure apparatus according to any one of claims 1 to 9, wherein the flat plate includes any one of stainless steel and fluororesin. 前記投影光学系に対して移動可能で、前記原版を保持する原版ステージをさらに備え、A master stage that is movable with respect to the projection optical system and holds the master;
前記原版および前記基板を前記投影光学系に対してスキャン移動させながら、前記原版のパターンを介して前記基板を露光することを特徴とする請求項1乃至請求項10のいずれか1項に記載の露光装置。  11. The substrate according to claim 1, wherein the substrate is exposed through a pattern of the original while the original and the substrate are scanned and moved with respect to the projection optical system. Exposure device.
請求項1乃至請求項11のいずれか1項に記載の露光装置を用いて基板を露光するステップと、A step of exposing a substrate using the exposure apparatus according to any one of claims 1 to 11,
前記ステップにおいて露光された前記基板を現像するステップと、を有することを特徴とするデバイス製造方法。  And developing the substrate exposed in the step.
JP2005291809A 2005-10-04 2005-10-04 Exposure apparatus and device manufacturing method Expired - Fee Related JP4164508B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005291809A JP4164508B2 (en) 2005-10-04 2005-10-04 Exposure apparatus and device manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005291809A JP4164508B2 (en) 2005-10-04 2005-10-04 Exposure apparatus and device manufacturing method

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2003185389A Division JP3862678B2 (en) 2003-06-27 2003-06-27 Exposure apparatus and device manufacturing method

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2007248076A Division JP4533416B2 (en) 2007-09-25 2007-09-25 Exposure apparatus and device manufacturing method

Publications (3)

Publication Number Publication Date
JP2006093721A JP2006093721A (en) 2006-04-06
JP2006093721A5 true JP2006093721A5 (en) 2007-08-23
JP4164508B2 JP4164508B2 (en) 2008-10-15

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Publication number Priority date Publication date Assignee Title
JP4517354B2 (en) * 2004-11-08 2010-08-04 株式会社ニコン Exposure apparatus and device manufacturing method
US7423720B2 (en) 2004-11-12 2008-09-09 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20080094592A1 (en) * 2006-08-31 2008-04-24 Nikon Corporation Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, and device manufacturing method
JP5177736B2 (en) * 2006-11-01 2013-04-10 レーザーテック株式会社 Mask inspection device

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KR20130010039A (en) * 2002-12-10 2013-01-24 가부시키가이샤 니콘 Exposure system and device producing method
SG194264A1 (en) * 2003-04-11 2013-11-29 Nikon Corp Apparatus having an immersion fluid system configured to maintain immersion fluid in a gap adjacent an optical assembly
JP2005277363A (en) * 2003-05-23 2005-10-06 Nikon Corp Exposure device and device manufacturing method

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